KR960002523A - 기상성장기구 및 열처리기구에 있어서의 가열장치 - Google Patents
기상성장기구 및 열처리기구에 있어서의 가열장치 Download PDFInfo
- Publication number
- KR960002523A KR960002523A KR1019950000862A KR19950000862A KR960002523A KR 960002523 A KR960002523 A KR 960002523A KR 1019950000862 A KR1019950000862 A KR 1019950000862A KR 19950000862 A KR19950000862 A KR 19950000862A KR 960002523 A KR960002523 A KR 960002523A
- Authority
- KR
- South Korea
- Prior art keywords
- reaction tube
- heat treatment
- heating device
- vapor phase
- phase growth
- Prior art date
Links
- 238000010438 heat treatment Methods 0.000 title claims abstract 27
- 238000001947 vapour-phase growth Methods 0.000 title claims abstract 6
- 238000009792 diffusion process Methods 0.000 claims abstract 2
- 239000010453 quartz Substances 0.000 claims abstract 2
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 claims abstract 2
- 229910010271 silicon carbide Inorganic materials 0.000 claims abstract 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims abstract 2
- 235000002918 Fraxinus excelsior Nutrition 0.000 claims 1
- 239000002956 ash Substances 0.000 claims 1
- 238000005553 drilling Methods 0.000 claims 1
- 238000003780 insertion Methods 0.000 claims 1
- 230000037431 insertion Effects 0.000 claims 1
- 238000000034 method Methods 0.000 claims 1
- 230000017525 heat dissipation Effects 0.000 abstract 1
- 238000009434 installation Methods 0.000 abstract 1
- 239000000463 material Substances 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/20—Deposition of semiconductor materials on a substrate, e.g. epitaxial growth solid phase epitaxy
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67098—Apparatus for thermal treatment
- H01L21/67109—Apparatus for thermal treatment mainly by convection
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/46—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for heating the substrate
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Computer Hardware Design (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Manufacturing & Machinery (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Mechanical Engineering (AREA)
- Materials Engineering (AREA)
- Furnace Details (AREA)
Abstract
[목적] 통형체인 가열로에 있어서, 가장 방열율이 높은 단부의 개구부를 보조가열체로 폐쇄하고, 노내에 있어서 종전 형서하고 있었던 보조가열영역의 설치기구를 배제하고, 유효용적의 전부를 균열영역으로 하고, 이 균열영역의 용적에 준하여 피가공처리재량을 상승시키는 것, 열의 절약, 또, 장치전체의 용적의 소형화 등을 목적으로 한다.
[구성] 기상성장, 열확산 또는 열처리를 행하려 하는 피가공처리재(5)의 복수를 설정한 자세를 유지 정착한 지지체(6)를 내장할 수 있는 석영 혹은 상화규소 등으로 이루어지는 반응관(1)의 외주에, 이 반응관(1)의 전 길이를 원통형의 가열장치(4)에 의해 피복형성하는 장치로서, 이 가열장치(4)의 전후 양단에 있어서의 개구부를 보조가열체(4a)를 가지고 폐쇄하고, 내재시킨 반응관(1)을 포설하여 이루어지는 것이다.
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제1도는 본 발명의 장치의 전체 단면도.
Claims (4)
- 가상성장, 열확산 또는 열처리를 행하려 하는 피가공처리재(5)의 복수를 설정한 자세를 유지정착한 지지체(6)를 내장할 수 있는 석영 혹은 탄화규소 등으로 이루어지는 반응관(1)의 외주에, 이 반응관(1)의 전 길이를 원통형의 가열장치(4)에 의해 피복형성하는 장치로서, 이 가열장치(4)의 전후 양단에 있어서의 개구부를 보조가열체(4a)를 가지고 폐쇄하고, 내재시킨 반응관(1)을 포설(包說)하여 이루어지는 것을 특징으로 하는 기상성장기구 및 열처리기구에 있어서의 가열장치.
- 제1항에 있어서, 반응관(1)의 전 길이를 피복형성하는 원통형의 가열장치(4)의 일단부로부터 돌출시킨 상기 반응관(1)에 연결되는 배기관(7)을 삽입관통시키는 도관삽입공(4al)을 뚫어 설치한 보조가열체(4a)를 가지고, 상기 배기도관(7)을 관통시키고, 또, 가열장치(4)의 개구부를 폐쇄하도록 접속하여 이루어지는 것을 특징으로 하는 기상성장기구 및 열처리기구에 있어서의 가열장치.
- 제1항에 있어서, 반응관(1)의 외주에, 이 반응관(1)의 전 길이를 가열장치(4)로 피복형성하는 장치로서, 상기 반응관(1)의 후단에, 피가공처리재(5)의 복수를 정착한 지지체(6)를 반입, 반출시키는 반송구(1c)를 개설하고, 이 반송구(1c)를 개폐하는 개폐문체(6)의 외측면에 보조가열체(4a)를 장착하여 이루어지는 것을 특징으로 하는 기상성장기구 및 열처리기구에 있어서의 가열장치.
