KR20160014630A - 결함 검사 시스템 및 필름의 제조 장치 - Google Patents

결함 검사 시스템 및 필름의 제조 장치 Download PDF

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Publication number
KR20160014630A
KR20160014630A KR1020157034190A KR20157034190A KR20160014630A KR 20160014630 A KR20160014630 A KR 20160014630A KR 1020157034190 A KR1020157034190 A KR 1020157034190A KR 20157034190 A KR20157034190 A KR 20157034190A KR 20160014630 A KR20160014630 A KR 20160014630A
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KR
South Korea
Prior art keywords
film
defect inspection
defect
polarizing filter
roll
Prior art date
Application number
KR1020157034190A
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English (en)
Korean (ko)
Inventor
게이타 이무라
Original Assignee
스미또모 가가꾸 가부시키가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Application filed by 스미또모 가가꾸 가부시키가이샤 filed Critical 스미또모 가가꾸 가부시키가이샤
Publication of KR20160014630A publication Critical patent/KR20160014630A/ko

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B32—LAYERED PRODUCTS
    • B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B27/00—Layered products comprising a layer of synthetic resin
    • B32B27/06—Layered products comprising a layer of synthetic resin as the main or only constituent of a layer, which is next to another layer of the same or of a different material
    • B32B27/08—Layered products comprising a layer of synthetic resin as the main or only constituent of a layer, which is next to another layer of the same or of a different material of synthetic resin
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B32—LAYERED PRODUCTS
    • B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B41/00—Arrangements for controlling or monitoring lamination processes; Safety arrangements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8422—Investigating thin films, e.g. matrix isolation method
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8914—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B32—LAYERED PRODUCTS
    • B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B41/00—Arrangements for controlling or monitoring lamination processes; Safety arrangements
    • B32B2041/04—Detecting wrong registration, misalignment, deviation, failure
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8422—Investigating thin films, e.g. matrix isolation method
    • G01N2021/8438—Mutilayers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G01N2021/8848—Polarisation of light

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  • Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Pathology (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Mathematical Physics (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
KR1020157034190A 2013-06-04 2014-05-30 결함 검사 시스템 및 필름의 제조 장치 KR20160014630A (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2013117947A JP6182806B2 (ja) 2013-06-04 2013-06-04 欠陥検査システム及びフィルムの製造装置
JPJP-P-2013-117947 2013-06-04
PCT/JP2014/064472 WO2014196476A1 (ja) 2013-06-04 2014-05-30 欠陥検査システム及びフィルムの製造装置

Related Child Applications (1)

Application Number Title Priority Date Filing Date
KR1020197027080A Division KR20190108655A (ko) 2013-06-04 2014-05-30 결함 검사 시스템 및 필름의 제조 장치

Publications (1)

Publication Number Publication Date
KR20160014630A true KR20160014630A (ko) 2016-02-11

Family

ID=52008120

Family Applications (2)

Application Number Title Priority Date Filing Date
KR1020157034190A KR20160014630A (ko) 2013-06-04 2014-05-30 결함 검사 시스템 및 필름의 제조 장치
KR1020197027080A KR20190108655A (ko) 2013-06-04 2014-05-30 결함 검사 시스템 및 필름의 제조 장치

Family Applications After (1)

Application Number Title Priority Date Filing Date
KR1020197027080A KR20190108655A (ko) 2013-06-04 2014-05-30 결함 검사 시스템 및 필름의 제조 장치

Country Status (5)

