KR20120108852A - Jig unit for testing led chip - Google Patents

Abstract

PURPOSE: A jig unit for LED chip inspection is provided to prevent interference between integral spheres which are installed on the upper surface of an LED chip. CONSTITUTION: A seating member(120) comprises a seating surface and a probe insertion hole. An LED chip is settled on the seating surface. The probe insertion hole is extended until the seating surface. A probe assembly(130) comprises a probe which contacting the lower surface of the LED chip through the probe insertion hole and is arranged which can be ascended and descended. A probe movement actuator(140) lifts the probe assembly and contacts the probe to the lower surface of the LED chip. A first holder(150) is arranged on the seating surface and is installed to be moved in a horizontal direction toward the probe insertion hole. A second holder(160) is installed to be moved in the horizontal direction. A holder moving actuator(170) moves the first holder and the second holder.

Description

Jig unit for testing LED chip}

The present invention relates to a jig unit for LED chip inspection, and more particularly, to a jig unit for LED chip inspection that can supply power to the LED chip and detect the electrical characteristics of the LED chip while fixing the LED chip. .

An LED is a light emitting device using a light emitting phenomenon generated when a voltage is applied to a semiconductor. One LED serves as a point light source, but when a plurality of LEDs are gathered, they may act as line light sources or surface light sources.

LEDs are more stable and reliable than other thermal conversion light emitting devices, have low power consumption, and have long life. At present, LED technology is rapidly evolving, and high-efficiency, high-brightness LEDs of various colors are being released. In addition, the application fields of LEDs, which have been applied to simple display devices, are expanding. Recently, as LED is used as a light source of a backlight unit used in a flat panel display, the demand for LED is greatly increased.

LED chips, a key component of LED products, are formed on wafers through a semiconductor process and then cut into individual chips. The separated LED chips are commercialized through packaging processes such as lead connection and molding. Recently, a technique of attaching to a circuit board using an electrode pattern on the bottom of an LED chip without using an additional connection structure such as a metal lead or an intermediate medium such as a ball grid array (BGA) has been utilized. In addition, in the production of LED products, a manufacturing method in which a production process is reduced by applying a fluorescent layer on a wafer on which an LED chip is formed and then performing a cutting process is used.

The produced LED chips are inspected before shipment. Common LED chip inspections include luminescence properties through a spectrometer and electrical properties through a probe, and these tests are performed simultaneously.

In the LED chip inspection, conventionally, the bottom surface of the LED chip was vacuum-adsorbed with a jig, and then a probe was brought into contact with the top surface of the LED chip to supply power to the LED chip, and the electrical characteristics of the LED chip were examined. However, in order for the probe to contact the upper surface of the LED chip, an integrating sphere for guiding light generated from the LED chip to the spectrometer must be disposed away from the LED chip, so that a part of the light generated from the LED chip is integrated with the LED chip. A problem emerged through the gaps between the spheres. If some of the light emitted from the LED chip escapes, the accuracy of the light emission characteristic test will be reduced.

In addition, in the related art, the probe for inspecting the power supply and the electrical characteristics of the LED is in contact with the upper surface of the LED chip, causing interference with the integrating sphere, and the task of contacting the probe with the LED chip is cumbersome.

The present invention is to solve this problem, an object of the present invention is to contact the probe to the lower surface of the LED chip to avoid interference with the integrating sphere to facilitate the probe contact work, LED chip that can increase the accuracy of the light emission characteristic inspection It is to provide an inspection jig unit.

LED chip inspection jig unit according to the present invention for achieving the above object is a seating member having a seating surface on which the LED chip is mounted and a probe insertion hole extending up and down to the seating surface, the probe insertion hole of the seating member A probe assembly having a probe in contact with a bottom surface of the LED chip placed on the seating surface, the probe assembly being arranged to be liftable with respect to the seating member, and a probe for raising the probe assembly to allow the probe to contact the bottom surface of the LED chip A first holder having a moving actuator disposed on the seating surface and movably installed in the horizontal direction toward the probe insertion hole, the first holding member having the probe insertion hole interposed therebetween A second holder having a second holding member which is disposed to face the second housing and is installed to be movable in a horizontal direction; And a holder actuating actuator for moving the first holder and the second holder to be proximate or away from each other.

