CN107664706B - LED measuring clamp - Google Patents

LED measuring clamp Download PDF

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Publication number
CN107664706B
CN107664706B CN201711062350.0A CN201711062350A CN107664706B CN 107664706 B CN107664706 B CN 107664706B CN 201711062350 A CN201711062350 A CN 201711062350A CN 107664706 B CN107664706 B CN 107664706B
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China
Prior art keywords
probe
led
control
ring
fixed
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CN201711062350.0A
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Chinese (zh)
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CN107664706A (en
Inventor
宫庆良
黄安平
张国军
陈培宏
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Shenzhen Aopute Technology Co ltd
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Shenzhen Aopute Technology Co ltd
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/04Housings; Supporting members; Arrangements of terminals
    • G01R1/0408Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0425Test clips, e.g. for IC's
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/073Multiple probes
    • G01R1/07392Multiple probes manipulating each probe element or tip individually
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02BCLIMATE CHANGE MITIGATION TECHNOLOGIES RELATED TO BUILDINGS, e.g. HOUSING, HOUSE APPLIANCES OR RELATED END-USER APPLICATIONS
    • Y02B20/00Energy efficient lighting technologies, e.g. halogen lamps or gas discharge lamps
    • Y02B20/40Control techniques providing energy savings, e.g. smart controller or presence detection

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)

Abstract

The invention discloses an LED measuring clamp which comprises an LED placing substrate, a probe, a fixed clamping mechanism, a probe control mechanism and a conductive mechanism connected with the probe, wherein the probe is arranged on the LED placing substrate; the fixing mechanism clamps and fixes the LEDs on the LED placing substrate, the probe control mechanism enables the probes to ascend or descend to enable the probes to be contacted with or far away from the LED conductive contacts in the vertical direction, and the conductive mechanism enables the probes to conduct electricity, and the test of relevant parameters is completed through the tester system. The LED measuring clamp is convenient to operate and long in service life; 2. the LED position is accurately controlled, the contact probe is accurate in position, and the stability is high; 3. the probe up-down control and the LED clamping plate control are separated, so that the LED placement process is more stable; 4. the stability of each parameter of the LED tested by the clamp is strong; 4. the time for replacing the LEDs is short; 5. the fixture space is reasonable in design and convenient in part replacement.

