DE3778137D1 - Vorrichtung zum messen von kenngroessen eines auf sehr hohe frequenzen ausgelegten bauteils. - Google Patents

Vorrichtung zum messen von kenngroessen eines auf sehr hohe frequenzen ausgelegten bauteils.

Info

Publication number
DE3778137D1
DE3778137D1 DE8787402913T DE3778137T DE3778137D1 DE 3778137 D1 DE3778137 D1 DE 3778137D1 DE 8787402913 T DE8787402913 T DE 8787402913T DE 3778137 T DE3778137 T DE 3778137T DE 3778137 D1 DE3778137 D1 DE 3778137D1
Authority
DE
Germany
Prior art keywords
sizes
measuring
high frequencies
component designed
designed
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE8787402913T
Other languages
English (en)
Inventor
Sylviane Bitoune
Dominique Geffroy
Francois Grossier
Creff Maurice Le
Gerard Ralala
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Thomson Composants Microondes
Original Assignee
Thomson Composants Microondes
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Thomson Composants Microondes filed Critical Thomson Composants Microondes
Application granted granted Critical
Publication of DE3778137D1 publication Critical patent/DE3778137D1/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01P—WAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
    • H01P1/00—Auxiliary devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/20—Modifications of basic electric elements for use in electric measuring instruments; Structural combinations of such elements with such instruments
    • G01R1/24—Transmission-line, e.g. waveguide, measuring sections, e.g. slotted section
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2822—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
DE8787402913T 1986-12-23 1987-12-18 Vorrichtung zum messen von kenngroessen eines auf sehr hohe frequenzen ausgelegten bauteils. Expired - Fee Related DE3778137D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR8618087A FR2608772B1 (fr) 1986-12-23 1986-12-23 Dispositif de mesure des caracteristiques d'un composant hyperfrequence

Publications (1)

Publication Number Publication Date
DE3778137D1 true DE3778137D1 (de) 1992-05-14

Family

ID=9342243

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8787402913T Expired - Fee Related DE3778137D1 (de) 1986-12-23 1987-12-18 Vorrichtung zum messen von kenngroessen eines auf sehr hohe frequenzen ausgelegten bauteils.

Country Status (6)

Country Link
US (1) US4808919A (de)
EP (1) EP0273825B1 (de)
CA (1) CA1283448C (de)
DE (1) DE3778137D1 (de)
ES (1) ES2030753T3 (de)
FR (1) FR2608772B1 (de)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IT1219140B (it) * 1988-03-23 1990-05-03 Cselt Centro Studi Lab Telecom Dispositivo per la misura delle caratteristiche statiche di componenti attivi a tre terminali per microonde
US5038100A (en) * 1989-05-25 1991-08-06 Massachusetts Institute Of Technology Microwave test fixture
US5017865A (en) * 1989-06-07 1991-05-21 Wiltron Company Coaxial microwave device test fixture
US5153505A (en) * 1991-11-05 1992-10-06 The Johns Hopkins University Adaptable multiport test fixture system
US5854559A (en) * 1996-11-20 1998-12-29 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Method and apparatus for testing microwave devices and circuits in a controlled environment
US6262571B1 (en) * 1999-11-17 2001-07-17 Agilent Technologies, Inc. Adjustable electrical connector for test fixture nest
US6384617B1 (en) 1999-11-17 2002-05-07 Agilent Technologies, Inc. Signal transfer device for probe test fixture
RU2577805C1 (ru) * 2014-12-17 2016-03-20 Открытое акционерное общество "Брянский электромеханический завод" Приспособление для снятия характеристик свч-устройств
US10184972B1 (en) * 2015-03-10 2019-01-22 Christos Tsironis Transistor test fixture with convex surface of the support blocks

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2142838B1 (de) * 1971-06-25 1974-04-05 Cit Alcatel
US3775644A (en) * 1972-09-20 1973-11-27 Communications Satellite Corp Adjustable microstrip substrate holder
US4365195A (en) * 1979-12-27 1982-12-21 Communications Satellite Corporation Coplanar waveguide mounting structure and test fixture for microwave integrated circuits
DD153439A1 (de) * 1980-10-09 1982-01-06 Wolfram Senf Anordnung zur messung von impedanzen an hoechstfrequenzflachstrukturen
US4547960A (en) * 1982-04-29 1985-10-22 At&T Technologies, Inc. Methods of and fixture for establishing an electrical connection
US4535307A (en) * 1982-06-30 1985-08-13 Raytheon Company Microwave circuit device package
US4538124A (en) * 1984-02-10 1985-08-27 Rca Corporation Planar microwave circuit component mounting system

Also Published As

Publication number Publication date
US4808919A (en) 1989-02-28
FR2608772A1 (fr) 1988-06-24
FR2608772B1 (fr) 1989-03-31
ES2030753T3 (es) 1992-11-16
EP0273825B1 (de) 1992-04-08
EP0273825A1 (de) 1988-07-06
CA1283448C (en) 1991-04-23

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee