KR20200064076A - 회로 배열의 테스팅 및 교정 - Google Patents

회로 배열의 테스팅 및 교정 Download PDF

Info

Publication number
KR20200064076A
KR20200064076A KR1020207009048A KR20207009048A KR20200064076A KR 20200064076 A KR20200064076 A KR 20200064076A KR 1020207009048 A KR1020207009048 A KR 1020207009048A KR 20207009048 A KR20207009048 A KR 20207009048A KR 20200064076 A KR20200064076 A KR 20200064076A
Authority
KR
South Korea
Prior art keywords
reference current
sensor electrode
circuit
current
current source
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
KR1020207009048A
Other languages
English (en)
Korean (ko)
Inventor
악셀 니마이어
Original Assignee
베링거잉겔하임베트메디카게엠베하
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 베링거잉겔하임베트메디카게엠베하 filed Critical 베링거잉겔하임베트메디카게엠베하
Publication of KR20200064076A publication Critical patent/KR20200064076A/ko
Ceased legal-status Critical Current

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2839—Fault-finding or characterising using signal generators, power supplies or circuit analysers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/12—Measuring rate of change
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
    • G01R19/252—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques using analogue/digital converters of the type with conversion of voltage or current into frequency and measuring of this frequency
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2829—Testing of circuits in sensor or actuator systems
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02H—EMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS
    • H02H1/00—Details of emergency protective circuit arrangements
    • H02H1/0007—Details of emergency protective circuit arrangements concerning the detecting means
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02H—EMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS
    • H02H3/00—Emergency protective circuit arrangements for automatic disconnection directly responsive to an undesired change from normal electric working condition with or without subsequent reconnection ; integrated protection
    • H02H3/08—Emergency protective circuit arrangements for automatic disconnection directly responsive to an undesired change from normal electric working condition with or without subsequent reconnection ; integrated protection responsive to excess current

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Electromagnetism (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
KR1020207009048A 2017-09-29 2018-09-27 회로 배열의 테스팅 및 교정 Ceased KR20200064076A (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP17020448.1 2017-09-29
EP17020448 2017-09-29
PCT/EP2018/076209 WO2019063663A1 (en) 2017-09-29 2018-09-27 TESTING AND CALIBRATION OF A CIRCUIT ARRANGEMENT

Publications (1)

Publication Number Publication Date
KR20200064076A true KR20200064076A (ko) 2020-06-05

Family

ID=60019665

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020207009048A Ceased KR20200064076A (ko) 2017-09-29 2018-09-27 회로 배열의 테스팅 및 교정

Country Status (8)

Country Link
US (1) US10921368B2 (enExample)
EP (1) EP3673274B1 (enExample)
JP (1) JP2020535422A (enExample)
KR (1) KR20200064076A (enExample)
CN (1) CN111108398A (enExample)
BR (1) BR112020006261A2 (enExample)
CA (1) CA3074169A1 (enExample)
WO (1) WO2019063663A1 (enExample)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2022219720A1 (ja) * 2021-04-13 2022-10-20 三菱電機株式会社 半導体集積回路および半導体装置

