KR20230016620A - 극자외 광원의 정렬 기술 - Google Patents

극자외 광원의 정렬 기술 Download PDF

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Publication number
KR20230016620A
KR20230016620A KR1020227037425A KR20227037425A KR20230016620A KR 20230016620 A KR20230016620 A KR 20230016620A KR 1020227037425 A KR1020227037425 A KR 1020227037425A KR 20227037425 A KR20227037425 A KR 20227037425A KR 20230016620 A KR20230016620 A KR 20230016620A
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KR
South Korea
Prior art keywords
light
metrology
target
light beam
path
Prior art date
Application number
KR1020227037425A
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English (en)
Korean (ko)
Inventor
알렉산더 앤서니 샤프간스
4세 존 탐 스튜얼트
Original Assignee
에이에스엠엘 네델란즈 비.브이.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Application filed by 에이에스엠엘 네델란즈 비.브이. filed Critical 에이에스엠엘 네델란즈 비.브이.
Publication of KR20230016620A publication Critical patent/KR20230016620A/ko

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    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05GX-RAY TECHNIQUE
    • H05G2/00Apparatus or processes specially adapted for producing X-rays, not involving X-ray tubes, e.g. involving generation of a plasma
    • H05G2/001X-ray radiation generated from plasma
    • H05G2/003X-ray radiation generated from plasma being produced from a liquid or gas
    • H05G2/005X-ray radiation generated from plasma being produced from a liquid or gas containing a metal as principal radiation generating component
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70008Production of exposure light, i.e. light sources
    • G03F7/70033Production of exposure light, i.e. light sources by plasma extreme ultraviolet [EUV] sources

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Optics & Photonics (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • General Physics & Mathematics (AREA)
KR1020227037425A 2020-05-28 2021-04-26 극자외 광원의 정렬 기술 KR20230016620A (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US202063031265P 2020-05-28 2020-05-28
US63/031,265 2020-05-28
PCT/EP2021/060794 WO2021239357A1 (en) 2020-05-28 2021-04-26 Alignment of extreme ultraviolet light source

Publications (1)

Publication Number Publication Date
KR20230016620A true KR20230016620A (ko) 2023-02-02

Family

ID=75787039

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020227037425A KR20230016620A (ko) 2020-05-28 2021-04-26 극자외 광원의 정렬 기술

Country Status (4)

Country Link
KR (1) KR20230016620A (zh)
CN (1) CN115669232A (zh)
TW (1) TW202202945A (zh)
WO (1) WO2021239357A1 (zh)

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6513025B2 (ja) * 2013-09-17 2019-05-15 ギガフォトン株式会社 極端紫外光生成装置
US11029324B2 (en) * 2018-09-28 2021-06-08 Taiwan Semiconductor Manufacturing Co., Ltd. Particle image velocimetry of extreme ultraviolet lithography systems

Also Published As

Publication number Publication date
CN115669232A (zh) 2023-01-31
WO2021239357A1 (en) 2021-12-02
TW202202945A (zh) 2022-01-16

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