CN210401482U - Miniature probe station - Google Patents
Miniature probe station Download PDFInfo
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- CN210401482U CN210401482U CN201921310850.6U CN201921310850U CN210401482U CN 210401482 U CN210401482 U CN 210401482U CN 201921310850 U CN201921310850 U CN 201921310850U CN 210401482 U CN210401482 U CN 210401482U
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- long arm
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Abstract
The utility model relates to an optical communication device makes the field, in particular to aging testing device of chip. The utility model provides a miniature probe platform installs adjustment mechanism and chip on the base and places the platform, adjustment mechanism includes left long arm, right long arm, and left long arm front end is fixed with left probe, and right long arm front end is fixed with right probe, and left long arm and right long arm lateral surface have the probe regulating spindle, and in the spout of probe regulating spindle assembly on the slip table, probe height adjusting screw was installed respectively to left long arm and right long arm. The utility model discloses the clamping is convenient, stable, does not receive the restriction of chip pad position, small in size, and the portability is high, can compatible not unidimensional chip, is applicable to various occasions, through to controlling around the probe, control and the adjustment of upper and lower position, can make the probe aim at the chip pad, and convenient operation is swift, and the test or add the electrical ageing process stability, has improved efficiency of software testing, has reduced manufacturing cost.
Description
Technical Field
The utility model relates to an optical communication device makes the field, in particular to aging testing device of chip.
Background
In the field of optical communication manufacturing, the production and manufacturing process thereof needs to perform testing and burn-in screening on chips, which is an important link for the stability and reliability of device operation. Generally, the chip volume is smaller, the chip pad positions and the intervals designed by chip manufacturers are different, the difficulty of chip aging test is increased, the traditional probe station is large in volume, complex in structure and high in cost, when the traditional probe station is used for testing or power-on aging of a chip, clamping is limited by the chip pad positions, operation is inconvenient, the testing or power-on aging process is unstable, and the testing efficiency is lower.
SUMMERY OF THE UTILITY MODEL
The utility model discloses a solve among the prior art probe station bulky, the structure is complicated, technical problem with high costs to a miniature probe station is provided, small in size, simple structure, cost are lower.
The utility model discloses a realize that the technical scheme that above-mentioned purpose adopted is: the utility model provides a miniature probe platform installs adjustment mechanism and chip on the base and places the platform, adjustment mechanism includes left long arm, right long arm, and left long arm front end is fixed with left probe, and right long arm front end is fixed with right probe, and left long arm and right long arm lateral surface have the probe regulating spindle, and in the spout of probe regulating spindle assembly on the slip table, probe height adjusting screw was installed respectively to left long arm and right long arm.
Furthermore, a left and right adjusting spring is arranged between the left long arm and the right long arm.
Further, the chip placing table adopts a chip lifting table structure, the chip lifting table is positioned in the front of the adjusting mechanism, and the front end of the base is provided with a chip lifting table adjusting screw which is in driving connection with the chip lifting table.
Furthermore, the chip lifting platform is provided with a rhombic inclined surface, and the rhombic inclined surface is in driving connection with the chip lifting platform adjusting screw.
The utility model discloses do not receive the restriction of chip pad position, the clamping is convenient, and is stable, through the regulation to probe three-dimensional direction, can make probe accurate alignment chip pad, realize the test and the electrified ageing of chip, moreover, the steam generator is simple in structure, small in size, the portability is high, can compatible not unidimensional chip, and is applicable to various occasions, through adjusting left long arm and right long arm, realize left probe and right probe three-dimensional direction's regulation, the probe regulating spindle is when realizing the probe front and back position adjustment, cooperation probe height adjusting screw, realize the regulation of probe upper and lower position, and convenient operation is swift, the test or add the electric ageing process stability, and the efficiency of software testing is improved, and the production cost is reduced.
Drawings
Fig. 1 is a structural diagram of the present invention.
