KR920704155A - X선 영상 시스템과 그것을 위한 고상 감지기 - Google Patents

X선 영상 시스템과 그것을 위한 고상 감지기

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KR920704155A
KR920704155A KR1019920701620A KR920701620A KR920704155A KR 920704155 A KR920704155 A KR 920704155A KR 1019920701620 A KR1019920701620 A KR 1019920701620A KR 920701620 A KR920701620 A KR 920701620A KR 920704155 A KR920704155 A KR 920704155A
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scintillator
sense
support
rays
cells
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KR1019920701620A
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존 디. 콕스
알람 엠 제이콥스
스테펜 에이 스코트
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원본미기재
제네랄 이매징 코포레이션
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Publication of KR920704155A publication Critical patent/KR920704155A/ko

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • G01T1/2914—Measurement of spatial distribution of radiation
    • G01T1/2921—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras
    • G01T1/2928—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras using solid state detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations
    • G01T1/20181—Stacked detectors, e.g. for measuring energy and positional information
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations
    • G01T1/20188—Auxiliary details, e.g. casings or cooling
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/245—Measuring radiation intensity with semiconductor detectors using memory cells
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14601—Structural or functional details thereof
    • H01L27/14609—Pixel-elements with integrated switching, control, storage or amplification elements
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14601—Structural or functional details thereof
    • H01L27/14618—Containers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14643—Photodiode arrays; MOS imagers
    • H01L27/14658—X-ray, gamma-ray or corpuscular radiation imagers
    • H01L27/14663—Indirect radiation imagers, e.g. using luminescent members
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N5/00—Details of television systems
    • H04N5/30—Transforming light or analogous information into electric information
    • H04N5/32—Transforming X-rays
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/30—Cameras or camera modules comprising electronic image sensors; Control thereof for generating image signals from X-rays

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  • Condensed Matter Physics & Semiconductors (AREA)
  • Toxicology (AREA)
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  • Measurement Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
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Abstract

내용 없음

Description

X선 영상 시스템과 그것을 위한 고상 감지기
[도면의 간단한 설명]
제1도는 X선 영상시스템을 나타내는 블록도이고,
제2도는 제1도의 영상시스템에 사용되는 집적회로감지기의 회로도이고,
제3도는 제2도의 회로도표의 전하저장 캐패시터의 하나를 보여주는 확대도이고.
제16도는 신틸레이터가 X선을 가시광으로 변환시키는데 사용되는 본 발명 실시예의 사시단면도이다.
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음

Claims (20)

