KR950034017U - 초고주파 회로용 회로기판 시험장치 - Google Patents

초고주파 회로용 회로기판 시험장치

Info

Publication number
KR950034017U
KR950034017U KR2019940010971U KR19940010971U KR950034017U KR 950034017 U KR950034017 U KR 950034017U KR 2019940010971 U KR2019940010971 U KR 2019940010971U KR 19940010971 U KR19940010971 U KR 19940010971U KR 950034017 U KR950034017 U KR 950034017U
Authority
KR
South Korea
Prior art keywords
high frequency
test device
ultra high
board test
circuit board
Prior art date
Application number
KR2019940010971U
Other languages
English (en)
Other versions
KR960006912Y1 (ko
Inventor
정기혁
Original Assignee
대우전자 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 대우전자 주식회사 filed Critical 대우전자 주식회사
Priority to KR2019940010971U priority Critical patent/KR960006912Y1/ko
Publication of KR950034017U publication Critical patent/KR950034017U/ko
Application granted granted Critical
Publication of KR960006912Y1 publication Critical patent/KR960006912Y1/ko

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2822—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Tests Of Electronic Circuits (AREA)
KR2019940010971U 1994-05-17 1994-05-17 초고주파 회로용 회로기판 시험장치 KR960006912Y1 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019940010971U KR960006912Y1 (ko) 1994-05-17 1994-05-17 초고주파 회로용 회로기판 시험장치

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019940010971U KR960006912Y1 (ko) 1994-05-17 1994-05-17 초고주파 회로용 회로기판 시험장치

Publications (2)

Publication Number Publication Date
KR950034017U true KR950034017U (ko) 1995-12-18
KR960006912Y1 KR960006912Y1 (ko) 1996-08-12

Family

ID=19383420

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019940010971U KR960006912Y1 (ko) 1994-05-17 1994-05-17 초고주파 회로용 회로기판 시험장치

Country Status (1)

Country Link
KR (1) KR960006912Y1 (ko)

Also Published As

Publication number Publication date
KR960006912Y1 (ko) 1996-08-12

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