KR880014364A - 무기질원소 농도 측정장치 - Google Patents

무기질원소 농도 측정장치 Download PDF

Info

Publication number
KR880014364A
KR880014364A KR870005527A KR870005527A KR880014364A KR 880014364 A KR880014364 A KR 880014364A KR 870005527 A KR870005527 A KR 870005527A KR 870005527 A KR870005527 A KR 870005527A KR 880014364 A KR880014364 A KR 880014364A
Authority
KR
South Korea
Prior art keywords
polyhedron
inorganic element
slit
laser
laser beam
Prior art date
Application number
KR870005527A
Other languages
English (en)
Other versions
KR900005331B1 (ko
Inventor
양근영
Original Assignee
최근선
주식회사 금성사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 최근선, 주식회사 금성사 filed Critical 최근선
Priority to KR1019870005527A priority Critical patent/KR900005331B1/ko
Priority to GB8812492A priority patent/GB2205157B/en
Priority to US07/199,765 priority patent/US4979123A/en
Priority to JP63130485A priority patent/JPH0776748B2/ja
Publication of KR880014364A publication Critical patent/KR880014364A/ko
Application granted granted Critical
Publication of KR900005331B1 publication Critical patent/KR900005331B1/ko

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • G01J3/06Scanning arrangements arrangements for order-selection
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28Investigating the spectrum
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28Investigating the spectrum
    • G01J3/30Measuring the intensity of spectral lines directly on the spectrum itself
    • G01J3/36Investigating two or more bands of a spectrum by separate detectors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/66Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
    • G01N21/67Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence using electric arcs or discharges
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/42Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44Electric circuits
    • G01J2001/4446Type of detector
    • G01J2001/446Photodiode
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28Investigating the spectrum
    • G01J2003/2866Markers; Calibrating of scan
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28Investigating the spectrum
    • G01J3/2889Rapid scan spectrometers; Time resolved spectrometry
    • G01J2003/2893Rapid scan spectrometers; Time resolved spectrometry with rotating grating

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)

Abstract

내용 없음

Description

무기질원소 농도 측정장치
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제1도는 종래장치의 구성도.
제2도는 본 발명 장치의 구성도.
제3도는 제2도의 스펙트로메타를 A방향에서 보인 측면도.

Claims (5)

  1. 가변하는 파장을 구하기 위해 레이저를 사용하며, 회전판(25)과 반사경(26)의 이중구조로 형성된 회전다면체(27)를 사용한 스펙트로메타(20) 설치되어 구성된 것을 특징으로 하는 무기물원소 농도 측정방법.
  2. 제1항에 있어서, 상기 스펙트로메타(20)가 초점이 출구측슬릿(21)상에 있고 공지 GDL(22)로부터 방출하는 빛을 집속하는 집속렌즈(23), 레이저 빔을 발사하는 레이저(24), 그레이틴(25)과 반사경(26)이 장치되고 구동모터(27′)로 구동되는 회전다면체(27), 곡률중심이 회전다면체(27)면에 있고 슬릿어레이를 가지고 있는 슬릿판(28)에 레이저 빔을 집속시키는 집속렌즈(29), 회전다면체(27)로부터 회절된 빛을 제어하는 입구측 슬릿(30), 회전다면체(27)로부터 회절된 GDL(22)로부터의 빛을 PM튜브(31)로 향하게 반사시키는 반사경(32), 회전다면체(27)에 의해 반사된 레이저 빔을 검지하는 포토다이오드(33), 회전다면체(27)의 회전에 의해 레이저 빔이 슬릿판(28)을 주사할 때 시작점을 알려주는 포토다이오드(34) 및 슬릿(35), 포토다이오드(33)에 의한 신호를 증폭하는 포토다이오드용 앰플리파이어(36), PM튜브용 A/D콘버터 및 앰플리파이어(37)로 구성된 것을 특징으로 하는 무기질원소 농도측정장치.
  3. 제2항에 있어서, 레이저(24)는 반도체 레이저를 사용하고, 회절판(25)은 다면체에 접착하여 회전다면체(27)를 형성한 것을 특징으로 하는 무기질원소 농도 측정장치.
  4. 제2항에 있어서, 레이저 빔을 집속하는 광학계의 광축과, 측정하고자 하는 빛을 집속하는 광학계의 광축이 만나지 않도록 양 광학계의 광축이 소정각도를 가지는 것을 특징으로 하는 무기질원소 농도 측정장치.
  5. 제2항에 있어서, 슬릿판(28)이 곡률을 가지며 곡률의 중심이 회전다면체(27)의 반사면에서 그레이팅(25)부와 반사경(26)부의 경계에 있도록 구성함을 특징으로 하는 무기질원소 농도 측정장치.
    ※ 참고사항:최초출원 내용에 의하여 공개하는 것임.
KR1019870005527A 1987-05-30 1987-05-30 무기질원소 농도측정장치 KR900005331B1 (ko)

Priority Applications (4)

Application Number Priority Date Filing Date Title
KR1019870005527A KR900005331B1 (ko) 1987-05-30 1987-05-30 무기질원소 농도측정장치
GB8812492A GB2205157B (en) 1987-05-30 1988-05-26 An apparatus for determining concentrations of mineral elements
US07/199,765 US4979123A (en) 1987-05-30 1988-05-27 Apparatus for determining concentrations of mineral elements
JP63130485A JPH0776748B2 (ja) 1987-05-30 1988-05-30 無機物元素濃度測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019870005527A KR900005331B1 (ko) 1987-05-30 1987-05-30 무기질원소 농도측정장치

