KR910001926A - 리이드 위치 인식 장치 - Google Patents
리이드 위치 인식 장치 Download PDFInfo
- Publication number
- KR910001926A KR910001926A KR1019900009655A KR900009655A KR910001926A KR 910001926 A KR910001926 A KR 910001926A KR 1019900009655 A KR1019900009655 A KR 1019900009655A KR 900009655 A KR900009655 A KR 900009655A KR 910001926 A KR910001926 A KR 910001926A
- Authority
- KR
- South Korea
- Prior art keywords
- lead position
- recognition device
- maximum
- position recognition
- contour
- Prior art date
Links
- 238000010586 diagram Methods 0.000 description 3
- 238000000034 method Methods 0.000 description 2
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/70—Determining position or orientation of objects or cameras
- G06T7/73—Determining position or orientation of objects or cameras using feature-based methods
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
- G06T2207/30148—Semiconductor; IC; Wafer
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Manufacturing & Machinery (AREA)
- Image Analysis (AREA)
- Image Processing (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Supply And Installment Of Electrical Components (AREA)
Abstract
내용 없음
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제1도는 본 발명이 일실시예의 리이드위치 인식장치의 블록도.
제2도는 동 리이드 위치 인식장치의 윤곽선의 극대점과 극소점의 중점을 연결하는 직선과 윤곽선의 교점을 검출하는 순서의 일례의 설명도.
제3도는 IC부분이 회전하였을 때의 윤곽선의 극대점과 극소점의 중점을 연결하는 직선과 윤곽선의 교점을 검출하는 순서의 일례의 설명도.
Claims (2)
- 인접하는 리이드에 의해서 포위된 영역의 윤곽선을 추적하는 수단과, 그 윤곽선의 극대점·극소점을 검출하는 수단과, 극대점과 극소점과의 중간점을 연결하는 직선과 윤곽선과의 교점으로 부터 리이드위치를 검출하는 수단을 구비한 것을 특징으로 하는 리이드 위치 인식장치.
- 제1항에 있어서, 윤곽선의 극대점, 극소점대신에 윤곽선의 180°코오너를 구하는 구성으로 한 것을 특징으로 하는 리이드위치 인식장치.※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1-170120 | 1989-06-30 | ||
JP1170120A JPH083405B2 (ja) | 1989-06-30 | 1989-06-30 | リード位置認識装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR910001926A true KR910001926A (ko) | 1991-01-31 |
KR940004922B1 KR940004922B1 (ko) | 1994-06-04 |
Family
ID=15899015
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019900009655A KR940004922B1 (ko) | 1989-06-30 | 1990-06-28 | 리이드 위치 인식장치 |
Country Status (3)
Country | Link |
---|---|
US (1) | US5007097A (ko) |
JP (1) | JPH083405B2 (ko) |
KR (1) | KR940004922B1 (ko) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
AU645123B2 (en) * | 1990-09-24 | 1994-01-06 | Fmc Corporation | Automatic windowing for article recognition |
US5406700A (en) * | 1990-11-20 | 1995-04-18 | Seiko Epson Corporation | Method for producing pin integrated circuit lead frame |
JPH06137839A (ja) * | 1992-02-18 | 1994-05-20 | Nec Corp | リード曲り測定装置 |
JP2851023B2 (ja) * | 1992-06-29 | 1999-01-27 | 株式会社鷹山 | Icの傾き検査方法 |
EP0604052B1 (en) * | 1992-12-23 | 2001-08-08 | AT&T Corp. | A method and system for locating objects with subpixel precision |
US5408537A (en) * | 1993-11-22 | 1995-04-18 | At&T Corp. | Mounted connector pin test using image processing |
US6053763A (en) * | 1998-08-05 | 2000-04-25 | Molex Incorporated | Electrical connector with multi-function terminals |
JP2002221404A (ja) * | 2001-01-26 | 2002-08-09 | Shinkawa Ltd | 画像処理方法および装置 |
US6789235B1 (en) | 2001-09-05 | 2004-09-07 | National Semiconductor Corporation | Bond program verification system |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0149457B1 (en) * | 1984-01-13 | 1993-03-31 | Kabushiki Kaisha Komatsu Seisakusho | Method of identifying contour lines |
FR2580534B1 (fr) * | 1985-04-19 | 1987-05-15 | Commissariat Energie Atomique | Procede de positionnement d'un point appartenant a la zone de coupe d'un outil et dispositif pour la mise en oeuvre de ce procede dans un tour a commande numerique |
DE3787587T2 (de) * | 1986-07-17 | 1994-01-27 | Matsushita Electric Ind Co Ltd | Formerkennungsverfahren. |
US4929843A (en) * | 1989-06-28 | 1990-05-29 | General Electric Company | Apparatus and method for determining a dimension of an object |
-
1989
- 1989-06-30 JP JP1170120A patent/JPH083405B2/ja not_active Expired - Fee Related
-
1990
- 1990-06-28 KR KR1019900009655A patent/KR940004922B1/ko not_active IP Right Cessation
- 1990-06-29 US US07/545,892 patent/US5007097A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
US5007097A (en) | 1991-04-09 |
JPH0335108A (ja) | 1991-02-15 |
KR940004922B1 (ko) | 1994-06-04 |
JPH083405B2 (ja) | 1996-01-17 |
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E902 | Notification of reason for refusal | ||
G160 | Decision to publish patent application | ||
E701 | Decision to grant or registration of patent right | ||
GRNT | Written decision to grant | ||
FPAY | Annual fee payment |
Payment date: 20040524 Year of fee payment: 11 |
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