KR20220118301A - 광학 샘플 분석에서의 오토포커스 기능 - Google Patents
광학 샘플 분석에서의 오토포커스 기능 Download PDFInfo
- Publication number
- KR20220118301A KR20220118301A KR1020217041917A KR20217041917A KR20220118301A KR 20220118301 A KR20220118301 A KR 20220118301A KR 1020217041917 A KR1020217041917 A KR 1020217041917A KR 20217041917 A KR20217041917 A KR 20217041917A KR 20220118301 A KR20220118301 A KR 20220118301A
- Authority
- KR
- South Korea
- Prior art keywords
- light
- autofocus light
- implementations
- optical system
- autofocus
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/645—Specially adapted constructive features of fluorimeters
- G01N21/6456—Spatial resolved fluorescence measurements; Imaging
- G01N21/6458—Fluorescence microscopy
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/06—Means for illuminating specimens
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/24—Base structure
- G02B21/241—Devices for focusing
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/24—Base structure
- G02B21/241—Devices for focusing
- G02B21/245—Devices for focusing using auxiliary sources, detectors
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/42—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect
- G02B27/4233—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect having a diffractive element [DOE] contributing to a non-imaging application
- G02B27/425—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect having a diffractive element [DOE] contributing to a non-imaging application in illumination systems
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/04—Prisms
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B7/00—Mountings, adjusting means, or light-tight connections, for optical elements
- G02B7/02—Mountings, adjusting means, or light-tight connections, for optical elements for lenses
- G02B7/04—Mountings, adjusting means, or light-tight connections, for optical elements for lenses with mechanism for focusing or varying magnification
- G02B7/09—Mountings, adjusting means, or light-tight connections, for optical elements for lenses with mechanism for focusing or varying magnification adapted for automatic focusing or varying magnification
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B7/00—Mountings, adjusting means, or light-tight connections, for optical elements
- G02B7/28—Systems for automatic generation of focusing signals
- G02B7/30—Systems for automatic generation of focusing signals using parallactic triangle with a base line
- G02B7/32—Systems for automatic generation of focusing signals using parallactic triangle with a base line using active means, e.g. light emitter
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
- G01N21/03—Cuvette constructions
- G01N21/05—Flow-through cuvettes
- G01N2021/058—Flat flow cell
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/645—Specially adapted constructive features of fluorimeters
- G01N2021/6463—Optics
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/645—Specially adapted constructive features of fluorimeters
- G01N2021/6482—Sample cells, cuvettes
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Health & Medical Sciences (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Life Sciences & Earth Sciences (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Automatic Focus Adjustment (AREA)
- Microscoopes, Condenser (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Applications Claiming Priority (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201962956083P | 2019-12-31 | 2019-12-31 | |
