CN220626483U - Chip test needle frame - Google Patents

Chip test needle frame Download PDF

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Publication number
CN220626483U
CN220626483U CN202322269722.4U CN202322269722U CN220626483U CN 220626483 U CN220626483 U CN 220626483U CN 202322269722 U CN202322269722 U CN 202322269722U CN 220626483 U CN220626483 U CN 220626483U
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CN
China
Prior art keywords
chip
rod
plate
test
assembly
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Application number
CN202322269722.4U
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Chinese (zh)
Inventor
陆冀成
陈明
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Shenzhen Bestfame Technology Co ltd
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Shenzhen Bestfame Technology Co ltd
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Priority to CN202322269722.4U priority Critical patent/CN220626483U/en
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Publication of CN220626483U publication Critical patent/CN220626483U/en
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Abstract

The utility model belongs to the technical field of chip testing and discloses a chip testing needle frame, which comprises a test bench, wherein a top plate is arranged above the test bench, a supporting rod is arranged between the test bench and the top plate, the supporting rod is vertically positioned at two sides of the top of the test bench, and a lifting plate is arranged below the top plate.

Description

Chip test needle frame
Technical Field
The utility model belongs to the technical field of chip testing, and particularly relates to a chip testing needle frame.
Background
In the research and development and mass production process of semiconductor chips, electrical performance tests must be performed to verify whether the chips can meet the requirements. The chip test needle frame is a key component in the test device and provides positioning for the chip during testing; and transmitting the electronic signals and the electric current between the chip and the test circuit board. The quality of the performance of the test needle frame directly influences the reliability and accuracy of the chip test.
When using the probe to detect, generally need place the probe on the support staff and carry out manual control probe longitudinal movement and detect the chip, this kind of support takes place to rock when the probe removes simultaneously the dynamics of pushing down also can't accurate control easily, leads to the inaccurate and damage problem of chip of testing result easily.
Disclosure of Invention
The utility model aims to provide a chip test needle frame, which solves the problems that the probe support provided in the prior art is easy to shake when a probe moves, the pressing force is not accurately controlled, and the detection result is inaccurate and the chip is damaged.
In order to achieve the above purpose, the present utility model provides the following technical solutions: a chip test needle rack comprising:
the test bench, the top of test bench is equipped with the roof, be equipped with the bracing piece between test bench and the roof, the vertical top both sides that are located the test bench of bracing piece, the below of roof is equipped with the lifter plate, the bottom of lifter plate is equipped with the mounting panel, install test probe under the mounting panel, be equipped with lifting assembly between roof and the lifter plate, be equipped with sliding assembly between lifter plate and the bracing piece, the top of test bench is equipped with the chip and places the frame, the top of test bench just is located the chip and places the frame and install pressure sensor, locating limiting assembly in the chip is placed the frame, limiting assembly is used for spacing the chip in the frame is placed to the chip.
Preferably, the lifting assembly is an electric lifting rod, the electric lifting rod is arranged at the center of the bottom of the top plate, and the telescopic end of the electric lifting rod is connected with the center of the top of the lifting plate.
Preferably, the sliding component is a sliding groove, the sliding groove is arranged on two sides of the inside of the lifting plate, and the sliding groove is slidably sleeved outside the supporting rod.
Preferably, the limiting component is a limiting plate, the limiting plates are arranged on two sides of the inner wall of the chip placement frame, a rotating component is arranged in the chip placement frame and used for realizing opposite movement of the two limiting plates in the chip placement frame.
Preferably, the rotating assembly comprises a thread groove and a threaded rod, the thread groove is formed in two sides of the inside of the chip placement frame, the threaded rod is arranged in the thread groove, one end of the threaded rod is connected with one end of the limiting plate, and a connecting assembly is arranged between the threaded rod and the limiting plate.
Preferably, the connecting assembly comprises a T-shaped groove and a T-shaped rod, the T-shaped groove is formed in one end of the threaded rod, which is close to the limiting plate, the T-shaped rod is arranged on one side of the limiting plate, and the T-shaped rod is embedded into the T-shaped groove.
Compared with the prior art, the utility model has the beneficial effects that:
(1) According to the utility model, the chip placement frame, the pressure sensor, the lifting plate, the sliding component, the electric lifting rod and the like are arranged, when the chip placement frame is used, the chip is placed in the chip placement frame, then the electric lifting rod is started to drive the lifting plate to move downwards, the sliding component arranged in the moving process of the lifting plate enables the lifting plate to move downwards stably, so that the shaking of the test probe is avoided, meanwhile, the chip can apply pressure to the pressure sensor after the test probe contacts the chip, the pressure sensor can judge whether the test probe contacts the chip in place, and the electric lifting rod stops working after the test probe contacts the chip, so that the chip is accurately detected.