Fig. 2 is a top view of the present invention.
Fig. 3 is a top view of the present invention with left and right adjusting springs.
Fig. 4 is the structure diagram of the chip lifting table of the present invention.
In the figure: 1. the device comprises a left long arm, a right long arm, a probe adjusting shaft, a probe, a chip placing table, a base, a chip lifting table adjusting screw, a probe height adjusting screw, a sliding table, a sliding groove and a left and right adjusting spring, wherein the probe adjusting shaft is 3, the left probe, the right probe, the probe 5, the chip placing table 6, the base 7, the chip lifting table adjusting screw 8, the probe height adjusting screw 9, the sliding table 10, the sliding groove 11.
Detailed Description
The present invention will be described in detail with reference to the accompanying drawings and examples, but the present invention is not limited to the specific examples.
Example 1
As shown in fig. 1-3, a miniature probe station, install adjustment mechanism and chip on the base 7 and place platform 6, adjustment mechanism includes left long arm 1, right long arm 2, and left long arm 1 front end is fixed with left probe 4, and right long arm 2 front end is fixed with right probe 5, and left long arm 1 and the 2 lateral surfaces of right long arm have probe regulating spindle 3, and in the spout 11 of probe regulating spindle 3 assembly on slip table 10, probe height adjusting screw 9 was installed respectively to left long arm 1 and right long arm 2, adjusting spring 12 about still being equipped with between left long arm 1 and the right long arm 2.
The operation method of the micro probe station comprises the following steps:
step 1: adjusting the three-dimensional direction: front and back position adjustment, namely placing a chip to be tested on a chip placing table 6, and when the precision requirement is low, manually pushing the rear parts of the left long arm 1 and the right long arm 2 to adjust the positions of the left long arm 1 and the right long arm 2 in the front and back directions; when the precision requirement is high, the probe adjusting shaft 3 is used for adjusting the front and back positions of the left long arm 1 and the right long arm 2, so that the front and back positions of the left probe 4 and the right probe 5 at the front ends of the left long arm and the right long arm are adjusted, and the sliding groove 11 plays a limiting role in the front and back adjustment process of the left long arm 1 and the right long arm 2; the left and right position adjustment is carried out, the position of the left long arm 1 and the position of the right long arm 2 in the left and right direction are adjusted by adjusting the tightness degree of a left and right adjusting spring 12 between the left long arm 1 and the right long arm 2, so that the left and right positions of the left probe 4 and the right probe 5 are adjusted; the up-down position adjustment is realized by adjusting the up-down position of the probe, the up-down position adjustment of the left probe 4 at the front end of the left long arm 1 and the right probe 5 at the front end of the right long arm 2 is adjusted by adjusting the fastening degree of the probe height adjusting screws 9 at the top ends of the left long arm 1 and the right long arm 2 and matching with the probe adjusting shaft 3, when the moments applied to the two ends of the probe adjusting shaft 3 by the two probe height adjusting screws 9 on the left long arm 1 are balanced, the left probe 4 keeps a horizontal state, when the moments applied to the two ends of the probe adjusting shaft 3 by the two probe height adjusting screws 9 on the right long arm 2 are balanced, the right probe 5 keeps a horizontal state, when the moments applied to the two ends of the probe adjusting shaft 3 by the two probe height adjusting screws 9 on the left long arm 1 are unbalanced, the left long arm 1 rotates by taking the probe adjusting shaft 3 as the axis, when the moments applied to the two probe height adjusting screws 9 on the right long arm 2 are unbalanced, the right long arm 2 rotates by taking the probe adjusting shaft 3 as a shaft, so that the left probe 4 and the right probe 5 are driven to be lifted or pressed down, and the vertical position adjustment of the probe head is completed;
step 2: testing and charged aging: the probe is aligned to the chip bonding pad through adjustment in the three-dimensional direction, and then the chip bonding pad is electrified through the probe to test or burn-in the chip.
