KR960002523A - 기상성장기구 및 열처리기구에 있어서의 가열장치 - Google Patents
기상성장기구 및 열처리기구에 있어서의 가열장치 Download PDFInfo
- Publication number
- KR960002523A KR960002523A KR1019950000862A KR19950000862A KR960002523A KR 960002523 A KR960002523 A KR 960002523A KR 1019950000862 A KR1019950000862 A KR 1019950000862A KR 19950000862 A KR19950000862 A KR 19950000862A KR 960002523 A KR960002523 A KR 960002523A
- Authority
- KR
- South Korea
- Prior art keywords
- reaction tube
- heat treatment
- heating device
- vapor phase
- phase growth
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0431—Apparatus for thermal treatment
- H10P72/0434—Apparatus for thermal treatment mainly by convection
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/46—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for heating the substrate
Landscapes
- Chemical & Material Sciences (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Furnace Details (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP94-158039 | 1994-06-16 | ||
| JP6158039A JPH088194A (ja) | 1994-06-16 | 1994-06-16 | 気相成長機構および熱処理機構における加熱装置 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR960002523A true KR960002523A (ko) | 1996-01-26 |
Family
ID=15662953
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1019950000862A Ceased KR960002523A (ko) | 1994-06-16 | 1995-01-19 | 기상성장기구 및 열처리기구에 있어서의 가열장치 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US5498292A (enExample) |
| JP (1) | JPH088194A (enExample) |
| KR (1) | KR960002523A (enExample) |
| TW (1) | TW282562B (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20040069449A (ko) * | 2003-01-29 | 2004-08-06 | 삼성전자주식회사 | 화학기상증착을 위한 퍼니스 장치 |
Families Citing this family (41)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6419984B1 (en) * | 1995-08-07 | 2002-07-16 | Taiwan Semiconductor Manufacturing Company | Low pressure chemical vapor deposition with reduced particulate contamination |
| US6111225A (en) * | 1996-02-23 | 2000-08-29 | Tokyo Electron Limited | Wafer processing apparatus with a processing vessel, upper and lower separately sealed heating vessels, and means for maintaining the vessels at predetermined pressures |
| TW506620U (en) * | 1996-03-15 | 2002-10-11 | Asahi Glass Co Ltd | Low pressure CVD apparatus |
| KR100469134B1 (ko) * | 1996-03-18 | 2005-09-02 | 비오이 하이디스 테크놀로지 주식회사 | 유도형플라즈마화학기상증착방법및그를이용하여생성된비정질실리콘박막트랜지스터 |
| US6133550A (en) * | 1996-03-22 | 2000-10-17 | Sandia Corporation | Method and apparatus for thermal processing of semiconductor substrates |
| US5849582A (en) * | 1997-05-01 | 1998-12-15 | Taiwan Semiconductor Manufacturing Company, Ltd. | Baking of photoresist on wafers |
| US6252202B1 (en) | 1998-02-10 | 2001-06-26 | Jeneric/Pentron, Inc. | Furnace for heat treatment of dental materials |
| DE60027686T2 (de) * | 2000-01-24 | 2007-01-11 | Infineon Technologies Ag | Reaktor zur Herstellung einer Halbleiteranordnung |
| JP2002176310A (ja) * | 2000-12-06 | 2002-06-21 | Nippon Antenna Co Ltd | 2共振アンテナ |
| KR20030040119A (ko) * | 2001-11-14 | 2003-05-22 | 아네르바 가부시키가이샤 | 발열체 cvd 장치 및 이것을 이용한 발열체 cvd 방법 |
| US6670071B2 (en) * | 2002-01-15 | 2003-12-30 | Quallion Llc | Electric storage battery construction and method of manufacture |
| US6800172B2 (en) | 2002-02-22 | 2004-10-05 | Micron Technology, Inc. | Interfacial structure for semiconductor substrate processing chambers and substrate transfer chambers and for semiconductor substrate processing chambers and accessory attachments, and semiconductor substrate processor |
