KR20250135849A - X선 발생 장치 및 x선 촬상 장치 - Google Patents

X선 발생 장치 및 x선 촬상 장치

Info

Publication number
KR20250135849A
KR20250135849A KR1020257027165A KR20257027165A KR20250135849A KR 20250135849 A KR20250135849 A KR 20250135849A KR 1020257027165 A KR1020257027165 A KR 1020257027165A KR 20257027165 A KR20257027165 A KR 20257027165A KR 20250135849 A KR20250135849 A KR 20250135849A
Authority
KR
South Korea
Prior art keywords
insulating
space
ray generating
generating device
tube
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
KR1020257027165A
Other languages
English (en)
Korean (ko)
Inventor
아츠히로 구와지마
다카히로 오카다
다케오 츠카모토
Original Assignee
캐논 아네르바 가부시키가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from PCT/JP2023/002275 external-priority patent/WO2024157394A1/ja
Application filed by 캐논 아네르바 가부시키가이샤 filed Critical 캐논 아네르바 가부시키가이샤
Publication of KR20250135849A publication Critical patent/KR20250135849A/ko
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/025—X-ray tubes with structurally associated circuit elements
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/04—Electrodes ; Mutual position thereof; Constructional adaptations therefor
    • H01J35/06—Cathodes
    • H01J35/064—Details of the emitter, e.g. material or structure
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/04—Electrodes ; Mutual position thereof; Constructional adaptations therefor
    • H01J35/08—Anodes; Anti cathodes
    • H01J35/112—Non-rotating anodes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/16—Vessels; Containers; Shields associated therewith
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/02—Constructional details
    • H05G1/04—Mounting the X-ray tube within a closed housing
    • H05G1/06—X-ray tube and at least part of the power supply apparatus being mounted within the same housing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/10—Different kinds of radiation or particles
    • G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
    • G01N2223/1016—X-ray
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/20—Sources of radiation
    • G01N2223/204—Sources of radiation source created from radiated target

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • X-Ray Techniques (AREA)
KR1020257027165A 2023-01-25 2023-09-13 X선 발생 장치 및 x선 촬상 장치 Pending KR20250135849A (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JPPCT/JP2023/002275 2023-01-25
PCT/JP2023/002275 WO2024157394A1 (ja) 2023-01-25 2023-01-25 Ｘ線発生装置およびｘ線撮像装置
PCT/JP2023/033426 WO2024157531A1 (ja) 2023-01-25 2023-09-13 Ｘ線発生装置およびｘ線撮像装置

Publications (1)

Publication Number Publication Date
KR20250135849A true KR20250135849A (ko) 2025-09-15

Family

ID=91067372

Family Applications (2)

Application Number Title Priority Date Filing Date
KR1020257027165A Pending KR20250135849A (ko) 2023-01-25 2023-09-13 X선 발생 장치 및 x선 촬상 장치
KR1020257027237A Pending KR20250135857A (ko) 2023-01-25 2024-01-16 X선 발생 장치 및 x선 촬상 장치

Family Applications After (1)

Application Number Title Priority Date Filing Date
KR1020257027237A Pending KR20250135857A (ko) 2023-01-25 2024-01-16 X선 발생 장치 및 x선 촬상 장치

Country Status (7)

Country Link
US (2) US20250351256A1 (https=)
EP (1) EP4657487A1 (https=)
JP (2) JP7486694B1 (https=)
KR (2) KR20250135849A (https=)
CN (2) CN120584548A (https=)
TW (2) TW202503807A (https=)
WO (1) WO2024157842A1 (https=)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20250136371A (ko) 2023-01-25 2025-09-16 캐논 아네르바 가부시키가이샤 X선 발생 장치 및 x선 촬상 장치
WO2025057338A1 (ja) * 2023-09-13 2025-03-20 キヤノンアネルバ株式会社 Ｘ線発生装置およびｘ線撮像装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2016103451A (ja) 2014-11-28 2016-06-02 キヤノン株式会社 Ｘ線発生管、ｘ線発生装置およびｘ線撮影システム

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5921153B2 (ja) * 2011-11-09 2016-05-24 キヤノン株式会社 放射線発生管および放射線発生装置
JP2014154423A (ja) * 2013-02-12 2014-08-25 Toshiba Corp Ｘ線発生装置
JP6230389B2 (ja) * 2013-06-05 2017-11-15 キヤノン株式会社 Ｘ線発生管及びそれを用いたｘ線発生装置とｘ線撮影システム
JP6415250B2 (ja) * 2014-10-29 2018-10-31 キヤノン株式会社 Ｘ線発生管、ｘ線発生装置及びｘ線撮影システム
JP6525941B2 (ja) * 2016-10-28 2019-06-05 キヤノン株式会社 Ｘ線発生装置及び、ｘ線撮影システム
CN113272931B (zh) * 2018-12-28 2022-10-18 佳能安内华股份有限公司 X射线产生管、x射线产生装置及x射线成像装置
CN113632195B (zh) * 2019-04-15 2022-05-27 佳能安内华股份有限公司 X射线产生装置和x射线成像装置
JP6792676B1 (ja) * 2019-07-24 2020-11-25 浜松ホトニクス株式会社 Ｘ線管
WO2021044524A1 (ja) * 2019-09-03 2021-03-11 キヤノンアネルバ株式会社 Ｘ線発生装置およびｘ線撮像装置
WO2021044525A1 (ja) * 2019-09-03 2021-03-11 キヤノンアネルバ株式会社 Ｘ線発生装置およびｘ線撮影装置

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2016103451A (ja) 2014-11-28 2016-06-02 キヤノン株式会社 Ｘ線発生管、ｘ線発生装置およびｘ線撮影システム

Also Published As

Publication number Publication date
CN120584548A (zh) 2025-09-02
EP4657487A1 (en) 2025-12-03
JP7486694B1 (ja) 2024-05-17
US20250351256A1 (en) 2025-11-13
TW202503808A (zh) 2025-01-16
JPWO2024157531A1 (https=) 2024-08-02
CN120604315A (zh) 2025-09-05
WO2024157842A1 (ja) 2024-08-02
TW202503807A (zh) 2025-01-16
US20250349489A1 (en) 2025-11-13
JPWO2024157842A1 (https=) 2024-08-02
KR20250135857A (ko) 2025-09-15

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