Description

LED measuring clamp
Technical Field
The invention relates to the technical field of measurement of electronic components, in particular to an LED measurement clamp.
Background
The LED (light emitting diode) has been widely popularized and applied due to meeting the development requirements of energy conservation and environmental protection in the current society. In the production process of the LED, the LED needs to be measured by using a clamp, and the stability of the LED clamp directly influences the stability of a test result. The jig is used very frequently during the production process, so the service life of the jig is also a very important index. The traditional fixture has the defects of unstable test results, short service life, inconvenient operation, long LED replacement time and the like caused by the problems of relatively imperfect structural design, inaccurate fixture fixing position, inaccurate contact probe position, unsophisticated mechanical operation and the like.
Disclosure of Invention
Aiming at the defects in the prior art, the invention provides the LED measuring clamp, which is used for testing various parameters of an LED, and has the advantages of high accuracy, strong stability, convenient operation, long service life and improved testing efficiency.
In order to achieve the above object, the technical scheme of the present invention is as follows:
an LED measuring clamp comprises an LED placing substrate for fixing an LED, a probe, a fixing and clamping mechanism for fixing and clamping the LED, a probe control mechanism for controlling the probe to ascend or descend and enabling the probe to contact with or be far away from an LED conductive contact in the vertical direction, and a conductive mechanism connected with the probe; the fixing mechanism clamps and fixes the LEDs on the LED placing substrate, the probe control mechanism enables the probes to ascend or descend to enable the probes to be contacted with or far away from the LED conductive contacts in the vertical direction, and the conductive mechanism enables the probes to conduct electricity, and the test of relevant parameters is completed through the tester system.
As an improvement to the technical scheme, the fixed clamping mechanism comprises a control needle lower pressure control ring, the LED placing substrate is arranged at the top end inner ring of the control needle lower pressure control ring, and the upper surface of the LED placing substrate is recessed with an LED placing groove for placing LEDs; the control needle downward pressure control ring is provided with a control button mounting groove below the LED placing substrate, and an LED clamping plate control button is movably arranged in the control button mounting groove; the LED clamp plate spring fixing box is fixedly arranged on the inner ring at the top end of the control needle lower pressure control ring, the LED clamp plate spring fixing box is opposite to the LED clamp plate control button, the clamp plate spring fixing box is provided with a clamp plate control spring, and the front end of the clamp plate control spring is connected with an LED clamp plate. The LED placing substrate is used for providing a groove for placing the LEDs and is matched with the LED clamping plate to fix the LED chips.
As an improvement to the technical scheme, the probe control mechanism comprises a probe, a fixed support with a hollow structure, a fixed ring sleeved on the periphery of the bottom end of the fixed support, a needle control lower pressure control ring sleeved on the periphery of the fixed support and embedded in the fixed ring in a vertically movable manner, and a probe upper and lower control panel arranged below the needle lower pressure control ring; the probe upper and lower control panel is arranged at the bottom end of the fixed support, the inner side of the probe upper and lower control panel is provided with a fixed plate and a fixed connecting plate, a probe direction fixing box is fixedly connected between the fixed plate and the fixed connecting plate, and the probe is fixed on the probe direction fixing box.
As an improvement to the technical scheme, the probe control mechanism further comprises a protruding block arranged at the bottom end of the probe lower pressure control ring, a protruding block arranged at the inner ring at the top end of the fixed ring, and a reset spring arranged under the upper and lower control panels of the probe, wherein the lower end of the reset spring is propped against the lower ring of the fixed ring, and the upper end of the reset spring is propped against the upper and lower control panels of the probe.
As an improvement to the technical scheme, the bottom protruding blocks of the probe downward pressure control ring and the top protruding blocks of the fixing ring are respectively two and correspondingly and symmetrically arranged.
The fixing ring is provided with two mutually symmetrical protruding blocks, and the two symmetrical protruding blocks are matched with the two symmetrical protruding blocks in the probe downward pressure control ring, so that the downward pressure and the upward pressure of the probe are realized. The probe downward pressure control ring is provided with two symmetrical protruding blocks which are matched with the two symmetrical protruding blocks in the fixed ring, so that the probe is pressed down and lifted up.
When the probe rises, the probe downward pressure control ring is rotated to enable the two symmetrical protruding blocks in the probe downward pressure control ring to be respectively overlapped with the two symmetrical protruding blocks in the fixed ring, so that the probe downward pressure control ring is integrally pressed down and drives the spring to compress, and the probe upward and downward control panel is connected with the probe assembly, thereby driving the probe to be pressed down and preserving the pressed down state, and the pressing depth is the height of the protruding blocks in the fixed ring.
When the probe is in a downward pressing state, the probe downward pressing control ring is rotated, so that two symmetrical protruding blocks in the probe downward pressing control ring and two symmetrical protruding blocks in the fixed ring are staggered, the probe downward pressing control ring is integrally lifted, the spring is driven to spring open, the upper and lower probe control panels are connected with the probe assembly, the probe is driven to lift, and the lifting depth is the height of the protruding blocks in the fixed ring.
As an improvement of the above technical solution, there are four guide holes in the probe direction fixing case, and there are four probes, which are respectively taken out from the four guide holes side of the probe direction fixing case.
As an improvement of the technical scheme, the probe direction fixing box is provided with a jackscrew hole and a jackscrew so as to adjust the relative position of the fixed probe relative to the probe direction fixing box.
As an improvement of the technical scheme, a fixture watchcase with a hollow structure is arranged below the fixed ring, the fixed ring is fixedly arranged on the periphery of the upper end of the fixture watchcase, and the part of the probe extending from the probe direction fixing box extends into the hollow structure of the fixture watchcase.
As an improvement to the above technical solution, the conductive mechanism includes a power aviation connector, and the power aviation connector is connected with the probe by a wire.
As an improvement to the technical scheme, the power supply aviation connector is arranged at the top end of the power supply aviation connector, and the power supply aviation connector is fixed at the bottom end of the clamp watchcase through the power supply aviation connector.
The test principle of the invention is as follows:
before use, the power input line is connected with the fixture power aviation connector, the probe is pressed downwards and is always in a pressed state through the probe control mechanism, at the moment, the clamping plate for fixing the LED is opened through the LED fixing clamping mechanism, after the LED fixing clamping plate is opened, the LED is placed in the LED slot, after the placement is completed, the LED clamping plate is loosened, the LED is fixed in the slot, at the moment, the contact probe is sprung upwards through the probe control mechanism, and contacts with the bottom contact of the tested LED. After the placing work is completed, the clamp is placed in the tester system, a relevant test power supply is input through an input power line, and the test of relevant parameters is performed through the tester system.
The LED placing substrate is used for providing a groove for placing the LEDs and fixing the LED chips by matching with the LED clamping plates; the probe downward pressure control ring is matched with the fixed ring for use, so that the functions of controlling the probe downward pressure and the probe upward pressure are achieved; the fixed bracket is a base for placing the upper and lower control panels of the probe and the lower control ring of the probe; the clamp watchcase is a part of an operator holding the clamp in the using process; the LED clamping plate control button is matched with the LED clamping plate spring fixing box to control the LED clamping plate to be switched on and off; the power supply aviation connector is a device with a clamp watchcase connected with the power supply aviation connector; the spring is arranged in the LED clamping plate spring fixing box, and the compression and the spring opening of the spring are realized through the LED clamping plate control button, so that the opening and the closing of the LED panel are controlled; the lower part of the upper and lower control panel of the probe is provided with a spring and is connected with the probe direction fixing box through a fixed plate, when the lower pressure control ring of the probe is pressed down, the upper and lower control panel of the probe is pressed down, so that the spring below the upper and lower control panel is compressed, the whole probe direction fixing box is driven to be pressed down, and the probes are also pressed down together.
The fixing plate is a connecting device between one side of the probe direction fixing box and the upper and lower control panels of the probe; the fixed connection plate is a connection device between the upper control panel and the lower control panel of the probe on the other side of the probe direction fixing box, and the probe direction fixing box is connected with the fixed bracket to control the overall direction of the overall probe block; four hole sites are arranged in the probe direction fixing box and respectively control the directions of the four probes.
The probe height fixing box is provided with four control hole sites, and the upper and lower heights of the probes are adjusted through screws; the LED clamping plate is matched with the LED placing substrate, so that the LED chip is fixed in the LED groove; the power aviation connector is connected with a power input line to realize connection of an external power supply and an internal circuit. The bottoms of the four probes are respectively connected with four wires, and the four wires are led into the power aviation connector.
Compared with the prior art, the invention has the advantages and positive effects that:
the LED measuring clamp is convenient to operate and long in service life; 2. the LED position is accurately controlled, the contact probe is accurate in position, and the stability is high; 3. the probe up-down control and the LED clamping plate control are separated, so that the LED placement process is more stable; 4. the stability of each parameter of the LED tested by the clamp is strong; 4. the time for replacing the LEDs is short; 5. the fixture space is reasonable in design and convenient in part replacement.
Drawings
In order to more clearly illustrate the embodiments of the invention or the technical solutions of the prior art, the drawings which are used in the description of the embodiments or the prior art will be briefly described, it being obvious that the drawings in the description below are only some embodiments of the invention, and that other drawings can be obtained according to these drawings without inventive faculty for a person skilled in the art.
FIG. 1 is a schematic diagram of the overall structure of the present invention;
FIG. 2 is a schematic top view of the present invention;
FIG. 3 is a schematic view of the cross-sectional structure A-A of FIG. 2;
FIG. 4 is a schematic view of the cross-sectional B-B structure of FIG. 2;
FIG. 5 is a schematic view of the cross-sectional C-C structure of FIG. 1;
FIG. 6 is a schematic perspective view of a retaining ring according to the present invention;
FIG. 7 is a schematic diagram showing a perspective structure of a probe down-pressure control ring according to the present invention;
FIG. 8 is a schematic view showing the relative positions of the probe pressing control ring and the fixing ring in the probe pressing state according to the present invention;
FIG. 9 is a schematic diagram showing the relative positions of the probe down-pressure control ring and the fixing ring in the probe up state according to the present invention.
Detailed Description
The following description of the embodiments of the present invention will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present invention, but not all embodiments. All other embodiments, modifications, equivalents, improvements, etc., which are apparent to those skilled in the art without the benefit of this disclosure, are intended to be included within the scope of this invention.
As shown in fig. 1 to 9, the LED measuring jig of the present invention comprises an LED placement substrate 1 for fixing an LED, a probe, a fixing and clamping mechanism for fixing and clamping the LED, a probe control mechanism for controlling the probe to rise or fall and to make the probe contact with or separate from the LED conductive contacts in the vertical direction, and a conductive mechanism connected to the probe; the fixing mechanism clamps and fixes the LEDs on the LED placing substrate, the probe control mechanism enables the probes to ascend or descend to enable the probes to be contacted with or far away from the LED conductive contacts in the vertical direction, and the conductive mechanism enables the probes to conduct electricity, and the test of relevant parameters is completed through the tester system.
The fixing and clamping mechanism comprises a control needle lower pressure control ring 2, the LED placing substrate 1 is arranged at the inner ring at the top end of the control needle lower pressure control ring 2, and an LED placing groove for placing LEDs is recessed in the upper surface of the LED placing substrate 1; the control needle downward pressure control ring 2 is provided with a control button mounting groove below the LED placing substrate 1, and an LED clamping plate control button 6 is movably arranged in the control button mounting groove; the LED splint spring fixing box 8 is fixedly arranged at the inner ring at the top end of the needle control lower pressure control ring 2, the LED splint spring fixing box 8 is opposite to the LED splint control button 6, the splint spring fixing box 8 is provided with a splint control spring, and the front end of the splint control spring is connected with an LED splint 14. The LED placement substrate 1 is used for providing a groove for placing LEDs and fixing the LED chips in cooperation with the LED clamping plate 14.