Since the jig unit for LED chip inspection according to the present invention can contact the probe for applying power and inspecting electrical characteristics to the lower surface of the LED chip, interference does not occur between the probe and the integrating sphere installed on the LED chip. Therefore, the operation of contacting the probe to the LED chip can be made very easily and quickly, and the LED chip inspection efficiency can be greatly improved.

In addition, the jig unit for inspecting the LED chip according to the present invention can be installed so that the integrating sphere completely covers the seating surface on which the LED chip is placed, thereby preventing external radiation of light due to a gap between the LED chip and the integrating sphere as in the prior art. It is possible to increase the accuracy of the light emission characteristic inspection.

In addition, the jig unit for LED chip inspection according to the present invention is made of a compact structure can be manufactured in a small size, it can be used for the inspection of LED chips of various sizes.

1 is a perspective view showing a jig unit for LED chip inspection according to an embodiment of the present invention.
2 is an exploded perspective view illustrating a jig unit for inspecting an LED chip according to an exemplary embodiment of the present invention.
Figure 3 is a side cross-sectional view showing the main part of the jig unit for LED chip inspection according to an embodiment of the present invention.
4 is a plan view illustrating a jig unit for inspecting an LED chip according to an exemplary embodiment of the present invention.
FIG. 5 illustrates an operation of clamping an LED chip having a first holder and a second holder of a jig unit for inspecting an LED chip according to an embodiment of the present invention.
6 illustrates an operation of a probe of a jig unit for inspecting an LED chip according to an embodiment of the present invention in contact with the LED chip.
7 shows a state in which the integrating sphere is coupled to the LED chip inspection jig unit according to an embodiment of the present invention.

Hereinafter, with reference to the accompanying drawings, it will be described in detail with respect to the LED chip inspection jig unit according to an embodiment of the present invention.

In describing the present invention, the sizes and shapes of the components shown in the drawings may be exaggerated or simplified for clarity and convenience of explanation.

As shown in Figure 1 and 2, the jig unit 100 for LED inspection according to an embodiment of the present invention, the base member 110, the seating member 120 on which the LED chip 10 is mounted, the power source A probe assembly 130 having a probe 131 for supply and electrical property inspection, and a probe movement actuator 140 for moving the probe assembly 130 to allow the probe 131 to contact the bottom surface of the LED chip 10. , A holder for operating the first holder 150 and the second holder 160, the first holder 150, and the second holder 160 to clamp the LED chip 10 seated on the seating member 120. An actuating actuator 170. Using the LED inspection jig unit 100 by contacting the probe 131 on the lower surface of the LED chip 10, and installs the integrating sphere 20 connected to the spectrometer 30 on the upper portion of the LED chip 10 electrical The property test and the light emission property test can be performed at the same time.

The base member 110 is coupled to the fixing member 185 to which the seating member 120 is fixed through the plurality of support bars 180. One end of the plurality of support bars 180 is coupled to the bottom surface of the fixing member 185 and the other end thereof is inserted and fixed in the fixing hole 111 provided on the top surface of the base member 110. Thus, the distance between the base member 110 and the seating member 120 is kept constant. The base member 110 has a mounting groove 112 and a through hole 113. The holder operation actuator 170 is coupled to the mounting groove 112, and the operation member 142 of the probe movement actuator 140 is inserted into the through hole 113.

The seating member 120 is coupled to an upper surface of the fixing member 185 and disposed above the base member 110. The mounting member 120 has a flat mounting surface 121 on which the LED chip 10 is mounted and a probe insertion hole 122 extending to the mounting surface 121. As shown in FIGS. 2 and 3, the probe insertion holes 122 extend from the bottom surface of the seating member 120 to the seating surface 121 on the top surface, and are provided in a number corresponding to the number of probes 131. . The probe 131 disposed below the seating member 120 may contact the bottom surface of the LED chip 10 seated on the seating surface 121 through the probe insertion hole 122. A pair of guide grooves 123 and 124 open to the outer side of the seating member 120 are provided. These guide grooves 123 and 124 are symmetrically disposed about the probe insertion hole 122.