- 제1항에 있어서, 반응관(1)의 일단에, 개폐한 반송구(1c)의 둘레 에지에 접속할 수 있는 플런지(8b)를 외주에 형성한 개폐문체(8)의 주부를 상기 반응관(1)의 반송구(1c)로부터 내방으로 삽입할 수 있는 함몰부(8c)를 요설(凹說)하고, 이 함몰부(8c)의 오목부에 보조가열체(4a)를 정착설치하여 이루어지는 것을 특징으로 하는 기상성장기구 및 열처리기구에 있어서의 가열장치.※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP94-158039 | 1994-06-16 | ||
JP6158039A JPH088194A (ja) | 1994-06-16 | 1994-06-16 | 気相成長機構および熱処理機構における加熱装置 |
Publications (1)
Publication Number | Publication Date |
---|---|
KR960002523A true KR960002523A (ko) | 1996-01-26 |
Family
ID=15662953
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019950000862A KR960002523A (ko) | 1994-06-16 | 1995-01-19 | 기상성장기구 및 열처리기구에 있어서의 가열장치 |
Country Status (4)
Country | Link |
---|---|
US (1) | US5498292A (ko) |
JP (1) | JPH088194A (ko) |
KR (1) | KR960002523A (ko) |
TW (1) | TW282562B (ko) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20040069449A (ko) * | 2003-01-29 | 2004-08-06 | 삼성전자주식회사 | 화학기상증착을 위한 퍼니스 장치 |
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KR100443415B1 (ko) * | 1996-02-23 | 2004-11-03 | 동경 엘렉트론 주식회사 | 열처리장치 |
TW506620U (en) * | 1996-03-15 | 2002-10-11 | Asahi Glass Co Ltd | Low pressure CVD apparatus |
GB2311298B (en) * | 1996-03-18 | 1999-09-29 | Hyundai Electronics Ind | Inductively coupled plasma chemical vapor deposition apparatus |
US6133550A (en) * | 1996-03-22 | 2000-10-17 | Sandia Corporation | Method and apparatus for thermal processing of semiconductor substrates |
US5849582A (en) * | 1997-05-01 | 1998-12-15 | Taiwan Semiconductor Manufacturing Company, Ltd. | Baking of photoresist on wafers |
US6252202B1 (en) | 1998-02-10 | 2001-06-26 | Jeneric/Pentron, Inc. | Furnace for heat treatment of dental materials |
EP1120813B1 (en) | 2000-01-24 | 2006-05-03 | Infineon Technologies SC300 GmbH & Co. KG | Reactor for manufacturing of a semiconductor device |
JP2002176310A (ja) * | 2000-12-06 | 2002-06-21 | Nippon Antenna Co Ltd | 2共振アンテナ |
TWI245329B (en) * | 2001-11-14 | 2005-12-11 | Anelva Corp | Heating element CVD device and heating element CVD method using the same |
US6670071B2 (en) * | 2002-01-15 | 2003-12-30 | Quallion Llc | Electric storage battery construction and method of manufacture |
US6800172B2 (en) | 2002-02-22 | 2004-10-05 | Micron Technology, Inc. | Interfacial structure for semiconductor substrate processing chambers and substrate transfer chambers and for semiconductor substrate processing chambers and accessory attachments, and semiconductor substrate processor |
US6814813B2 (en) * | 2002-04-24 | 2004-11-09 | Micron Technology, Inc. | Chemical vapor deposition apparatus |
US6858264B2 (en) | 2002-04-24 | 2005-02-22 | Micron Technology, Inc. | Chemical vapor deposition methods |
US6838114B2 (en) | 2002-05-24 | 2005-01-04 | Micron Technology, Inc. | Methods for controlling gas pulsing in processes for depositing materials onto micro-device workpieces |
US6821347B2 (en) * | 2002-07-08 | 2004-11-23 | Micron Technology, Inc. | Apparatus and method for depositing materials onto microelectronic workpieces |
AU2003256487A1 (en) * | 2002-07-15 | 2004-02-02 | Aviza Technology, Inc. | Variable heater element for low to high temperature ranges |
US6955725B2 (en) * | 2002-08-15 | 2005-10-18 | Micron Technology, Inc. | Reactors with isolated gas connectors and methods for depositing materials onto micro-device workpieces |
TW589396B (en) * | 2003-01-07 | 2004-06-01 | Arima Optoelectronics Corp | Chemical vapor deposition reactor |
US6926775B2 (en) * | 2003-02-11 | 2005-08-09 | Micron Technology, Inc. | Reactors with isolated gas connectors and methods for depositing materials onto micro-device workpieces |
US7335396B2 (en) * | 2003-04-24 | 2008-02-26 | Micron Technology, Inc. | Methods for controlling mass flow rates and pressures in passageways coupled to reaction chambers and systems for depositing material onto microfeature workpieces in reaction chambers |
JP3802889B2 (ja) * | 2003-07-01 | 2006-07-26 | 東京エレクトロン株式会社 | 熱処理装置及びその校正方法 |
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US7235138B2 (en) * | 2003-08-21 | 2007-06-26 | Micron Technology, Inc. | Microfeature workpiece processing apparatus and methods for batch deposition of materials on microfeature workpieces |