Country Link
JP (1) JP6182806B2 (zh)
KR (2) KR20160014630A (zh)
CN (1) CN105308441B (zh)
TW (1) TWI629466B (zh)
WO (1) WO2014196476A1 (zh)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101898835B1 (ko) * 2015-04-09 2018-09-13 스미또모 가가꾸 가부시키가이샤 적층 광학 필름의 결함 검사 방법, 광학 필름의 결함 검사 방법 및 적층 광학 필름의 제조 방법
CN105291562B (zh) * 2015-11-02 2018-05-11 江苏顺泰包装印刷科技有限公司 一种用于高速凹印机的印刷缺陷标识装置及其工作方法
JP6628669B2 (ja) * 2016-03-31 2020-01-15 倉敷紡績株式会社 構造物表面検査装置およびそれを備える構造物表面検査システム並びに構造物表面検査方法
JP6924002B2 (ja) * 2016-07-22 2021-08-25 日東電工株式会社 検査装置及び検査方法
KR102438892B1 (ko) * 2017-03-03 2022-08-31 스미또모 가가꾸 가부시키가이샤 결함 검사 시스템, 필름 제조 장치, 필름 제조 방법, 인자 장치 및 인자 방법
KR102475056B1 (ko) * 2017-03-03 2022-12-06 스미또모 가가꾸 가부시키가이샤 결함 마킹 방법 및 결함 마킹 장치, 원반의 제조 방법 및 원반, 그리고 시트의 제조 방법 및 시트
JP6934733B2 (ja) * 2017-03-03 2021-09-15 住友化学株式会社 マーキング装置、欠陥検査システム及びフィルム製造方法
CN107449785B (zh) * 2017-08-02 2020-03-17 苏州市朗电机器人有限公司 一种光学膜的视觉智能检测机构
TWI790763B (zh) * 2021-09-30 2023-01-21 千釜事業有限公司 包材及其製作方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008049604A (ja) 2006-08-25 2008-03-06 Toray Ind Inc 透明な積層体の製造方法及びその製造装置
JP2011007779A (ja) 2009-05-26 2011-01-13 Asahi Kasei E-Materials Corp フィルム用欠陥マーキング装置及び欠陥マーキング方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004286526A (ja) * 2003-03-20 2004-10-14 Lintec Corp 外観検査機補正用フィルム、外観検査機補正方法及び製品用フィルム検査方法並びに外観検査済みフィルム
KR20050013491A (ko) * 2003-07-28 2005-02-04 닛토덴코 가부시키가이샤 시트형상 제품의 검사 방법 및 검사 시스템
JP2005062165A (ja) * 2003-07-28 2005-03-10 Nitto Denko Corp シート状製品の検査方法、検査システム、シート状製品、及び、画像表示装置
JP4960161B2 (ja) * 2006-10-11 2012-06-27 日東電工株式会社 検査データ処理装置及び検査データ処理方法
JP2009243911A (ja) * 2008-03-28 2009-10-22 Toray Ind Inc 欠陥検査システム
US20100162865A1 (en) * 2008-12-31 2010-07-01 E.I. Du Pont De Nemours And Company Defect-containing strip and method for detecting such defects
JP4503690B1 (ja) * 2009-10-13 2010-07-14 日東電工株式会社 液晶表示素子を連続製造する装置に用いられる情報格納読出システム、及び、前記情報格納読出システムを製造する方法及び装置
WO2011148790A1 (ja) * 2010-05-25 2011-12-01 東レ株式会社 フィルムの欠陥検査装置、欠陥検査方法および離型フィルム
JP5274622B2 (ja) * 2011-06-27 2013-08-28 富士フイルム株式会社 欠陥検査装置及び方法

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008049604A (ja) 2006-08-25 2008-03-06 Toray Ind Inc 透明な積層体の製造方法及びその製造装置
JP2011007779A (ja) 2009-05-26 2011-01-13 Asahi Kasei E-Materials Corp フィルム用欠陥マーキング装置及び欠陥マーキング方法

Also Published As

Publication number Publication date
JP2014235123A (ja) 2014-12-15
CN105308441A (zh) 2016-02-03
KR20190108655A (ko) 2019-09-24
JP6182806B2 (ja) 2017-08-23
TWI629466B (zh) 2018-07-11
WO2014196476A1 (ja) 2014-12-11
TW201510512A (zh) 2015-03-16
CN105308441B (zh) 2019-02-26

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Effective date: 20191112