KR930015335U - 기억 소자의 순간 전류 측정 회로 - Google Patents
기억 소자의 순간 전류 측정 회로Info
- Publication number
- KR930015335U KR930015335U KR2019910023422U KR910023422U KR930015335U KR 930015335 U KR930015335 U KR 930015335U KR 2019910023422 U KR2019910023422 U KR 2019910023422U KR 910023422 U KR910023422 U KR 910023422U KR 930015335 U KR930015335 U KR 930015335U
- Authority
- KR
- South Korea
- Prior art keywords
- memory element
- current measurement
- measurement circuit
- instantaneous current
- instantaneous
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
- G01R31/31924—Voltage or current aspects, e.g. driver, receiver
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
- G01R19/16566—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533
- G01R19/16571—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533 comparing AC or DC current with one threshold, e.g. load current, over-current, surge current or fault current
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Power Engineering (AREA)
- General Engineering & Computer Science (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR2019910023422U KR0110481Y1 (ko) | 1991-12-23 | 1991-12-23 | 기억 소자의 순간 전류 측정 회로 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR2019910023422U KR0110481Y1 (ko) | 1991-12-23 | 1991-12-23 | 기억 소자의 순간 전류 측정 회로 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR930015335U true KR930015335U (ko) | 1993-07-28 |
KR0110481Y1 KR0110481Y1 (ko) | 1998-10-01 |
Family
ID=19325182
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR2019910023422U KR0110481Y1 (ko) | 1991-12-23 | 1991-12-23 | 기억 소자의 순간 전류 측정 회로 |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR0110481Y1 (ko) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20030059527A (ko) * | 2001-12-29 | 2003-07-10 | 한국 고덴시 주식회사 | 다이오드의 사이리스트 현상 검출 시스템 |
-
1991
- 1991-12-23 KR KR2019910023422U patent/KR0110481Y1/ko not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
KR0110481Y1 (ko) | 1998-10-01 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
E701 | Decision to grant or registration of patent right | ||
REGI | Registration of establishment | ||
FPAY | Annual fee payment |
Payment date: 20060818 Year of fee payment: 10 |
|
EXPY | Expiration of term |