KR960016157A - 3점 교정부를 구비한 시그마 델타 아날로그-디지털 변환기 - Google Patents

3점 교정부를 구비한 시그마 델타 아날로그-디지털 변환기 Download PDF

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Publication number
KR960016157A
KR960016157A KR1019950036827A KR19950036827A KR960016157A KR 960016157 A KR960016157 A KR 960016157A KR 1019950036827 A KR1019950036827 A KR 1019950036827A KR 19950036827 A KR19950036827 A KR 19950036827A KR 960016157 A KR960016157 A KR 960016157A
Authority
KR
South Korea
Prior art keywords
signal
offset
correction
positive
full scale
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
KR1019950036827A
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English (en)
Korean (ko)
Inventor
제이.콘블룸 존
에이.우가르테 카를로스
와이.마 팬
Original Assignee
카렌 지.핑크
해리스 코포레이션
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 카렌 지.핑크, 해리스 코포레이션 filed Critical 카렌 지.핑크
Publication of KR960016157A publication Critical patent/KR960016157A/ko
Abandoned legal-status Critical Current

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Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M3/00—Conversion of analogue values to or from differential modulation
    • H03M3/30—Delta-sigma modulation
    • H03M3/38—Calibration
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
    • H03M1/0602—Continuously compensating for, or preventing, undesired influence of physical parameters of deviations from the desired transfer characteristic
    • H03M1/0604—Continuously compensating for, or preventing, undesired influence of physical parameters of deviations from the desired transfer characteristic at one point, i.e. by adjusting a single reference value, e.g. bias or gain error
    • H03M1/0607—Offset or drift compensation
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M3/00—Conversion of analogue values to or from differential modulation
    • H03M3/30—Delta-sigma modulation
    • H03M3/458—Analogue/digital converters using delta-sigma modulation as an intermediate step

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Compression, Expansion, Code Conversion, And Decoders (AREA)
  • Analogue/Digital Conversion (AREA)
KR1019950036827A 1994-10-28 1995-10-24 3점 교정부를 구비한 시그마 델타 아날로그-디지털 변환기 Abandoned KR960016157A (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US8/331,015 1994-10-28
US08/331,015 US5598157A (en) 1994-10-28 1994-10-28 Sigma Delta analog to digital converter with three point calibration apparatus and method

Publications (1)

Publication Number Publication Date
KR960016157A true KR960016157A (ko) 1996-05-22

Family

ID=23292271

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019950036827A Abandoned KR960016157A (ko) 1994-10-28 1995-10-24 3점 교정부를 구비한 시그마 델타 아날로그-디지털 변환기

Country Status (5)

Country Link
US (1) US5598157A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
EP (1) EP0709971A3 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
KR (1) KR960016157A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
IL (1) IL115631A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
TW (1) TW290763B (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

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KR100688520B1 (ko) * 2005-01-17 2007-03-02 삼성전자주식회사 아날로그 디지털 컨버터의 캘리브레이션 방법