| US62/956,083 | 2019-12-31 | ||
| US202062959681P | 2020-01-10 | 2020-01-10 | |
| US62/959,681 | 2020-01-10 | ||
| PCT/US2020/070951 WO2021138633A1 (en) | 2019-12-31 | 2020-12-22 | Autofocus functionality in optical sample analysis |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR20220118301A true KR20220118301A (ko) | 2022-08-25 |
Family
ID=76546085
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020217041917A Pending KR20220118301A (ko) | 2019-12-31 | 2020-12-22 | 광학 샘플 분석에서의 오토포커스 기능 |
Country Status (12)
| Country | Link |
|---|---|
| US (3) | US11815458B2 (https=) |
| EP (2) | EP3990891B1 (https=) |
| JP (1) | JP7716994B2 (https=) |
| KR (1) | KR20220118301A (https=) |
| CN (4) | CN217561823U (https=) |
| AU (1) | AU2020418180A1 (https=) |
| CA (1) | CA3144819A1 (https=) |
| IL (1) | IL289312B2 (https=) |
| MX (1) | MX2021016073A (https=) |
| SA (1) | SA521431290B1 (https=) |
| TW (2) | TWI866056B (https=) |
| WO (1) | WO2021138633A1 (https=) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US12038622B2 (en) | 2022-11-11 | 2024-07-16 | Samsung Electro-Mechanics Co., Ltd. | Optical imaging system |
| US12517419B2 (en) | 2022-11-09 | 2026-01-06 | Samsung Electro-Mechanics Co., Ltd. | Optical imaging system |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102019008989B3 (de) * | 2019-12-21 | 2021-06-24 | Abberior Instruments Gmbh | Verfahren zur Störungskorrektur und Laserscanningmikroskop mit Störungskorrektur |
| EP4092462A1 (en) * | 2021-05-18 | 2022-11-23 | Leica Instruments (Singapore) Pte. Ltd. | Laser assisted autofocus |
| US20230051226A1 (en) | 2021-08-10 | 2023-02-16 | Mgi Tech Co., Ltd. | Flow cell imaging systems and methods, and flow cells and other substrates for use in the same |
| CN113687492B (zh) * | 2021-08-17 | 2025-08-15 | 深圳市卡提列光学技术有限公司 | 自动调焦系统 |
| FR3128994B1 (fr) * | 2021-11-08 | 2024-03-15 | Inst De Radioprotection Et De Surete Nucleaire | Module d’observation et dispositif associe de detection de la presence d’au moins une particule d’un aerosol |
| WO2024158609A1 (en) * | 2023-01-23 | 2024-08-02 | University Of Pittsburgh-Of The Commonwealth System Of Higher Education | Hyper-throughput, multiplex, single molecule imaging platform |
| CN118795654B (zh) * | 2024-08-23 | 2025-11-14 | 长三角物理研究中心有限公司 | 一种三维单转盘共聚焦显微镜 |
Family Cites Families (51)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FI67588C (fi) * | 1983-01-26 | 1985-04-10 | Ahlstroem Oy | Silplaot |
| US5557315A (en) * | 1994-08-18 | 1996-09-17 | Eastman Kodak Company | Digital printer using a modulated white light exposure source |
| CA2293980A1 (en) * | 2000-01-07 | 2001-07-07 | Gang He | Optical spectrum analyzer |
| US6661580B1 (en) * | 2000-03-10 | 2003-12-09 | Kla-Tencor Technologies Corporation | High transmission optical inspection tools |
| US6947133B2 (en) * | 2000-08-08 | 2005-09-20 | Carl Zeiss Jena Gmbh | Method for increasing the spectral and spatial resolution of detectors |
| US6674522B2 (en) * | 2001-05-04 | 2004-01-06 | Kla-Tencor Technologies Corporation | Efficient phase defect detection system and method |
| AU2003207248A1 (en) * | 2002-02-07 | 2003-09-02 | Fuji Electric Holdings Co., Ltd. | Fluorescent image measuring method and device |
| JP4370554B2 (ja) * | 2002-06-14 | 2009-11-25 | 株式会社ニコン | オートフォーカス装置およびオートフォーカス付き顕微鏡 |
| US7221452B2 (en) * | 2002-08-07 | 2007-05-22 | Coherent, Inc. | Tunable optical filter, optical apparatus for use therewith and method utilizing same |