  1. 제1지지 부재와: 상기 제1지지 부재의 대향표면과 대향한 표면을 가지는 제2지지 부재와; 제1지지 부재의 대향표면에 고정되고, 각기 흡수체 재질로 만들어지며, 도체에 의하여 수시접근 가능한 패턴으로 연결되는 다수의 방사선 감지 셀을 구비한 다수의 방사선 감지기 어레이 등과; 상기 제2지지 부재의 상기 대향면에 고정되는 다수의 프리프로세서들과; 상기 감지 셀을 상기 프리프로세서에 연결하기 위하여 상기 방사성 감지기 어레이로 부터 상기 프리프로세서 까지 연장한 다수의 전도체 들과; 충돌 X선 들이 상기 감지 셀들 상에 전하에 영향력을 발휘하도록 하는(동기유발) 수단들로 구성시킨 것을 특징으로 하는 장치.
  2. 제1항에 있어서, 상기 전도체가 상기 제1과 제2지지 부재들에 수직으로 연장된 것을 특징으로 하는 장치.
  3. 제1항에 있어서, 동기유발 수단이 상기 충돌 X선 들로부터 자유 전자를 발생시키도록 상기 셀을 인접한 제1지지 부재에 고정되게한 추가의 흡수체 재질을 구비한 것을 특징으로 하는 장치.
  4. 제1항에 있어서, 동기유발 수단이 상기 제1 및 제2지지 부재 사이에 설치되어 상기 충돌 X선 들을 가시광으로 변환시키는 신틸레이터와 이 신틸레이터 부터 상기 감지 셀 까지의 광학 경로로 이루어진 것을 특징으로 하는 장치.
  5. 제1항에 있어서, 상기 전도체가 상기 감지기 어레이와 프리프로세서 상에 형성되는 솔더 범프(LOLDER BUMPS)들로 이루어지게한 것을 특징으로 하는 장치.
  6. 제1항에 있어서, 상기 프리프로세서에 인접하여 외부로 부터 접근 가능한 전도체들을 형성한 것을 특징으로 하는 장치.
  7. 제6항에 있어서, 상기 외부 접근 가능한 전도체들이 탭 연결 되게 한 것을 특징으로 하는 장치.
  8. 제3항에 있어서, 여분의 흡수체 재질이 상기 제1지지 표면과 감지 셀들 사이에 위치되게한 것을 특징으로 하는 장치.
  9. 제4항에 있어서, 상기 신틸레이터가 인광물질로 도핑된 유리판을 구비한 것을 특징으로 하는 장치.
  10. 제9항에 있어서, 상기 신틸레이터가 상기 전도체를 관통시키는 다수의 구멍들을 갖게한 것을 특징으로 하는 장치.
  11. 제1항에 있어서, 감지기 어레이의 결합 영역이 약 14×17인치 되게한 것을 특징으로 하는 장치.
  12. 충돌 X선 들을 가시광으로 변환시키는 신틸레이터와; 가시광을 감지하는 상기 신틸레이터의 일측면상에 다수의 감지 셀들과; 상기 감지 셀들로 부터 수신된 데이터를 처리하는 상기 신틸레이터의 타측면상에 다수의 프로세싱 회로와; 상기 감지 셀들을 상기 프로세싱 회로에 연결하기 위하여 상기 신틸레이터를 통과하여 연장한 범퍼 결합부들로 구성시킨 것을 특징으로 하는 장치.
  13. 제12항에 있어서. 상기 신틸레이터가 상기 감지 셀들과 처리회로들에 대하여 구조적 지지를 제공하는 인광물질로 도핑된 유리판을 구비하게 한 것을 특징으로 하는 장치.
  14. 제13항에 있어서, 상기 유리판으로부터 상기 프로세서의 반대 측면상에 추가의 지지부로 이루어진 것을 특징으로 하는 장치.
  15. 제14항에 있어서, 상기 유리판으로부터 상기 감지 셀의 반대측면상에 다른 지지부와 이루어진 것을 특징으로 하는 장치.
  16. 제15항에 있어서, 상기 다른 지지부가 X선에 대하여 투명한 것을 특징으로 하는 장치.
  17. 제12항에 있어서, 각각의 상기 범프 결합부들이 상기 감지 어레이상에 범프 상기 프로세싱 회로들 중의 어느 한 회로상의 범프와 이들 범프들이 상기 유리판의 양측면상에 있게한 첨단부까지 상기 신틸레이터에 형성한 구멍에 충진되는 전도체 재질들로 이루어지게한 것을 특징으로 하는 장치.
  18. 제1지지 표면상에 가장 인접하여 다수의 감지 어레이를 고정하는 단계와; 제2 지지 표면상에 다수의 프로세싱 회로를 설치하는 단계와; 상기 감지 어레이로 부터 상기 프로세싱 회로들까지 커넥터들을 직접 연장시키므로서 감지 어레이들이 상기 프로세싱 회로와 접속되게한 단계들로 이루어진 것을 특징으로 하는 장치.
  19. 제18항에 있어서, 충돌 X선 들을 자유전자들로 직접 변환시키기 위하여 추가의 합수체 재질로써 상기 감지 어레이를 형성하는 단계로 이루어진 것을 특징으로 하는 장치.
  20. 제18항에 있어서, 상기 프로세싱 회로들과 대향하는 방향으로 상기 감지 셀들읕 노출시키고 충돌 X선들을 가시광으로 변환 시키기 위하여 상기 감지 어레이와 프로세싱 회로 사이에 신틸레이터를 위치시키는 단계로 되는 것을 특징으로 하는 장치.
    ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
KR1019920701620A 1990-01-08 1990-12-18 X선 영상 시스템과 그것을 위한 고상 감지기 KR920704155A (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US07/462,042 US5043582A (en) 1985-12-11 1990-01-08 X-ray imaging system and solid state detector therefor
US462042 1990-01-08
PCT/US1990/007291 WO1991010921A1 (en) 1990-01-08 1990-12-18 X-ray imaging system and solid state detector therefor

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KR920704155A true KR920704155A (ko) 1992-12-19

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US (1) US5043582A (ko)
EP (1) EP0513208A1 (ko)
JP (1) JPH05505025A (ko)
KR (1) KR920704155A (ko)
AU (1) AU7322091A (ko)
CA (1) CA2073343A1 (ko)
WO (1) WO1991010921A1 (ko)

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WO1991010921A1 (en) 1991-07-25
US5043582A (en) 1991-08-27
EP0513208A1 (en) 1992-11-19
JPH05505025A (ja) 1993-07-29
CA2073343A1 (en) 1991-07-09
EP0513208A4 (ko) 1994-04-06

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