The probe control mechanism comprises a probe, a fixed support 4 with a hollow structure, a fixed ring 3 sleeved on the periphery of the bottom end of the fixed support 4, a needle control lower control ring 2 sleeved on the periphery of the fixed support 4 and embedded in the fixed ring 3 in a vertically movable manner, and a probe upper and lower control panel 9 arranged below the needle control lower control ring 2; the probe upper and lower control panel 9 is arranged at the bottom end of the fixed support 4, a fixed plate 10 and a fixed connecting plate 11 are arranged on the inner side of the probe upper and lower control panel 9, a probe direction fixing box 12 is fixedly connected between the fixed plate 10 and the fixed connecting plate 11, and the probe is fixed on the probe direction fixing box 12.
The probe control mechanism further comprises two protruding blocks arranged at the bottom end of the probe lower pressure control ring 2, two protruding blocks arranged at the inner ring at the top end of the fixed ring 3 and a reset spring arranged under the upper and lower probe control panel 9, wherein the lower end of the reset spring is propped against the lower ring of the fixed ring, the upper end of the reset spring is propped against the upper and lower probe control panel 9, and the two protruding blocks at the bottom end of the probe lower pressure control ring and the two protruding blocks at the top end of the fixed ring are correspondingly and symmetrically arranged.
The fixing ring is provided with two mutually symmetrical protruding blocks, and the two symmetrical protruding blocks are matched with the two symmetrical protruding blocks in the probe downward pressure control ring, so that the downward pressure and the upward pressure of the probe are realized. The probe downward pressure control ring is provided with two symmetrical protruding blocks which are matched with the two symmetrical protruding blocks in the fixed ring, so that the probe is pressed down and lifted up.
When the probe rises, the probe downward pressure control ring is rotated to enable the two symmetrical protruding blocks in the probe downward pressure control ring to be respectively overlapped with the two symmetrical protruding blocks in the fixed ring, so that the probe downward pressure control ring is integrally pressed down and drives the spring to compress, and the probe upward and downward control panel is connected with the probe assembly, thereby driving the probe to be pressed down and preserving the pressed down state, and the pressing depth is the height of the protruding blocks in the fixed ring.
When the probe is in a downward pressing state, the probe downward pressing control ring is rotated, so that two symmetrical protruding blocks in the probe downward pressing control ring and two symmetrical protruding blocks in the fixed ring are staggered, the probe downward pressing control ring is integrally lifted, the spring is driven to spring open, the upper and lower probe control panels are connected with the probe assembly, the probe is driven to lift, and the lifting depth is the height of the protruding blocks in the fixed ring.
The probe direction fixing case 12 has four guide holes, and the probes have four guide holes, which are respectively formed at the sides of the four guide holes of the probe direction fixing case 12. The probe orientation fixture 12 is provided with a top thread hole and a top thread to adjust the relative position of the fixture probe with respect to the probe orientation fixture 12.
The fixture watchcase 5 with a hollow structure is arranged below the fixing ring, the fixing ring is fixedly arranged on the periphery of the upper end of the fixture watchcase 5, and the part of the probe extending from the probe direction fixing box 12 extends into the hollow structure of the fixture watchcase 5.
The conductive mechanism includes a power air terminal 15 having a wire connected to the probe. The top end of the power aviation connector 15 is provided with a power aviation connector 7, and the power aviation connector 15 is fixed at the bottom end of the fixture watchcase 5 through the power aviation connector 7.
The test principle of the invention is as follows:
before use, the power input line is connected with the fixture power aviation connector, the probe is pressed downwards and is always in a pressed state through the probe control mechanism, at the moment, the clamping plate for fixing the LED is opened through the LED fixing clamping mechanism, after the LED fixing clamping plate is opened, the LED is placed in the LED slot, after the placement is completed, the LED clamping plate is loosened, the LED is fixed in the slot, at the moment, the contact probe is sprung upwards through the probe control mechanism, and contacts with the bottom contact of the tested LED. After the placing work is completed, the clamp is placed in the tester system, a relevant test power supply is input through an input power line, and the test of relevant parameters is performed through the tester system.
The LED placing substrate is used for providing a groove for placing the LEDs and fixing the LED chips by matching with the LED clamping plates; the probe downward pressure control ring is matched with the fixed ring for use, so that the functions of controlling the probe downward pressure and the probe upward pressure are achieved; the fixed bracket is a base for placing the upper and lower control panels of the probe and the lower control ring of the probe; the clamp watchcase is a part of an operator holding the clamp in the using process; the LED clamping plate control button is matched with the LED clamping plate spring fixing box to control the LED clamping plate to be switched on and off; the power supply aviation connector is a device with a clamp watchcase connected with the power supply aviation connector; the spring is arranged in the LED clamping plate spring fixing box, and the compression and the spring opening of the spring are realized through the LED clamping plate control button, so that the opening and the closing of the LED panel are controlled; the lower part of the upper and lower control panel of the probe is provided with a spring and is connected with the probe direction fixing box through a fixed plate, when the lower pressure control ring of the probe is pressed down, the upper and lower control panel of the probe is pressed down, so that the spring below the upper and lower control panel is compressed, the whole probe direction fixing box is driven to be pressed down, and the probes are also pressed down together.
The fixing plate is a connecting device between one side of the probe direction fixing box and the upper and lower control panels of the probe; the fixed connection plate is a connection device between the upper control panel and the lower control panel of the probe on the other side of the probe direction fixing box, and the probe direction fixing box is connected with the fixed bracket to control the overall direction of the overall probe block; four hole sites are arranged in the probe direction fixing box and respectively control the directions of the four probes.
The probe height fixing box is provided with four control hole sites, and the upper and lower heights of the probes are adjusted through screws; the LED clamping plate is matched with the LED placing substrate, so that the LED chip is fixed in the LED groove; the power aviation connector is connected with a power input line to realize connection of an external power supply and an internal circuit. The bottoms of the four probes are respectively connected with four wires, and the four wires are led into the power aviation connector.
The LED measuring clamp is convenient to operate and long in service life; 2. the LED position is accurately controlled, the contact probe is accurate in position, and the stability is high; 3. the probe up-down control and the LED clamping plate control are separated, so that the LED placement process is more stable; 4. the stability of each parameter of the LED tested by the clamp is strong; 4. the time for replacing the LEDs is short; 5. the fixture space is reasonable in design and convenient in part replacement.