| US7345814B2 (en) * | 2003-09-29 | 2008-03-18 | Olympus Corporation | Microscope system and microscope focus maintaining device for the same |
| CN101031837B (zh) * | 2004-07-23 | 2011-06-15 | 通用电气医疗集团尼亚加拉有限公司 | 用于荧光共焦显微镜检查的方法和设备 |
| US7889348B2 (en) * | 2005-10-14 | 2011-02-15 | The General Hospital Corporation | Arrangements and methods for facilitating photoluminescence imaging |
| US7329860B2 (en) * | 2005-11-23 | 2008-02-12 | Illumina, Inc. | Confocal imaging methods and apparatus |
| US7838302B2 (en) * | 2006-08-07 | 2010-11-23 | President And Fellows Of Harvard College | Sub-diffraction limit image resolution and other imaging techniques |
| US20090325211A1 (en) * | 2007-10-06 | 2009-12-31 | Ye Fang | System and method for dual-detection of a cellular response |
| US8908151B2 (en) * | 2008-02-14 | 2014-12-09 | Nikon Corporation | Illumination optical system, exposure apparatus, device manufacturing method, compensation filter, and exposure optical system |
| US8173080B2 (en) * | 2008-02-14 | 2012-05-08 | Illumina, Inc. | Flow cells and manifolds having an electroosmotic pump |
| GB2460648A (en) * | 2008-06-03 | 2009-12-09 | M Solv Ltd | Method and apparatus for laser focal spot size control |
| US20100157086A1 (en) * | 2008-12-15 | 2010-06-24 | Illumina, Inc | Dynamic autofocus method and system for assay imager |
| EP3151052B1 (en) * | 2010-02-01 | 2025-03-26 | Illumina, Inc. | Focusing methods and optical systems and assemblies using the same |
| DE202011003570U1 (de) * | 2010-03-06 | 2012-01-30 | Illumina, Inc. | Systeme und Vorrichtungen zum Detektieren optischer Signale aus einer Probe |
| DE102010017630B4 (de) * | 2010-06-29 | 2016-06-02 | Leica Microsystems Cms Gmbh | Verfahren und Einrichtung zur lichtmikroskopischen Abbildung einer Probenstruktur |
| DE102010036709A1 (de) * | 2010-07-28 | 2012-02-02 | Leica Microsystems Cms Gmbh | Einrichtung und Verfahren zur mikroskopischen Bildaufnahme einer Probenstruktur |
| DE102011050030B4 (de) * | 2011-05-02 | 2013-03-28 | Scanlab Ag | Positionsdetektor und Lichtablenkvorrichtung mit Positionsdetektor |
| JP2014521114A (ja) * | 2011-06-30 | 2014-08-25 | ジーイー・ヘルスケア・バイオサイエンス・コーポレイション | 生体イメージングの画像品質最適化 |
| DE102011053232B4 (de) * | 2011-09-02 | 2020-08-06 | Leica Microsystems Cms Gmbh | Mikroskopische Einrichtung und mikroskopisches Verfahren zur dreidimensionalen Lokalisierung von punktförmigen Objekten |
| DE102011082756A1 (de) * | 2011-09-15 | 2013-03-21 | Leica Microsystems (Schweiz) Ag | Autofokussierverfahren und -einrichtung für ein Mikroskop |
| US10001622B2 (en) * | 2011-10-25 | 2018-06-19 | Sanford Burnham Medical Research Institute | Multifunction autofocus system and method for automated microscopy |
| EP2834622B1 (en) * | 2012-04-03 | 2023-04-12 | Illumina, Inc. | Integrated optoelectronic read head and fluidic cartridge useful for nucleic acid sequencing |
| DE102012009836A1 (de) * | 2012-05-16 | 2013-11-21 | Carl Zeiss Microscopy Gmbh | Lichtmikroskop und Verfahren zur Bildaufnahme mit einem Lichtmikroskop |
| CN206281782U (zh) | 2013-08-28 | 2017-06-27 | 伊鲁米那股份有限公司 | 检查设备及光学检测装置 |
| US8809809B1 (en) * | 2013-09-27 | 2014-08-19 | Hong Kong Applied Science and Technology Research Institute Company Limited | Apparatus and method for focusing in fluorescence microscope |
| FR3020684B1 (fr) * | 2014-04-30 | 2017-05-19 | Horiba Jobin Yvon Sas | Systeme et procede de spectrometrie de decharge luminescente et de mesure in situ de la profondeur de gravure d'un echantillon |
