KR960002523A - 기상성장기구 및 열처리기구에 있어서의 가열장치 - Google Patents

기상성장기구 및 열처리기구에 있어서의 가열장치 Download PDF

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Publication number
KR960002523A
KR960002523A KR1019950000862A KR19950000862A KR960002523A KR 960002523 A KR960002523 A KR 960002523A KR 1019950000862 A KR1019950000862 A KR 1019950000862A KR 19950000862 A KR19950000862 A KR 19950000862A KR 960002523 A KR960002523 A KR 960002523A
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KR
South Korea
Prior art keywords
reaction tube
heat treatment
heating device
vapor phase
phase growth
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KR1019950000862A
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English (en)
Inventor
야스시 오자끼
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기시모또 요시노리
기시모또산교 가부시끼가이샤
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Application filed by 기시모또 요시노리, 기시모또산교 가부시끼가이샤 filed Critical 기시모또 요시노리
Publication of KR960002523A publication Critical patent/KR960002523A/ko

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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/20Deposition of semiconductor materials on a substrate, e.g. epitaxial growth solid phase epitaxy
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67098Apparatus for thermal treatment
    • H01L21/67109Apparatus for thermal treatment mainly by convection
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/46Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for heating the substrate

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  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Computer Hardware Design (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Manufacturing & Machinery (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Chemical & Material Sciences (AREA)
  • Mechanical Engineering (AREA)
  • Materials Engineering (AREA)
  • Furnace Details (AREA)

Abstract

[목적] 통형체인 가열로에 있어서, 가장 방열율이 높은 단부의 개구부를 보조가열체로 폐쇄하고, 노내에 있어서 종전 형서하고 있었던 보조가열영역의 설치기구를 배제하고, 유효용적의 전부를 균열영역으로 하고, 이 균열영역의 용적에 준하여 피가공처리재량을 상승시키는 것, 열의 절약, 또, 장치전체의 용적의 소형화 등을 목적으로 한다.
[구성] 기상성장, 열확산 또는 열처리를 행하려 하는 피가공처리재(5)의 복수를 설정한 자세를 유지 정착한 지지체(6)를 내장할 수 있는 석영 혹은 상화규소 등으로 이루어지는 반응관(1)의 외주에, 이 반응관(1)의 전 길이를 원통형의 가열장치(4)에 의해 피복형성하는 장치로서, 이 가열장치(4)의 전후 양단에 있어서의 개구부를 보조가열체(4a)를 가지고 폐쇄하고, 내재시킨 반응관(1)을 포설하여 이루어지는 것이다.

Description

기상성장기구 및 열처리기구에 있어서의 가열장치
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제1도는 본 발명의 장치의 전체 단면도.

Claims (4)

  1. 가상성장, 열확산 또는 열처리를 행하려 하는 피가공처리재(5)의 복수를 설정한 자세를 유지정착한 지지체(6)를 내장할 수 있는 석영 혹은 탄화규소 등으로 이루어지는 반응관(1)의 외주에, 이 반응관(1)의 전 길이를 원통형의 가열장치(4)에 의해 피복형성하는 장치로서, 이 가열장치(4)의 전후 양단에 있어서의 개구부를 보조가열체(4a)를 가지고 폐쇄하고, 내재시킨 반응관(1)을 포설(包說)하여 이루어지는 것을 특징으로 하는 기상성장기구 및 열처리기구에 있어서의 가열장치.
  2. 제1항에 있어서, 반응관(1)의 전 길이를 피복형성하는 원통형의 가열장치(4)의 일단부로부터 돌출시킨 상기 반응관(1)에 연결되는 배기관(7)을 삽입관통시키는 도관삽입공(4al)을 뚫어 설치한 보조가열체(4a)를 가지고, 상기 배기도관(7)을 관통시키고, 또, 가열장치(4)의 개구부를 폐쇄하도록 접속하여 이루어지는 것을 특징으로 하는 기상성장기구 및 열처리기구에 있어서의 가열장치.
  3. 제1항에 있어서, 반응관(1)의 외주에, 이 반응관(1)의 전 길이를 가열장치(4)로 피복형성하는 장치로서, 상기 반응관(1)의 후단에, 피가공처리재(5)의 복수를 정착한 지지체(6)를 반입, 반출시키는 반송구(1c)를 개설하고, 이 반송구(1c)를 개폐하는 개폐문체(6)의 외측면에 보조가열체(4a)를 장착하여 이루어지는 것을 특징으로 하는 기상성장기구 및 열처리기구에 있어서의 가열장치.
  4. 제1항에 있어서, 반응관(1)의 일단에, 개폐한 반송구(1c)의 둘레 에지에 접속할 수 있는 플런지(8b)를 외주에 형성한 개폐문체(8)의 주부를 상기 반응관(1)의 반송구(1c)로부터 내방으로 삽입할 수 있는 함몰부(8c)를 요설(凹說)하고, 이 함몰부(8c)의 오목부에 보조가열체(4a)를 정착설치하여 이루어지는 것을 특징으로 하는 기상성장기구 및 열처리기구에 있어서의 가열장치.
    ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
KR1019950000862A 1994-06-16 1995-01-19 기상성장기구 및 열처리기구에 있어서의 가열장치 KR960002523A (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP94-158039 1994-06-16
JP6158039A JPH088194A (ja) 1994-06-16 1994-06-16 気相成長機構および熱処理機構における加熱装置

