KR20170100068A - 균일한 증착을 위한 장치 및 방법 - Google Patents
균일한 증착을 위한 장치 및 방법 Download PDFInfo
- Publication number
- KR20170100068A KR20170100068A KR1020177023703A KR20177023703A KR20170100068A KR 20170100068 A KR20170100068 A KR 20170100068A KR 1020177023703 A KR1020177023703 A KR 1020177023703A KR 20177023703 A KR20177023703 A KR 20177023703A KR 20170100068 A KR20170100068 A KR 20170100068A
- Authority
- KR
- South Korea
- Prior art keywords
- collimator
- chamber
- sputtering target
- aspect ratio
- substrate support
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
- 238000000034 method Methods 0.000 title claims abstract description 28
- 230000008021 deposition Effects 0.000 title claims description 19
- 239000000758 substrate Substances 0.000 claims abstract description 72
- 239000000463 material Substances 0.000 claims abstract description 30
- 230000002093 peripheral effect Effects 0.000 claims abstract description 26
- 238000000151 deposition Methods 0.000 claims abstract description 23
- 238000004544 sputter deposition Methods 0.000 claims abstract description 17
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 claims description 37
- 238000005477 sputtering target Methods 0.000 claims description 24
- 230000007423 decrease Effects 0.000 claims description 15
- 230000002829 reductive effect Effects 0.000 claims description 6
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 5
- 229910052802 copper Inorganic materials 0.000 claims description 5
- 239000010949 copper Substances 0.000 claims description 5
- 230000008569 process Effects 0.000 claims description 5
- 229910052782 aluminium Inorganic materials 0.000 claims description 4
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 4
- 229910001220 stainless steel Inorganic materials 0.000 claims description 3
- 239000010935 stainless steel Substances 0.000 claims description 3
- 230000003247 decreasing effect Effects 0.000 abstract description 2
- 238000005240 physical vapour deposition Methods 0.000 description 15
- 239000010410 layer Substances 0.000 description 8
- 150000002500 ions Chemical class 0.000 description 7
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 6
- 239000007789 gas Substances 0.000 description 6
- 229910052786 argon Inorganic materials 0.000 description 3
- 230000006870 function Effects 0.000 description 3
- 239000012212 insulator Substances 0.000 description 3
- 0 CC(C(C)C(C(C)C(C(C)C1C(C)C(C)C2C(C)C3*C4**5)C6C7C1C2C1C3C2C4C3C5*C4C(C)(C*5CCC5)C(C)C5C(C)C8C)C9C6C6%10)C%11C9C9C6C6C%12C%13C%14C%15=C%16C(C)=C%17C%18=C%19C(C)=C%15C%15C%20C%14C%14C%12C%10C7C1C%14C2C%20C3C4C%15C5C%19C8C(C)C%18C(C)C(C(C)C(C)C1C(C)C(*C2**3)C4C5C2C2C3*3)C%17C1C4C%16C%13C5C6C2C9C3C%11C Chemical compound CC(C(C)C(C(C)C(C(C)C1C(C)C(C)C2C(C)C3*C4**5)C6C7C1C2C1C3C2C4C3C5*C4C(C)(C*5CCC5)C(C)C5C(C)C8C)C9C6C6%10)C%11C9C9C6C6C%12C%13C%14C%15=C%16C(C)=C%17C%18=C%19C(C)=C%15C%15C%20C%14C%14C%12C%10C7C1C%14C2C%20C3C4C%15C5C%19C8C(C)C%18C(C)C(C(C)C(C)C1C(C)C(*C2**3)C4C5C2C2C3*3)C%17C1C4C%16C%13C5C6C2C9C3C%11C 0.000 description 2
- 238000001914 filtration Methods 0.000 description 2
- 230000004907 flux Effects 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 230000036961 partial effect Effects 0.000 description 2
- 230000009467 reduction Effects 0.000 description 2
- 239000010409 thin film Substances 0.000 description 2
- 230000001154 acute effect Effects 0.000 description 1
- 239000006117 anti-reflective coating Substances 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
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- 230000009286 beneficial effect Effects 0.000 description 1
- 239000002131 composite material Substances 0.000 description 1
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- 238000009792 diffusion process Methods 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 238000011049 filling Methods 0.000 description 1
- 239000010408 film Substances 0.000 description 1
- 230000000670 limiting effect Effects 0.000 description 1
- 238000011068 loading method Methods 0.000 description 1
