KR960008997A - 패턴 형성방법 및 이 방법을 이용한 반도체 디바이스 제조방법 - Google Patents
패턴 형성방법 및 이 방법을 이용한 반도체 디바이스 제조방법Info
- Publication number
- KR960008997A KR960008997A KR1019950026459A KR19950026459A KR960008997A KR 960008997 A KR960008997 A KR 960008997A KR 1019950026459 A KR1019950026459 A KR 1019950026459A KR 19950026459 A KR19950026459 A KR 19950026459A KR 960008997 A KR960008997 A KR 960008997A
- Authority
- KR
- South Korea
- Prior art keywords
- semiconductor device
- pattern forming
- device manufacturing
- forming method
- pattern
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
- G03F7/70125—Use of illumination settings tailored to particular mask patterns
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/027—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/70283—Mask effects on the imaging process
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP94-202619 | 1994-08-26 | ||
JP20261994 | 1994-08-26 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR960008997A true KR960008997A (ko) | 1996-03-22 |
KR100377206B1 KR100377206B1 (ko) | 2003-06-09 |
Family
ID=16460381
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019950026459A KR100377206B1 (ko) | 1994-08-26 | 1995-08-24 | 패턴형성방법및이방법을이용한반도체디바이스제조방법 |
Country Status (4)
Country | Link |
---|---|
EP (1) | EP0698824B1 (ko) |
KR (1) | KR100377206B1 (ko) |
DE (1) | DE69519143T2 (ko) |
SG (2) | SG48693A1 (ko) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07122478A (ja) * | 1993-10-27 | 1995-05-12 | Sony Corp | パターン投影方法 |
KR20000016498A (ko) * | 1996-06-10 | 2000-03-25 | 다니엘 제이. 설리반 | 생산환경을 위한 홀로그래픽 패터닝방법 및 공구 |
US6930754B1 (en) | 1998-06-30 | 2005-08-16 | Canon Kabushiki Kaisha | Multiple exposure method |
WO2005015314A2 (en) * | 2003-07-30 | 2005-02-17 | Carl Zeiss Smt Ag | An illumination system for microlithography |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02138491A (ja) | 1988-11-15 | 1990-05-28 | Dowa Mining Co Ltd | 微細電解銅粉末の製造方法 |
JP3245882B2 (ja) * | 1990-10-24 | 2002-01-15 | 株式会社日立製作所 | パターン形成方法、および投影露光装置 |
JP3102076B2 (ja) * | 1991-08-09 | 2000-10-23 | キヤノン株式会社 | 照明装置及びそれを用いた投影露光装置 |
DE4303028C2 (de) | 1992-02-03 | 1997-08-14 | Hitachi Ltd | Projektionsbelichtungsgerät |
US5309198A (en) * | 1992-02-25 | 1994-05-03 | Nikon Corporation | Light exposure system |
DE69418131D1 (de) * | 1993-03-01 | 1999-06-02 | Gen Signal Corp | Vorrichtung zur erzeugung einer einstellbaren ringförmigen beleuchtung für einen photolithograpischen projektionsapparat |
JPH07122478A (ja) * | 1993-10-27 | 1995-05-12 | Sony Corp | パターン投影方法 |
-
1995
- 1995-08-24 KR KR1019950026459A patent/KR100377206B1/ko not_active IP Right Cessation
- 1995-08-25 EP EP95401955A patent/EP0698824B1/en not_active Expired - Lifetime
- 1995-08-25 SG SG1995001206A patent/SG48693A1/en unknown
- 1995-08-25 SG SG1998000412A patent/SG67481A1/en unknown
- 1995-08-25 DE DE69519143T patent/DE69519143T2/de not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
EP0698824A3 (en) | 1996-03-06 |
SG48693A1 (en) | 1998-05-18 |
EP0698824A2 (en) | 1996-02-28 |
DE69519143T2 (de) | 2001-04-05 |
DE69519143D1 (de) | 2000-11-23 |
KR100377206B1 (ko) | 2003-06-09 |
SG67481A1 (en) | 1999-09-21 |
EP0698824B1 (en) | 2000-10-18 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
E902 | Notification of reason for refusal | ||
E701 | Decision to grant or registration of patent right | ||
GRNT | Written decision to grant | ||
FPAY | Annual fee payment |
Payment date: 20110302 Year of fee payment: 9 |
|
LAPS | Lapse due to unpaid annual fee |