| WO2016027453A1 (ja) | 2014-08-18 | 2016-02-25 | 国立大学法人大阪大学 | ラマン分光顕微鏡及びラマン散乱光観察方法 |
| US9897791B2 (en) * | 2014-10-16 | 2018-02-20 | Illumina, Inc. | Optical scanning systems for in situ genetic analysis |
| WO2016157458A1 (ja) * | 2015-03-31 | 2016-10-06 | 株式会社ニコン | 測定装置、測定システム、信号列処理方法、プログラム |
| EP3344964A2 (en) * | 2015-09-01 | 2018-07-11 | Qiagen Instruments AG | Systems and methods for color detection in high-throughput nucleic acid sequencing systems |
| DE102015116452A1 (de) * | 2015-09-29 | 2017-03-30 | Carl Zeiss Microscopy Gmbh | Mikroskop |
| KR20180108578A (ko) * | 2016-01-11 | 2018-10-04 | 일루미나, 인코포레이티드 | 마이크로 형광 측정기, 유체 시스템, 및 플로우 셀 래치 클램프 모듈을 구비하는 검출 장치 |
| JP2019520574A (ja) * | 2016-06-21 | 2019-07-18 | エスアールアイ インターナショナルSRI International | ハイパースペクトルイメージング方法および装置 |
| US10712270B2 (en) * | 2016-10-11 | 2020-07-14 | National University Corporation Kobe University | Digital holographic microscope |
| NL2018857B1 (en) | 2017-05-05 | 2018-11-09 | Illumina Inc | Systems and methods for improved focus tracking using a light source configuration |
| NL2018853B1 (en) * | 2017-05-05 | 2018-11-14 | Illumina Inc | Systems and methods for improved focus tracking using a hybrid mode light source |
| NL2018854B1 (en) * | 2017-05-05 | 2018-11-14 | Illumina Inc | Systems and methodes for improved focus tracking using blocking structures |
| NL2018855B1 (en) * | 2017-05-05 | 2018-11-14 | Illumina Inc | Laser line illuminator for high throughput sequencing |
| DE102017218449B3 (de) * | 2017-10-16 | 2019-02-21 | Leica Microsystems Cms Gmbh | Mikroskopieverfahren mit Fokusstabilisierung, Recheneinheit, Mikroskopsystem und Computerprogrammprodukt |
| KR102438502B1 (ko) * | 2017-12-04 | 2022-09-01 | 에이에스엠엘 네델란즈 비.브이. | 측정 방법, 패터닝 디바이스 및 디바이스 제조 방법 |
| RU2739571C1 (ru) * | 2018-03-09 | 2020-12-25 | Иллюмина Кембридж Лимитед | Генерализованное стохастическое секвенирование сверхразрешения |
| EP3614192A1 (en) * | 2018-08-20 | 2020-02-26 | Till GmbH | Microscope device |
| CN108761624B (zh) * | 2018-09-03 | 2023-10-24 | 中国科学院武汉物理与数学研究所 | 大入射视场角和超高消光比的楔形偏振分光棱镜 |
| US12117606B2 (en) * | 2019-08-27 | 2024-10-15 | SCREEN Holdings Co., Ltd. | MEMs phased-array for LiDAR applications |
-
2020
- 2020-12-22 MX MX2021016073A patent/MX2021016073A/es unknown
- 2020-12-22 EP EP20909529.8A patent/EP3990891B1/en active Active
- 2020-12-22 WO PCT/US2020/070951 patent/WO2021138633A1/en not_active Ceased
- 2020-12-22 CA CA3144819A patent/CA3144819A1/en active Pending
- 2020-12-22 KR KR1020217041917A patent/KR20220118301A/ko active Pending
- 2020-12-22 AU AU2020418180A patent/AU2020418180A1/en active Pending
- 2020-12-22 US US17/247,777 patent/US11815458B2/en active Active
- 2020-12-22 IL IL289312A patent/IL289312B2/en unknown
- 2020-12-22 JP JP2021577121A patent/JP7716994B2/ja active Active
- 2020-12-22 EP EP25220231.2A patent/EP4682612A3/en active Pending
- 2020-12-24 TW TW112104260A patent/TWI866056B/zh active
- 2020-12-24 TW TW109146010A patent/TWI794708B/zh active
- 2020-12-30 CN CN202220443018.9U patent/CN217561823U/zh active Active
- 2020-12-30 CN CN202011613363.4A patent/CN113064266B/zh active Active
- 2020-12-30 CN CN202023330037.0U patent/CN215953954U/zh active Active
- 2020-12-30 CN CN202510133921.3A patent/CN119937145A/zh active Pending
-
2021
- 2021-12-30 SA SA521431290A patent/SA521431290B1/ar unknown
-
2023
- 2023-10-04 US US18/480,803 patent/US20240027349A1/en not_active Abandoned