Publications (1)

Publication Number Publication Date
KR960002523A true KR960002523A (ko) 1996-01-26

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US (1) US5498292A (ko)
JP (1) JPH088194A (ko)
KR (1) KR960002523A (ko)
TW (1) TW282562B (ko)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20040069449A (ko) * 2003-01-29 2004-08-06 삼성전자주식회사 화학기상증착을 위한 퍼니스 장치

Families Citing this family (41)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6419984B1 (en) * 1995-08-07 2002-07-16 Taiwan Semiconductor Manufacturing Company Low pressure chemical vapor deposition with reduced particulate contamination
KR100443415B1 (ko) * 1996-02-23 2004-11-03 동경 엘렉트론 주식회사 열처리장치
TW506620U (en) * 1996-03-15 2002-10-11 Asahi Glass Co Ltd Low pressure CVD apparatus
GB2311298B (en) * 1996-03-18 1999-09-29 Hyundai Electronics Ind Inductively coupled plasma chemical vapor deposition apparatus
US6133550A (en) * 1996-03-22 2000-10-17 Sandia Corporation Method and apparatus for thermal processing of semiconductor substrates
US5849582A (en) * 1997-05-01 1998-12-15 Taiwan Semiconductor Manufacturing Company, Ltd. Baking of photoresist on wafers
US6252202B1 (en) 1998-02-10 2001-06-26 Jeneric/Pentron, Inc. Furnace for heat treatment of dental materials
EP1120813B1 (en) 2000-01-24 2006-05-03 Infineon Technologies SC300 GmbH & Co. KG Reactor for manufacturing of a semiconductor device
JP2002176310A (ja) * 2000-12-06 2002-06-21 Nippon Antenna Co Ltd 2共振アンテナ
TWI245329B (en) * 2001-11-14 2005-12-11 Anelva Corp Heating element CVD device and heating element CVD method using the same
US6670071B2 (en) * 2002-01-15 2003-12-30 Quallion Llc Electric storage battery construction and method of manufacture
US6800172B2 (en) 2002-02-22 2004-10-05 Micron Technology, Inc. Interfacial structure for semiconductor substrate processing chambers and substrate transfer chambers and for semiconductor substrate processing chambers and accessory attachments, and semiconductor substrate processor
US6814813B2 (en) * 2002-04-24 2004-11-09 Micron Technology, Inc. Chemical vapor deposition apparatus
US6858264B2 (en) 2002-04-24 2005-02-22 Micron Technology, Inc. Chemical vapor deposition methods
US6838114B2 (en) 2002-05-24 2005-01-04 Micron Technology, Inc. Methods for controlling gas pulsing in processes for depositing materials onto micro-device workpieces
US6821347B2 (en) * 2002-07-08 2004-11-23 Micron Technology, Inc. Apparatus and method for depositing materials onto microelectronic workpieces
AU2003256487A1 (en) * 2002-07-15 2004-02-02 Aviza Technology, Inc. Variable heater element for low to high temperature ranges
US6955725B2 (en) * 2002-08-15 2005-10-18 Micron Technology, Inc. Reactors with isolated gas connectors and methods for depositing materials onto micro-device workpieces
TW589396B (en) * 2003-01-07 2004-06-01 Arima Optoelectronics Corp Chemical vapor deposition reactor
US6926775B2 (en) * 2003-02-11 2005-08-09 Micron Technology, Inc. Reactors with isolated gas connectors and methods for depositing materials onto micro-device workpieces
US7335396B2 (en) * 2003-04-24 2008-02-26 Micron Technology, Inc. Methods for controlling mass flow rates and pressures in passageways coupled to reaction chambers and systems for depositing material onto microfeature workpieces in reaction chambers
JP3802889B2 (ja) * 2003-07-01 2006-07-26 東京エレクトロン株式会社 熱処理装置及びその校正方法
US7344755B2 (en) * 2003-08-21 2008-03-18 Micron Technology, Inc. Methods and apparatus for processing microfeature workpieces; methods for conditioning ALD reaction chambers
US7235138B2 (en) * 2003-08-21 2007-06-26 Micron Technology, Inc. Microfeature workpiece processing apparatus and methods for batch deposition of materials on microfeature workpieces
US7422635B2 (en) * 2003-08-28 2008-09-09 Micron Technology, Inc. Methods and apparatus for processing microfeature workpieces, e.g., for depositing materials on microfeature workpieces
US7056806B2 (en) 2003-09-17 2006-06-06 Micron Technology, Inc. Microfeature workpiece processing apparatus and methods for controlling deposition of materials on microfeature workpieces
US7282239B2 (en) * 2003-09-18 2007-10-16 Micron Technology, Inc. Systems and methods for depositing material onto microfeature workpieces in reaction chambers
US7323231B2 (en) * 2003-10-09 2008-01-29 Micron Technology, Inc. Apparatus and methods for plasma vapor deposition processes
US7581511B2 (en) * 2003-10-10 2009-09-01 Micron Technology, Inc. Apparatus and methods for manufacturing microfeatures on workpieces using plasma vapor processes
US7647886B2 (en) * 2003-10-15 2010-01-19 Micron Technology, Inc. Systems for depositing material onto workpieces in reaction chambers and methods for removing byproducts from reaction chambers
US7258892B2 (en) * 2003-12-10 2007-08-21 Micron Technology, Inc. Methods and systems for controlling temperature during microfeature workpiece processing, e.g., CVD deposition
US7906393B2 (en) * 2004-01-28 2011-03-15 Micron Technology, Inc. Methods for forming small-scale capacitor structures
US7584942B2 (en) * 2004-03-31 2009-09-08 Micron Technology, Inc. Ampoules for producing a reaction gas and systems for depositing materials onto microfeature workpieces in reaction chambers
US20050249873A1 (en) * 2004-05-05 2005-11-10 Demetrius Sarigiannis Apparatuses and methods for producing chemically reactive vapors used in manufacturing microelectronic devices
US8133554B2 (en) * 2004-05-06 2012-03-13 Micron Technology, Inc. Methods for depositing material onto microfeature workpieces in reaction chambers and systems for depositing materials onto microfeature workpieces
US7699932B2 (en) * 2004-06-02 2010-04-20 Micron Technology, Inc. Reactors, systems and methods for depositing thin films onto microfeature workpieces
US20060165873A1 (en) * 2005-01-25 2006-07-27 Micron Technology, Inc. Plasma detection and associated systems and methods for controlling microfeature workpiece deposition processes
US20060237138A1 (en) * 2005-04-26 2006-10-26 Micron Technology, Inc. Apparatuses and methods for supporting microelectronic devices during plasma-based fabrication processes
TWI442013B (zh) * 2011-10-04 2014-06-21 Kern Energy Entpr Co Ltd 熱處理爐結構
CN106288760A (zh) * 2015-05-13 2017-01-04 章小进 一种立式加热炉
DE102018204107A1 (de) * 2018-03-17 2019-09-19 centrotherm international AG Heizeinheit für Horizontalofen

