KR20170016688A - Test socket for micro pitch - Google Patents
Test socket for micro pitch Download PDFInfo
- Publication number
- KR20170016688A KR20170016688A KR1020150110118A KR20150110118A KR20170016688A KR 20170016688 A KR20170016688 A KR 20170016688A KR 1020150110118 A KR1020150110118 A KR 1020150110118A KR 20150110118 A KR20150110118 A KR 20150110118A KR 20170016688 A KR20170016688 A KR 20170016688A
- Authority
- KR
- South Korea
- Prior art keywords
- conductive
- terminal
- test socket
- inspected
- conductive portion
- Prior art date
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0416—Connectors, terminals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0433—Sockets for IC's or transistors
- G01R1/0441—Details
- G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2601—Apparatus or methods therefor
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
Abstract
The present invention relates to a test socket for fine pitch capable of reliable electrical contact with a terminal of an inspected device having a fine pitch. A test socket for fine pitch according to an embodiment of the present invention includes a conductive portion, a base portion, and an aligning portion. Here, the conductive portion is composed of a plurality of conductive particles provided in the elastic material, and the conductive portion is formed in a columnar shape and has a conductivity in the up-down direction and may be provided in plural. The base portion is integrally formed with the conductive portion, and is fixed so that each conductive portion is disposed at a position corresponding to the terminal of the device to be inspected and the pad of the inspection apparatus, and is insulated from the conductive portion. The aligning portion is formed in a thickness direction so as to insert each conductive portion, and is secondarily fixed so that the inserted conductive portion is disposed at a position corresponding to the terminal of the device to be inspected and the pad of the inspecting device.
Description
TECHNICAL FIELD The present invention relates to a test socket for fine pitch, and more particularly, to a test socket for fine pitch capable of reliable electrical contact with a terminal of a device to be inspected having a fine pitch.
Generally, devices to be inspected such as semiconductor devices, which have been manufactured, are subjected to electrical tests to determine whether they are defective or not. Specifically, a predetermined test signal is caused to flow from the testing device to the device under test to determine whether the device under test is short-circuited. Here, the test device and the device under test are not directly connected to each other, but are indirectly connected using an intermediate device called a test socket.
Various test sockets such as pogo pins can be used. Recently, test sockets using anisotropic elastic sheets have been widely used.
FIG. 1 is a cross-sectional view showing an example of a conventional test socket, and FIG. 2 is an exemplary view showing an operation example of the test socket of FIG.
First, as shown in FIG. 1, the
The
These
2, when the inspected
For aligning the
The
Thereafter, when a predetermined test signal is applied from the
Such a test socket has a characteristic of exhibiting conductivity only in its thickness direction when it is pressed in the thickness direction and has an advantage of being excellent in durability and achieving a simple electrical connection since no mechanical means such as soldering or a spring is used.
In addition, since it can absorb mechanical impact or deformation, it has a merit that a soft connection can be performed and is widely used for electrical connection between various electric circuit devices and test devices.
On the other hand, in the case where the terminals of the device to be inspected have fine pitches, it is very important to align the conductive parts of the test socket accurately to the terminals of the device to be inspected. However, due to the characteristics of the silicon material constituting the insulating support portion and the conductive portion, shrinkage and expansion occur at the time of manufacture of the product and in the test environment, and thus the position of the conductive portion of the test socket is deformed. The deformation of the position of the conductive portion may cause a contact failure between the conductive portion and the terminal of the device to be inspected, which may lower the reliability of the test.
Practically, when the pitch between the terminals of the device to be inspected is 0.4 mm or more, the allowable range of the position of the conductive portion of the test socket is required to be 0.05 mm or less. When the pitch between the terminals is a fine pitch of 0.4 mm or less, The allowable range of the conductive part of the socket is required to be within ± 0.03 mm.
Therefore, there is a demand for a fine pitch test socket having a conductive portion capable of making reliable contact with a terminal even when the terminal of the device to be inspected has a fine pitch.
SUMMARY OF THE INVENTION In order to solve the above problems, the present invention provides a test socket for fine pitch capable of reliable electrical contact with a terminal of an inspected device having a fine pitch.
According to an aspect of the present invention, there is provided an electro-optical device including: a plurality of conductive parts formed of a plurality of conductive particles provided in an elastic material and formed in a columnar shape and having conductivity in a vertical direction; A base part formed integrally with the conductive part and fixed so that each of the conductive parts is disposed at a position corresponding to a terminal of the device to be inspected and a pad of the inspection device and is insulated from the conductive parts; And an aligning portion having an alignment hole which is formed in a thickness direction so as to insert each of the conductive portions and is secondarily fixed so that the inserted conductive portion is disposed at a position corresponding to a terminal of the device to be inspected and a pad of the inspection apparatus, The test socket for fine pitch.
In one embodiment of the present invention, the upper portion of the liner may further include a guide portion extending upward in order to guide the terminal of the device under test to be correctly positioned on the conductive portion.
