ES2030753T3 - Dispositivo de medida de las caracteristicas de un componente de hiperfrecuencia. - Google Patents

Dispositivo de medida de las caracteristicas de un componente de hiperfrecuencia.

Info

Publication number
ES2030753T3
ES2030753T3 ES198787402913T ES87402913T ES2030753T3 ES 2030753 T3 ES2030753 T3 ES 2030753T3 ES 198787402913 T ES198787402913 T ES 198787402913T ES 87402913 T ES87402913 T ES 87402913T ES 2030753 T3 ES2030753 T3 ES 2030753T3
Authority
ES
Spain
Prior art keywords
component
access
measuring
frequency component
parameters
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
ES198787402913T
Other languages
English (en)
Inventor
Sylviane Bitoune
Dominique Geffroy
Francois Grossier
Maurice Le Creff
Gerard Ralala
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Thomson Composants Microondes
Original Assignee
Thomson Composants Microondes
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Thomson Composants Microondes filed Critical Thomson Composants Microondes
Application granted granted Critical
Publication of ES2030753T3 publication Critical patent/ES2030753T3/es
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01P—WAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
    • H01P1/00—Auxiliary devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/20—Modifications of basic electric elements for use in electric measuring instruments; Structural combinations of such elements with such instruments
    • G01R1/24—Transmission-line, e.g. waveguide, measuring sections, e.g. slotted section
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2822—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Measurement Of Resistance Or Impedance (AREA)

Abstract

LA INVENCION CONCIERNE A UN DISPOSITIVO QUE, FIJADO SOBRE UN APARATO DE MEDIDA, PERMITE TENER ACCESO A LOS BORNES DE UN COMPONENTE DE HIPERFRECUENCIA, PARA MEDIDA DE SUS PARAMETROS "S". A FIN DE CONSEGUIR UNIONES MAS CORTAS ENTRE LAS LINEAS DE ACCESO (4+7) DEL DISPOSITIVO Y LOS BORNES DE ENTRADA Y SALIDA DEL COMPONENTE (24) A MEDIR, LA INVENCION PREVE QUE LOS DOS BLOQUES DE ACCESO (1,2) QUE SOPORTAN LAS LINEAS DE ACCESO, SEAN REGULABLES EN POSICION, CON RESPECTO AL COMPONENTE (24) A MEDIR, SEGUN DOS GRADOS DE LIBERTAD, EN DISTANCIA Y EN TRASLACION LATERAL. EL COMPONENTE A MEDIR, CUALQUIERA QUE SEA SU TIPO (PULGA, ENCAPSULADO, EN CIRCUITO HIBRIDO) ESTA SOPORTADO POR UN BLOQUE (17), INSERTADO ENTRE LOS DOS BLOQUES DE ACCESO (1,2), Y DE DIMENSIONES IGUALES A LAS DEL COMPONENTE (24). APLICACION A LA MEDIDA DE LOS PARAMETROS "S", DE RUIDO, DE POTENCIA, EN HIPERFRECUENCIAS.
ES198787402913T 1986-12-23 1987-12-18 Dispositivo de medida de las caracteristicas de un componente de hiperfrecuencia. Expired - Lifetime ES2030753T3 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR8618087A FR2608772B1 (fr) 1986-12-23 1986-12-23 Dispositif de mesure des caracteristiques d'un composant hyperfrequence

Publications (1)

Publication Number Publication Date
ES2030753T3 true ES2030753T3 (es) 1992-11-16

Family

ID=9342243

Family Applications (1)

Application Number Title Priority Date Filing Date
ES198787402913T Expired - Lifetime ES2030753T3 (es) 1986-12-23 1987-12-18 Dispositivo de medida de las caracteristicas de un componente de hiperfrecuencia.

Country Status (6)

Country Link
US (1) US4808919A (es)
EP (1) EP0273825B1 (es)
CA (1) CA1283448C (es)
DE (1) DE3778137D1 (es)
ES (1) ES2030753T3 (es)
FR (1) FR2608772B1 (es)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IT1219140B (it) * 1988-03-23 1990-05-03 Cselt Centro Studi Lab Telecom Dispositivo per la misura delle caratteristiche statiche di componenti attivi a tre terminali per microonde
US5038100A (en) * 1989-05-25 1991-08-06 Massachusetts Institute Of Technology Microwave test fixture
US5017865A (en) * 1989-06-07 1991-05-21 Wiltron Company Coaxial microwave device test fixture
US5153505A (en) * 1991-11-05 1992-10-06 The Johns Hopkins University Adaptable multiport test fixture system
US5854559A (en) * 1996-11-20 1998-12-29 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Method and apparatus for testing microwave devices and circuits in a controlled environment
US6262571B1 (en) * 1999-11-17 2001-07-17 Agilent Technologies, Inc. Adjustable electrical connector for test fixture nest
US6384617B1 (en) 1999-11-17 2002-05-07 Agilent Technologies, Inc. Signal transfer device for probe test fixture
RU2577805C1 (ru) * 2014-12-17 2016-03-20 Открытое акционерное общество "Брянский электромеханический завод" Приспособление для снятия характеристик свч-устройств
US10184972B1 (en) * 2015-03-10 2019-01-22 Christos Tsironis Transistor test fixture with convex surface of the support blocks

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2142838B1 (es) * 1971-06-25 1974-04-05 Cit Alcatel
US3775644A (en) * 1972-09-20 1973-11-27 Communications Satellite Corp Adjustable microstrip substrate holder
US4365195A (en) * 1979-12-27 1982-12-21 Communications Satellite Corporation Coplanar waveguide mounting structure and test fixture for microwave integrated circuits
DD153439A1 (de) * 1980-10-09 1982-01-06 Wolfram Senf Anordnung zur messung von impedanzen an hoechstfrequenzflachstrukturen
US4547960A (en) * 1982-04-29 1985-10-22 At&T Technologies, Inc. Methods of and fixture for establishing an electrical connection
US4535307A (en) * 1982-06-30 1985-08-13 Raytheon Company Microwave circuit device package
US4538124A (en) * 1984-02-10 1985-08-27 Rca Corporation Planar microwave circuit component mounting system

Also Published As

Publication number Publication date
US4808919A (en) 1989-02-28
FR2608772A1 (fr) 1988-06-24
FR2608772B1 (fr) 1989-03-31
EP0273825B1 (fr) 1992-04-08
DE3778137D1 (de) 1992-05-14
EP0273825A1 (fr) 1988-07-06
CA1283448C (en) 1991-04-23

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