| US6814813B2 (en) * | 2002-04-24 | 2004-11-09 | Micron Technology, Inc. | Chemical vapor deposition apparatus |
| US6858264B2 (en) | 2002-04-24 | 2005-02-22 | Micron Technology, Inc. | Chemical vapor deposition methods |
| US6838114B2 (en) | 2002-05-24 | 2005-01-04 | Micron Technology, Inc. | Methods for controlling gas pulsing in processes for depositing materials onto micro-device workpieces |
| US6821347B2 (en) * | 2002-07-08 | 2004-11-23 | Micron Technology, Inc. | Apparatus and method for depositing materials onto microelectronic workpieces |
| AU2003256486A1 (en) * | 2002-07-15 | 2004-02-02 | Aviza Technology, Inc. | System and method for cooling a thermal processing apparatus |
| US6955725B2 (en) * | 2002-08-15 | 2005-10-18 | Micron Technology, Inc. | Reactors with isolated gas connectors and methods for depositing materials onto micro-device workpieces |
| TW589396B (en) * | 2003-01-07 | 2004-06-01 | Arima Optoelectronics Corp | Chemical vapor deposition reactor |
| US6926775B2 (en) * | 2003-02-11 | 2005-08-09 | Micron Technology, Inc. | Reactors with isolated gas connectors and methods for depositing materials onto micro-device workpieces |
| US7335396B2 (en) * | 2003-04-24 | 2008-02-26 | Micron Technology, Inc. | Methods for controlling mass flow rates and pressures in passageways coupled to reaction chambers and systems for depositing material onto microfeature workpieces in reaction chambers |
| JP3802889B2 (ja) * | 2003-07-01 | 2006-07-26 | 東京エレクトロン株式会社 | 熱処理装置及びその校正方法 |
| US7344755B2 (en) * | 2003-08-21 | 2008-03-18 | Micron Technology, Inc. | Methods and apparatus for processing microfeature workpieces; methods for conditioning ALD reaction chambers |
| US7235138B2 (en) * | 2003-08-21 | 2007-06-26 | Micron Technology, Inc. | Microfeature workpiece processing apparatus and methods for batch deposition of materials on microfeature workpieces |
| US7422635B2 (en) * | 2003-08-28 | 2008-09-09 | Micron Technology, Inc. | Methods and apparatus for processing microfeature workpieces, e.g., for depositing materials on microfeature workpieces |
| US7056806B2 (en) * | 2003-09-17 | 2006-06-06 | Micron Technology, Inc. | Microfeature workpiece processing apparatus and methods for controlling deposition of materials on microfeature workpieces |
| US7282239B2 (en) * | 2003-09-18 | 2007-10-16 | Micron Technology, Inc. | Systems and methods for depositing material onto microfeature workpieces in reaction chambers |
| US7323231B2 (en) * | 2003-10-09 | 2008-01-29 | Micron Technology, Inc. | Apparatus and methods for plasma vapor deposition processes |
| US7581511B2 (en) * | 2003-10-10 | 2009-09-01 | Micron Technology, Inc. | Apparatus and methods for manufacturing microfeatures on workpieces using plasma vapor processes |
| US7647886B2 (en) * | 2003-10-15 | 2010-01-19 | Micron Technology, Inc. | Systems for depositing material onto workpieces in reaction chambers and methods for removing byproducts from reaction chambers |
| US7258892B2 (en) * | 2003-12-10 | 2007-08-21 | Micron Technology, Inc. | Methods and systems for controlling temperature during microfeature workpiece processing, e.g., CVD deposition |
| US7906393B2 (en) * | 2004-01-28 | 2011-03-15 | Micron Technology, Inc. | Methods for forming small-scale capacitor structures |
| US7584942B2 (en) * | 2004-03-31 | 2009-09-08 | Micron Technology, Inc. | Ampoules for producing a reaction gas and systems for depositing materials onto microfeature workpieces in reaction chambers |