Family Cites Families (35)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3711779A (en) 1970-11-17 1973-01-16 Instrumentation Specialties Co Apparatus for determining and characterizing the slopes of time-varying signals
US4199728A (en) 1978-08-21 1980-04-22 Innovative Medical Systems, Corp. Slope detector
DE3034124A1 (de) * 1980-09-11 1982-04-22 Knorr-Bremse GmbH, 8000 München Schaltungsanordnung zur digitalen messung einer zeitveraenderlichen groesse
JP3372866B2 (ja) * 1998-04-08 2003-02-04 三基システムエンジニアリング株式会社 封止破壊検知装置
JP4268266B2 (ja) * 1999-06-10 2009-05-27 日本特殊陶業株式会社 配線基板の導体層形成工程の検査方法
CN2436941Y (zh) * 2000-07-27 2001-06-27 李坤 电信线路故障检测仪
EP1278073A1 (de) * 2001-07-20 2003-01-22 ENSECO GmbH Einrichtung zur Messung des fliessenden elektrischen Stromes in mindestens einem elektrischen Leiter und Verfahren zur Fehlerkorrektur von solchen Einrichtungen
DE10203996A1 (de) * 2002-02-01 2003-08-21 Infineon Technologies Ag Schaltkreis-Anordnung, Redox-Recycling-Sensor, Sensor-Anordnung und Verfahren zum Verarbeiten eines über eine Sensor-Elektrode bereitgestellten Stromsignals
DE10321490B3 (de) * 2002-02-05 2004-10-14 Infineon Technologies Ag Schaltkreis-Anordnung, elektrochemischer Sensor, Sensor-Anordnung und Verfahren zum Verarbeiten eines über eine Sensor-Elektrode bereitgestellten Stromsignals
DE10204652B4 (de) * 2002-02-05 2004-07-22 Infineon Technologies Ag Schaltkreis-Anordnung, elektrochemischer Sensor, Sensor-Anordnung und Verfahren zum Verarbeiten eines über eine Sensor-Elektrode bereitgestellten Stromsignals
DE10221885B4 (de) * 2002-05-16 2005-12-29 Infineon Technologies Ag Sensor-Einheit, Sensor-Anordnung und Verfahren zum Betreiben einer Sensor-Einheit
WO2004005908A1 (ja) * 2002-07-02 2004-01-15 Matsushita Electric Industrial Co., Ltd. バイオセンサ，バイオセンサチップ及びバイオセンサ装置
EP1636599B1 (de) 2003-05-13 2007-05-02 Siemens Aktiengesellschaft Schaltkreisanordnung zur potentialkonstanthaltung an einem biosensor und zur digitalisierung des messstroms
CN1281924C (zh) * 2004-03-25 2006-10-25 浙江大学 基于电压频率变换原理的低成本高精度测量方法
DE102004025580A1 (de) 2004-05-25 2005-12-22 Infineon Technologies Ag Sensor-Anordnung, Sensor-Array und Verfahren zum Herstellen einer Sensor-Anordnung
DE102004059960A1 (de) * 2004-12-13 2006-06-22 Bourns, Inc., Riverside Schaltungsanordnung zur Messung eines elektrischen Stromes
CN1818681A (zh) * 2005-01-21 2006-08-16 三洋电机株式会社 电压－频率转换装置及其基准电压变更方法
GB2436619B (en) * 2005-12-19 2010-10-06 Toumaz Technology Ltd Sensor circuits
TWI296457B (en) * 2006-01-18 2008-05-01 Univ Yuan Ze High-performance power conditioner for solar photovoltaic system
AT503742B8 (de) * 2006-05-15 2011-08-15 Arc Austrian Res Centers Gmbh Elektronische biosensoranordnung
CN101281191B (zh) * 2007-11-14 2012-10-10 石西增 一种对磁敏传感生物芯片进行自动测量的仪器
WO2009082706A1 (en) * 2007-12-21 2009-07-02 The Trustees Of Columbia University In The City Of New York Active cmos sensor array for electrochemical biomolecular detection
JP5635989B2 (ja) * 2008-10-16 2014-12-03 コーニンクレッカ フィリップス エヌ ヴェ インピーダンス測定回路及び方法
FR2956212B1 (fr) * 2010-02-08 2012-03-09 Schneider Electric Ind Sas Dispositif et procede de comptage d'energie electrique
US20110208435A1 (en) * 2010-02-25 2011-08-25 Lifescan Scotland Ltd. Capacitance detection in electrochemical assays
JP5201194B2 (ja) * 2010-10-28 2013-06-05 株式会社デンソー 粒子状物質検出装置及び粒子状物質検出素子の製造方法
CN102299752B (zh) * 2011-05-27 2013-12-11 上海信朴臻微电子有限公司 预校准射频功率检测器
CN102411117B (zh) * 2011-08-09 2014-07-02 中国电力科学研究院 一种基于分布式智能多重校准的配电网短路故障定位方法
JP2013134078A (ja) * 2011-12-26 2013-07-08 Denso Corp 容量式物理量検出装置
GB2518592B (en) * 2013-08-06 2016-02-24 Ge Aviat Systems Ltd Built-in testing of an arc fault/transient detector
CN103543323A (zh) * 2013-11-05 2014-01-29 云南省计量测试技术研究院 大直流充放电设施电流检测装置
CN104635104B (zh) * 2013-11-14 2017-11-24 宁波舜宇光电信息有限公司 一种摄像模组断路短路自动测试设备及其测试方法
CN203658433U (zh) * 2013-11-25 2014-06-18 中国船舶重工集团公司第七一九研究所 一种高灵敏度宽量程电流放大变换电路
CN106501617B (zh) * 2016-12-22 2023-05-02 华南理工大学 介质材料测量件的校准方法、短路校准件、介质材料测量方法及装置
CN106990321A (zh) * 2017-03-22 2017-07-28 武汉双微电气股份有限公司 基于电压监测的配电线路故障识别装置

