CN213423238U - Chip detection clamp - Google Patents

Chip detection clamp Download PDF

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Publication number
CN213423238U
CN213423238U CN202021525478.3U CN202021525478U CN213423238U CN 213423238 U CN213423238 U CN 213423238U CN 202021525478 U CN202021525478 U CN 202021525478U CN 213423238 U CN213423238 U CN 213423238U
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chip
plate
clamp
probe
cover body
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CN202021525478.3U
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Chinese (zh)
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金光福
朴文杰
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Suzhou Akins Electronics Co ltd
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Suzhou Akins Electronics Co ltd
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Abstract

The utility model relates to the technical field and discloses a chip detection clamp, which comprises a clamp body and a plurality of probes; the chip detection clamp has the advantages that the probe is arranged at the position corresponding to the root of the pin of the chip, when the chip is clamped by the clamp body, the top end of the probe is in contact with the root of the pin of the chip, the root of the pin is parallel to the chip, so that the probe can be perpendicular to the root of the pin, the root of the pin is good in stability and not easy to deform in the production and transfer processes, the contact between the probe and the pin is more sufficient and firm due to the factors, the connection between the chip and a detection circuit is more reliable in chip test, and a more accurate detection result can be obtained; the bulge arranged on the bearing plate is surrounded into a shape matched with the outline of the chip, so that the movement of the chip can be limited, the chip is kept stable on the bearing plate, and the reliable connection between the chip and the detection circuit is further ensured.

Description

Chip detection clamp
Technical Field
The utility model relates to a chip detects technical field, concretely relates to chip detects anchor clamps.
Background
The chip manufacturing industry needs to detect a large amount of produced chips to ensure that the performance of the chips is good, and the chips also need to be detected according to performance indexes such as aging degree in the chip research and development process, the chips are usually required to be fixed in a chip detection clamp by the detection, a plurality of probes in one-to-one correspondence with the pins of the chips on the chip detection clamp are contacted with the pins of the chips, and then the probes are connected to a circuit, so that the performance of the chips is detected through the circuit. When the chip detection clamp in the prior art detects, because the tip of the chip pin is not parallel to the chip body, but is a certain inclination angle with the chip body, the inclination angle of each pin is not completely the same, the chip can also make the pin take place deformation to a certain extent in the processes of production, transfer and the like, the probe of the chip detection clamp is perpendicular to the chip body, the extending length of each probe is also the same, therefore, the condition that the pin tip of a single or a plurality of probes and the chip can not be fully contacted can often appear, and the detection result is easy to cause inaccuracy. It can be seen that the existing chip detection clamp has the above problems and needs to be improved.
SUMMERY OF THE UTILITY MODEL
Not enough to prior art exists, the utility model aims to provide a chip detects anchor clamps, this chip detect anchor clamps's probe can fully contact with the pin of chip, makes chip and detection circuitry form reliable connection, guarantees the accuracy of testing result.
In order to achieve the above object, the present invention provides the following technical solutions:
a chip detection fixture, comprising: the clamp body is used for bearing and clamping the chip; and the probes are used for contacting pins of the chip, connecting the chip into the detection circuit and fixing the chip on the clamp body, and when the chip is placed on the clamp body, the positions of the probes correspond to the roots of the pins of the chip.
The utility model discloses in, it is preferred, the anchor clamps body includes: the clamping mechanism is used for clamping the chip; the bearing mechanism is used for bearing a chip, the probe is fixed on the bearing mechanism, and the clamping mechanism is fixedly connected with the bearing mechanism.
The utility model discloses in, preferred, bear the mechanism including bearing the dish, bear the dish and install bear the top layer of mechanism for bear the chip, the front of bearing the dish is provided with a plurality of bellyings, be provided with on the bellyings a plurality of with the through-hole that the probe position corresponds, the probe can pass the through-hole, the chip place in when bearing on the dish, the position of the through-hole on the bellyings is corresponding with the root of the pin of chip, and is a plurality of the shape that the bellyings enclose and the profile phase-match of chip.
The utility model discloses in, preferred, bearing mechanism is still including holding the faller, it is located to hold the faller bear the dish below, with bear the dish and connect, the probe install in hold in the faller, and the both ends of probe are located hold beyond the faller.