Example 2
The present embodiment adopts a micro probe station substantially the same as that of embodiment 1, except that the chip placing station 6 adopts a chip lifting station structure as shown in fig. 4, the chip lifting station is located in front of the adjusting mechanism, the chip lifting station is provided with a rhombic inclined surface, and the rhombic inclined surface is in driving connection with a chip lifting station adjusting screw 8 arranged at the front end of the base 7. The chip lifting platform is provided with a rhombic inclined surface, and the rhombic inclined surface is in driving connection with the chip lifting platform adjusting screw 8.
The present embodiment adopts the same operation method of the micro probe station as that of embodiment 1, except that step 1, step 1: the front-back position adjustment and the left-right position adjustment are the same as those in embodiment 1, except that the up-down position adjustment is realized by adjusting the up-down position of the chip lifting table: screwing the chip lifting table adjusting screw 8, and lifting the top of the chip lifting table adjusting screw 8 upwards along the rhombic inclined plane of the chip lifting table so as to enable the chip lifting table to descend downwards; otherwise, the chip lifting platform rises, thereby realizing accurate adjustment.
Example 3
This example used the same micro-probe station as example 2.
The present embodiment adopts the same operation method of the micro probe station as that of embodiment 1, except that step 1, step 1: the front-back position adjustment and the left-right position adjustment are the same as those in embodiment 1, except that the up-down position adjustment is realized by adjusting the up-down positions of the probe and the chip lifting table: after the position of the chip lifting table is adjusted, the upper position and the lower position of the probe are finely adjusted relative to the upper position and the lower position of the chip lifting table, so that accurate adjustment is realized.
The above description is further detailed in connection with the preferred embodiments of the present invention, and it is not intended that the specific embodiments of the present invention be limited to these descriptions. To the utility model belongs to the technical field of the ordinary technical personnel, do not deviate from the utility model discloses a under the prerequisite of the design, can also make simple deduction and replacement, all should regard as the utility model discloses a protection scope.
Claims (4)
1. A miniature probe station which characterized in that: install adjustment mechanism and chip on base (7) and place platform (6), adjustment mechanism includes left long arm (1), right long arm (2), and left long arm (1) front end is fixed with left probe (4), and right long arm (2) front end is fixed with right probe (5), and left long arm (1) and right long arm (2) lateral surface have probe regulating spindle (3), and in spout (11) of probe regulating spindle (3) assembly on slip table (10), probe height adjusting screw (9) are installed respectively to left long arm (1) and right long arm (2).
2. The micro-probe station of claim 1, wherein: a left and right adjusting spring (12) is also arranged between the left long arm (1) and the right long arm (2).
3. A micro-probe station according to claim 1 or 2, characterized in that: the chip placing table (6) adopts a chip lifting table structure, the chip lifting table is positioned in the front of the adjusting mechanism, and the front end of the base (7) is provided with a chip lifting table adjusting screw (8) which is in driving connection with the chip lifting table.
4. The micro-probe station of claim 3, wherein: the chip lifting platform is provided with a rhombic inclined surface, and the rhombic inclined surface is in driving connection with a chip lifting platform adjusting screw (8).
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2019209500858 | 2019-06-24 | ||
| CN201920950085 | 2019-06-24 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN210401482U true CN210401482U (en) | 2020-04-24 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201921310850.6U Active CN210401482U (en) | 2019-06-24 | 2019-08-14 | Miniature probe station |
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| CN (1) | CN210401482U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110376406A (en) * | 2019-08-14 | 2019-10-25 | 大连藏龙光电子科技有限公司 | A kind of miniature probe platform and its operating method |
-
2019
- 2019-08-14 CN CN201921310850.6U patent/CN210401482U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110376406A (en) * | 2019-08-14 | 2019-10-25 | 大连藏龙光电子科技有限公司 | A kind of miniature probe platform and its operating method |
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