KR20230085203A - 처리액 순환 방법, 및 기판 처리 방법 - Google Patents

처리액 순환 방법, 및 기판 처리 방법 Download PDF

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Publication number
KR20230085203A
KR20230085203A KR1020237016562A KR20237016562A KR20230085203A KR 20230085203 A KR20230085203 A KR 20230085203A KR 1020237016562 A KR1020237016562 A KR 1020237016562A KR 20237016562 A KR20237016562 A KR 20237016562A KR 20230085203 A KR20230085203 A KR 20230085203A
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KR
South Korea
Prior art keywords
treatment liquid
pressure
circulation
pipe
processing liquid
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KR1020237016562A
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English (en)
Korean (ko)
Inventor
도모미 히구치
Original Assignee
가부시키가이샤 스크린 홀딩스
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Publication of KR20230085203A publication Critical patent/KR20230085203A/ko

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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67017Apparatus for fluid treatment
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/304Mechanical treatment, e.g. grinding, polishing, cutting

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Cleaning Or Drying Semiconductors (AREA)
  • Coating Apparatus (AREA)
KR1020237016562A 2021-02-26 2021-10-22 처리액 순환 방법, 및 기판 처리 방법 KR20230085203A (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2021031079A JP2022131885A (ja) 2021-02-26 2021-02-26 処理液循環方法、及び、基板処理方法
JPJP-P-2021-031079 2021-02-26
PCT/JP2021/039088 WO2022180928A1 (ja) 2021-02-26 2021-10-22 処理液循環方法、及び、基板処理方法

Publications (1)

Publication Number Publication Date
KR20230085203A true KR20230085203A (ko) 2023-06-13

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ID=83047932

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020237016562A KR20230085203A (ko) 2021-02-26 2021-10-22 처리액 순환 방법, 및 기판 처리 방법

Country Status (5)

Country Link
JP (1) JP2022131885A (zh)
KR (1) KR20230085203A (zh)
CN (1) CN116868315A (zh)
TW (1) TWI797826B (zh)
WO (1) WO2022180928A1 (zh)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2024042242A (ja) * 2022-09-15 2024-03-28 株式会社Screenホールディングス 基板処理装置、および、フィルタの気泡除去方法

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2019041039A (ja) 2017-08-28 2019-03-14 東京エレクトロン株式会社 液処理装置および液処理方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6605394B2 (ja) * 2016-05-17 2019-11-13 東京エレクトロン株式会社 基板液処理装置、タンク洗浄方法及び記憶媒体
JP6762184B2 (ja) * 2016-09-26 2020-09-30 株式会社Screenホールディングス 回収配管洗浄方法および基板処理装置
JP6916633B2 (ja) * 2017-02-24 2021-08-11 株式会社Screenホールディングス 処理液供給装置、基板処理装置、および処理液供給方法

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2019041039A (ja) 2017-08-28 2019-03-14 東京エレクトロン株式会社 液処理装置および液処理方法

Also Published As

Publication number Publication date
TW202234496A (zh) 2022-09-01
JP2022131885A (ja) 2022-09-07
WO2022180928A1 (ja) 2022-09-01
CN116868315A (zh) 2023-10-10
TWI797826B (zh) 2023-04-01

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