KR910001926A - 리이드 위치 인식 장치 - Google Patents

리이드 위치 인식 장치 Download PDF

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Publication number
KR910001926A
KR910001926A KR1019900009655A KR900009655A KR910001926A KR 910001926 A KR910001926 A KR 910001926A KR 1019900009655 A KR1019900009655 A KR 1019900009655A KR 900009655 A KR900009655 A KR 900009655A KR 910001926 A KR910001926 A KR 910001926A
Authority
KR
South Korea
Prior art keywords
lead position
recognition device
maximum
position recognition
contour
Prior art date
Application number
KR1019900009655A
Other languages
English (en)
Other versions
KR940004922B1 (ko
Inventor
세이지 미즈오카
카즈마사 오쿠무라
Original Assignee
다니이 아끼오
마쯔시다덴기산교 가부시기가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 다니이 아끼오, 마쯔시다덴기산교 가부시기가이샤 filed Critical 다니이 아끼오
Publication of KR910001926A publication Critical patent/KR910001926A/ko
Application granted granted Critical
Publication of KR940004922B1 publication Critical patent/KR940004922B1/ko

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Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/70—Determining position or orientation of objects or cameras
    • G06T7/73—Determining position or orientation of objects or cameras using feature-based methods
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30148—Semiconductor; IC; Wafer

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Manufacturing & Machinery (AREA)
  • Image Analysis (AREA)
  • Supply And Installment Of Electrical Components (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Image Processing (AREA)

Abstract

내용 없음

Description

리이드 위치 인식 장치
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제1도는 본 발명이 일실시예의 리이드위치 인식장치의 블록도.
제2도는 동 리이드 위치 인식장치의 윤곽선의 극대점과 극소점의 중점을 연결하는 직선과 윤곽선의 교점을 검출하는 순서의 일례의 설명도.
제3도는 IC부분이 회전하였을 때의 윤곽선의 극대점과 극소점의 중점을 연결하는 직선과 윤곽선의 교점을 검출하는 순서의 일례의 설명도.

Claims (2)

  1. 인접하는 리이드에 의해서 포위된 영역의 윤곽선을 추적하는 수단과, 그 윤곽선의 극대점·극소점을 검출하는 수단과, 극대점과 극소점과의 중간점을 연결하는 직선과 윤곽선과의 교점으로 부터 리이드위치를 검출하는 수단을 구비한 것을 특징으로 하는 리이드 위치 인식장치.
  2. 제1항에 있어서, 윤곽선의 극대점, 극소점대신에 윤곽선의 180°코오너를 구하는 구성으로 한 것을 특징으로 하는 리이드위치 인식장치.
    ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
KR1019900009655A 1989-06-30 1990-06-28 리이드 위치 인식장치 KR940004922B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP1170120A JPH083405B2 (ja) 1989-06-30 1989-06-30 リード位置認識装置
JP1-170120 1989-06-30

Publications (2)

Publication Number Publication Date
KR910001926A true KR910001926A (ko) 1991-01-31
KR940004922B1 KR940004922B1 (ko) 1994-06-04

Family

ID=15899015

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019900009655A KR940004922B1 (ko) 1989-06-30 1990-06-28 리이드 위치 인식장치

Country Status (3)

Country Link
US (1) US5007097A (ko)
JP (1) JPH083405B2 (ko)
KR (1) KR940004922B1 (ko)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AU645123B2 (en) * 1990-09-24 1994-01-06 Fmc Corporation Automatic windowing for article recognition
US5406700A (en) * 1990-11-20 1995-04-18 Seiko Epson Corporation Method for producing pin integrated circuit lead frame
JPH06137839A (ja) * 1992-02-18 1994-05-20 Nec Corp リード曲り測定装置
JP2851023B2 (ja) * 1992-06-29 1999-01-27 株式会社鷹山 Ｉｃの傾き検査方法
EP0604052B1 (en) * 1992-12-23 2001-08-08 AT&T Corp. A method and system for locating objects with subpixel precision
US5408537A (en) * 1993-11-22 1995-04-18 At&T Corp. Mounted connector pin test using image processing
US6053763A (en) * 1998-08-05 2000-04-25 Molex Incorporated Electrical connector with multi-function terminals
JP2002221404A (ja) * 2001-01-26 2002-08-09 Shinkawa Ltd 画像処理方法および装置
US6789235B1 (en) * 2001-09-05 2004-09-07 National Semiconductor Corporation Bond program verification system

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0149457B1 (en) * 1984-01-13 1993-03-31 Kabushiki Kaisha Komatsu Seisakusho Method of identifying contour lines
FR2580534B1 (fr) * 1985-04-19 1987-05-15 Commissariat Energie Atomique Procede de positionnement d'un point appartenant a la zone de coupe d'un outil et dispositif pour la mise en oeuvre de ce procede dans un tour a commande numerique
EP0253397B1 (en) * 1986-07-17 1993-09-29 Matsushita Electric Industrial Co., Ltd. Shape recognition method
US4929843A (en) * 1989-06-28 1990-05-29 General Electric Company Apparatus and method for determining a dimension of an object

Also Published As

Publication number Publication date
US5007097A (en) 1991-04-09
JPH083405B2 (ja) 1996-01-17
KR940004922B1 (ko) 1994-06-04
JPH0335108A (ja) 1991-02-15

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