KR970000196B1 - 활성화층들을 가지는 전극의 시험 - Google Patents

활성화층들을 가지는 전극의 시험 Download PDF

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Publication number
KR970000196B1
KR970000196B1 KR1019890010004A KR890010004A KR970000196B1 KR 970000196 B1 KR970000196 B1 KR 970000196B1 KR 1019890010004 A KR1019890010004 A KR 1019890010004A KR 890010004 A KR890010004 A KR 890010004A KR 970000196 B1 KR970000196 B1 KR 970000196B1
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KR
South Korea
Prior art keywords
electrode
cathode
anode
support
tested
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Expired - Fee Related
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KR1019890010004A
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English (en)
Korean (ko)
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KR900008068A (ko
Inventor
코토우스키 스테판
부쎄 베른드
돈너르하크 베른드
Original Assignee
헤레우스 에렉트로덴 게엠베하
하르트무트 보오슈트
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Publication of KR900008068A publication Critical patent/KR900008068A/ko
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Publication of KR970000196B1 publication Critical patent/KR970000196B1/ko
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    • C—CHEMISTRY; METALLURGY
    • C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D17/00—Constructional parts, or assemblies thereof, of cells for electrolytic coating
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/26—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electrochemical variables; by using electrolysis or electrophoresis
    • G01N27/416—Systems
    • G01N27/4163—Systems checking the operation of, or calibrating, the measuring apparatus

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  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Electrochemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Physics & Mathematics (AREA)
  • Molecular Biology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Electrolytic Production Of Metals (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Electroplating Methods And Accessories (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Investigating And Analyzing Materials By Characteristic Methods (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)
  • Electrochromic Elements, Electrophoresis, Or Variable Reflection Or Absorption Elements (AREA)
  • Investigating Or Analyzing Non-Biological Materials By The Use Of Chemical Means (AREA)
  • Liquid Crystal (AREA)
  • Coating With Molten Metal (AREA)
KR1019890010004A 1988-11-03 1989-07-13 활성화층들을 가지는 전극의 시험 Expired - Fee Related KR970000196B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DEP3837290.8 1988-11-03
DE3837290A DE3837290A1 (de) 1988-11-03 1988-11-03 Pruefung von elektroden mit aktivierungsschichten

Publications (2)

Publication Number Publication Date
KR900008068A KR900008068A (ko) 1990-06-02
KR970000196B1 true KR970000196B1 (ko) 1997-01-06

Family

ID=6366377

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019890010004A Expired - Fee Related KR970000196B1 (ko) 1988-11-03 1989-07-13 활성화층들을 가지는 전극의 시험

Country Status (9)

Country Link
US (2) US4919766A (enExample)
EP (1) EP0369103B1 (enExample)
JP (1) JPH0762277B2 (enExample)
KR (1) KR970000196B1 (enExample)
AT (1) ATE81206T1 (enExample)
BR (1) BR8905380A (enExample)
CA (1) CA1290396C (enExample)
DE (2) DE3837290A1 (enExample)
ES (1) ES2034499T3 (enExample)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5076906A (en) * 1991-01-31 1991-12-31 Raytheon Company Method for testing encapsulation integrity
US5916705A (en) * 1997-08-04 1999-06-29 Lockhead Martin Tactical Defense Systems, Inc. Fuel cell cathode testing device and method for using the same
US6248601B1 (en) 1999-04-19 2001-06-19 Taiwan Semiconductor Manufacturing Company Fix the glassivation layer's micro crack point precisely by using electroplating method
FI107192B (fi) 1999-11-09 2001-06-15 Outokumpu Oy Menetelmä elektrodin pinnanlaadun tarkistamiseksi
ES2168224B1 (es) * 2000-10-20 2003-02-16 Univ Valencia Politecnica Procedimiento electro-optico de analisis de procesos electroquimicos en tiempo real y dispositivo para su puesta en practica.
WO2015035528A1 (es) * 2013-09-13 2015-03-19 New Tech Copper Spa. Dispositivo de visualización portátil sumergible, para observación en el interior de celdas electrolíticas
CN109234788A (zh) * 2018-08-03 2019-01-18 诚亿电子（嘉兴）有限公司 除胶再生机可视化检查方法
CN113092551A (zh) * 2021-04-29 2021-07-09 中国华能集团清洁能源技术研究院有限公司 一种具有多电极的工作电极、组合平行测试系统及其使用方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3384556A (en) * 1964-11-23 1968-05-21 Sperry Rand Corp Method of electrolytically detecting imperfections in oxide passivation layers
US3408270A (en) * 1965-06-25 1968-10-29 Anthony J Gentile Method for non-destructive testing of materials
EP0088192B1 (en) * 1982-03-05 1986-11-05 M & T Chemicals, Inc. Control of anode gas evolution in trivalent chromium plating bath
US4511838A (en) * 1982-03-31 1985-04-16 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Method for determining the point of zero zeta potential of semiconductor
HU199020B (en) * 1987-05-04 1989-12-28 Magyar Tudomanyos Akademia Method and apparatus for measuring the layer thickness of semiconductor layer structures

Also Published As

Publication number Publication date
CA1290396C (en) 1991-10-08
JPH02179898A (ja) 1990-07-12
US4919766A (en) 1990-04-24
ATE81206T1 (de) 1992-10-15
JPH0762277B2 (ja) 1995-07-05
DE58902375D1 (de) 1992-11-05
EP0369103B1 (de) 1992-09-30
KR900008068A (ko) 1990-06-02
DE3837290A1 (de) 1990-07-05
US4963244A (en) 1990-10-16
EP0369103A1 (de) 1990-05-23
DE3837290C2 (enExample) 1992-01-16
ES2034499T3 (es) 1993-04-01
BR8905380A (pt) 1990-05-22

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