JPWO2024157531A1 - - Google Patents

Info

Publication number
JPWO2024157531A1
JPWO2024157531A1 JP2024506267A JP2024506267A JPWO2024157531A1 JP WO2024157531 A1 JPWO2024157531 A1 JP WO2024157531A1 JP 2024506267 A JP2024506267 A JP 2024506267A JP 2024506267 A JP2024506267 A JP 2024506267A JP WO2024157531 A1 JPWO2024157531 A1 JP WO2024157531A1
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2024506267A
Other languages
Japanese (ja)
Other versions
JP7486694B1 (ja
JPWO2024157531A5 (https=
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from PCT/JP2023/002275 external-priority patent/WO2024157394A1/ja
Application filed filed Critical
Application granted granted Critical
Publication of JP7486694B1 publication Critical patent/JP7486694B1/ja
Publication of JPWO2024157531A1 publication Critical patent/JPWO2024157531A1/ja
Publication of JPWO2024157531A5 publication Critical patent/JPWO2024157531A5/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00X-ray tubes
    • H01J35/02Details
    • H01J35/025X-ray tubes with structurally associated circuit elements
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00X-ray tubes
    • H01J35/02Details
    • H01J35/04Electrodes ; Mutual position thereof; Constructional adaptations therefor
    • H01J35/06Cathodes
    • H01J35/064Details of the emitter, e.g. material or structure
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00X-ray tubes
    • H01J35/02Details
    • H01J35/04Electrodes ; Mutual position thereof; Constructional adaptations therefor
    • H01J35/08Anodes; Anti cathodes
    • H01J35/112Non-rotating anodes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00X-ray tubes
    • H01J35/02Details
    • H01J35/16Vessels; Containers; Shields associated therewith
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05GX-RAY TECHNIQUE
    • H05G1/00X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/02Constructional details
    • H05G1/04Mounting the X-ray tube within a closed housing
    • H05G1/06X-ray tube and at least part of the power supply apparatus being mounted within the same housing
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/10Different kinds of radiation or particles
    • G01N2223/101Different kinds of radiation or particles electromagnetic radiation
    • G01N2223/1016X-ray
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/20Sources of radiation
    • G01N2223/204Sources of radiation source created from radiated target

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • X-Ray Techniques (AREA)
JP2024506267A 2023-01-25 2023-09-13 X線発生装置およびx線撮像装置 Active JP7486694B1 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JPPCT/JP2023/002275 2023-01-25
PCT/JP2023/002275 WO2024157394A1 (ja) 2023-01-25 2023-01-25 X線発生装置およびx線撮像装置
PCT/JP2023/033426 WO2024157531A1 (ja) 2023-01-25 2023-09-13 X線発生装置およびx線撮像装置

Publications (3)

Publication Number Publication Date
JP7486694B1 JP7486694B1 (ja) 2024-05-17
JPWO2024157531A1 true JPWO2024157531A1 (https=) 2024-08-02
JPWO2024157531A5 JPWO2024157531A5 (https=) 2024-12-24

Family

ID=91067372

Family Applications (2)

Application Number Title Priority Date Filing Date
JP2024506267A Active JP7486694B1 (ja) 2023-01-25 2023-09-13 X線発生装置およびx線撮像装置
JP2024572989A Pending JPWO2024157842A1 (https=) 2023-01-25 2024-01-16

Family Applications After (1)

Application Number Title Priority Date Filing Date
JP2024572989A Pending JPWO2024157842A1 (https=) 2023-01-25 2024-01-16

Country Status (7)

Country Link
US (2) US20250351256A1 (https=)
EP (1) EP4657487A1 (https=)
JP (2) JP7486694B1 (https=)
KR (2) KR20250135849A (https=)
CN (2) CN120584548A (https=)
TW (2) TW202503807A (https=)
WO (1) WO2024157842A1 (https=)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20250136371A (ko) 2023-01-25 2025-09-16 캐논 아네르바 가부시키가이샤 X선 발생 장치 및 x선 촬상 장치
WO2025057338A1 (ja) * 2023-09-13 2025-03-20 キヤノンアネルバ株式会社 X線発生装置およびx線撮像装置

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5921153B2 (ja) * 2011-11-09 2016-05-24 キヤノン株式会社 放射線発生管および放射線発生装置
JP2014154423A (ja) * 2013-02-12 2014-08-25 Toshiba Corp X線発生装置
JP6230389B2 (ja) * 2013-06-05 2017-11-15 キヤノン株式会社 X線発生管及びそれを用いたx線発生装置とx線撮影システム
JP6415250B2 (ja) * 2014-10-29 2018-10-31 キヤノン株式会社 X線発生管、x線発生装置及びx線撮影システム
JP6468821B2 (ja) * 2014-11-28 2019-02-13 キヤノン株式会社 X線発生管、x線発生装置およびx線撮影システム
JP6525941B2 (ja) * 2016-10-28 2019-06-05 キヤノン株式会社 X線発生装置及び、x線撮影システム
CN113272931B (zh) * 2018-12-28 2022-10-18 佳能安内华股份有限公司 X射线产生管、x射线产生装置及x射线成像装置
CN113632195B (zh) * 2019-04-15 2022-05-27 佳能安内华股份有限公司 X射线产生装置和x射线成像装置
JP6792676B1 (ja) * 2019-07-24 2020-11-25 浜松ホトニクス株式会社 X線管
WO2021044524A1 (ja) * 2019-09-03 2021-03-11 キヤノンアネルバ株式会社 X線発生装置およびx線撮像装置
WO2021044525A1 (ja) * 2019-09-03 2021-03-11 キヤノンアネルバ株式会社 X線発生装置およびx線撮影装置

Also Published As

Publication number Publication date
CN120584548A (zh) 2025-09-02
EP4657487A1 (en) 2025-12-03
JP7486694B1 (ja) 2024-05-17
US20250351256A1 (en) 2025-11-13
TW202503808A (zh) 2025-01-16
CN120604315A (zh) 2025-09-05
WO2024157842A1 (ja) 2024-08-02
TW202503807A (zh) 2025-01-16
US20250349489A1 (en) 2025-11-13
JPWO2024157842A1 (https=) 2024-08-02
KR20250135849A (ko) 2025-09-15
KR20250135857A (ko) 2025-09-15

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