(2) According to the chip placement frame, the limiting plates are arranged on the two sides of the inner wall of the chip placement frame, and the two limiting plates can move in the chip placement frame in opposite directions through the rotating assembly, so that chips with different sizes placed in the chip placement frame are fixed, the situation that the chips are easy to move in the chip placement frame and accurate in detection is avoided, the practicability of the chip placement frame is improved, and the chips with different sizes are convenient to fix and detect.
Drawings
FIG. 1 is a schematic diagram of the structure of the present utility model;
FIG. 2 is an external view of the present utility model;
fig. 3 is an enlarged view at a in fig. 1;
FIG. 4 is a schematic view of a connection assembly according to the present utility model;
in the figure: 1. a test bench; 2. a top plate; 3. a support rod; 4. a lifting plate; 5. a mounting plate; 6. a test probe; 7. an electric lifting rod; 8. a chute; 9. a chip placement frame; 10. a pressure sensor; 11. a limiting plate; 12. a thread groove; 13. a threaded rod; 14. a T-shaped groove; 15. t-shaped rod.
Detailed Description
The following description of the embodiments of the present utility model will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present utility model, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the utility model without making any inventive effort, are intended to be within the scope of the utility model.
Referring to fig. 1-4, the present utility model provides the following technical solutions: a chip test needle rack comprising:
the test bench 1, the top of test bench 1 is equipped with roof 2, be equipped with bracing piece 3 between test bench 1 and the roof 2, the vertical top both sides that are located test bench 1 of bracing piece 3, the below of roof 2 is equipped with lifter plate 4, the bottom of lifter plate 4 is equipped with mounting panel 5, install test probe 6 under the mounting panel 5, be equipped with lifting assembly between roof 2 and the lifter plate 4, be equipped with sliding assembly between lifter plate 4 and the bracing piece 3, the top of test bench 1 is equipped with chip placement frame 9, the top of test bench 1 just is located the chip placement frame 9 and installs pressure sensor 10, locate spacing subassembly in the chip placement frame 9, spacing subassembly is used for spacing the chip in the chip placement frame 9.
Referring to fig. 1-2, the lifting assembly is an electric lifting rod 7, the electric lifting rod 7 is installed at the bottom center of the top plate 2, the telescopic end of the electric lifting rod 7 is connected with the top center of the lifting plate 4, and the electric lifting rod 7 is externally connected with programmable processing control equipment and a driving source.
The sliding component is a sliding groove 8, the sliding groove 8 is arranged on two sides of the inside of the lifting plate 4, and the sliding groove 8 is slidably sleeved outside the supporting rod 3.
Through the technical scheme: when the chip is used, the chip is placed in the chip placement frame 9, the bottom of the chip is contacted with the pressure sensor 10, then the electric lifting rod 7 is started, the lifting plate 4 is enabled to move downwards through the operation of the electric lifting rod 7, so that the test probe 6 under the mounting plate 5 is driven to move downwards, the lifting plate 4 is enabled to move downwards along a correct path under the limit of the chute 8 sleeved outside the supporting rod 3 in the downward moving process of the lifting plate 4, the test probe 6 is stably lowered into the chip placement frame 9 to detect the chip, the pressure sensor 10 is applied by the chip after the test probe 6 contacts the chip, whether the test probe 6 contacts the chip or not can be judged through the pressure sensor 10, the electric lifting rod 7 stops working after the contact is finished, and therefore the chip is accurately detected, the problem that the detection result is inaccurate and the chip is damaged easily caused by the fact that the manual operation cannot accurately control the downward pressing force is avoided.
Referring to fig. 1-4, the limiting components are limiting plates 11, the limiting plates 11 are arranged on two sides of the inner wall of the chip placement frame 9, a rotating component is arranged in the chip placement frame 9, and the rotating component is used for realizing opposite movement of the two limiting plates 11 in the chip placement frame 9.
The rotating assembly comprises a thread groove 12 and a threaded rod 13, the thread groove 12 is formed in two sides of the interior of the chip placement frame 9, the threaded rod 13 is arranged in the thread groove 12, one end of the threaded rod 13 is connected with one end of the limiting plate 11, and a connecting assembly is arranged between the threaded rod 13 and the limiting plate 11.
The connecting assembly comprises a T-shaped groove 14 and a T-shaped rod 15, the T-shaped groove 14 is formed in one end of the threaded rod 13, which is close to the limiting plate 11, the T-shaped rod 15 is arranged on one side of the limiting plate 11, and the T-shaped rod 15 is embedded into the T-shaped groove 14.
Through the technical scheme: after the chip is placed in the chip placement frame 9, the two threaded rods 13 are screwed to drive the two limiting plates 11 in the chip placement frame 9 to move in opposite directions, so that the chip placed in the chip placement frame 9 is clamped and fixed, the situation that the chip is easy to shake in the chip placement frame 9 and accurate detection is caused is avoided, the practicability of the device is improved, and chips with different sizes are fixed and detected in the chip placement frame 9.
Although embodiments of the present utility model have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made therein without departing from the principles and spirit of the utility model, the scope of which is defined in the appended claims and their equivalents.