The utility model discloses in, it is preferred, hold the needle board including holding the needle roof and holding the needle bottom plate, hold the needle roof and hold the needle bottom plate and can dismantle the connection, the probe joint is in hold the needle roof and hold between the needle bottom plate.
The utility model discloses in, preferred, bear the dish with hold needle board sliding connection to install a plurality of return springs between the two, it is a plurality of return spring's elasticity is less than clamping mechanism's clamp force.
The utility model discloses in, preferred, bearing mechanism still includes the circuit board, the circuit board is located hold the faller below, with hold faller fixed connection, the probe with circuit board electric connection.
The utility model discloses in, preferred, clamping mechanism includes down the lid, goes up lid and chip clamp, down the lid with bear mechanism fixed connection, it is located to go up the lid down the lid top, with lid sliding connection down, go up the lid with install a plurality of clamping spring down between the lid, the middle part of chip clamp with the lid is articulated down, the afterbody of chip clamp with it is articulated to go up the lid.
The utility model discloses in, it is preferred, be provided with a plurality of directions on the upper cover body the sliding arm that the lid direction extends down, be provided with the spout on the sliding arm, be provided with down on the lateral wall of lid with the slide bar that the sliding arm position corresponds, the slide bar passes the spout.
The utility model discloses in, preferred, clamping mechanism still includes swing joint spare, swing joint spare one end with the middle part of chip clamp is articulated, the other end with the lid is articulated down.
Compared with the prior art, the beneficial effects of the utility model are that:
the chip detection clamp of the utility model arranges the probe at the position corresponding to the root of the pin of the chip, when the chip is clamped by the clamp body, the top end of the probe is contacted with the root of the pin of the chip, the root of the pin is parallel to the chip, the probe can be vertical to the root of the pin, the root stability of the pin is good, the pin is not easy to deform in the production and transfer processes, the contact between the probe and the pin is more sufficient and firm due to the factors, the connection between the chip and the detection circuit is more reliable during the chip test, thereby obtaining more accurate detection results; the bulge arranged on the bearing plate is surrounded into a shape matched with the outline of the chip, so that the movement of the chip can be limited, the chip is kept stable on the bearing plate, and the reliable connection between the chip and the detection circuit is further ensured.
Drawings
Fig. 1 is a schematic structural view of a chip inspection jig.
FIG. 2 is a schematic diagram of the structure of the probe.
Fig. 3 is a schematic structural diagram of the bearing mechanism.
Fig. 4 is a schematic structural diagram of the front surface of the carrier tray.
Fig. 5 is a schematic structural view of the back surface of the carrier tray.
Fig. 6 is a schematic view showing the chip placed on the carrier tray.
Fig. 7 is an enlarged view of a portion a in fig. 6.
Fig. 8 is a schematic structural view of the needle holding plate.
Fig. 9 is a structural schematic view of the back of the needle holding top plate.
Fig. 10 is a schematic structural view of the needle holding base plate.
Fig. 11 is a schematic structural diagram of the circuit board.
Fig. 12 is a schematic structural view of the clamping mechanism.
FIG. 13 is a schematic view of the structure of the upper cover and the chip clamp.
FIG. 14 is a top view of the upper lid and the clip.
FIG. 15 is a right side view of the upper cover and the chip holder.
Fig. 16 is a schematic structural view of the lower cover and the movable connecting member.
FIG. 17 is a schematic view of a chip holder.
Fig. 18 is a side view of a chip.
In the drawings: 1-bearing mechanism, 101-bearing disc, 1011-lug boss, 1012-sliding column, 102-needle holding plate, 1021-needle holding top plate, 1022-needle holding bottom plate, 103-circuit board, 104-return spring, 2-clamping mechanism, 201-upper cover body, 2011-sliding arm, 202-lower cover body, 2021-sliding rod, 203-chip clamp, 204-movable connecting piece, 205-clamping spring, 3-probe, 4-chip, 401-chip body and 402-pin.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.
It will be understood that when an element is referred to as being "secured to" another element, it can be directly on the other element or intervening elements may also be present. When a component is referred to as being "connected" to another component, it can be directly connected to the other component or intervening components may also be present. When a component is referred to as being "disposed on" another component, it can be directly on the other component or intervening components may also be present. The terms "vertical," "horizontal," "left," "right," and the like as used herein are for illustrative purposes only.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. The terminology used in the description of the invention herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. As used herein, the term "and/or" includes any and all combinations of one or more of the associated listed items.
Referring to fig. 1 to 18, a preferred embodiment of the present invention provides a chip testing fixture, which includes a fixture body and a plurality of probes 3.
In the present embodiment, the jig body includes a bearing mechanism 1 and a clamping mechanism 2. The bearing mechanism 1 is fixedly connected with the clamping mechanism 2, the chip 4 can be placed on the bearing mechanism 1, and the clamping mechanism 2 can clamp and fix the chip 4 on the bearing mechanism 1. Wherein, the bearing mechanism 1 comprises a bearing disc 101, the bearing disc 101 is positioned at the top of the bearing mechanism 1, and the clamping mechanism 2 can fix the chip 4 on the bearing disc 101. The bearing plate 101 is provided with a plurality of through holes, the probes 3 are fixed on the bearing mechanism 1 at positions corresponding to the through holes, the top ends of the probes 3 can penetrate through the through holes to be contacted with the pins 402 of the chip 4 on the bearing plate 101 during detection, and the bottom ends of the probes 3 are used for being connected with a detection circuit.
Generally, the chip 4 includes a chip body 401 and a plurality of pins 402, and the pins 402 are arranged at equal intervals around the chip body 401. One end of the pin 402 is connected to the chip body 401, and the end and the portion near the end are substantially parallel to the chip body 401, and in this embodiment, the end and the portion near the end are referred to as the root of the pin 402; the other end of the pin 402 is a free end for connection with a circuit, and is usually required to be inserted into a PCB (printed circuit board) for soldering, so that the end and the portion near the end are usually not parallel to the chip body 401, but have a certain slope for easy insertion into the PCB, and the end and the portion near the end are referred to as the tip of the pin 402 in this embodiment.
When chip detection is performed, the chip 4 is placed on the bearing plate 101, the clamping mechanism 2 clamps and fixes the chip 4 on the bearing plate 101, in order to enable the probe 3 to contact with the root of the pin 402, the shape surrounded by the through holes on the bearing plate 101 should match with the outline of the chip 4, and the shape should be smaller than the overall outline of the chip 4 and larger than and close to the outline of the chip body 401, that is, the position of the through hole of the bearing plate 101 corresponds to the root of the pin 402. Likewise, the positions of the probes 3 should be set based on the positions of the through holes of the carrier plate 101, i.e., the positions of the probes 3 correspond to the through holes of the carrier plate 101.
The front surface of the bearing plate 101 can be provided with a plurality of protruding portions 1011, the protruding portions 1011 are located around the position of the bearing chip, the plurality of protruding portions 1011 can enclose a shape, the shape is matched with the outline of the chip 4, similarly, the area of the shape is smaller than the whole outline of the chip 4 and larger than and close to the outline of the chip body 401, and the through holes of the bearing plate 101 are arranged on the protruding portions 1011. The probe 3 can then be passed through the through hole and extend from the boss 1011 to contact the root of the pin 402. Because the shape and size of the circumference of each convex part 1011 match the outline of the chip body 401, when the chip 4 is placed in the middle of each convex part 1011, the convex parts 1011 can limit the chip 4, so that the chip 4 cannot move freely in a large range in the bearing plate 101. On the other hand, the size of the shape surrounded by the convex portions 1011 should be set according to the largest area among a large number of chips of the same type with a certain dimensional tolerance, so that the chip with the largest area can be placed in the middle of each convex portion 1011, and any chip of the type will not be stuck in the carrier tray 101.