The fixing member 185 is fixed to the base member 110 through the plurality of support bars 180 and supports the seating member 120. A support member insertion hole 186 connected to the plurality of probe insertion holes 122 is provided at the center of the fixing member 185, and a pair of guide grooves opened outward at both sides of the support member insertion hole 186. (187) (188). The probe support member 132 of the probe assembly 130 to be described later is inserted into the support member insertion hole 186. The pair of guide grooves 187 and 188 are connected to the guide grooves 123 and 124 of the seating member 120 in the vertical direction.

As illustrated in FIGS. 1 to 3, the probe assembly 130 is disposed to be movable in the vertical direction between the base member 110 and the fixing member 185. A probe support member 132 protruding upward is provided at the center of the upper surface of the probe assembly 130, and a plurality of probes 131 are coupled to the probe support member 132. The probe 131 extends from the lower surface of the probe support member 132 so that an upper end thereof protrudes in the upper direction of the probe support member 132.

The lower end of the probe 131 is connected to a cable 133 for power supply and signal transmission. The cable 133 is connected to the probe 131 through a connection hole 134 provided on one side of the probe assembly 130. The probe 131 is a pogo type in which an upper end thereof is supported by a shock absorbing member such as a spring so that an excessive impact is not applied to the LED chip 10 when the probe 131 is in contact with the bottom surface of the LED chip 10. Can be used. As the probe 131, a wire pin-shaped probe other than the pogo type may be used.

The probe assembly 130 includes a plurality of guide bar insertion grooves disposed around the pair of guide grooves 135 and 136 and the probe support member 132 which are formed to face each other with the probe support member 132 at the center thereof. Has 137. The pair of guide grooves 135 and 136 extend in the inner and outer directions and are connected to the guide grooves 187 and 188 of the fixing member 185 in the vertical direction. The support bar 180 is inserted into the plurality of support bar insertion grooves 137 such that the probe assembly 130 slides along the support bar 180.

The probe assembly 130 rises toward the seating member 120 by the probe movement actuator 140, and when the action force of the probe movement actuator 140 is removed, the probe assembly 130 is originally positioned by the spring 183 coupled to the support bar 180. Return to. The spring 183 is disposed between the fixing member 185 and the probe assembly 130 to apply an elastic force to the probe assembly 130 in a direction opposite to the direction of movement by the probe movement actuator 140. The installation position of the spring 183 is not limited to that shown, and may be changed to another position where an elastic force may be applied to return the probe assembly 130.

When the operation member 142 of the probe movement actuator 140 that raised the probe assembly 130 is lowered to its original position, the probe assembly 130 may be lowered by its own weight, and thus the spring 183 may be omitted. When the operation member 142 is coupled to the probe assembly 130, the probe assembly 130 may be elevated by the operation of the operation member 142. In this case, the spring 183 may be omitted.

As shown in FIGS. 1 and 2, the probe movement actuator 140 includes a body 141 and an operation member 142 slidably coupled to the body 141. As the probe movement actuator 140, various devices capable of providing a linear force to the probe assembly 130 such as a pneumatic cylinder and a hydraulic cylinder may be used. The probe movement actuator 140 has a body 141 disposed below the base member 110 and an actuating member 142 on the lower surface of the probe assembly 130 through the through hole 113 of the base member 110. By reaching, it is located inside the base member 110 in the width direction. This arrangement advantageously serves to reduce the overall width of the jig unit 100 for LED chip inspection according to the present invention.