-
2024
- 2024-11-06 US US18/939,115 patent/US20250123208A1/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US12517419B2 (en) | 2022-11-09 | 2026-01-06 | Samsung Electro-Mechanics Co., Ltd. | Optical imaging system |
| US12038622B2 (en) | 2022-11-11 | 2024-07-16 | Samsung Electro-Mechanics Co., Ltd. | Optical imaging system |
Also Published As
| Publication number | Publication date |
|---|---|
| CN113064266A (zh) | 2021-07-02 |
| US11815458B2 (en) | 2023-11-14 |
| EP3990891C0 (en) | 2025-12-03 |
| IL289312B1 (en) | 2024-11-01 |
| EP4682612A2 (en) | 2026-01-21 |
| TW202127083A (zh) | 2021-07-16 |
| EP3990891B1 (en) | 2025-12-03 |
| IL289312A (en) | 2022-02-01 |
| BR112021026660A2 (pt) | 2022-07-12 |
| CN215953954U (zh) | 2022-03-04 |
| JP7716994B2 (ja) | 2025-08-01 |
| TWI866056B (zh) | 2024-12-11 |
| TW202331329A (zh) | 2023-08-01 |
| EP3990891A1 (en) | 2022-05-04 |
| EP3990891A4 (en) | 2023-07-26 |
| US20210199587A1 (en) | 2021-07-01 |
| EP4682612A3 (en) | 2026-04-15 |
| CN217561823U (zh) | 2022-10-11 |
| JP2023510438A (ja) | 2023-03-14 |
| CN113064266B (zh) | 2025-02-25 |
| CA3144819A1 (en) | 2021-07-08 |
| SA521431290B1 (ar) | 2024-07-10 |
| US20240027349A1 (en) | 2024-01-25 |
| CN119937145A (zh) | 2025-05-06 |
| TWI794708B (zh) | 2023-03-01 |
| IL289312B2 (en) | 2025-03-01 |
| US20250123208A1 (en) | 2025-04-17 |
| WO2021138633A1 (en) | 2021-07-08 |
| AU2020418180A1 (en) | 2022-01-06 |
| MX2021016073A (es) | 2022-03-25 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP7716994B2 (ja) | 光学試料分析におけるオートフォーカス機能 | |
| US11604346B2 (en) | Structured illumination of a sample | |
| JP7237100B2 (ja) | 試料の構造化照明 | |
| RU2832005C1 (ru) | Функция автофокусировки в оптическом анализе проб | |
| HK40055224A (en) | Improved autofocus functionality in optical sample analysis | |
| HK40055224B (zh) | 在光学样本分析中改进的自动聚焦功能 | |
| US20140217267A1 (en) | Method and device for coupling a light beam into a foil | |
| BR112021026660B1 (pt) | Método | |
| US12411327B2 (en) | Performing structured illumination microscopy on a patterned substrate |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PA0105 | International application |
St.27 status event code: A-0-1-A10-A15-nap-PA0105 |
|
| P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |
|
| P13-X000 | Application amended |
St.27 status event code: A-2-2-P10-P13-nap-X000 |
|
| PG1501 | Laying open of application |
St.27 status event code: A-1-1-Q10-Q12-nap-PG1501 |
|
| E13-X000 | Pre-grant limitation requested |
St.27 status event code: A-2-3-E10-E13-lim-X000 |
|
| P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |
|
| P13-X000 | Application amended |
St.27 status event code: A-2-2-P10-P13-nap-X000 |
|
| PA0201 | Request for examination |
St.27 status event code: A-1-2-D10-D11-exm-PA0201 |
|
| D21 | Rejection of application intended |
Free format text: ST27 STATUS EVENT CODE: A-1-2-D10-D21-EXM-PE0902 (AS PROVIDED BY THE NATIONAL OFFICE) |
|
| PE0902 | Notice of grounds for rejection |
St.27 status event code: A-1-2-D10-D21-exm-PE0902 |
|
| E13 | Pre-grant limitation requested |
Free format text: ST27 STATUS EVENT CODE: A-2-3-E10-E13-LIM-X000 (AS PROVIDED BY THE NATIONAL OFFICE) |
|
| E13-X000 | Pre-grant limitation requested |
St.27 status event code: A-2-3-E10-E13-lim-X000 |
|
| P11 | Amendment of application requested |
Free format text: ST27 STATUS EVENT CODE: A-2-2-P10-P11-NAP-X000 (AS PROVIDED BY THE NATIONAL OFFICE) |
|
| P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |