KR20150129844A - 펄스 자극을 이용한 수동 상호변조 테스트 - Google Patents

펄스 자극을 이용한 수동 상호변조 테스트 Download PDF

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Publication number
KR20150129844A
KR20150129844A KR1020157029131A KR20157029131A KR20150129844A KR 20150129844 A KR20150129844 A KR 20150129844A KR 1020157029131 A KR1020157029131 A KR 1020157029131A KR 20157029131 A KR20157029131 A KR 20157029131A KR 20150129844 A KR20150129844 A KR 20150129844A
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KR
South Korea
Prior art keywords
pim
pulse
device under
product
under test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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KR1020157029131A
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English (en)
Korean (ko)
Inventor
티모시 엘. 홀트
티모시 엠. 오브라이언
Original Assignee
버드 테크놀러지스 그룹, 인코포레이티드
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Publication of KR20150129844A publication Critical patent/KR20150129844A/ko
Withdrawn legal-status Critical Current

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    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B17/00—Monitoring; Testing
    • H04B17/0082—Monitoring; Testing using service channels; using auxiliary channels
    • H04B17/0085—Monitoring; Testing using service channels; using auxiliary channels using test signal generators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • G01R23/16—Spectrum analysis; Fourier analysis
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • G01R23/16—Spectrum analysis; Fourier analysis
    • G01R23/20—Measurement of non-linear distortion
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B17/00—Monitoring; Testing
    • H04B17/10—Monitoring; Testing of transmitters
    • H04B17/11—Monitoring; Testing of transmitters for calibration
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B17/00—Monitoring; Testing
    • H04B17/20—Monitoring; Testing of receivers
    • H04B17/26—Monitoring; Testing of receivers using historical data, averaging values or statistics
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B17/00—Monitoring; Testing
    • H04B17/20—Monitoring; Testing of receivers
    • H04B17/29—Performance testing
    • H04B17/294—Performance testing with test equipment located at the receiver
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B17/00—Monitoring; Testing
    • H04B17/30—Monitoring; Testing of propagation channels
    • H04B17/309—Measuring or estimating channel quality parameters
    • H04B17/318—Received signal strength
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B17/00—Monitoring; Testing
    • H04B17/30—Monitoring; Testing of propagation channels
    • H04B17/373—Predicting channel quality or other radio frequency [RF] parameters

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Electromagnetism (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • General Physics & Mathematics (AREA)
  • Mathematical Physics (AREA)
  • Nonlinear Science (AREA)
  • Quality & Reliability (AREA)
  • Probability & Statistics with Applications (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Measurement Of Mechanical Vibrations Or Ultrasonic Waves (AREA)
  • Measuring Pulse, Heart Rate, Blood Pressure Or Blood Flow (AREA)
  • Tests Of Electronic Circuits (AREA)
KR1020157029131A 2013-03-15 2014-03-17 펄스 자극을 이용한 수동 상호변조 테스트 Withdrawn KR20150129844A (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201361793644P 2013-03-15 2013-03-15
US61/793,644 2013-03-15
PCT/US2014/030344 WO2014145553A1 (en) 2013-03-15 2014-03-17 Passive intermodulation testing using pulse stimulus

Publications (1)

Publication Number Publication Date
KR20150129844A true KR20150129844A (ko) 2015-11-20

Family

ID=51538022

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020157029131A Withdrawn KR20150129844A (ko) 2013-03-15 2014-03-17 펄스 자극을 이용한 수동 상호변조 테스트

Country Status (8)

Country Link
US (2) US9391721B2 (https=)
EP (1) EP2972424B1 (https=)
JP (1) JP2016517220A (https=)
KR (1) KR20150129844A (https=)
CN (1) CN105051554A (https=)
CA (1) CA2905160C (https=)
HK (1) HK1217042A1 (https=)
WO (1) WO2014145553A1 (https=)

Cited By (1)

* Cited by examiner, † Cited by third party
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WO2018143505A1 (ko) * 2017-02-01 2018-08-09 주식회사 이너트론 모듈화된 pim 분석 장치 및 방법