The first holder 150 and the second holder 160 are clamped or spaced from the LED chip 10 while being moved by the holder actuating actuator 170. The first holder 150 is disposed on the seating surface 121 and is moved in the horizontal direction by the first holding member 151 and the holder operating actuator 170 which move in the horizontal direction toward the probe insertion hole 122. The operating arm 152, the first holding member 151 and the first connecting member 153 connecting the first operating arm 152 are included. Here, the horizontal direction is a horizontal direction with respect to the seating surface 121 on which the LED chip 10 is placed.

When the first actuating arm 152 is moved in the horizontal direction by the holder actuating actuator 170, the first holding member 151 is closer to or farther from the probe inserting hole 122. By changing the structure of the first operating arm 152, the first holding member 151 may be directly coupled to the first operating arm 152 without the first connecting member 153. The first holding member 151 is vertically coupled to the first connecting member 153 at the upper end of the first connecting member 153 so as to face the probe insertion hole 122 in the center of the mounting surface 121, and the first holder. Except for the first holding member 151 of 150, the guide groove 123 of the seating member 120, the guide groove 187 of the fixing member 185, the guide groove 135 of the probe assembly 130 Move within. Therefore, the first holder 150 is located inside the base member 110 when viewed in the width direction as shown in FIG. 4.

The second holder 160 is disposed on the seating surface 121 to the second holding member 161 and the holder operating actuator 170 facing the first holding member 151 with the probe insertion hole 122 therebetween. And a second connecting member 163 connecting the second operating arm 162, the second holding member 161, and the second operating arm 162 to be coupled thereto. Since the structure of the second holder 160 is the same as that of the first holder 150, detailed descriptions of the components of the second holder 160 will be omitted.

The second holding member 161 is vertically coupled to the second connecting member 163 at the upper end of the second connecting member 163 to face the probe insertion hole 122 in the center of the mounting surface 121, and the second holder. Except for the second holding member 161 of the 160, the guide groove 124 of the seating member 120, the guide groove 188 of the fixing member 185, the guide groove 136 of the probe assembly 130 Move within. Therefore, the second holder 160 is located inside the base member 110 in the same width direction as the first holder 150.

The holder actuating actuator 170 moves the first holder 150 and the second holder 160 to be close to or far from each other. When the holder actuating actuator 170 moves the first holder 150 and the second holder 160 in close proximity to each other, the first holding member 151 and the second holding member 161 move the probe insertion hole 122. It moves toward to clamp the LED chip 10 placed on the probe insertion hole 122. On the contrary, when the holder actuating actuator 170 moves the first holder 150 and the second holder 160 away from each other, the first holding member 151 and the second holding member 161 move to the LED chip 10. Falls from.

As shown in FIG. 4, the first holding member 151 has a first fixing groove 154 for accommodating a part of the outer edge of the LED chip 10, and the second holding member 161 is formed of a first holding member 161. It has a second fixing groove 164 for accommodating a part of the opposite side of the outer edge portion of the LED chip 10 inserted into the first fixing groove 154. The first fixing groove 154 has a shape corresponding to a part of the outer edge of the LED chip 10, the second fixing groove 164 has a shape corresponding to the other part of the outer edge of the LED chip 10. Is done.

Therefore, the first holding member 151 and the second holding member 161 may be in contact with the outer edge of the LED chip 10 to align the LED chip 10. That is, even if the LED chip 10 is placed on the seating surface 121 so that the posture is misaligned, the first holding member 151 and the second holding member 161 are joined to the outer edges of the LED chip 10, thereby forming an electrode pattern. The posture of the LED chip 10 is corrected so that the 11 is positioned directly above the probe insertion hole 122.

As shown in FIG. 3, the first inclined surface 155 and the second inclined surface 165 are formed at the edge of the first holding member 151 and the second holding member 161 in contact with the LED chip 10. Each is provided. The first inclined surface 155 presses a portion of the outer edge of the LED chip 10 downward, and the second inclined surface 165 presses another portion of the outer edge of the LED chip 10 downward. When the probe 131 contacts the LED chip 10 by the action of the first inclined surface 155 and the second inclined surface 165, the LED chip 10 is not spaced apart from the probe 131, and the probe 131 May maintain a stable contact state with the electrode pattern 11 of the LED chip 10.

