KR920001169U - 미세전류 측정회로 - Google Patents

미세전류 측정회로

Info

Publication number
KR920001169U
KR920001169U KR2019900008206U KR900008206U KR920001169U KR 920001169 U KR920001169 U KR 920001169U KR 2019900008206 U KR2019900008206 U KR 2019900008206U KR 900008206 U KR900008206 U KR 900008206U KR 920001169 U KR920001169 U KR 920001169U
Authority
KR
South Korea
Prior art keywords
current measurement
measurement circuit
micro current
micro
circuit
Prior art date
Application number
KR2019900008206U
Other languages
English (en)
Other versions
KR930002777Y1 (ko
Inventor
이훈규
Original Assignee
금성일렉트론 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 금성일렉트론 주식회사 filed Critical 금성일렉트론 주식회사
Priority to KR2019900008206U priority Critical patent/KR930002777Y1/ko
Publication of KR920001169U publication Critical patent/KR920001169U/ko
Application granted granted Critical
Publication of KR930002777Y1 publication Critical patent/KR930002777Y1/ko

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
    • G01R19/16566—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533
    • G01R19/16571—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533 comparing AC or DC current with one threshold, e.g. load current, over-current, surge current or fault current
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318577—AC testing, e.g. current testing, burn-in

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
KR2019900008206U 1990-06-11 1990-06-11 미세전류 측정회로 KR930002777Y1 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019900008206U KR930002777Y1 (ko) 1990-06-11 1990-06-11 미세전류 측정회로

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019900008206U KR930002777Y1 (ko) 1990-06-11 1990-06-11 미세전류 측정회로

Publications (2)

Publication Number Publication Date
KR920001169U true KR920001169U (ko) 1992-01-28
KR930002777Y1 KR930002777Y1 (ko) 1993-05-21

Family

ID=19299774

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019900008206U KR930002777Y1 (ko) 1990-06-11 1990-06-11 미세전류 측정회로

Country Status (1)

Country Link
KR (1) KR930002777Y1 (ko)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101064707B1 (ko) * 2008-11-07 2011-09-14 한국전자통신연구원 배터리 전원 시스템의 전류 측정 장치 및 방법

Also Published As

Publication number Publication date
KR930002777Y1 (ko) 1993-05-21

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