US7422635B2 (en) * | 2003-08-28 | 2008-09-09 | Micron Technology, Inc. | Methods and apparatus for processing microfeature workpieces, e.g., for depositing materials on microfeature workpieces |
US7056806B2 (en) | 2003-09-17 | 2006-06-06 | Micron Technology, Inc. | Microfeature workpiece processing apparatus and methods for controlling deposition of materials on microfeature workpieces |
US7282239B2 (en) * | 2003-09-18 | 2007-10-16 | Micron Technology, Inc. | Systems and methods for depositing material onto microfeature workpieces in reaction chambers |
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US7581511B2 (en) * | 2003-10-10 | 2009-09-01 | Micron Technology, Inc. | Apparatus and methods for manufacturing microfeatures on workpieces using plasma vapor processes |
US7647886B2 (en) * | 2003-10-15 | 2010-01-19 | Micron Technology, Inc. | Systems for depositing material onto workpieces in reaction chambers and methods for removing byproducts from reaction chambers |
US7258892B2 (en) * | 2003-12-10 | 2007-08-21 | Micron Technology, Inc. | Methods and systems for controlling temperature during microfeature workpiece processing, e.g., CVD deposition |
US7906393B2 (en) * | 2004-01-28 | 2011-03-15 | Micron Technology, Inc. | Methods for forming small-scale capacitor structures |
US7584942B2 (en) * | 2004-03-31 | 2009-09-08 | Micron Technology, Inc. | Ampoules for producing a reaction gas and systems for depositing materials onto microfeature workpieces in reaction chambers |
US20050249873A1 (en) * | 2004-05-05 | 2005-11-10 | Demetrius Sarigiannis | Apparatuses and methods for producing chemically reactive vapors used in manufacturing microelectronic devices |
US8133554B2 (en) * | 2004-05-06 | 2012-03-13 | Micron Technology, Inc. | Methods for depositing material onto microfeature workpieces in reaction chambers and systems for depositing materials onto microfeature workpieces |
US7699932B2 (en) * | 2004-06-02 | 2010-04-20 | Micron Technology, Inc. | Reactors, systems and methods for depositing thin films onto microfeature workpieces |
US20060165873A1 (en) * | 2005-01-25 | 2006-07-27 | Micron Technology, Inc. | Plasma detection and associated systems and methods for controlling microfeature workpiece deposition processes |
US20060237138A1 (en) * | 2005-04-26 | 2006-10-26 | Micron Technology, Inc. | Apparatuses and methods for supporting microelectronic devices during plasma-based fabrication processes |
TWI442013B (zh) * | 2011-10-04 | 2014-06-21 | Kern Energy Entpr Co Ltd | 熱處理爐結構 |
CN106288760A (zh) * | 2015-05-13 | 2017-01-04 | 章小进 | 一种立式加热炉 |
DE102018204107A1 (de) * | 2018-03-17 | 2019-09-19 | centrotherm international AG | Heizeinheit für Horizontalofen |
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GB1273499A (en) * | 1970-10-07 | 1972-05-10 | Vnii Elektroter Micheskogo Obo | Electric vacuum furnace |
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DE3906075A1 (de) * | 1989-02-27 | 1990-08-30 | Soehlbrand Heinrich Dr Dipl Ch | Verfahren zur thermischen behandlung von halbleitermaterialien und vorrichtung zur durchfuehrung desselben |
JP2662722B2 (ja) * | 1990-01-12 | 1997-10-15 | 東京エレクトロン株式会社 | バッチ式熱処理装置 |
JP3230836B2 (ja) * | 1992-04-09 | 2001-11-19 | 東京エレクトロン株式会社 | 熱処理装置 |
JP3253734B2 (ja) * | 1992-06-19 | 2002-02-04 | 富士通株式会社 | 半導体装置製造用の石英製装置 |
-
1994
- 1994-06-16 JP JP6158039A patent/JPH088194A/ja active Pending
- 1994-12-23 TW TW083112086A patent/TW282562B/zh active
-
1995
- 1995-01-19 KR KR1019950000862A patent/KR960002523A/ko not_active Application Discontinuation
- 1995-01-19 US US08/374,828 patent/US5498292A/en not_active Expired - Fee Related
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20040069449A (ko) * | 2003-01-29 | 2004-08-06 | 삼성전자주식회사 | 화학기상증착을 위한 퍼니스 장치 |
Also Published As
Publication number | Publication date |
---|---|
TW282562B (ko) | 1996-08-01 |
JPH088194A (ja) | 1996-01-12 |
US5498292A (en) | 1996-03-12 |
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