KR20140123956A - 온-칩 코오스 지연 교정 - Google Patents
온-칩 코오스 지연 교정 Download PDFInfo
- Publication number
- KR20140123956A KR20140123956A KR1020147022900A KR20147022900A KR20140123956A KR 20140123956 A KR20140123956 A KR 20140123956A KR 1020147022900 A KR1020147022900 A KR 1020147022900A KR 20147022900 A KR20147022900 A KR 20147022900A KR 20140123956 A KR20140123956 A KR 20140123956A
- Authority
- KR
- South Korea
- Prior art keywords
- delay line
- chip
- delay
- power
- calibrated
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
- 238000000034 method Methods 0.000 claims abstract description 66
- 230000004044 response Effects 0.000 claims abstract description 5
- 238000004891 communication Methods 0.000 claims description 15
- 238000012937 correction Methods 0.000 claims description 12
- 238000004590 computer program Methods 0.000 claims description 3
- 230000008569 process Effects 0.000 abstract description 33
- 238000013461 design Methods 0.000 description 16
- 239000004065 semiconductor Substances 0.000 description 14
- 238000003860 storage Methods 0.000 description 12
- 238000010586 diagram Methods 0.000 description 8
- 230000015654 memory Effects 0.000 description 7
- 230000008901 benefit Effects 0.000 description 6
- 230000006870 function Effects 0.000 description 6
- 230000000694 effects Effects 0.000 description 4
- 239000000203 mixture Substances 0.000 description 4
- 238000012545 processing Methods 0.000 description 4
- 239000000463 material Substances 0.000 description 3
- 230000002596 correlated effect Effects 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 229910044991 metal oxide Inorganic materials 0.000 description 2
- 150000004706 metal oxides Chemical class 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 2
- 229920005591 polysilicon Polymers 0.000 description 2
- 230000004075 alteration Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 230000000295 complement effect Effects 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 230000000875 corresponding effect Effects 0.000 description 1
- 230000001934 delay Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- -1 e.g. Substances 0.000 description 1
- 238000000609 electron-beam lithography Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000005669 field effect Effects 0.000 description 1
- 230000010355 oscillation Effects 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 238000004088 simulation Methods 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 238000012795 verification Methods 0.000 description 1
- 235000012431 wafers Nutrition 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
- H03K5/13—Arrangements having a single output and transforming input signals into pulses delivered at desired time intervals
Landscapes
- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Semiconductor Integrated Circuits (AREA)
- Design And Manufacture Of Integrated Circuits (AREA)
- Pulse Circuits (AREA)
Applications Claiming Priority (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201261587705P | 2012-01-18 | 2012-01-18 | |
| US61/587,705 | 2012-01-18 | ||
| US13/368,906 US8680908B2 (en) | 2012-01-18 | 2012-02-08 | On-chip coarse delay calibration |
| US13/368,906 | 2012-03-08 | ||
| PCT/US2013/021836 WO2013109688A1 (en) | 2012-01-18 | 2013-01-17 | On-chip coarse delay calibration |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR20140123956A true KR20140123956A (ko) | 2014-10-23 |
Family
ID=48779550
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020147022900A Ceased KR20140123956A (ko) | 2012-01-18 | 2013-01-17 | 온-칩 코오스 지연 교정 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US8680908B2 (enExample) |
| EP (1) | EP2805416A1 (enExample) |
| JP (2) | JP2015511427A (enExample) |
| KR (1) | KR20140123956A (enExample) |
| CN (1) | CN104054263B (enExample) |