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US6587560B1 (en) * 1997-04-22 2003-07-01 Silicon Laboratories Inc. Low voltage circuits powered by the phone line
US6516024B1 (en) 1997-04-22 2003-02-04 Silicon Laboratories Inc. Digital access arrangement circuitry and method for connecting to phone lines having a DC holding circuit with low distortion and current limiting
US6442271B1 (en) 1997-04-22 2002-08-27 Silicon Laboratories, Inc. Digital isolation system with low power mode
US6430229B1 (en) 1997-04-22 2002-08-06 Silicon Laboratories Inc. Capacitive isolation system with digital communication and power transfer
US6307891B1 (en) 1997-04-22 2001-10-23 Silicon Laboratories, Inc. Method and apparatus for freezing a communication link during a disruptive event
US6504864B1 (en) 1997-04-22 2003-01-07 Silicon Laboratories Inc. Digital access arrangement circuitry and method for connecting to phone lines having a second order DC holding circuit
US6339048B1 (en) * 1999-12-23 2002-01-15 Elementis Specialties, Inc. Oil and oil invert emulsion drilling fluids with improved anti-settling properties
US6442213B1 (en) * 1997-04-22 2002-08-27 Silicon Laboratories Inc. Digital isolation system with hybrid circuit in ADC calibration loop
US5870046A (en) 1997-04-22 1999-02-09 Silicon Laboratories Inc. Analog isolation system with digital communication across a capacitive barrier
US6498825B1 (en) * 1997-04-22 2002-12-24 Silicon Laboratories Inc. Digital access arrangement circuitry and method for connecting to phone lines having a DC holding circuit with programmable current limiting
US6137827A (en) 1997-04-22 2000-10-24 Silicon Laboratories, Inc. Isolation system with digital communication across a capacitive barrier
US6385235B1 (en) * 1997-04-22 2002-05-07 Silicon Laboratories, Inc. Direct digital access arrangement circuitry and method for connecting to phone lines
US6167134A (en) 1997-04-22 2000-12-26 Silicon Laboratories, Inc. External resistor and method to minimize power dissipation in DC holding circuitry for a communication system
US6480602B1 (en) 1997-04-22 2002-11-12 Silicon Laboratories, Inc. Ring-detect interface circuitry and method for a communication system
US6456712B1 (en) 1997-04-22 2002-09-24 Silicon Laboratories Inc. Separation of ring detection functions across isolation barrier for minimum power
US6408034B1 (en) 1997-04-22 2002-06-18 Silicon Laboratories, Inc. Framed delta sigma data with unlikely delta sigma data patterns
US6144326A (en) 1997-04-22 2000-11-07 Silicon Laboratories, Inc. Digital isolation system with ADC offset calibration
US6255970B1 (en) * 1997-10-10 2001-07-03 Photobit Corporation Correction of missing codes nonlinearity in A to D converters
US6008685A (en) * 1998-03-25 1999-12-28 Mosaic Design Labs, Inc. Solid state temperature measurement
US6351228B1 (en) * 1999-02-03 2002-02-26 Hitachi Electronics Engineering Co., Ltd. Digital calibration method and apparatus for A/D or D/A converters
US6384755B1 (en) * 1999-04-09 2002-05-07 Hewlett-Packard Company Method and apparatus for analog to digital conversion using an impedance device as an identifier
US6411232B1 (en) 1999-09-30 2002-06-25 Motorola, Inc. Method and system for determining an element conversion characteristic contemporaneous with converting and input signal in a signal converter
US6608580B2 (en) 2001-02-15 2003-08-19 Sarnoff Corporation Differential analog-to-digital converter
US6924755B1 (en) 2002-12-02 2005-08-02 Analog Devices, Inc. Multi-channel analog to digital converter which facilitates calibration of the analog to digital converter and respective input channels to the analog to digital converter, and a method for calibrating the analog to digital converter
JP2012165169A (ja) * 2011-02-07 2012-08-30 Renesas Electronics Corp Ａ／ｄ変換器及び半導体装置
JP5870699B2 (ja) * 2012-01-10 2016-03-01 ミツミ電機株式会社 センサ出力補正回路及びセンサ出力補正装置、並びにセンサ出力補正方法
US8847804B2 (en) * 2012-11-05 2014-09-30 Freescale Semiconductor, Inc. Delay compensated continuous time sigma delta analog-to-digital converter
US9438266B1 (en) 2016-02-10 2016-09-06 Texas Instruments Incorporated Calibrated-output analog-to-digital converter apparatus and methods
US9843337B1 (en) * 2017-03-16 2017-12-12 Analog Devices Global Background flash offset calibration in continuous-time delta-sigma ADCS
CN117728838B (zh) * 2024-02-08 2024-05-28 深圳市山海半导体科技有限公司 用于adc失调误差的模数转换装置与校准方法

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US5257026A (en) * 1992-04-17 1993-10-26 Crystal Semiconductor, Inc. Method and apparatus for calibrating a multi-bit delta-sigma modular
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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100688520B1 (ko) * 2005-01-17 2007-03-02 삼성전자주식회사 아날로그 디지털 컨버터의 캘리브레이션 방법

Also Published As

Publication number Publication date
EP0709971A3 (en) 1998-05-06
IL115631A0 (en) 1996-01-19
US5598157A (en) 1997-01-28
TW290763B (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1996-11-11
IL115631A (en) 1999-03-12
EP0709971A2 (en) 1996-05-01

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Patent event date: 20000818

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