Publications (2)

Publication Number Publication Date
KR880014364A true KR880014364A (ko) 1988-12-23
KR900005331B1 KR900005331B1 (ko) 1990-07-27

Family

ID=19261863

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019870005527A KR900005331B1 (ko) 1987-05-30 1987-05-30 무기질원소 농도측정장치

Country Status (4)

Country Link
US (1) US4979123A (ko)
JP (1) JPH0776748B2 (ko)
KR (1) KR900005331B1 (ko)
GB (1) GB2205157B (ko)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5153670A (en) * 1990-01-12 1992-10-06 Physical Optics Corporation Holographic lippmann-bragg filter in a spectroscopic system
US5355815A (en) * 1993-03-19 1994-10-18 Ag-Chem Equipment Co., Inc. Closed-loop variable rate applicator
US5408315A (en) * 1993-07-28 1995-04-18 Leco Corporation Glow discharge analytical instrument for performing excitation and analyzation on the same side of a sample
DE19635046A1 (de) * 1996-08-29 1998-03-05 Nis Ingenieurgesellschaft Mbh Spektralanalytische Vorrichtung und Verfahren zur Bestimmung von Elementzusammensetzungen und -konzentrationen
EP1393026A1 (en) * 2001-06-01 2004-03-03 CiDra Corporation Optical channel monitor
US7253897B2 (en) 2001-06-01 2007-08-07 Cidra Corporation Optical spectrum analyzer
CN101788340A (zh) * 2010-03-24 2010-07-28 上海交通大学 波长扫描装置
KR102240270B1 (ko) * 2014-07-21 2021-04-14 삼성전자주식회사 광 변환 모듈 및 광학 측정 시스템
CN115808408B (zh) * 2023-01-18 2023-04-28 江苏奥文仪器科技有限公司 一种用激光增强辉光放电强度的辉光光谱仪激发装置

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3229566A (en) * 1961-11-24 1966-01-18 Cons Electrodynamics Corp Spectroscopic alignment monitor
US3846024A (en) * 1972-06-12 1974-11-05 Baird Atomic Inc Optical alignment system for optical spectrometers
US4191473A (en) * 1978-01-09 1980-03-04 Hansch Theodor W Method of and apparatus for measuring the absolute wavelength of a source of unknown frequency radiation
US4575241A (en) * 1981-04-16 1986-03-11 Baird Corporation Spectrometer
FR2519427A1 (fr) * 1982-01-04 1983-07-08 Instruments Sa Dispositif de spectrometrie
US4648714A (en) * 1985-09-11 1987-03-10 University Of Utah Molecular gas analysis by Raman scattering in intracavity laser configuration
JPS6255152U (ko) * 1985-09-27 1987-04-06
US4784486A (en) * 1987-10-06 1988-11-15 Albion Instruments Multi-channel molecular gas analysis by laser-activated Raman light scattering

Also Published As

Publication number Publication date
GB2205157A (en) 1988-11-30
US4979123A (en) 1990-12-18
JPS63311151A (ja) 1988-12-19
GB2205157B (en) 1991-07-17
KR900005331B1 (ko) 1990-07-27
JPH0776748B2 (ja) 1995-08-16
GB8812492D0 (en) 1988-06-29

Similar Documents

Publication Publication Date Title
US4475787A (en) Single facet wobble free scanner
JP2789741B2 (ja) レーザレーダ走査装置
CA2084324A1 (en) Optical pickup apparatus and a hologram element used for same
KR880014364A (ko) 무기질원소 농도 측정장치
JPH02262107A (ja) 光走査用回折格子
JPS62239120A (ja) テレセントリツク光線を発生する方法及び装置
FR2517131B1 (fr) Dispositif pour faire varier la puissance d'un laser
JP3351374B2 (ja) レーザ式測距装置
US3002419A (en) Alignment theodolite
JPS57199909A (en) Distance measuring device
JPH0517528B2 (ko)
SU1539721A1 (ru) Дефлектор светового пучка
SU1532808A2 (ru) Устройство дл контрол линейных размеров
SU1543277A1 (ru) Устройство дл контрол центрировки оптических систем
SU1142732A1 (ru) Устройство дл контрол линейных размеров
SU1504497A1 (ru) Устройство дл измерени линейных размеров и формы элементов на плоских объектах с дифракционными тестовыми структурами
SU362217A1 (ru) Оптическое контрольное устройство
JP3057286B2 (ja) シ―ト状物体の特性測定装置
US4624527A (en) Radiation-utilizing measurement system
JPH0515043Y2 (ko)
RU1816964C (ru) Устройство дл измерени шероховатости поверхности издели
SU712658A2 (ru) Устройство дл измерени взаимного углового положени объектов
SU700780A1 (ru) Фотоэлектрический автоколлимационный датчик угла наклона
SU1442824A1 (ru) Способ контрол фотоэлектрических автоколлиматоров
JPH0120641Y2 (ko)

Legal Events

Date Code Title Description
A201 Request for examination
G160 Decision to publish patent application
E701 Decision to grant or registration of patent right
GRNT Written decision to grant
FPAY Annual fee payment

Payment date: 19941227

Year of fee payment: 6

LAPS Lapse due to unpaid annual fee