MD790Z - Method for measurement of impedance components - Google Patents

Method for measurement of impedance components

Info

Publication number
MD790Z
MD790Z MDS20140027A MDS20140027A MD790Z MD 790 Z MD790 Z MD 790Z MD S20140027 A MDS20140027 A MD S20140027A MD S20140027 A MDS20140027 A MD S20140027A MD 790 Z MD790 Z MD 790Z
Authority
MD
Moldova
Prior art keywords
impedance
components
signal
comparison element
measuring
Prior art date
Application number
MDS20140027A
Other languages
Moldavian (mo)
Romanian (ro)
Russian (ru)
Inventor
Виталие НАСТАС
Original Assignee
Технический университет Молдовы
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Технический университет Молдовы filed Critical Технический университет Молдовы
Priority to MDS20140027A priority Critical patent/MD790Z/en
Publication of MD790Y publication Critical patent/MD790Y/en
Publication of MD790Z publication Critical patent/MD790Z/en

Links

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  • Measurement Of Resistance Or Impedance (AREA)

Abstract

The invention relates to the field of electrical and electronic measuring and can be used for high-precision measurement of impedance components.The method for measurement of impedance components consists in the formation of a resonant measuring circuit of the object to be measured and a comparison element, reproducing an impedance with virtual character, power supply of the resonant circuit with the measuring signal, formation of disequilibrium signal as a result of interaction of the measuring signal with the resonant circuit and control of this signal, regulation of impedance comparison element to the attainment of the resonance state between the measured components of the unknown impedance and the corresponding components of the comparison element impedance, as well as determination of values of the measured impedance components from their known dependence on the values of the comparison element impedance components in the equilibrium state of the measuring circuit. The measuring signal of the resonance circuit is regulated to a value ensuring the lack of signal distortion in the comparison element.
MDS20140027A 2014-03-05 2014-03-05 Method for measurement of impedance components MD790Z (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
MDS20140027A MD790Z (en) 2014-03-05 2014-03-05 Method for measurement of impedance components

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
MDS20140027A MD790Z (en) 2014-03-05 2014-03-05 Method for measurement of impedance components

Publications (2)

Publication Number Publication Date
MD790Y MD790Y (en) 2014-06-30
MD790Z true MD790Z (en) 2015-01-31

Family

ID=51022566

Family Applications (1)

Application Number Title Priority Date Filing Date
MDS20140027A MD790Z (en) 2014-03-05 2014-03-05 Method for measurement of impedance components

Country Status (1)

Country Link
MD (1) MD790Z (en)

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
MD2086G2 (en) * 2001-12-03 2003-08-31 Виталие НАСТАС Method for measurement of impedance components
MD2509G2 (en) * 2004-01-12 2005-02-28 Технический университет Молдовы Method of impedance components measurement
MD3577G2 (en) * 2006-09-21 2008-11-30 Технический университет Молдовы Method of measuring the impedance components
MD392Z (en) * 2010-11-25 2012-01-31 Технический университет Молдовы Method for measuring the impedance components
MD489Z (en) * 2011-06-09 2012-09-30 Технический университет Молдовы Method for measuring the impedance components
MD628Z (en) * 2012-11-23 2013-11-30 Технический университет Молдовы Method for measuring the impedance components
MD662Z (en) * 2013-01-11 2014-02-28 Технический университет Молдовы Method for measuring the impedance components
  • 2014

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
MD2086G2 (en) * 2001-12-03 2003-08-31 Виталие НАСТАС Method for measurement of impedance components
MD2509G2 (en) * 2004-01-12 2005-02-28 Технический университет Молдовы Method of impedance components measurement
MD3577G2 (en) * 2006-09-21 2008-11-30 Технический университет Молдовы Method of measuring the impedance components
MD392Z (en) * 2010-11-25 2012-01-31 Технический университет Молдовы Method for measuring the impedance components
MD489Z (en) * 2011-06-09 2012-09-30 Технический университет Молдовы Method for measuring the impedance components
MD628Z (en) * 2012-11-23 2013-11-30 Технический университет Молдовы Method for measuring the impedance components
MD662Z (en) * 2013-01-11 2014-02-28 Технический университет Молдовы Method for measuring the impedance components

Also Published As

Publication number Publication date
MD790Y (en) 2014-06-30

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Legal Events

Date Code Title Description
FG9Y Short term patent issued
KA4A Patent for invention lapsed due to non-payment of fees (with right of restoration)