| US20050249873A1 (en) * | 2004-05-05 | 2005-11-10 | Demetrius Sarigiannis | Apparatuses and methods for producing chemically reactive vapors used in manufacturing microelectronic devices |
| US8133554B2 (en) | 2004-05-06 | 2012-03-13 | Micron Technology, Inc. | Methods for depositing material onto microfeature workpieces in reaction chambers and systems for depositing materials onto microfeature workpieces |
| US7699932B2 (en) * | 2004-06-02 | 2010-04-20 | Micron Technology, Inc. | Reactors, systems and methods for depositing thin films onto microfeature workpieces |
| US20060165873A1 (en) * | 2005-01-25 | 2006-07-27 | Micron Technology, Inc. | Plasma detection and associated systems and methods for controlling microfeature workpiece deposition processes |
| US20060237138A1 (en) * | 2005-04-26 | 2006-10-26 | Micron Technology, Inc. | Apparatuses and methods for supporting microelectronic devices during plasma-based fabrication processes |
| TWI442013B (zh) * | 2011-10-04 | 2014-06-21 | Kern Energy Entpr Co Ltd | 熱處理爐結構 |
| CN106288760A (zh) * | 2015-05-13 | 2017-01-04 | 章小进 | 一种立式加热炉 |
| DE102018204107A1 (de) * | 2018-03-17 | 2019-09-19 | centrotherm international AG | Heizeinheit für Horizontalofen |
Family Cites Families (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB1273499A (en) * | 1970-10-07 | 1972-05-10 | Vnii Elektroter Micheskogo Obo | Electric vacuum furnace |
| JPS6079729A (ja) * | 1983-10-07 | 1985-05-07 | Hitachi Ltd | ウエハ酸化方式 |
| JPS6095917A (ja) * | 1983-10-29 | 1985-05-29 | Gijutsu Joho Kenkyusho:Kk | 熱処理炉 |
| US4496693A (en) * | 1983-12-01 | 1985-01-29 | General Electric Company | Compatibilization of polycarbonate blends |
| JPS6291494A (ja) * | 1985-10-16 | 1987-04-25 | Res Dev Corp Of Japan | 化合物半導体単結晶成長方法及び装置 |
| DE3539981C1 (de) * | 1985-11-11 | 1987-06-11 | Telog Systems Gmbh | Verfahren und Vorrichtung zur Behandlung von Halbleitermaterialien |
| JP2583503B2 (ja) * | 1987-05-08 | 1997-02-19 | 東京エレクトロン東北株式会社 | 熱処理装置 |
| JPH0642474B2 (ja) * | 1988-03-31 | 1994-06-01 | 株式会社東芝 | 半導体製造装置 |
| DE3906075A1 (de) * | 1989-02-27 | 1990-08-30 | Soehlbrand Heinrich Dr Dipl Ch | Verfahren zur thermischen behandlung von halbleitermaterialien und vorrichtung zur durchfuehrung desselben |
| JP2662722B2 (ja) * | 1990-01-12 | 1997-10-15 | 東京エレクトロン株式会社 | バッチ式熱処理装置 |
| JP3230836B2 (ja) * | 1992-04-09 | 2001-11-19 | 東京エレクトロン株式会社 | 熱処理装置 |
| JP3253734B2 (ja) * | 1992-06-19 | 2002-02-04 | 富士通株式会社 | 半導体装置製造用の石英製装置 |
-
1994
- 1994-06-16 JP JP6158039A patent/JPH088194A/ja active Pending
- 1994-12-23 TW TW083112086A patent/TW282562B/zh active
-
1995
- 1995-01-19 KR KR1019950000862A patent/KR960002523A/ko not_active Ceased
- 1995-01-19 US US08/374,828 patent/US5498292A/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20040069449A (ko) * | 2003-01-29 | 2004-08-06 | 삼성전자주식회사 | 화학기상증착을 위한 퍼니스 장치 |
Also Published As
| Publication number | Publication date |
|---|---|
| TW282562B (enExample) | 1996-08-01 |
| US5498292A (en) | 1996-03-12 |
| JPH088194A (ja) | 1996-01-12 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| KR960002523A (ko) | 기상성장기구 및 열처리기구에 있어서의 가열장치 | |
| EP0881675A3 (en) | Semiconductor package lid with internal heat pipe | |
| US4168726A (en) | Thermal boot apparatus | |
| KR920018875A (ko) | 열 처리 장치 | |
| BR0008257B1 (pt) | dispositivo de transporte de pré-formas, comportando meios de preensão aperfeiçoados. | |