Claims (9)

1. An LED measuring fixture, characterized in that: the LED probe comprises an LED placing substrate for fixing an LED, a probe, a fixing and clamping mechanism for fixing and clamping the LED, a probe control mechanism for controlling the probe to ascend or descend and enabling the probe to contact with or be far away from an LED conductive contact in the vertical direction, and a conductive mechanism connected with the probe; the LED is clamped and fixed on the LED placing substrate by the fixing mechanism, the probe is lifted or lowered by the probe control mechanism, the probe is contacted with or separated from the LED conductive contact in the vertical direction, the conductive mechanism conducts electricity of the probe, and the test of related parameters is completed by the tester system;
the fixed clamping mechanism comprises a control needle lower pressure control ring, the LED placing substrate is arranged at the inner ring at the top end of the control needle lower pressure control ring, and the upper surface of the LED placing substrate is sunken with an LED placing groove for placing LEDs; the control needle downward pressure control ring is provided with a control button mounting groove below the LED placing substrate, and an LED clamping plate control button is movably arranged in the control button mounting groove; the LED clamp plate spring fixing box is fixedly arranged on the inner ring at the top end of the control needle lower pressure control ring, the LED clamp plate spring fixing box is opposite to the LED clamp plate control button, the clamp plate spring fixing box is provided with a clamp plate control spring, and the front end of the clamp plate control spring is connected with an LED clamp plate.
2. The LED measurement fixture of claim 1, wherein: the probe control mechanism comprises a probe, a fixed support with a hollow structure, a fixed ring sleeved on the periphery of the bottom end of the fixed support, a needle control lower pressure control ring sleeved on the periphery of the fixed support and embedded in the fixed ring in a vertically movable manner, and a probe upper and lower control panel arranged below the needle lower pressure control ring; the probe upper and lower control panel is arranged at the bottom end of the fixed support, the inner side of the probe upper and lower control panel is provided with a fixed plate and a fixed connecting plate, a probe direction fixing box is fixedly connected between the fixed plate and the fixed connecting plate, and the probe is fixed on the probe direction fixing box.
3. The LED measurement fixture of claim 2, wherein: the probe control mechanism further comprises a protruding block arranged at the bottom end of the probe lower pressure control ring, a protruding block arranged at the inner ring at the top end of the fixed ring and a reset spring arranged under the probe upper and lower control panel, wherein the lower end of the reset spring is propped against the lower ring of the fixed ring, and the upper end of the reset spring is propped against the probe upper and lower control panel.
4. The LED measurement fixture of claim 3, wherein: the bottom end protruding blocks of the probe downward pressure control ring and the top end protruding blocks of the fixing ring are respectively two and correspondingly and symmetrically arranged.
5. The LED measurement fixture of claim 2, wherein: the probe direction fixing box is provided with four guide holes, the probes are four, and the four probes are respectively led out from the four guide holes of the probe direction fixing box.
6. The LED measurement fixture of claim 2, wherein: the probe direction fixing box is provided with a jackscrew hole and jackscrews so as to adjust and fix the relative position of the probe relative to the probe direction fixing box.
7. The LED measurement fixture of claim 2, wherein: the fixture is characterized in that a fixture watchcase with a hollow structure is arranged below the fixing ring, the fixing ring is fixedly arranged on the periphery of the upper end of the fixture watchcase, and the part of the probe extending out of the probe direction fixing box extends into the hollow structure of the fixture watchcase.
8. The LED measurement fixture of claim 7, wherein: the conductive mechanism comprises a power aviation connector, and the power aviation connector is connected with the probe through a wire.
9. The LED measurement fixture of claim 8, wherein: the top of power aviation connects has power aviation to connect the connector, power aviation connects the bottom at the anchor clamps watchcase through power aviation to connect the connector to fix.
CN201711062350.0A 2017-11-02 2017-11-02 LED measuring clamp Active CN107664706B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201711062350.0A CN107664706B (en) 2017-11-02 2017-11-02 LED measuring clamp