In the embodiment, the bearing disc 101 is arranged on the bearing mechanism 1, so that the function of bearing the chip 4 can be realized, the probe 3 and the through hole for the probe 3 to pass through are arranged at the position corresponding to the root of the pin 402, the probe 3 can be contacted with the root of the pin 402 during detection, the root of the pin 402 is basically parallel to the chip body 401, the root of the pin 402 has good stability and is not easy to deform, compared with the detection mode that the probe 3 is contacted with the tip of the pin 402 in the prior art, the contact area is obviously larger by the contact mode of the probe 3 and the root of the pin 402, the contact between the probe 3 and the pin 402 is more sufficient, the connection between the chip 4 and the detection circuit is more reliable, and a more accurate detection result can be obtained; the front surface of the bearing plate 101 is provided with a plurality of protruding parts 1011, and the shape surrounded by the protruding parts 1011 can limit the chip 4 to move on the bearing plate 101, so that the chip 4 is kept stable, and the reliable connection between the chip 4 and the detection circuit is further ensured.
In this embodiment, preferably, the carrier mechanism 1 further includes a needle holding plate 102, the needle holding plate 102 is located below the carrier plate 101 and connected to the carrier plate 101, the probe 3 is installed in the needle holding plate 102, through holes corresponding to the probe 3 are provided on both top and bottom surfaces of the needle holding plate 102, and both ends of the probe 3 pass through the through holes on both sides of the needle holding plate 102, so that both ends of the probe 3 are located outside the needle holding plate 102. The probe 3 is arranged in the needle holding plate 102, the needle holding plate 102 can protect the probe 3 and limit the extending angle of the probe 3, the probe 3 is not easy to be damaged, the probe 3 keeps the extending angle, and the probe is ensured to be fully contacted with the root of the pin 402.
In the present embodiment, the needle holding plate 102 preferably includes a needle holding top plate 1021 and a needle holding bottom plate 1022. The needle holding top plate 1021 is covered on the needle holding bottom plate 1022, and the two are detachably connected by a bolt, and other known methods can be used for detachable connection here. Through holes corresponding to the through holes of the carrier tray 101 are formed in the needle holding top plate 1021 and the needle holding bottom plate 1022, and two ends of the probe 3 respectively penetrate through the through holes of the needle holding top plate 1021 and the needle holding bottom plate 1022, so that two ends of the probe 3 are located outside the needle holding top plate 1021 and the needle holding bottom plate 1022. The probe 3 has a structure in which the diameter of the middle portion is large and the diameters of the both end portions are small. Therefore, the diameter of the through hole of the needle holding top plate 1021 and the needle holding bottom plate 1022 is larger than the diameter of both ends of the probe 3 and smaller than the middle portion of the probe 3, and the probe 3 is clamped between the needle holding top plate 1021 and the needle holding bottom plate 1022, so that the probe 3 can be mounted inside the needle holding plate 102. The needle holding plate 102 is divided into the detachable needle holding top plate 1021 and the detachable needle holding bottom plate 1022, so that the needle holding plate 102 can be manufactured more simply, the needle holding plate 102 is convenient to disassemble and assemble, and the inspection and the replacement of the probe 3 in the needle holding plate are facilitated.
In this embodiment, it is preferable that the back surface of the carrier tray 101 is provided with a plurality of sliding columns 1012, sliding grooves are provided at positions corresponding to the sliding columns 1012 on the needle holding top plate 1021 and the needle holding bottom plate 1022, and the sliding columns 1012 are inserted into the sliding grooves, thereby achieving the sliding connection between the carrier tray 101 and the needle holding plate 102. The back of bearing dish 101 still is provided with a plurality of spring grooves, and the relevant position of needle holder roof 1021 also is provided with the spring groove, all installs return spring 104 in the two spring grooves that correspond to the resultant force of each return spring 104 is less than clamping force of clamping mechanism 2, promptly: when the clamping mechanism 2 acts, the chip 4 is clamped on the bearing plate 101, the return spring 104 is compressed, the bearing plate 101 is pressed downwards, the distance between the bearing plate 101 and the needle holding plate 102 is shortened, and the probe 3 extends out of the through hole of the bearing plate 101 and is contacted with the root of the pin 402; when the clamping mechanism 2 is not operated, the return spring 104 is released, the carrier plate 101 rises, the distance between the carrier plate 101 and the needle holding plate 102 is extended, and the probe 3 returns to the through hole of the carrier plate 101 and is not contacted with the root of the pin 402 any more. The bearing disc 101 is connected with the needle holding plate 102 in a sliding mode, the return spring 104 is arranged between the bearing disc and the needle holding plate, whether the probe 3 is in contact with the root of the pin 402 or not can be controlled by controlling the action or non-action of the clamping mechanism 2, and therefore the use of the chip 4 detection clamp is simpler and more convenient.