- 230000007935 neutral effect Effects 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 239000002243 precursor Substances 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 230000000717 retained effect Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 239000002344 surface layer Substances 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
Images
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/35—Sputtering by application of a magnetic field, e.g. magnetron sputtering
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/04—Coating on selected surface areas, e.g. using masks
- C23C14/046—Coating cavities or hollow spaces, e.g. interior of tubes; Infiltration of porous substrates
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/3407—Cathode assembly for sputtering apparatus, e.g. Target
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/50—Substrate holders
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/56—Apparatus specially adapted for continuous coating; Arrangements for maintaining the vacuum, e.g. vacuum locks
- C23C14/564—Means for minimising impurities in the coating chamber such as dust, moisture, residual gases
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3411—Constructional aspects of the reactor
- H01J37/3447—Collimators, shutters, apertures
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Plasma & Fusion (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- Physical Vapour Deposition (AREA)
- Electrodes Of Semiconductors (AREA)
- Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US7313008P | 2008-06-17 | 2008-06-17 | |
| US61/073,130 | 2008-06-17 | ||
| PCT/US2009/047103 WO2009155208A2 (en) | 2008-06-17 | 2009-06-11 | Apparatus and method for uniform deposition |
Related Parent Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020167034645A Division KR20160145849A (ko) | 2008-06-17 | 2009-06-11 | 균일한 증착을 위한 장치 및 방법 |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020197023662A Division KR20190097315A (ko) | 2008-06-17 | 2009-06-11 | 균일한 증착을 위한 장치 및 방법 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR20170100068A true KR20170100068A (ko) | 2017-09-01 |
Family
ID=41413769
Family Applications (8)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020177023703A Ceased KR20170100068A (ko) | 2008-06-17 | 2009-06-11 | 균일한 증착을 위한 장치 및 방법 |
| KR1020197023662A Ceased KR20190097315A (ko) | 2008-06-17 | 2009-06-11 | 균일한 증착을 위한 장치 및 방법 |
| KR1020207021871A Withdrawn KR20200093084A (ko) | 2008-06-17 | 2009-06-11 | 균일한 증착을 위한 장치 및 방법 |
| KR1020117001222A Ceased KR20110020918A (ko) | 2008-06-17 | 2009-06-11 | 균일한 증착을 위한 장치 및 방법 |
| KR1020167034645A Ceased KR20160145849A (ko) | 2008-06-17 | 2009-06-11 | 균일한 증착을 위한 장치 및 방법 |
| KR1020187004305A Ceased KR20180019762A (ko) | 2008-06-17 | 2009-06-11 | 균일한 증착을 위한 장치 및 방법 |
| KR1020157033650A Ceased KR20150137131A (ko) | 2008-06-17 | 2009-06-11 | 균일한 증착을 위한 장치 및 방법 |
| KR1020167031883A Ceased KR20160134873A (ko) | 2008-06-17 | 2009-06-11 | 균일한 증착을 위한 장치 및 방법 |
Family Applications After (7)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020197023662A Ceased KR20190097315A (ko) | 2008-06-17 | 2009-06-11 | 균일한 증착을 위한 장치 및 방법 |
| KR1020207021871A Withdrawn KR20200093084A (ko) | 2008-06-17 | 2009-06-11 | 균일한 증착을 위한 장치 및 방법 |
| KR1020117001222A Ceased KR20110020918A (ko) | 2008-06-17 | 2009-06-11 | 균일한 증착을 위한 장치 및 방법 |
| KR1020167034645A Ceased KR20160145849A (ko) | 2008-06-17 | 2009-06-11 | 균일한 증착을 위한 장치 및 방법 |
| KR1020187004305A Ceased KR20180019762A (ko) | 2008-06-17 | 2009-06-11 | 균일한 증착을 위한 장치 및 방법 |
| KR1020157033650A Ceased KR20150137131A (ko) | 2008-06-17 | 2009-06-11 | 균일한 증착을 위한 장치 및 방법 |
| KR1020167031883A Ceased KR20160134873A (ko) | 2008-06-17 | 2009-06-11 | 균일한 증착을 위한 장치 및 방법 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US20090308732A1 (enExample) |
| JP (1) | JP2011524471A (enExample) |
| KR (8) | KR20170100068A (enExample) |
| CN (1) | CN102066603B (enExample) |
| WO (1) | WO2009155208A2 (enExample) |