| WO (1) | WO2013109688A1 (enExample) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20140266290A1 (en) * | 2013-03-14 | 2014-09-18 | Bhavin Odedara | Process detection circuit |
| CN104378088B (zh) * | 2013-08-15 | 2017-06-09 | 瑞昱半导体股份有限公司 | 延迟时间差检测及调整装置与方法 |
| US9503090B2 (en) | 2014-08-19 | 2016-11-22 | International Business Machines Corporation | High speed level translator |
Family Cites Families (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH05199088A (ja) * | 1991-02-25 | 1993-08-06 | Toshiba Corp | 遅延回路 |
| US5796682A (en) * | 1995-10-30 | 1998-08-18 | Motorola, Inc. | Method for measuring time and structure therefor |
| US6166821A (en) * | 1998-10-02 | 2000-12-26 | Electronics For Imaging, Inc. | Self calibrating pulse width modulator for use in electrostatic printing applications |
| US7595686B2 (en) | 2001-11-09 | 2009-09-29 | The Regents Of The University Of Colorado | Digital controller for high-frequency switching power supplies |
| US7315270B2 (en) | 2005-03-04 | 2008-01-01 | The Regents Of The University Of Colorado | Differential delay-line analog-to-digital converter |
| JP2007110686A (ja) * | 2005-09-14 | 2007-04-26 | Advantest Corp | デジタル回路、半導体デバイス及びクロック調整方法 |
| CN1862273B (zh) * | 2006-01-09 | 2010-04-21 | 北京大学深圳研究生院 | 一种测试时钟信号抖动的片上系统 |
| US7750706B1 (en) * | 2006-07-21 | 2010-07-06 | Marvell International Ltd. | Circuits, architectures, apparatuses, systems, and methods for low voltage clock delay generation |
| JP4271244B2 (ja) | 2007-03-26 | 2009-06-03 | 株式会社半導体理工学研究センター | アナログ・デジタル（ａｄ）変換器及びアナログ・デジタル変換方法 |
| JP2011169594A (ja) * | 2008-06-13 | 2011-09-01 | Advantest Corp | マルチストローブ回路およびそのキャリブレーション方法および試験装置 |
| US8228106B2 (en) * | 2010-01-29 | 2012-07-24 | Intel Mobile Communications GmbH | On-chip self calibrating delay monitoring circuitry |
| US20130002274A1 (en) * | 2010-03-29 | 2013-01-03 | Nec Corporation | Aging degradation diagnosis circuit and aging degradation diagnosis method for semiconductor integrated circuit |
-
2012
- 2012-02-08 US US13/368,906 patent/US8680908B2/en not_active Expired - Fee Related
-
2013
- 2013-01-17 JP JP2014553393A patent/JP2015511427A/ja active Pending
- 2013-01-17 CN CN201380005672.5A patent/CN104054263B/zh not_active Expired - Fee Related
- 2013-01-17 EP EP13704267.7A patent/EP2805416A1/en not_active Withdrawn
- 2013-01-17 WO PCT/US2013/021836 patent/WO2013109688A1/en not_active Ceased
- 2013-01-17 KR KR1020147022900A patent/KR20140123956A/ko not_active Ceased
-
2018
- 2018-04-04 JP JP2018072371A patent/JP2018152567A/ja active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| US20130181759A1 (en) | 2013-07-18 |
| JP2018152567A (ja) | 2018-09-27 |
| US8680908B2 (en) | 2014-03-25 |
| WO2013109688A1 (en) | 2013-07-25 |
| JP2015511427A (ja) | 2015-04-16 |
| CN104054263A (zh) | 2014-09-17 |
| EP2805416A1 (en) | 2014-11-26 |
| CN104054263B (zh) | 2017-02-22 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PA0105 | International application |
Patent event date: 20140814 Patent event code: PA01051R01D Comment text: International Patent Application |
|
| PG1501 | Laying open of application | ||
| A201 | Request for examination | ||
| PA0201 | Request for examination |
Patent event code: PA02012R01D Patent event date: 20180102 Comment text: Request for Examination of Application |
|
| E902 | Notification of reason for refusal | ||
| PE0902 | Notice of grounds for rejection |
Comment text: Notification of reason for refusal Patent event date: 20190128 Patent event code: PE09021S01D |
|
| E601 | Decision to refuse application | ||
| PE0601 | Decision on rejection of patent |
Patent event date: 20190409 Comment text: Decision to Refuse Application Patent event code: PE06012S01D Patent event date: 20190128 Comment text: Notification of reason for refusal Patent event code: PE06011S01I |