| NO913317D0 (no) | Fremgangsmaate ved elektrisk oppvarming av roerledninger. | |
| DE69721004D1 (de) | Wärmebehandlungsvorrichtung | |
| WO2003040513A3 (en) | In situ thermal processing of a hydrocarbon containing formation | |
| NO865295D0 (no) | Fremgangsmaate ved innvendig foring av roerledninger, og hylser for roerledninger som er foret ifoelge fremgangsmaaten. | |
| GB2369989A (en) | Cooking apparatus | |
| KR890010265A (ko) | 열처리 장치 | |
| KR900702069A (ko) | 금속 산화 처리 장치. | |
| EP1329534A3 (en) | Combination CVI/CVD and heat treat susceptor lid | |
| JP2001210649A (ja) | 超高温熱処理装置 | |
| FR2763201B1 (fr) | Dispositif de cuisson avec chauffage par induction et chauffage par resistance ainsi que le procede de fabrication de celui-ci | |
| KR960038218A (ko) | 열전쌍 보호용 튜브 및 그 성형 방법 | |
| AU1273300A (en) | Device for the treatment of fuel in thermal engines | |
| ES2152063T3 (es) | Union por acoplamiento entre un tubo conductor de gas de escape y una brida de fijacion y procedimiento para la realizacion de esta union. | |
| KR960010317A (ko) | 연료 역류방지기구 | |
| KR200208875Y1 (ko) | 전기밥통의 단열 및 보온장치 | |
| US20070113547A1 (en) | Exhaust treatment device with condensate gate | |
| KR910003346A (ko) | 진공가열 처리장치 | |
| JP4434334B2 (ja) | Cvd装置および膜の形成方法 | |
| JPH03285884A (ja) | 炭化硅素治具 | |
| KR890008929A (ko) | 열처리 장치 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PA0109 | Patent application |
St.27 status event code: A-0-1-A10-A12-nap-PA0109 |
|
| R17-X000 | Change to representative recorded |
St.27 status event code: A-3-3-R10-R17-oth-X000 |
|
| PG1501 | Laying open of application |
St.27 status event code: A-1-1-Q10-Q12-nap-PG1501 |
|
| N231 | Notification of change of applicant | ||
| PN2301 | Change of applicant |
St.27 status event code: A-3-3-R10-R13-asn-PN2301 St.27 status event code: A-3-3-R10-R11-asn-PN2301 |
|
| A201 | Request for examination | ||
| P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |
|
| P13-X000 | Application amended |
St.27 status event code: A-2-2-P10-P13-nap-X000 |
|
| PA0201 | Request for examination |
St.27 status event code: A-1-2-D10-D11-exm-PA0201 |
|
| R17-X000 | Change to representative recorded |
St.27 status event code: A-3-3-R10-R17-oth-X000 |
|
| E902 | Notification of reason for refusal | ||
| PE0902 | Notice of grounds for rejection |
St.27 status event code: A-1-2-D10-D21-exm-PE0902 |
|
| T11-X000 | Administrative time limit extension requested |
St.27 status event code: U-3-3-T10-T11-oth-X000 |
|
| T11-X000 | Administrative time limit extension requested |
St.27 status event code: U-3-3-T10-T11-oth-X000 |
|
| T11-X000 | Administrative time limit extension requested |
St.27 status event code: U-3-3-T10-T11-oth-X000 |
|
| T11-X000 | Administrative time limit extension requested |
St.27 status event code: U-3-3-T10-T11-oth-X000 |
|
| T11-X000 | Administrative time limit extension requested |
St.27 status event code: U-3-3-T10-T11-oth-X000 |
|
| T11-X000 | Administrative time limit extension requested |
St.27 status event code: U-3-3-T10-T11-oth-X000 |
|
| T11-X000 | Administrative time limit extension requested |
St.27 status event code: U-3-3-T10-T11-oth-X000 |
|
| E601 | Decision to refuse application | ||
| PE0601 | Decision on rejection of patent |
St.27 status event code: N-2-6-B10-B15-exm-PE0601 |
|
| P22-X000 | Classification modified |
St.27 status event code: A-2-2-P10-P22-nap-X000 |
|
| P22-X000 | Classification modified |
St.27 status event code: A-2-2-P10-P22-nap-X000 |