As shown in FIGS. 1 and 2, the holder actuating actuator 170 is coupled to the mounting groove 112 of the base member 110. The holder actuating actuator 170 extends below the base member 110 in the longitudinal direction but does not leave the base member 110 in the width direction. As the holder operating actuator 170, various devices capable of moving the first holder 150 and the second holder 160 in the horizontal direction, such as a pneumatic cylinder and a hydraulic cylinder, may be used.

Hereinafter, the operation of the jig unit for LED chip inspection according to an embodiment of the present invention will be described.

As shown in FIGS. 3 and 4, when the LED chip 10 is seated on the seating surface 121 directly above the probe insertion hole 122, the holder actuating actuator 170 is operated to first operate the first holder 150. ) And the second holder 160 move closer to each other. At this time, the first holding member 151 and the second holding member 161 move in the horizontal direction and simultaneously approach the LED chip 10.

As shown in FIG. 5, when the first holding member 151 and the second holding member 161 reach the LED chip 10, the LED chip 10 has a portion of the outer edge of the first holding member ( A part of the outer edge of the second fixing member 161 is received in the first fixing groove 154 of the second holding member 161 is received in the second fixing groove 164 of the second holding member 161. At this time, the LED chip 10 is aligned while the outer edge thereof is accommodated in the first fixing groove 154 and the second fixing groove 164 and then fixed under the same pressure from two opposite directions.

After the LED chip 10 is fixed, the holder actuating actuator 170 is stopped, and the probe movement actuator 140 is operated. As shown in FIG. 6, the probe movement actuator 140 pushes the probe assembly 130 upward to move the probe assembly 130 by a predetermined distance. When the probe assembly 130 is raised, the probe 131 slides along the probe insertion hole 122, and an upper end thereof contacts the electrode pattern 11 on the bottom surface of the LED chip 10. At this time, the LED chip 10 is subjected to a force in the upper direction, the first inclined surface 155 of the first holding member 151 and the second inclined surface 165 of the second holding member 161 to the outer edge Since the LED chip 10 is pressed downward, the probe 131 may maintain a stable contact state.

After the probe 131 contacts the electrode pattern 11 of the LED chip 10, the probe 131 supplies power to the LED chip 10 and simultaneously checks electrical characteristics of the LED chip 10. In addition, as shown in FIG. 7, when the integrating sphere 20 to which the spectrometer 30 is coupled is coupled to the jig unit 100 to cover the LED chip 10, light generated through the spectrometer 30 may be generated. The light emission characteristics of the LED chip 10 can be inspected. In this case, since the integrating sphere 20 completely covers the seating surface 121 on which the LED chip 10 is placed, external radiation of light due to the generation of a gap between the LED chip 10 and the integrating sphere 20 as in the prior art is generated. You can stop it.

As described above, the LED chip inspection jig unit 100 according to the present invention stably fixes the LED chip 10 placed on the seating surface 121, and then inserts a probe insertion hole formed through the seating surface 121 ( Since the probe 131 may be in contact with the bottom surface of the LED chip 10 through 122, the operation of contacting the probe 131 to the LED chip 10 is very easy.

In addition, the integrating sphere 20 may be installed to completely cover the seating surface 121 on which the LED chip 10 is placed so that the light generated from the LED chip 10 may be completely trapped in the integrating sphere 20. Therefore, the external radiation of light due to the generation of a gap between the LED chip 10 and the integrating sphere 20 can be prevented as in the prior art, thereby improving the accuracy of the light emission characteristic inspection.

In addition, if all or part of the first holding member 151 and the second holding member 161 which are in contact with the LED chip 10 are made of a transparent material, the loss of light generated by the LED chip 10 is further reduced. By doing so, it is possible to further increase the accuracy of the light emission characteristic inspection.

In addition, coating the mounting surface 121 on which the LED chip 10 is seated with a material capable of reflecting light may further reduce the loss of light generated from the LED chip 10. Meanwhile, the holder operating actuator 170 for operating the first holder 150 and the second holder 160 described above may be configured using various mechanical elements such as a motor, a ball string, as well as a pneumatic actuator.

The embodiments of the present invention described above and illustrated in the drawings should not be construed as limiting the technical spirit of the present invention, and the protection scope of the present invention is limited only by the matters described in the claims. Those skilled in the art can improve or change the technical spirit of the present invention in various forms, and such improvements and modifications will fall within the protection scope of the present invention.

100: LED chip inspection jig unit 110: base
120: seating member 121: seating surface
122: probe insertion hole 130: brobe assembly
131: probe 132: probe support member
140: probe movement actuator 142: operating member
150, 160: 1st, 2nd holder 151, 161: 1st, 2nd holding member
152, 162: 1st, 2nd working arm 153, 163: 1st, 2nd connection member
154, 164: first and second fixing grooves 155, 165: first and second inclined surfaces
170: Holder Actuator

Claims (9)

A seating member having a seating surface on which an LED chip is mounted and a probe insertion hole extending up and down to the seating surface;
A probe assembly having a probe contacting a lower surface of the LED chip placed on the seating surface through a probe insertion hole of the seating member, the probe assembly disposed to be liftable with respect to the seating member;
A probe movement actuator for raising the probe assembly to allow the probe to contact the bottom surface of the LED chip;
A first holder disposed on the seating surface and having a first holding member movably installed in a horizontal direction toward the probe insertion hole;
A second holder having a second holding member disposed on the seating surface so as to face the first holding member so as to be movable in a horizontal direction with the probe insertion hole interposed therebetween; And
And a holder actuating actuator for moving the first holder and the second holder to be close to or far from each other. The method of claim 1,
The first holding member has a first fixing groove for receiving a portion of the outer edge of the LED chip,
The second holding member has a second fixing groove for accommodating the other part of the outer edge of the LED chip jig unit for inspection. The method according to claim 1 or 2,
The first holding member has a first inclined surface for pressing a portion of an outer edge of the LED chip toward the probe such that the LED chip is not spaced apart from the probe when the probe contacts the LED chip.
The second holding member has a second inclined surface for pressing another part of the outer edge of the LED chip toward the probe so that the LED chip is not spaced apart from the probe when the probe contacts the LED chip. Jig unit for LED inspection. The method of claim 1,
And a spring for applying an elastic force in a downward direction with respect to the probe assembly in order to return the probe assembly lifted by the probe movement actuator. The method of claim 1,
A base member disposed below the probe assembly; And
And a support bar coupled to the base member so as to face upward and supporting the seating member.
And the probe assembly has a support bar insertion hole into which the support bar is inserted to slide along the support bar between the seating member and the base member. The method of claim 5, wherein
The probe movement actuator includes an actuating rod removably coupled to the body to pressurize the body and the probe assembly,
The body of the probe movement actuator is disposed under the base member, the operation rod reaches the probe assembly through a through hole which is provided to penetrate the base member in the vertical direction. . The method of claim 1,
A fixing member disposed between the seating member and the probe assembly to fix the seating member and having a support member insertion hole connected to the probe insertion hole,
The probe assembly is a jig unit for LED inspection, characterized in that the probe support member protruding upward to support the probe and to slide along the support member insertion hole. The method of claim 1,
The holder actuating actuator is disposed below the probe assembly,
The first holder further comprises a first actuating arm engaged with the first holding member and moved in a horizontal direction by the holder actuating actuator toward the probe insertion hole,
And the second holder further comprises a second operating arm coupled with the second holding member and moved horizontally by the holder operating actuator toward the probe insertion hole. The method of claim 8,
Each of the seating member and the probe assembly includes the first holder and the second holder such that a portion except the first holding member of the first holder and a portion except the second holding member of the second holder are accommodated. Jig unit for testing LED, characterized in that it has a guide groove extending in the moving direction of.

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