Also Published As

Publication number Publication date
BR112020006261A2 (pt) 2020-10-20
CA3074169A1 (en) 2019-04-04
US10921368B2 (en) 2021-02-16
EP3673274A1 (en) 2020-07-01
US20190101584A1 (en) 2019-04-04
WO2019063663A1 (en) 2019-04-04
JP2020535422A (ja) 2020-12-03
EP3673274B1 (en) 2021-09-01
CN111108398A (zh) 2020-05-05

Similar Documents

Publication Publication Date Title
US7914655B2 (en) Potentiostatic circuit arrangement on a biosensor for digitisation of the measured current
US10663423B2 (en) System for detecting electrical properties of a molecular complex
US6990422B2 (en) Method of analyzing the time-varying electrical response of a stimulated target substance
JP4004473B2 (ja) 回路構成、電気化学センサ、センサ構成、およびセンサ電極を介して電気信号を処理する方法
Lee et al. CMOS capacitive biosensor with enhanced sensitivity for label-free DNA detection
JP2008256721A (ja) バイオセンサおよびバイオセンサ装置
JP5769020B2 (ja) 複数の電極を備えたｉｃチップ
KR20200064076A (ko) 회로 배열의 테스팅 및 교정
US6922081B2 (en) Electronic circuit, sensor arrangement and method for processing a sensor signal
US20060267570A1 (en) Apparatus and method for testing bio-semiconductor integrated circuits
US20060292708A1 (en) Circuit arrangement, redox recycling sensor, sensor assembly and a method for processing a current signal provided by a sensor electrode
EP4306948A1 (en) Validation of electrochemical measurements using a potentiostat
DE10321490B3 (de) Schaltkreis-Anordnung, elektrochemischer Sensor, Sensor-Anordnung und Verfahren zum Verarbeiten eines über eine Sensor-Elektrode bereitgestellten Stromsignals
CN112384794A (zh) 用于运行用于证明测量气体中的具有结合氧的测量气体成分的至少一个份额的传感器的方法
US9395332B2 (en) Controlled slew rate transition for electrochemical analysis

Legal Events

Date Code Title Description
PA0105 International application

Patent event date: 20200327

Patent event code: PA01051R01D

Comment text: International Patent Application

PG1501 Laying open of application
A201 Request for examination
PA0201 Request for examination

Patent event code: PA02012R01D

Patent event date: 20210927

Comment text: Request for Examination of Application

E902 Notification of reason for refusal
PE0902 Notice of grounds for rejection

Comment text: Notification of reason for refusal

Patent event date: 20230810

Patent event code: PE09021S01D

E601 Decision to refuse application
PE0601 Decision on rejection of patent

Patent event date: 20231109

Comment text: Decision to Refuse Application

Patent event code: PE06012S01D

Patent event date: 20230810

Comment text: Notification of reason for refusal

Patent event code: PE06011S01I