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1273499A (en) * 1970-10-07 1972-05-10 Vnii Elektroter Micheskogo Obo Electric vacuum furnace
JPS6079729A (ja) * 1983-10-07 1985-05-07 Hitachi Ltd ウエハ酸化方式
JPS6095917A (ja) * 1983-10-29 1985-05-29 Gijutsu Joho Kenkyusho:Kk 熱処理炉
US4496693A (en) * 1983-12-01 1985-01-29 General Electric Company Compatibilization of polycarbonate blends
JPS6291494A (ja) * 1985-10-16 1987-04-25 Res Dev Corp Of Japan 化合物半導体単結晶成長方法及び装置
DE3539981C1 (de) * 1985-11-11 1987-06-11 Telog Systems Gmbh Verfahren und Vorrichtung zur Behandlung von Halbleitermaterialien
JP2583503B2 (ja) * 1987-05-08 1997-02-19 東京エレクトロン東北株式会社 熱処理装置
JPH0642474B2 (ja) * 1988-03-31 1994-06-01 株式会社東芝 半導体製造装置
DE3906075A1 (de) * 1989-02-27 1990-08-30 Soehlbrand Heinrich Dr Dipl Ch Verfahren zur thermischen behandlung von halbleitermaterialien und vorrichtung zur durchfuehrung desselben
JP2662722B2 (ja) * 1990-01-12 1997-10-15 東京エレクトロン株式会社 バッチ式熱処理装置
JP3230836B2 (ja) * 1992-04-09 2001-11-19 東京エレクトロン株式会社 熱処理装置
JP3253734B2 (ja) * 1992-06-19 2002-02-04 富士通株式会社 半導体装置製造用の石英製装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20040069449A (ko) * 2003-01-29 2004-08-06 삼성전자주식회사 화학기상증착을 위한 퍼니스 장치

Also Published As

Publication number Publication date
TW282562B (ko) 1996-08-01
JPH088194A (ja) 1996-01-12
US5498292A (en) 1996-03-12

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