In one embodiment of the present invention, the base portion may be integrally formed at a lower portion of the conductive portion.
According to an embodiment of the present invention, a seating part may be formed on the lower part of the alignment part so that the base part is seated.
In one embodiment of the present invention, the lower end of the base portion may be formed to surround the pad of the inspection apparatus.
In one embodiment of the present invention, the base portion may be integrally formed on the conductive portion.
In an exemplary embodiment of the present invention, a guide protrusion may be further formed on the upper surface of the base portion so as to guide the terminal of the device under test to the upper portion of the conductive portion formed along the upper edge of the conductive portion.
In an embodiment of the present invention, the allowable range of the pitch between the liner and the inter-artificial air may be equal to or less than 0.03 mm.
According to the embodiment of the present invention, since the conductive parts can be arranged at fine pitches by being coupled to the artificial holes, it is possible to positively make contact with the terminals of the device under test having fine pitches, thereby improving the reliability of the test .
Also, according to an embodiment of the present invention, the conductive portion and the base portion may be separately manufactured from the aligning portion and combined so as to be detachable from the aligning portion. Therefore, when a problem such as breakage or deformation occurs in the upper part of the conductive part due to repetitive contact with the terminal of the device to be inspected, only the conductive part and the base part can be separated and replaced.
It should be understood that the effects of the present invention are not limited to the above effects and include all effects that can be deduced from the detailed description of the present invention or the configuration of the invention described in the claims.
1 is a cross-sectional view showing an example of a conventional test socket.
2 is an exemplary view showing an operation example of the test socket of FIG.
3 is a cross-sectional view illustrating a test socket for fine pitch according to the first embodiment of the present invention.
4 is an exploded view showing a test socket for fine pitch according to the first embodiment of the present invention.
5 and 6 are diagrams illustrating an example of operation of a test socket for fine pitch according to the first embodiment of the present invention.
7 is an exemplary view showing another embodiment of the alignment portion in the test socket for fine pitch according to the first embodiment of the present invention.
8 is an exemplary view showing another embodiment of the base portion in the test socket for fine pitch according to the first embodiment of the present invention.
9 is a cross-sectional view illustrating a test socket for fine pitch according to a second embodiment of the present invention.
10 is an exploded view showing a test socket for fine pitch according to a second embodiment of the present invention.
11 and 12 are diagrams illustrating an operation example of a test socket for fine pitch according to a second embodiment of the present invention.
13 is an exemplary view showing another embodiment of the alignment portion in the test socket for fine pitch according to the second embodiment of the present invention.
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, the present invention will be described with reference to the accompanying drawings. The present invention may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. In order to clearly illustrate the present invention, parts not related to the description are omitted, and similar parts are denoted by like reference characters throughout the specification.
Throughout the specification, when a part is referred to as being "connected" to another part, it includes not only "directly connected" but also "indirectly connected" . Also, when an element is referred to as "comprising ", it means that it can include other elements, not excluding other elements unless specifically stated otherwise.
Hereinafter, embodiments of the present invention will be described in detail with reference to the accompanying drawings.
FIG. 3 is a cross-sectional view illustrating a test socket for fine pitch according to a first embodiment of the present invention, FIG. 4 is an exploded view illustrating a test socket for fine pitch according to the first embodiment of the present invention, 6 is an exemplary view showing an operation example of a test socket for fine pitch according to the first embodiment of the present invention.
3 to 6, the
Here, the
The
In addition, the
The
The
The
Here, as the
The
It is preferable that the magnetic core particles for obtaining the
The
The upper surface of the
In addition, the
The
The base 300 may be made of the same material as the elastic material of the
The
On the other hand, the
The
At this time, the
The
The
Therefore, the
The
In addition, according to the present invention, the
7 is a view illustrating another example of the alignment portion in the test socket for fine pitch according to the first embodiment of the present invention. Referring to FIG. 7, the guide portion 430 ) Can be provided.
Here, the
A
The
The
The distance D between the
The
According to the present invention, since the
8 is a view illustrating another embodiment of the base portion in the test socket for fine pitch according to the first embodiment of the present invention. Referring to FIG. 8, the
In this configuration, since the lower end of the
FIG. 9 is a cross-sectional view illustrating a test socket for fine pitch according to a second embodiment of the present invention, FIG. 10 is an exploded view showing a test socket for fine pitch according to a second embodiment of the present invention, and FIGS. 11 and 12 Is an exemplary view showing an operation example of the test socket for fine pitch according to the second embodiment of the present invention. In this embodiment, the base portion can be integrally formed on the upper portion of the conductive portion and can have a difference in configuration due to this, and other basic structures are the same as those of the first embodiment, and thus description thereof is omitted.