Families Citing this family (29)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101845610B (zh) * | 2010-06-07 | 2011-12-07 | 崔铮 | 一种连续垂直热蒸发的金属镀膜方法 |
| JP5825781B2 (ja) * | 2010-12-17 | 2015-12-02 | キヤノン株式会社 | 反射防止膜形成方法及び反射防止膜形成装置 |
| CN103165375B (zh) * | 2011-12-09 | 2016-06-01 | 中国科学院微电子研究所 | 半导体腔室用压片装置 |
| US9404174B2 (en) | 2011-12-15 | 2016-08-02 | Applied Materials, Inc. | Pinned target design for RF capacitive coupled plasma |
| US8702918B2 (en) * | 2011-12-15 | 2014-04-22 | Applied Materials, Inc. | Apparatus for enabling concentricity of plasma dark space |
| US20140061039A1 (en) * | 2012-09-05 | 2014-03-06 | Applied Materials, Inc. | Target cooling for physical vapor deposition (pvd) processing systems |
| US9831074B2 (en) * | 2013-10-24 | 2017-11-28 | Applied Materials, Inc. | Bipolar collimator utilized in a physical vapor deposition chamber |
| CN103602954B (zh) * | 2013-11-06 | 2016-02-24 | 深圳市华星光电技术有限公司 | 用于磁控溅射阳极棒的支撑件及包括其的磁控溅射装置 |
| US20150122643A1 (en) * | 2013-11-06 | 2015-05-07 | Shenzhen China Star Optoelectronics Technology Co., Ltd. | Supporting member for magnetron sputtering anode bar and magnetron sputtering device including the same |
| US9887072B2 (en) | 2014-01-23 | 2018-02-06 | Taiwan Semiconductor Manufacturing Company, Ltd. | Systems and methods for integrated resputtering in a physical vapor deposition chamber |
| US20170182556A1 (en) * | 2014-07-18 | 2017-06-29 | Applied Materials, Inc. | Additive manufacturing with laser and gas flow |
| US9543126B2 (en) * | 2014-11-26 | 2017-01-10 | Applied Materials, Inc. | Collimator for use in substrate processing chambers |
| US9887073B2 (en) | 2015-02-13 | 2018-02-06 | Taiwan Semiconductor Manufacturing Co., Ltd. | Physical vapor deposition system and physical vapor depositing method using the same |
| JP7034912B2 (ja) * | 2015-10-27 | 2022-03-14 | アプライド マテリアルズ インコーポレイテッド | Pvdスパッタチャンバ向けのバイアス可能なフラックスオプティマイザ/コリメータ |
| WO2017155812A1 (en) * | 2016-03-05 | 2017-09-14 | Applied Materials, Inc. | Methods and apparatus for controlling ion fraction in physical vapor deposition processes |
| JP6088083B1 (ja) * | 2016-03-14 | 2017-03-01 | 株式会社東芝 | 処理装置及びコリメータ |
| USD858468S1 (en) * | 2018-03-16 | 2019-09-03 | Applied Materials, Inc. | Collimator for a physical vapor deposition chamber |
| USD859333S1 (en) * | 2018-03-16 | 2019-09-10 | Applied Materials, Inc. | Collimator for a physical vapor deposition chamber |
| US11017989B2 (en) | 2018-03-16 | 2021-05-25 | Samsung Electronics Co., Ltd. | Collimator, fabrication apparatus including the same, and method of fabricating a semiconductor device using the same |
| CN110643958A (zh) * | 2019-10-21 | 2020-01-03 | 吴浪生 | 一种利用溅镀实现晶圆的物理镀膜设备 |
| USD937329S1 (en) | 2020-03-23 | 2021-11-30 | Applied Materials, Inc. | Sputter target for a physical vapor deposition chamber |
| USD998575S1 (en) | 2020-04-07 | 2023-09-12 | Applied Materials, Inc. | Collimator for use in a physical vapor deposition (PVD) chamber |
| US20220406583A1 (en) * | 2021-06-18 | 2022-12-22 | Taiwan Semiconductor Manufacturing Co., Ltd. | Deposition system and method |
| US11851751B2 (en) | 2021-07-23 | 2023-12-26 | Taiwan Semiconductor Manufacturing Co., Ltd. | Deposition system and method |
| USD1009816S1 (en) | 2021-08-29 | 2024-01-02 | Applied Materials, Inc. | Collimator for a physical vapor deposition chamber |
| USD997111S1 (en) | 2021-12-15 | 2023-08-29 | Applied Materials, Inc. | Collimator for use in a physical vapor deposition (PVD) chamber |
| USD1038901S1 (en) | 2022-01-12 | 2024-08-13 | Applied Materials, Inc. | Collimator for a physical vapor deposition chamber |
| FI20225334A1 (en) * | 2022-04-21 | 2023-10-22 | Biomensio Ltd | Collimator to produce piezoelectric layers having tilted c-axis orientation |
| WO2025226404A1 (en) * | 2024-04-22 | 2025-10-30 | Applied Materials, Inc. | Delivery of configurable pulsed voltage waveforms for substrate processing |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5380414A (en) * | 1993-06-11 | 1995-01-10 | Applied Materials, Inc. | Shield and collimator pasting deposition chamber with a wafer support periodically used as an acceptor |
