KR970000196B1 - 활성화층들을 가지는 전극의 시험 - Google Patents

활성화층들을 가지는 전극의 시험 Download PDF

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Publication number
KR970000196B1
KR970000196B1 KR1019890010004A KR890010004A KR970000196B1 KR 970000196 B1 KR970000196 B1 KR 970000196B1 KR 1019890010004 A KR1019890010004 A KR 1019890010004A KR 890010004 A KR890010004 A KR 890010004A KR 970000196 B1 KR970000196 B1 KR 970000196B1
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KR
South Korea
Prior art keywords
electrode
cathode
anode
support
tested
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Expired - Fee Related
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KR1019890010004A
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English (en)
Korean (ko)
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KR900008068A (ko
Inventor
코토우스키 스테판
부쎄 베른드
돈너르하크 베른드
Original Assignee
헤레우스 에렉트로덴 게엠베하
하르트무트 보오슈트
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Publication of KR900008068A publication Critical patent/KR900008068A/ko
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Publication of KR970000196B1 publication Critical patent/KR970000196B1/ko
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    • C—CHEMISTRY; METALLURGY
    • C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D17/00—Constructional parts, or assemblies thereof, of cells for electrolytic coating
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/26—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electrochemical variables; by using electrolysis or electrophoresis
    • G01N27/416—Systems
    • G01N27/4163—Systems checking the operation of, or calibrating, the measuring apparatus

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  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Electrochemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Physics & Mathematics (AREA)
  • Molecular Biology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Electrolytic Production Of Metals (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Electroplating Methods And Accessories (AREA)
  • Investigating And Analyzing Materials By Characteristic Methods (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Coating With Molten Metal (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Electrochromic Elements, Electrophoresis, Or Variable Reflection Or Absorption Elements (AREA)
  • Investigating Or Analyzing Non-Biological Materials By The Use Of Chemical Means (AREA)
  • Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)
  • Liquid Crystal (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
KR1019890010004A 1988-11-03 1989-07-13 활성화층들을 가지는 전극의 시험 Expired - Fee Related KR970000196B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE3837290A DE3837290A1 (de) 1988-11-03 1988-11-03 Pruefung von elektroden mit aktivierungsschichten
DEP3837290.8 1988-11-03

Publications (2)

Publication Number Publication Date
KR900008068A KR900008068A (ko) 1990-06-02
KR970000196B1 true KR970000196B1 (ko) 1997-01-06

Family

ID=6366377

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019890010004A Expired - Fee Related KR970000196B1 (ko) 1988-11-03 1989-07-13 활성화층들을 가지는 전극의 시험

Country Status (9)

Country Link
US (2) US4919766A (https=)
EP (1) EP0369103B1 (https=)
JP (1) JPH0762277B2 (https=)
KR (1) KR970000196B1 (https=)
AT (1) ATE81206T1 (https=)
BR (1) BR8905380A (https=)
CA (1) CA1290396C (https=)
DE (2) DE3837290A1 (https=)
ES (1) ES2034499T3 (https=)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5076906A (en) * 1991-01-31 1991-12-31 Raytheon Company Method for testing encapsulation integrity
US5916705A (en) * 1997-08-04 1999-06-29 Lockhead Martin Tactical Defense Systems, Inc. Fuel cell cathode testing device and method for using the same
US6248601B1 (en) 1999-04-19 2001-06-19 Taiwan Semiconductor Manufacturing Company Fix the glassivation layer's micro crack point precisely by using electroplating method
FI107192B (fi) * 1999-11-09 2001-06-15 Outokumpu Oy Menetelmä elektrodin pinnanlaadun tarkistamiseksi
ES2168224B1 (es) * 2000-10-20 2003-02-16 Univ Valencia Politecnica Procedimiento electro-optico de analisis de procesos electroquimicos en tiempo real y dispositivo para su puesta en practica.
WO2015035528A1 (es) * 2013-09-13 2015-03-19 New Tech Copper Spa. Dispositivo de visualización portátil sumergible, para observación en el interior de celdas electrolíticas
CN109234788A (zh) * 2018-08-03 2019-01-18 诚亿电子（嘉兴）有限公司 除胶再生机可视化检查方法
CN113092551A (zh) * 2021-04-29 2021-07-09 中国华能集团清洁能源技术研究院有限公司 一种具有多电极的工作电极、组合平行测试系统及其使用方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3384556A (en) * 1964-11-23 1968-05-21 Sperry Rand Corp Method of electrolytically detecting imperfections in oxide passivation layers
US3408270A (en) * 1965-06-25 1968-10-29 Anthony J Gentile Method for non-destructive testing of materials
EP0088192B1 (en) * 1982-03-05 1986-11-05 M & T Chemicals, Inc. Control of anode gas evolution in trivalent chromium plating bath
US4511838A (en) * 1982-03-31 1985-04-16 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Method for determining the point of zero zeta potential of semiconductor
HU199020B (en) * 1987-05-04 1989-12-28 Magyar Tudomanyos Akademia Method and apparatus for measuring the layer thickness of semiconductor layer structures

Also Published As

Publication number Publication date
US4919766A (en) 1990-04-24
DE58902375D1 (de) 1992-11-05
KR900008068A (ko) 1990-06-02
ATE81206T1 (de) 1992-10-15
BR8905380A (pt) 1990-05-22
ES2034499T3 (es) 1993-04-01
EP0369103B1 (de) 1992-09-30
DE3837290C2 (https=) 1992-01-16
CA1290396C (en) 1991-10-08
JPH02179898A (ja) 1990-07-12
JPH0762277B2 (ja) 1995-07-05
EP0369103A1 (de) 1990-05-23
US4963244A (en) 1990-10-16
DE3837290A1 (de) 1990-07-05

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