9 to 12, according to the embodiment of the present invention, the
Accordingly, the
Further, a
Here, the
In addition, an
13 is an exemplary view showing another embodiment of the alignment portion in the test socket for fine pitch according to the second embodiment of the present invention. Referring to FIG. 13, the seating portion 1440 of the
The
It will be understood by those skilled in the art that the foregoing description of the present invention is for illustrative purposes only and that those of ordinary skill in the art can readily understand that various changes and modifications may be made without departing from the spirit or essential characteristics of the present invention. will be. It is therefore to be understood that the above-described embodiments are illustrative in all aspects and not restrictive. For example, each component described as a single entity may be distributed and implemented, and components described as being distributed may also be implemented in a combined form.
The scope of the present invention is defined by the appended claims, and all changes or modifications derived from the meaning and scope of the claims and their equivalents should be construed as being included within the scope of the present invention.
100:
300, 300a, 1300:
410, 1410: LINEAR ARTIF 430:
440, and 1440: a mounting
510, 1510: Terminal 600: Inspection device
610: Pad 620: Alignment projection
1350: guide projection
Claims (8)
A base part formed integrally with the conductive part and fixed so that each of the conductive parts is disposed at a position corresponding to a terminal of the device to be inspected and a pad of the inspection device and is insulated from the conductive parts; And
And an aligning portion formed in the thickness direction so as to insert each of the conductive portions and having an alignment hole for securing the inserted conductive portion to a position of a terminal of the device to be inspected and a pad of the inspection apparatus Test socket for fine pitch.
Further comprising a guide portion extending upward in an upward direction for guiding the terminal of the device to be inspected to be positioned right above the conductive portion, at an upper end of the liner.
Wherein the base portion is integrally formed at a lower portion of the conductive portion.
And a seating portion is further formed at a lower portion of the alignment portion so that the base portion is seated.
And a lower end of the base portion is formed to surround a pad of the testing apparatus.
Wherein the base portion is integrally formed on an upper portion of the conductive portion.
And a guide protrusion is formed on an upper surface of the base portion so as to guide the terminal of the device under test to be positioned on the upper portion of the conductive portion.
Wherein a tolerance range of the pitch between the liner and the interlayer is 0.03 mm or less.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020150110118A KR101779172B1 (en) | 2015-08-04 | 2015-08-04 | Test socket for micro pitch |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020150110118A KR101779172B1 (en) | 2015-08-04 | 2015-08-04 | Test socket for micro pitch |
Publications (2)
Publication Number | Publication Date |
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KR20170016688A true KR20170016688A (en) | 2017-02-14 |
KR101779172B1 KR101779172B1 (en) | 2017-09-15 |
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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KR1020150110118A KR101779172B1 (en) | 2015-08-04 | 2015-08-04 | Test socket for micro pitch |
Country Status (1)
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KR (1) | KR101779172B1 (en) |
Cited By (3)
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KR101961101B1 (en) * | 2017-12-07 | 2019-03-22 | (주)티에스이 | Rubber socket for test having no-frame structure and manufacturing method thereof |
KR102211358B1 (en) * | 2020-03-19 | 2021-02-03 | (주)티에스이 | Test socket and test apparatus having the same, manufacturing method for the test socket |
KR102271503B1 (en) * | 2020-05-25 | 2021-07-01 | (주)티에스이 | Data signal transmission connector |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
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KR102291194B1 (en) | 2020-03-09 | 2021-08-20 | 에이엠티 주식회사 | The align device and method thereof of the device having micro pitch |
KR102295435B1 (en) | 2020-03-12 | 2021-08-31 | 에이엠티 주식회사 | The align of the device having micro pitch and testing device and align method of device |
KR102525844B1 (en) * | 2021-03-29 | 2023-04-28 | (주)위드멤스 | Contactor assembly and method for manufacturing the same |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101284212B1 (en) | 2012-04-27 | 2013-07-09 | 주식회사 아이에스시 | Test socket which can be aligned easily |
-
2015
- 2015-08-04 KR KR1020150110118A patent/KR101779172B1/en active IP Right Grant
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101961101B1 (en) * | 2017-12-07 | 2019-03-22 | (주)티에스이 | Rubber socket for test having no-frame structure and manufacturing method thereof |
KR102211358B1 (en) * | 2020-03-19 | 2021-02-03 | (주)티에스이 | Test socket and test apparatus having the same, manufacturing method for the test socket |
TWI738629B (en) * | 2020-03-19 | 2021-09-01 | 南韓商Tse有限公司 | Test socket and test apparatus having the same, manufacturing method for the test socket |
US11199577B2 (en) | 2020-03-19 | 2021-12-14 | Tse Co., Ltd. | Test socket and test apparatus having the same, manufacturing method for the test socket |
KR102271503B1 (en) * | 2020-05-25 | 2021-07-01 | (주)티에스이 | Data signal transmission connector |
Also Published As
Publication number | Publication date |
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KR101779172B1 (en) | 2017-09-15 |
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