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Application Number Priority Date Filing Date Title
CN201711062350.0A CN107664706B (en) 2017-11-02 2017-11-02 LED measuring clamp

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Publication Number Publication Date
CN107664706A CN107664706A (en) 2018-02-06
CN107664706B true CN107664706B (en) 2024-01-16

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Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108982925A (en) * 2018-05-28 2018-12-11 苏州诺纳可电子科技有限公司 A kind of clamp for sheet type LED lamp wick

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CN101639490A (en) * 2008-07-31 2010-02-03 安捷伦科技有限公司 Probe relay, test clamp and method for isolating by using test clamp
CN201583562U (en) * 2009-12-31 2010-09-15 郑晓明 Measuring clamp for bottom surface base pin LED
CN104483106A (en) * 2014-12-31 2015-04-01 华中科技大学 Online flip LED chip detection device
CN205507030U (en) * 2016-04-24 2016-08-24 孙汝继 Automatic detection apparatus for subscriber line interface circuit
CN207730793U (en) * 2017-11-02 2018-08-14 深圳市奥谱特科技有限公司 A kind of LED measured materials

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Publication number Priority date Publication date Assignee Title
CN204462195U (en) * 2015-01-29 2015-07-08 京东方光科技有限公司 Electrical part test fixture

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN201096804Y (en) * 2007-07-10 2008-08-06 翔宏兴业有限公司 Chip testing device
CN101639490A (en) * 2008-07-31 2010-02-03 安捷伦科技有限公司 Probe relay, test clamp and method for isolating by using test clamp
CN201583562U (en) * 2009-12-31 2010-09-15 郑晓明 Measuring clamp for bottom surface base pin LED
CN104483106A (en) * 2014-12-31 2015-04-01 华中科技大学 Online flip LED chip detection device
CN205507030U (en) * 2016-04-24 2016-08-24 孙汝继 Automatic detection apparatus for subscriber line interface circuit
CN207730793U (en) * 2017-11-02 2018-08-14 深圳市奥谱特科技有限公司 A kind of LED measured materials

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