In this embodiment, the carrying mechanism 1 preferably further includes a circuit board 103, and the circuit board 103 is provided with a detection circuit (not shown in the drawings) for detecting the chip 4, typically a PCB. The circuit board 103 is located below the needle holding plate 102 and is fixedly connected with the needle holding plate 102. A plurality of contacts corresponding to the positions of the probes 3 one by one are arranged in the detection circuit on the circuit board 103, and the bottom end of each probe 3 is contacted with the corresponding contact, so that the probes 3 are electrically connected with the circuit board 103, and the chip 4 can be connected into the detection circuit when the top end of each probe 3 is contacted with the root of the pin 402, and the performance of the chip 4 can be detected. Through holding needle board 102 below fixed connection circuit board 103 to probe 3 and the contact of corresponding contact on the circuit board 103, can realize being connected of probe 3 and detection circuitry, the convenience is to chip 4's detection, makes chip 4 detect anchor clamps's wholeness higher.
In the present embodiment, the clamping mechanism 2 preferably includes an upper cover 201, a lower cover 202, and a chip holder 203. The upper cover body 201 and the lower cover body 202 are both cover-shaped structures with hollowed middle parts, the lower cover body 202 is fixedly connected with the circuit board 103 to cover parts connected with the upper edge position of the circuit board 103, the upper cover body 201 is positioned above the lower cover body 202 and is slidably connected with the lower cover body 202, the hollowed middle part of the upper cover body 201 can facilitate the chip 4 to be placed in the bearing disc 101, meanwhile, spring grooves are arranged at the positions of the upper cover body 201 corresponding to the lower cover body 202, for example, spring grooves are arranged at four corners of the upper cover body 201 and the lower cover body 202, and clamping springs 205 are arranged in the spring grooves. The chip clamp 203 is arranged on the top of the lower cover body 202, the middle part of the chip clamp 203 is hinged with the top of the lower cover body 202, so that the chip clamp 203 can rotate by taking the middle part as an axis, the head part of the chip clamp 203 is positioned above the bearing disc 101, the tail part of the chip clamp 203 is positioned below the edge part of the upper cover body 201 and is hinged with the part of the upper cover body 201 extending towards the direction of the lower cover body 202, therefore, the tail part of the chip clamp 203 is driven to rise when the upper cover body 201 rises, the head part of the chip clamp presses the bearing disc 101 and the chip 4 positioned on the bearing disc 101, and the tail part of the chip clamp 203 is driven to fall and the head part of the chip clamp is driven to rise when the upper. Wherein, in order to ensure the clamping of the chip 4, the number of the chip clamps 203 may be plural. In addition, the total elastic force of each clamping spring 205 should be greater than the total elastic force of each return spring 104, so that the clamping spring 205 can make the chip clamp 203 press the carrier tray 101 and the chip 4 downward when acting, the probe 3 can fully contact the root of the pin 402, the carrier tray 101 can only be lifted up due to the elastic force of the return spring 104 when the clamping spring 205 is not acting, and the pin 402 no longer contacts the probe 3. Set clamping mechanism 2 to above-mentioned structure, can realize under the condition of no exogenic action continuously pressing from both sides tight and bearing dish 101 continuously pushing down chip 4, guarantee the lasting abundant contact of probe 3 and pin 402 root, convenient detection to chip 4, when needing to release chip 4, only need push down lid 201 with foreign force, chip clamp 203 can lift up, takes out chip 4, easy operation is convenient.
In the present embodiment, the sliding connection between the upper cover 201 and the lower cover 202 is preferably realized by: the upper cover body 201 is provided with a plurality of sliding arms 2011 extending towards the lower cover body 202, the sliding arms 2011 are provided with sliding grooves, the side wall of the lower cover body 202 is provided with sliding rods 2021 at positions corresponding to the sliding arms 2011, the sliding rods 2021 are matched with the sliding grooves in the sliding arms 2011 and penetrate through the sliding grooves in the sliding arms 2011 to form sliding connection. The sliding connection between the upper cover body 201 and the lower cover body 202 is realized by the sliding rod 2021 penetrating through the sliding groove on the sliding arm 2011, so that the upper cover body 201 and the lower cover body 202 can be accurately positioned, and the structure is simple.
