JPS57146378A - Operator programmable inspector and object checking apparatus - Google Patents
Operator programmable inspector and object checking apparatusInfo
- Publication number
- JPS57146378A JPS57146378A JP56182402A JP18240281A JPS57146378A JP S57146378 A JPS57146378 A JP S57146378A JP 56182402 A JP56182402 A JP 56182402A JP 18240281 A JP18240281 A JP 18240281A JP S57146378 A JPS57146378 A JP S57146378A
- Authority
- JP
- Japan
- Prior art keywords
- inspector
- checking apparatus
- object checking
- operator programmable
- programmable
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
- G06T7/0006—Industrial image inspection using a design-rule based approach
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V10/00—Arrangements for image or video recognition or understanding
- G06V10/98—Detection or correction of errors, e.g. by rescanning the pattern or by human intervention; Evaluation of the quality of the acquired patterns
- G06V10/987—Detection or correction of errors, e.g. by rescanning the pattern or by human intervention; Evaluation of the quality of the acquired patterns with the intervention of an operator
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
Landscapes
- Engineering & Computer Science (AREA)
- Quality & Reliability (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Multimedia (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Image Processing (AREA)
- Image Analysis (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US20774880A | 1980-11-17 | 1980-11-17 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS57146378A true JPS57146378A (en) | 1982-09-09 |
Family
ID=22771840
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP56182402A Pending JPS57146378A (en) | 1980-11-17 | 1981-11-16 | Operator programmable inspector and object checking apparatus |
Country Status (5)
Country | Link |
---|---|
JP (1) | JPS57146378A (ja) |
CA (1) | CA1193709A (ja) |
DE (1) | DE3145832A1 (ja) |
IT (1) | IT1139710B (ja) |
MX (1) | MX150612A (ja) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4519041A (en) * | 1982-05-03 | 1985-05-21 | Honeywell Inc. | Real time automated inspection |
FR2559581B1 (fr) * | 1984-02-10 | 1986-07-11 | Siderurgie Fse Inst Rech | Procede et installation de detection de defauts de surface sur une bande en cours de defilement |
US4696047A (en) * | 1985-02-28 | 1987-09-22 | Texas Instruments Incorporated | Apparatus for automatically inspecting electrical connecting pins |
DE3612256C2 (de) * | 1986-04-11 | 1998-05-14 | Twi Tech Wissenschaftliche Ind | Verfahren und Einrichtung zur optoelektronischen Qualitätskontrolle |
DE19646694A1 (de) | 1996-11-12 | 1998-05-14 | Heuft Systemtechnik Gmbh | Verfahren zum Testen der Zuverlässigkeit eines Prüfgerätes, insbesondere eines Leerflascheninspektors |
DE19646678A1 (de) | 1996-11-12 | 1998-05-14 | Heuft Systemtechnik Gmbh | Verfahren zum Testen der Zuverlässigkeit eines Prüfgerätes, insbesondere eines Leerflascheninspektors |
JP2002018680A (ja) | 2000-07-10 | 2002-01-22 | Mitsubishi Electric Corp | 工作機械 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5399731A (en) * | 1977-02-14 | 1978-08-31 | Barry Wehmiller Co | Method of and device for electronically analyzing image of article to be illuminated |
JPS55908A (en) * | 1978-06-14 | 1980-01-07 | Toshiba Corp | Picture display unit |
JPS55119782A (en) * | 1979-03-09 | 1980-09-13 | Daihen Corp | Pattern automatic inspection method |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4025202A (en) * | 1975-08-07 | 1977-05-24 | Ball Brothers Service Corporation | Method and apparatus for inspecting the bottoms of hollow glass articles |
DE2916159A1 (de) * | 1979-04-20 | 1980-10-30 | Hajime Industries | Inspektionseinrichtung |
-
1981
- 1981-09-23 CA CA000386515A patent/CA1193709A/en not_active Expired
- 1981-11-12 IT IT25038/81A patent/IT1139710B/it active
- 1981-11-16 JP JP56182402A patent/JPS57146378A/ja active Pending
- 1981-11-16 MX MX190132A patent/MX150612A/es unknown
- 1981-11-16 DE DE19813145832 patent/DE3145832A1/de not_active Ceased
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5399731A (en) * | 1977-02-14 | 1978-08-31 | Barry Wehmiller Co | Method of and device for electronically analyzing image of article to be illuminated |
JPS55908A (en) * | 1978-06-14 | 1980-01-07 | Toshiba Corp | Picture display unit |
JPS55119782A (en) * | 1979-03-09 | 1980-09-13 | Daihen Corp | Pattern automatic inspection method |
Also Published As
Publication number | Publication date |
---|---|
IT1139710B (it) | 1986-09-24 |
DE3145832A1 (de) | 1982-09-23 |
MX150612A (es) | 1984-05-30 |
IT8125038A0 (it) | 1981-11-12 |
CA1193709A (en) | 1985-09-17 |
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