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HK1217042A1 (zh) * 2013-03-15 2016-12-16 Bird Technologies Group Inc. 使用脉冲激励的无源互调测试
US10429493B2 (en) * 2015-05-12 2019-10-01 Texas Instruments Incorporated Socket device adapted to send, receive, and loopback test signals
CN104993878A (zh) * 2015-05-25 2015-10-21 陶长英 一种poi系统无源互调快速测试装置
CN104993883A (zh) * 2015-05-25 2015-10-21 陶长英 一种双极化天线无源互调快速测试装置
US10039022B2 (en) 2015-06-09 2018-07-31 At&T Intellectual Property I, L.P. Remote diagnosis and cancellation of passive intermodulation
US10440660B2 (en) * 2015-07-08 2019-10-08 Telefonaktiebolaget Lm Ericsson (Publ) Uplink spectrum analysis technique for passive intermodulation (PIM) detection
US9768812B1 (en) 2016-06-10 2017-09-19 At&T Intellectual Property I, L.P. Facilitation of passive intermodulation cancellation
US10429423B2 (en) 2016-09-27 2019-10-01 PIM Solutions LLC Passive intermodulation (PIM) probe
WO2019000034A1 (en) * 2017-06-27 2019-01-03 Kaelus Pty Ltd APPARATUS AND SYSTEM FOR IDENTIFYING DEFECTS IN A RADIO FREQUENCY DEVICE OR A SYSTEM
US10187098B1 (en) 2017-06-30 2019-01-22 At&T Intellectual Property I, L.P. Facilitation of passive intermodulation cancelation via machine learning
US10498465B2 (en) * 2018-03-01 2019-12-03 Commscope Technologies Llc Methods and apparatuses for measuring the distance to a passive intermodulation source
EP3954051A1 (en) 2019-04-09 2022-02-16 Telefonaktiebolaget LM Ericsson (publ) Eigenvalue-based passive intermodulation detection
CN111371511A (zh) * 2020-03-10 2020-07-03 焱行科技(上海)有限公司 一种器件功率容量测试装置及方法
CN114414884B (zh) * 2021-12-28 2024-07-05 北京无线电计量测试研究所 一种兆瓦级脉冲功率测量装置及方法
EP4270020B1 (de) * 2022-04-27 2025-07-30 Rosenberger Hochfrequenztechnik GmbH & Co. KG Intermodulations-messverfahren, intermodulations-messvorrichtung und computerprogramm zur ermittlung einer intermodulationsquelle in einer übertragungsstrecke

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US6144692A (en) 1998-04-07 2000-11-07 Harris Corporation System and method of testing for passive intermodulation in antennas
US20030040277A1 (en) 2000-07-18 2003-02-27 Deats Bradley W. Apparatus and method for measuring and identifying sources of communications interference
US20020094785A1 (en) 2000-07-18 2002-07-18 Deats Bradley W. Portable device used to measure passive intermodulation in radio frequency communication systems
JP2002359581A (ja) * 2001-05-31 2002-12-13 Hitachi Cable Ltd 相互変調歪発生箇所検出方法
JP2005121494A (ja) * 2003-10-17 2005-05-12 Nippon Telegr & Teleph Corp <Ntt> 相互変調測定方法及び装置
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US8294469B2 (en) 2008-10-06 2012-10-23 Anritsu Company Passive intermodulation (PIM) distance to fault analyzer with selectable harmonic level
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JP5120278B2 (ja) * 2009-01-26 2013-01-16 富士通株式会社 超伝導チューナブルフィルタ装置、非線形歪測定装置、非線形歪測定方法
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2018143505A1 (ko) * 2017-02-01 2018-08-09 주식회사 이너트론 모듈화된 pim 분석 장치 및 방법

Also Published As

Publication number Publication date
CA2905160C (en) 2021-01-19
JP2016517220A (ja) 2016-06-09
EP2972424B1 (en) 2018-07-11
CN105051554A (zh) 2015-11-11
US20160028497A1 (en) 2016-01-28
WO2014145553A1 (en) 2014-09-18
CA2905160A1 (en) 2014-09-18
US20160301483A1 (en) 2016-10-13
HK1217042A1 (zh) 2016-12-16
EP2972424A1 (en) 2016-01-20
US9391721B2 (en) 2016-07-12
US10615888B2 (en) 2020-04-07
EP2972424A4 (en) 2016-10-19

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PA0105 International application

Patent event date: 20151013

Patent event code: PA01051R01D

Comment text: International Patent Application

PG1501 Laying open of application
PC1203 Withdrawal of no request for examination
WITN Application deemed withdrawn, e.g. because no request for examination was filed or no examination fee was paid