In this embodiment, the clamping mechanism 2 preferably further includes a movable connecting member 204. The middle part of the chip clamp 203 can be directly hinged with the top of the lower cover body 202, the middle part of the chip clamp 203 and the top of the lower cover body 202 have a hinge point fixed at the same position, the chip clamp 203 needs to be set into a shape with a larger curvature to clamp and release the chip through the rotation of the chip clamp 203, the upper cover body 201 can be ensured to drive the chip clamp 203 to rotate for a sufficient angle in a limited sliding stroke, and the shape of the chip clamp 203 is more complex; the middle part of the chip clamp 203 can be hinged to the top of the lower cover 202 by a movable connection element 204, i.e. one end of the movable connection element 204 is hinged to the middle part of the chip clamp 203, and the other end is hinged to the top of the lower cover 202, so that the hinge point of the middle part of the chip clamp 203 can rotate around the hinge point of the top of the lower cover 202, and the chip clamp 203 can rotate around the hinge point of the middle part of the chip clamp which can move. Compared with the hinge mode of the fixed hinge point, the mode of setting the movable hinge point through the movable connecting piece 204 enlarges the moving range of the chip clamp 203, the chip clamp 203 rotates more flexibly, the shape of the chip clamp 203 can be set more simply, and the chip clamp 203 is convenient to manufacture and exert the functions.
The working principle is as follows:
when the chip detection clamp of the utility model is used for chip detection, firstly, external force is applied to the upper cover body 201 to press the upper cover body 201 downwards, the clamping spring 205 is compressed, the upper cover body 201 descends to drive the tail part of the chip clamp 203 to descend, the head part of the chip clamp 203 is lifted, the space above the bearing disc 101 below the head part of the chip clamp 203 is vacated, the bearing disc 101 ascends due to the action of the return spring 104 below the bearing disc 101, and the probe 3 is sunk into the through hole on the bulge part 1011 of the bearing disc 101; then, the chip 4 to be tested is placed in the middle of each convex part 1011 on the bearing plate 101, the chip body 401 falls into the shape surrounded by each convex part 1011, the root of the pin 402 just falls above the through hole on each convex part 1011, and the chip 4 cannot move freely due to the limitation of each convex part 1011; then, the upper cover body 201 is released, the upper cover body 201 rises due to the action of the clamping spring 205, the tail part of the chip clamp 203 is driven by the upper cover body 201 to rise, the head part of the chip clamp 203 descends to press the chip 4 down to be clamped on the bearing disc 101, meanwhile, the bearing disc 101 is also pressed down, the return spring 104 is compressed, the bearing disc 101 descends, the bulge 1011 descends to be below the probe 3, the probe 3 extends out of the through hole on the bulge 1011, the root part of the pin 402 is fully contacted with the top end of the probe 3, the pin 402 is electrically connected with the circuit board 103 at the bottom end of the probe 3 through the probe 3, and therefore the chip 4 is connected into a detection circuit which detects the performance of the chip 4; and finally, after the circuit detection is finished, applying external force to press down the upper cover body 201, lifting the chip clamp 203, releasing the detected chip 4 and the bearing disc 101, taking out the detected chip 4, and continuously putting the next chip 4 to be detected. Wherein, the root of pin 402 is parallel with chip body 401 basically to because be connected closely with chip body 401 and non-deformable in production and transfer process, stability is stronger, has certain inclination and yielding characteristic in the tip of pin 402, and the contact of probe 3 and pin 402 root is more abundant, thereby chip 4 is more reliable with detection circuitry's connection, can obtain more accurate testing result.
The above description is for the detailed description of the preferred possible embodiments of the present invention, but the embodiments are not intended to limit the scope of the present invention, and all equivalent changes or modifications accomplished under the technical spirit suggested by the present invention should fall within the scope of the present invention.

Claims (10)

1. A chip detection jig, comprising:
the clamp body is used for bearing and clamping the chip; and
and the probes are used for contacting pins of the chip, connecting the chip into the detection circuit and are fixed on the clamp body, and when the chip is placed on the clamp body, the positions of the probes correspond to the roots of the pins of the chip.