| US5362372A (en) * | 1993-06-11 | 1994-11-08 | Applied Materials, Inc. | Self cleaning collimator |
| US5415753A (en) * | 1993-07-22 | 1995-05-16 | Materials Research Corporation | Stationary aperture plate for reactive sputter deposition |
| US5431799A (en) * | 1993-10-29 | 1995-07-11 | Applied Materials, Inc. | Collimation hardware with RF bias rings to enhance sputter and/or substrate cavity ion generation efficiency |
| US5650052A (en) * | 1995-10-04 | 1997-07-22 | Edelstein; Sergio | Variable cell size collimator |
| US5985102A (en) * | 1996-01-29 | 1999-11-16 | Micron Technology, Inc. | Kit for electrically isolating collimator of PVD chamber, chamber so modified, and method of using |
| US5658442A (en) * | 1996-03-07 | 1997-08-19 | Applied Materials, Inc. | Target and dark space shield for a physical vapor deposition system |
| JPH10176267A (ja) * | 1996-12-13 | 1998-06-30 | Applied Materials Inc | スパッタ装置 |
| US6692617B1 (en) * | 1997-05-08 | 2004-02-17 | Applied Materials, Inc. | Sustained self-sputtering reactor having an increased density plasma |
| US6482301B1 (en) * | 1998-06-04 | 2002-11-19 | Seagate Technology, Inc. | Target shields for improved magnetic properties of a recording medium |
| US6149776A (en) * | 1998-11-12 | 2000-11-21 | Applied Materials, Inc. | Copper sputtering target |
| KR20000052104A (ko) * | 1999-01-29 | 2000-08-16 | 윤종용 | 스퍼터링 장치의 콜리메이터 구조 및 그 제조방법 |
| US20030116427A1 (en) * | 2001-08-30 | 2003-06-26 | Applied Materials, Inc. | Self-ionized and inductively-coupled plasma for sputtering and resputtering |
| US6699375B1 (en) * | 2000-06-29 | 2004-03-02 | Applied Materials, Inc. | Method of extending process kit consumable recycling life |
| US20030015421A1 (en) * | 2001-07-20 | 2003-01-23 | Applied Materials, Inc. | Collimated sputtering of cobalt |
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| US7041200B2 (en) * | 2002-04-19 | 2006-05-09 | Applied Materials, Inc. | Reducing particle generation during sputter deposition |
| US7048837B2 (en) * | 2002-09-13 | 2006-05-23 | Applied Materials, Inc. | End point detection for sputtering and resputtering |
| JPWO2004047160A1 (ja) * | 2002-11-20 | 2006-03-23 | 株式会社ルネサステクノロジ | 半導体装置の製造方法 |
| US7018515B2 (en) * | 2004-03-24 | 2006-03-28 | Applied Materials, Inc. | Selectable dual position magnetron |
| JP2007273490A (ja) * | 2004-03-30 | 2007-10-18 | Renesas Technology Corp | 半導体集積回路装置の製造方法 |
-
2009
- 2009-06-11 WO PCT/US2009/047103 patent/WO2009155208A2/en not_active Ceased
- 2009-06-11 KR KR1020177023703A patent/KR20170100068A/ko not_active Ceased
- 2009-06-11 KR KR1020197023662A patent/KR20190097315A/ko not_active Ceased
- 2009-06-11 KR KR1020207021871A patent/KR20200093084A/ko not_active Withdrawn
- 2009-06-11 JP JP2011514713A patent/JP2011524471A/ja active Pending
- 2009-06-11 US US12/482,713 patent/US20090308732A1/en not_active Abandoned
- 2009-06-11 CN CN2009801229458A patent/CN102066603B/zh active Active
- 2009-06-11 KR KR1020117001222A patent/KR20110020918A/ko not_active Ceased
- 2009-06-11 KR KR1020167034645A patent/KR20160145849A/ko not_active Ceased
- 2009-06-11 KR KR1020187004305A patent/KR20180019762A/ko not_active Ceased
- 2009-06-11 KR KR1020157033650A patent/KR20150137131A/ko not_active Ceased
- 2009-06-11 KR KR1020167031883A patent/KR20160134873A/ko not_active Ceased
Also Published As
| Publication number | Publication date |
|---|---|
| US20090308732A1 (en) | 2009-12-17 |
| KR20180019762A (ko) | 2018-02-26 |
| KR20150137131A (ko) | 2015-12-08 |
| WO2009155208A2 (en) | 2009-12-23 |
| JP2011524471A (ja) | 2011-09-01 |
| KR20160134873A (ko) | 2016-11-23 |
| WO2009155208A3 (en) | 2010-03-18 |
| KR20190097315A (ko) | 2019-08-20 |
| CN102066603A (zh) | 2011-05-18 |
| KR20110020918A (ko) | 2011-03-03 |
| KR20160145849A (ko) | 2016-12-20 |
| KR20200093084A (ko) | 2020-08-04 |
| CN102066603B (zh) | 2013-04-10 |
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