CN212399299U

CN212399299U - Test analysis anchor clamps

Info

Publication number: CN212399299U
Application number: CN202020494782.XU
Authority: CN
Inventors: 李�浩; 张伟
Original assignee: Hitech Semiconductor Wuxi Co Ltd
Current assignee: Hitech Semiconductor Wuxi Co Ltd
Priority date: 2020-04-07
Filing date: 2020-04-07
Publication date: 2021-01-26
Anticipated expiration: 2030-04-07

Abstract

The utility model provides a test analysis clamp, which comprises a bottom plate, a copper wire connecting wire and a test mould, wherein the bottom plate is fixedly provided with the test mould, the positive electrode and the negative electrode of a power supply of the test mould are both connected with the copper wire connecting wire, and a clamping seat for fixing a test packaging bottom plate is arranged in the test mould; a storage drawer is arranged below the bottom plate, and a sample placing device is arranged on the vertical side surface of the bottom plate; the sample placing device comprises a sample placing seat and a sample placing mold, wherein a mounting groove is formed in the sample placing seat, and the sample placing mold is movably placed in the mounting groove. The utility model discloses simple structure, convenient operation, the sample is fixed simplifies most, improves analysis efficiency.

Description

Test analysis anchor clamps

Technical Field

The utility model relates to a semiconductor testing field especially relates to a test analysis anchor clamps.

Background

The packaged chip product is a mainstream product in the current DRAM market, and the market scale is quite large, and the structure and the technology of the packaged chip product are leading most products in the industry. The chip structure in the product is responsible for, and the difficulty of failure analysis of the internal circuit is large. The product is mainly used for replacing BOC products, and has large market demand and higher product profit.

The newly purchased test equipment finds that the sample spends too long time in the fixing ring section in the use process, so that the analysis efficiency is greatly influenced, and meanwhile, when the sample test point is connected with the equipment circuit connection point manually, the damage rate to the sample is extremely high, so that an analysis accident is generated, and therefore, the development of a set of clamp suitable for the test equipment is very urgent and necessary.

The published Chinese invention patent, application number CN201911121030.7, patent name: the utility model provides a probe anchor clamps and chip electrical property testing arrangement, application date: 2019-11-15, the utility model relates to the technical field of chip detection, and discloses a probe clamp and a chip electrical property testing device, wherein the probe clamp comprises a top plate and a bottom plate, and a plurality of slotted holes are arranged on the bottom plate; the probes are arranged between the top plate and the bottom plate and are vertical to the bottom plate, the probes correspond to the slotted holes in the bottom plate one by one, one end of each group of corresponding probes is inserted into the slotted hole and is in clearance fit with the slotted hole, the other end of each group of corresponding probes penetrates through the top plate and protrudes out of the surface of one side of the top plate, which is far away from the bottom plate, a protruding part extending along the radial direction of each probe is arranged between the two ends of each probe, and an elastic component is arranged between the protruding part of each probe and the bottom plate; the interface assembly is arranged on the bottom plate and comprises a plurality of pins in one-to-one correspondence with the probes, and each group of probes in mutual correspondence is electrically connected with the pins. The probe assembly is simple in structure, convenient to maintain, beneficial to reducing the cost of the test industry, low in requirement on the performance of the probe, few in signal transmission links and high in reliability.

SUMMERY OF THE UTILITY MODEL

Aiming at the defects in the prior art, the utility model provides a test analysis clamp, which comprises a bottom plate 1, a copper wire connecting wire 2 and a test mould 3, wherein the test mould 3 is fixedly arranged on the bottom plate 1, the copper wire connecting wire 2 is connected to the positive electrode and the negative electrode of a power supply of the test mould 3, and a clamping seat for fixing a test packaging bottom plate is arranged in the test mould 3;

a storage drawer 4 is arranged below the bottom plate 1, and a sample placing device is arranged on the vertical side surface of the bottom plate 1;

the sample placing device comprises a sample placing seat 5 and a sample placing mold 6, wherein a mounting groove is formed in the sample placing seat 5, and the sample placing mold 6 is movably placed in the mounting groove.

Preferably, the base plate 1 is fixed with the test mold 3 by liquid glue.

Preferably, the sample placement device is arranged behind the test mold 3.

Preferably, a hook 7 is arranged on one side of the bottom plate 1 close to the sample placing device, and a clamping groove is arranged on the sample placing seat 5 corresponding to the hook 7.

Preferably, handles 8 are provided on both sides of the storage drawer 4.

Preferably, the bottom of the storage drawer 4 is bolted with a foot pad 9.

Preferably, the bottom plate 1 is made of transparent organic glass.

The utility model has the advantages that: simple structure, convenient operation, the fixed simplest of sample improves analysis efficiency.