2. The chip detection jig of claim 1, wherein the jig body comprises:
the clamping mechanism is used for clamping the chip;
the bearing mechanism is used for bearing a chip, the probe is fixed on the bearing mechanism, and the clamping mechanism is fixedly connected with the bearing mechanism.
3. The chip detection clamp according to claim 2, wherein the carrying mechanism comprises a carrying plate, the carrying plate is mounted on a top layer of the carrying mechanism and used for carrying a chip, a plurality of protrusions are arranged on a front surface of the carrying plate, a plurality of through holes corresponding to the positions of the probes are arranged on the protrusions, the probes can pass through the through holes, when the chip is placed on the carrying plate, the positions of the through holes on the protrusions correspond to roots of pins of the chip, and a shape defined by the plurality of protrusions is matched with the outline of the chip.
4. The chip detecting fixture according to claim 3, wherein the supporting mechanism further comprises a supporting plate, the supporting plate is located below the supporting plate and connected to the supporting plate, the probe is installed in the supporting plate, and two ends of the probe are located outside the supporting plate.
5. The chip detection clamp according to claim 4, wherein the needle holding plate comprises a needle holding top plate and a needle holding bottom plate, the needle holding top plate and the needle holding bottom plate are detachably connected, and the probe is clamped between the needle holding top plate and the needle holding bottom plate.
6. The chip detection clamp according to claim 4, wherein the bearing plate is slidably connected to the pin holding plate, and a plurality of return springs are installed between the bearing plate and the pin holding plate, and an elastic force of the plurality of return springs is smaller than a clamping force of the clamping mechanism.
7. The chip detecting clamp according to claim 5 or 6, wherein the carrying mechanism further comprises a circuit board, the circuit board is located below the needle holding plate and fixedly connected with the needle holding plate, and the probe is electrically connected with the circuit board.
8. The chip detection clamp according to claim 2, wherein the clamping mechanism comprises a lower cover body, an upper cover body and a chip clamp, the lower cover body is fixedly connected with the bearing mechanism, the upper cover body is positioned above the lower cover body and is slidably connected with the lower cover body, a plurality of clamping springs are installed between the upper cover body and the lower cover body, the middle part of the chip clamp is hinged to the lower cover body, and the tail part of the chip clamp is hinged to the upper cover body.
9. The chip detecting jig according to claim 8, wherein the upper cover is provided with a plurality of sliding arms extending toward the lower cover, the sliding arms are provided with sliding slots, the side walls of the lower cover are provided with sliding rods corresponding to the positions of the sliding arms, and the sliding rods pass through the sliding slots.
10. The chip detection clamp according to claim 8, wherein the clamping mechanism further comprises a movable connecting member, one end of the movable connecting member is hinged to the middle part of the chip clamp, and the other end of the movable connecting member is hinged to the lower cover.
CN202021525478.3U 2020-07-28 2020-07-28 Chip detection clamp Active CN213423238U (en)

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Application Number Priority Date Filing Date Title
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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113257335A (en) * 2021-07-15 2021-08-13 深圳泰思特半导体有限公司 High-precision memory test equipment
CN114137045A (en) * 2021-11-17 2022-03-04 中国计量大学 Micro-fluidic chip testing equipment for electrochemical detection
CN114184939A (en) * 2021-12-30 2022-03-15 北京半导体专用设备研究所(中国电子科技集团公司第四十五研究所) Be suitable for ultra-low temperature environment's chip clamping device

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113257335A (en) * 2021-07-15 2021-08-13 深圳泰思特半导体有限公司 High-precision memory test equipment
CN114137045A (en) * 2021-11-17 2022-03-04 中国计量大学 Micro-fluidic chip testing equipment for electrochemical detection
CN114137045B (en) * 2021-11-17 2024-04-16 中国计量大学 Microfluidic chip testing equipment for electrochemical detection
CN114184939A (en) * 2021-12-30 2022-03-15 北京半导体专用设备研究所(中国电子科技集团公司第四十五研究所) Be suitable for ultra-low temperature environment's chip clamping device

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