KR890020028U - 웨이퍼 자동 감지장치 - Google Patents

웨이퍼 자동 감지장치

Info

Publication number
KR890020028U
KR890020028U KR2019880004082U KR880004082U KR890020028U KR 890020028 U KR890020028 U KR 890020028U KR 2019880004082 U KR2019880004082 U KR 2019880004082U KR 880004082 U KR880004082 U KR 880004082U KR 890020028 U KR890020028 U KR 890020028U
Authority
KR
South Korea
Prior art keywords
sensing device
automatic sensing
wafer automatic
wafer
sensing
Prior art date
Application number
KR2019880004082U
Other languages
English (en)
Other versions
KR910006945Y1 (ko
Inventor
한충율
김형돈
김애란
Original Assignee
삼성전자 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 삼성전자 주식회사 filed Critical 삼성전자 주식회사
Priority to KR2019880004082U priority Critical patent/KR910006945Y1/ko
Publication of KR890020028U publication Critical patent/KR890020028U/ko
Application granted granted Critical
Publication of KR910006945Y1 publication Critical patent/KR910006945Y1/ko

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/30Structural arrangements specially adapted for testing or measuring during manufacture or treatment, or specially adapted for reliability measurements
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/10Measuring as part of the manufacturing process

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Measuring Leads Or Probes (AREA)
KR2019880004082U 1988-03-28 1988-03-28 웨이퍼 자동 감지장치 KR910006945Y1 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019880004082U KR910006945Y1 (ko) 1988-03-28 1988-03-28 웨이퍼 자동 감지장치

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019880004082U KR910006945Y1 (ko) 1988-03-28 1988-03-28 웨이퍼 자동 감지장치

Publications (2)

Publication Number Publication Date
KR890020028U true KR890020028U (ko) 1989-10-05
KR910006945Y1 KR910006945Y1 (ko) 1991-09-17

Family

ID=19273556

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019880004082U KR910006945Y1 (ko) 1988-03-28 1988-03-28 웨이퍼 자동 감지장치

Country Status (1)

Country Link
KR (1) KR910006945Y1 (ko)

Also Published As

Publication number Publication date
KR910006945Y1 (ko) 1991-09-17

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Legal Events

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Year of fee payment: 11

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