Drawings

FIG. 1 is a block diagram of the present invention;

FIG. 2 is a block diagram of another perspective of the storage drawer of the present invention;

in the figure, the position of the upper end of the main shaft,

1. a base plate; 2. a copper wire connecting wire; 3. testing the mold; 4. a storage drawer; 5. a sample placement seat; 6. placing a sample in a mold; 7. hooking; 8. a handle; 9. and (5) a foot pad.

Detailed Description

In order to make the technical solutions of the present invention better understood and make the above features, objects, and advantages of the present invention more comprehensible, the present invention is further described with reference to the following examples. The examples are intended to illustrate the invention only and are not intended to limit the scope of the invention.

As shown in fig. 1-2, the present invention comprises: the testing device comprises a base plate 1, a copper wire connecting wire 2 and a testing mold 3, wherein the testing mold 3 is fixedly arranged on the base plate 1, the copper wire connecting wire 2 is connected to a power supply positive electrode and a power supply negative electrode of the testing mold 3, and a clamping seat for fixing a testing packaging base plate is arranged in the testing mold 3;

When in use, firstly, the position of the storage drawer 4 and the height of the storage drawer 4 are well placed, and then the copper wire connecting wires 2 connected with the positive electrode and the negative electrode of the testing mold 3 are determined to prepare for testing; then utilize the position of fixing the sample of fixing mould 3 on bottom plate 1, reach the purpose that the sample is fixed the simplest, can perfectly match with monitoring facilities, need not all adjust the height or connect again 0.2mm copper wire connecting wire after adjusting the position at every turn, reach anchor clamps and perfect match of equipment, the use is simplified, and the analysis result is accurate not unusual, and analysis efficiency promotes.

In the present embodiment, the base plate 1 is preferably fixed with the test mold 3 by liquid glue.

Set up above-mentioned structure, use liquid glue can not harm bottom plate 1 and test die 3, in addition, can play the fixed action to test die 3 when using, dismantlement test die 3 that also can be convenient after the use, simple to operate.

In the present embodiment, it is preferable that the sample placement device is disposed behind the test mold 3.

Set up above-mentioned structure, convenient position is set for, improves the efficiency that the product was taken, convenient work.

In this embodiment, it is preferable that a hook 7 is provided on one side of the bottom plate 1 close to the sample placement device, and a slot is provided on the sample placement base 5 corresponding to the hook 7.

With the above structure, the sample placing device is convenient to disassemble and assemble on the bottom plate 1, in addition.

In the present embodiment, the storage drawer 4 is preferably provided with handles 8 on both sides.

By adopting the structure, the integral device can be conveniently moved through the handle 8, the working efficiency is improved, the components on the bottom plate 1 are stabilized, and the movement is avoided.

In the present embodiment, the bottom of the storage drawer 4 is preferably bolted with a foot pad 9.

By adopting the structure, the height of the pad feet 9 can be adjusted on the bolt, so that the horizontal arrangement of the drawer is ensured, and the horizontal of the whole device is further ensured.

In this embodiment, the bottom plate 1 is preferably made of transparent organic glass.

The above-described embodiments are merely illustrative of the principles and utilities of the present patent application and are not intended to limit the present patent application. Modifications and variations can be made to the above-described embodiments by those skilled in the art without departing from the spirit and scope of this patent application. Accordingly, it is intended that all equivalent modifications or changes which can be made by those skilled in the art without departing from the spirit and technical concepts disclosed in the present application shall be covered by the claims of this patent application.

Claims

1. A test analysis clamp is characterized by comprising a bottom plate (1), copper wire connecting wires (2) and a test mold (3), wherein the test mold (3) is fixedly arranged on the bottom plate (1), the copper wire connecting wires (2) are connected to positive and negative electrodes of a power supply of the test mold (3), and a clamping seat for fixing a test packaging bottom plate is arranged in the test mold (3);

a storage drawer (4) is arranged below the bottom plate (1), and a sample placing device is arranged on the vertical side surface of the bottom plate (1);

the sample placing device comprises a sample placing seat (5) and a sample placing die (6), wherein a mounting groove is formed in the sample placing seat (5), and the sample placing die (6) is movably placed in the mounting groove.

2. The test analysis fixture of claim 1, wherein: the bottom plate (1) is fixed with a testing mold (3) through liquid glue.

3. The test analysis fixture of claim 2, wherein: the sample placing device is arranged behind the testing mold (3).

4. The test analysis fixture of claim 3, wherein: one side of the bottom plate (1) close to the sample placing device is provided with a hook (7), and a clamping groove is arranged on the sample placing seat (5) corresponding to the hook (7).

5. The test analysis fixture of claim 4, wherein: handles (8) are arranged on two sides of the storage drawer (4).

6. The test analysis fixture of claim 5, wherein: the bottom of the storage drawer (4) is provided with a pad (9) through a bolt.

7. The test analysis fixture of claim 6, wherein: the bottom plate (1) is made of transparent organic glass material.