KR20150095053A - 제품 검사의 유효성 검증 장치 및 방법 - Google Patents

제품 검사의 유효성 검증 장치 및 방법 Download PDF

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Publication number
KR20150095053A
KR20150095053A KR1020140016106A KR20140016106A KR20150095053A KR 20150095053 A KR20150095053 A KR 20150095053A KR 1020140016106 A KR1020140016106 A KR 1020140016106A KR 20140016106 A KR20140016106 A KR 20140016106A KR 20150095053 A KR20150095053 A KR 20150095053A
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KR
South Korea
Prior art keywords
product
inspection
defect information
image
validity
Prior art date
Application number
KR1020140016106A
Other languages
English (en)
Korean (ko)
Inventor
홍진광
남수용
이성헌
Original Assignee
한화테크윈 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 한화테크윈 주식회사 filed Critical 한화테크윈 주식회사
Priority to KR1020140016106A priority Critical patent/KR20150095053A/ko
Priority to CN201410400690.XA priority patent/CN104834656B/zh
Publication of KR20150095053A publication Critical patent/KR20150095053A/ko

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    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/008—Reliability or availability analysis
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30148—Semiconductor; IC; Wafer

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  • Engineering & Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • General Engineering & Computer Science (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Analysis (AREA)
KR1020140016106A 2014-02-12 2014-02-12 제품 검사의 유효성 검증 장치 및 방법 KR20150095053A (ko)

Priority Applications (2)

Application Number Priority Date Filing Date Title
KR1020140016106A KR20150095053A (ko) 2014-02-12 2014-02-12 제품 검사의 유효성 검증 장치 및 방법
CN201410400690.XA CN104834656B (zh) 2014-02-12 2014-08-14 产品检查的有效性验证装置以及其方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020140016106A KR20150095053A (ko) 2014-02-12 2014-02-12 제품 검사의 유효성 검증 장치 및 방법

Publications (1)

Publication Number Publication Date
KR20150095053A true KR20150095053A (ko) 2015-08-20

Family

ID=53812549

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020140016106A KR20150095053A (ko) 2014-02-12 2014-02-12 제품 검사의 유효성 검증 장치 및 방법

Country Status (2)

Country Link
KR (1) KR20150095053A (zh)
CN (1) CN104834656B (zh)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108993909A (zh) * 2018-06-28 2018-12-14 广东拓斯达科技股份有限公司 玻璃的分拣设备及方法、计算机可读存储介质
CN114279716A (zh) * 2021-11-16 2022-04-05 江苏金发科技新材料有限公司 一种门板缺陷验证装置

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101810991B1 (ko) * 2016-02-04 2018-01-25 주식회사 고영테크놀러지 검사대, 검사 시스템 및 검사 방법
KR101782363B1 (ko) * 2016-05-23 2017-09-27 (주)에이앤아이 데이터 밸런싱을 통한 학습기반의 비전검사 방법
CN107239813B (zh) * 2017-07-18 2020-07-14 北京创享合一管理咨询有限公司 对信息介质进行认证的方法及装置

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040086166A1 (en) * 2002-11-01 2004-05-06 Photon Dynamics, Inc. Method and apparatus for flat patterned media inspection
CN2847275Y (zh) * 2005-08-26 2006-12-13 山东省药用玻璃股份有限公司 玻璃瓶口检验机
DE102005045625B4 (de) * 2005-09-23 2008-06-05 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Vorrichtung, Verfahren und Computerprogramm zum Zusammenstellen eines Tests sowie Vorrichtung, Verfahren und Computerprogramm zum Prüfen eines Prüflings
JP5100419B2 (ja) * 2008-01-30 2012-12-19 オリンパス株式会社 検査システム
CN101446699B (zh) * 2008-12-30 2010-06-02 友达光电股份有限公司 检测装置与用于此检测装置的检测方法
CN101718714B (zh) * 2009-11-25 2012-07-11 东旭集团有限公司 一种检测平板玻璃表面缺陷的系统及方法
CN103064206B (zh) * 2013-01-08 2015-04-22 深圳市华星光电技术有限公司 玻璃基板的缺陷检测方法

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108993909A (zh) * 2018-06-28 2018-12-14 广东拓斯达科技股份有限公司 玻璃的分拣设备及方法、计算机可读存储介质
CN114279716A (zh) * 2021-11-16 2022-04-05 江苏金发科技新材料有限公司 一种门板缺陷验证装置

Also Published As

Publication number Publication date
CN104834656A (zh) 2015-08-12
CN104834656B (zh) 2018-05-29

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