KR960026570A - Highly Integrated Semiconductor Device Manufacturing Method - Google Patents
Highly Integrated Semiconductor Device Manufacturing Method Download PDFInfo
- Publication number
- KR960026570A KR960026570A KR1019940037517A KR19940037517A KR960026570A KR 960026570 A KR960026570 A KR 960026570A KR 1019940037517 A KR1019940037517 A KR 1019940037517A KR 19940037517 A KR19940037517 A KR 19940037517A KR 960026570 A KR960026570 A KR 960026570A
- Authority
- KR
- South Korea
- Prior art keywords
- oxide film
- forming
- film
- field oxide
- silicon
- Prior art date
Links
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 9
- 239000004065 semiconductor Substances 0.000 title claims abstract 10
- 238000000034 method Methods 0.000 claims abstract 7
- 239000000758 substrate Substances 0.000 claims abstract 7
- 239000007943 implant Substances 0.000 claims abstract 4
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims abstract 3
- 238000010438 heat treatment Methods 0.000 claims abstract 3
- 229910052710 silicon Inorganic materials 0.000 claims abstract 3
- 239000010703 silicon Substances 0.000 claims abstract 3
- 150000004767 nitrides Chemical class 0.000 claims 6
- 238000005468 ion implantation Methods 0.000 claims 5
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims 3
- 229910052814 silicon oxide Inorganic materials 0.000 claims 3
- 229910052581 Si3N4 Inorganic materials 0.000 claims 2
- 229910021420 polycrystalline silicon Inorganic materials 0.000 claims 2
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 claims 2
- 230000000903 blocking effect Effects 0.000 claims 1
- 238000005530 etching Methods 0.000 claims 1
- 238000001459 lithography Methods 0.000 claims 1
- 229920002120 photoresistant polymer Polymers 0.000 claims 1
- 125000006850 spacer group Chemical group 0.000 claims 1
- 239000000463 material Substances 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/77—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
- H01L21/78—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
- H01L21/82—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components
- H01L21/822—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components the substrate being a semiconductor, using silicon technology
- H01L21/8232—Field-effect technology
- H01L21/8234—MIS technology, i.e. integration processes of field effect transistors of the conductor-insulator-semiconductor type
- H01L21/823481—MIS technology, i.e. integration processes of field effect transistors of the conductor-insulator-semiconductor type isolation region manufacturing related aspects, e.g. to avoid interaction of isolation region with adjacent structure
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/66007—Multistep manufacturing processes
- H01L29/66075—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials
- H01L29/66227—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials the devices being controllable only by the electric current supplied or the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched, e.g. three-terminal devices
- H01L29/66409—Unipolar field-effect transistors
- H01L29/66477—Unipolar field-effect transistors with an insulated gate, i.e. MISFET
- H01L29/66568—Lateral single gate silicon transistors
- H01L29/66575—Lateral single gate silicon transistors where the source and drain or source and drain extensions are self-aligned to the sides of the gate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
Abstract
본 발명은 버즈빅에 의한 활성영역의 감소와 필드산화막과 주변의 활성영역과의 단차 발생을 방지하기 위한 고집적 반도체 소자 제조방법에 관한 것으로, 반도체 소자에 사용되는 소자와 소자 사이를 절연시켜 주는 필드 산화막의 제조과정 중 실리콘 기판 상부에 마스크를 사용하여 필드 산화막을 형성할 영역 이외의 영역에 감광 물질을 형성한 다음, O2임플란트를 한 후 열처리를 함으로써 필드산화막을 형성하는 단계를 포함하여 이루어지는 것을 특징으로 한다.BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for fabricating a highly integrated semiconductor device for reducing the active area caused by Buzzvik and preventing the step difference between the field oxide film and the surrounding active area. by a using a mask in the silicon substrate during the manufacturing process of the oxide film to form a photosensitive material in a region other than the region to form the field oxide film and then the next, O 2 implant the heat treatment that comprises the steps of forming a field oxide film It features.
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음Since this is an open matter, no full text was included.
제1A도 및 제1B도는 본 발명의 제1실시예에 따른 제조과정을 나타내는 단면도, 제2A도 내지 제2C도는 본발명의 제2실시예에 따른 제조과정3을 나타내는 단면도, 제3A도 내지 제3C도는 본 발명의 제3실시예에 따른 제조과정을 나타내는 단면도.1A and 1B are cross-sectional views showing a manufacturing process according to the first embodiment of the present invention, Figures 2A to 2C are cross-sectional views showing a manufacturing process 3 according to a second embodiment of the present invention, Figures 3A to 3C is a sectional view showing a manufacturing process according to the third embodiment of the present invention.
Claims (7)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019940037517A KR0147428B1 (en) | 1994-12-27 | 1994-12-27 | High integrated semiconductor device and the manufacturing method thereof |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019940037517A KR0147428B1 (en) | 1994-12-27 | 1994-12-27 | High integrated semiconductor device and the manufacturing method thereof |
Publications (2)
Publication Number | Publication Date |
---|---|
KR960026570A true KR960026570A (en) | 1996-07-22 |
KR0147428B1 KR0147428B1 (en) | 1998-11-02 |
Family
ID=19404007
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019940037517A KR0147428B1 (en) | 1994-12-27 | 1994-12-27 | High integrated semiconductor device and the manufacturing method thereof |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR0147428B1 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100734651B1 (en) * | 2002-12-30 | 2007-07-02 | 동부일렉트로닉스 주식회사 | Method for manufacturing semiconductor device |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100400918B1 (en) * | 2001-06-28 | 2003-10-10 | 동부전자 주식회사 | Method For Manufacturing Semiconductor Devices |
JP4175650B2 (en) * | 2004-08-26 | 2008-11-05 | シャープ株式会社 | Manufacturing method of semiconductor device |
-
1994
- 1994-12-27 KR KR1019940037517A patent/KR0147428B1/en not_active IP Right Cessation
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100734651B1 (en) * | 2002-12-30 | 2007-07-02 | 동부일렉트로닉스 주식회사 | Method for manufacturing semiconductor device |
Also Published As
Publication number | Publication date |
---|---|
KR0147428B1 (en) | 1998-11-02 |
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