Claims (6)

1. A chip test needle holder, comprising:
test bench (1), the top of test bench (1) is equipped with roof (2), be equipped with bracing piece (3) between test bench (1) and roof (2), the vertical top both sides that are located test bench (1) of bracing piece (3), the below of roof (2) is equipped with lifter plate (4), the bottom of lifter plate (4) is equipped with mounting panel (5), install test probe (6) under mounting panel (5), be equipped with lifting assembly between roof (2) and lifter plate (4), be equipped with sliding assembly between lifter plate (4) and bracing piece (3), the top of test bench (1) is equipped with chip and places frame (9), the top of test bench (1) just is located chip and places frame (9) and install pressure sensor (10), locate spacing subassembly in chip place frame (9), spacing subassembly is used for spacing the chip in frame (9) to the chip.
2. A chip test needle holder as defined in claim 1, wherein: the lifting assembly is an electric lifting rod (7), the electric lifting rod (7) is arranged at the center of the bottom of the top plate (2), and the telescopic end of the electric lifting rod (7) is connected with the center of the top of the lifting plate (4).
3. A chip test needle holder as defined in claim 2, wherein: the sliding assembly is a sliding groove (8), the sliding groove (8) is formed in two sides of the inside of the lifting plate (4), and the sliding groove (8) is slidably sleeved outside the supporting rod (3).
4. A chip test needle holder according to claim 3, wherein: the limiting assembly is a limiting plate (11), the limiting plates (11) are arranged on two sides of the inner wall of the chip placement frame (9), a rotating assembly is arranged in the chip placement frame (9), and the rotating assembly is used for realizing opposite movement of the two limiting plates (11) in the chip placement frame (9).
5. A chip test needle holder as defined in claim 4, wherein: the rotating assembly comprises a thread groove (12) and a threaded rod (13), wherein the thread groove (12) is formed in two sides of the inside of the chip placement frame (9), the threaded rod (13) is arranged in the thread groove (12), one end of the threaded rod (13) is connected with one end of the limiting plate (11), and a connecting assembly is arranged between the threaded rod (13) and the limiting plate (11).
6. A chip test needle holder as defined in claim 5, wherein: the connecting assembly comprises a T-shaped groove (14) and a T-shaped rod (15), wherein the T-shaped groove (14) is formed in one end of the threaded rod (13) close to the limiting plate (11), the T-shaped rod (15) is arranged on one side of the limiting plate (11), and the T-shaped rod (15) is embedded into the T-shaped groove (14).
CN202322269722.4U 2023-08-23 2023-08-23 Chip test needle frame Active CN220626483U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202322269722.4U CN220626483U (en) 2023-08-23 2023-08-23 Chip test needle frame

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202322269722.4U CN220626483U (en) 2023-08-23 2023-08-23 Chip test needle frame

Publications (1)

Publication Number Publication Date
CN220626483U true CN220626483U (en) 2024-03-19

Family

ID=90226676

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202322269722.4U Active CN220626483U (en) 2023-08-23 2023-08-23 Chip test needle frame

Country Status (1)

Country Link
CN (1) CN220626483U (en)

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