KR20120006501A - 엑스선 발생장치와 그것을 사용하는 복합장치 및 엑스선 발생방법 - Google Patents
엑스선 발생장치와 그것을 사용하는 복합장치 및 엑스선 발생방법 Download PDFInfo
- Publication number
- KR20120006501A KR20120006501A KR1020117023428A KR20117023428A KR20120006501A KR 20120006501 A KR20120006501 A KR 20120006501A KR 1020117023428 A KR1020117023428 A KR 1020117023428A KR 20117023428 A KR20117023428 A KR 20117023428A KR 20120006501 A KR20120006501 A KR 20120006501A
- Authority
- KR
- South Korea
- Prior art keywords
- electron
- emitting device
- ray
- ultraviolet
- energy
- Prior art date
Links
- 238000000034 method Methods 0.000 title claims description 15
- 239000002131 composite material Substances 0.000 title description 2
- 229910052751 metal Inorganic materials 0.000 claims abstract description 22
- 239000002184 metal Substances 0.000 claims abstract description 22
- 239000000835 fiber Substances 0.000 claims description 9
- 230000001678 irradiating effect Effects 0.000 claims description 5
- 239000000126 substance Substances 0.000 claims description 2
- 239000000463 material Substances 0.000 abstract description 17
- 239000013078 crystal Substances 0.000 description 7
- 229910052802 copper Inorganic materials 0.000 description 6
- 239000010949 copper Substances 0.000 description 6
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 5
- 206010028980 Neoplasm Diseases 0.000 description 4
- 201000011510 cancer Diseases 0.000 description 4
- 238000010894 electron beam technology Methods 0.000 description 4
- 239000013307 optical fiber Substances 0.000 description 4
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 3
- 229910013641 LiNbO 3 Inorganic materials 0.000 description 3
- 239000002041 carbon nanotube Substances 0.000 description 3
- 229910021393 carbon nanotube Inorganic materials 0.000 description 3
- 238000004846 x-ray emission Methods 0.000 description 3
- -1 for example Chemical compound 0.000 description 2
- 230000005484 gravity Effects 0.000 description 2
- 238000005459 micromachining Methods 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 239000010453 quartz Substances 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 229910000838 Al alloy Inorganic materials 0.000 description 1
- 229910000881 Cu alloy Inorganic materials 0.000 description 1
- 238000002441 X-ray diffraction Methods 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 150000001879 copper Chemical class 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 230000004807 localization Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000006386 neutralization reaction Methods 0.000 description 1
- 230000035515 penetration Effects 0.000 description 1
- 230000010287 polarization Effects 0.000 description 1
- 230000001737 promoting effect Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000001179 sorption measurement Methods 0.000 description 1
- 230000002269 spontaneous effect Effects 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J35/00—X-ray tubes
- H01J35/02—Details
- H01J35/04—Electrodes ; Mutual position thereof; Constructional adaptations therefor
- H01J35/06—Cathodes
- H01J35/065—Field emission, photo emission or secondary emission cathodes
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05G—X-RAY TECHNIQUE
- H05G2/00—Apparatus or processes specially adapted for producing X-rays, not involving X-ray tubes, e.g. involving generation of a plasma
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2235/00—X-ray tubes
- H01J2235/06—Cathode assembly
- H01J2235/062—Cold cathodes
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Optics & Photonics (AREA)
- Plasma & Fusion (AREA)
- X-Ray Techniques (AREA)
- Radiation-Therapy Devices (AREA)
Abstract
Description
도2는 X선 발생장치의 변형 태양을 나타낸다.
도3은 X선 발생장치와 센서를 조합시켜서 이루어지는 복합장치를 나타낸다.
3 : 펄스레이저 발진기
5 : 자외선광용 파이버
10 : 초전체
20 : 금속편
Claims (12)
- 에너지를 받아서 전자를 방출하는 전자방출소자(電子放出素子)와,
상기 전자방출소자로부터 방출된 전자를 받아서 X선을 방출하는 금속편(金屬片)과,
상기 전자방출소자로 에너지를 공급하는 에너지 공급부(energy 供給部)를
구비하는 X선 발생장치(X線 發生裝置)로서,
상기 에너지 공급부는 상기 전자방출소자에 국소적인 고에너지 부분을 형성하는 것을 특징으로 하는 X선 발생장치.
- 제1항에 있어서,
상기 에너지 공급부는 자외선(紫外線)을 상기 전자방출소자로 조사(照射)하는 것을 특징으로 하는 X선 발생장치.
- 제2항에 있어서,
상기 자외선은 300nm 이하의 파장을 구비하는 것을 특징으로 하는 X선 발생장치.
- 제2항 또는 제3항에 있어서,
상기 자외선을 펄스(pulse) 모양으로 하여 상기 전자방출소자로 조사하는 것을 특징으로 하는 X선 발생장치.
- 제2항 내지 제4항 중 어느 하나의 항에 있어서,
상기 전자방출소자에 있어서 상기 금속편과 대향(對向)하는 면과 반대측의 면으로 상기 자외선을 조사하는 것을 특징으로 하는 X선 발생장치.
- 제2항 내지 제5항 중 어느 하나의 항에 있어서,
상기 에너지 공급부는,
상기 자외선을 발생시키는 자외선 발생부(紫外線 發生部)와,
자외선용 파이버(紫外線用 fiber)를
구비하고,
상기 자외선 발생부에 의하여 발생된 상기 자외선을 상기 자외선용 파이버를 통하여 상기 전자방출소자로 조사하는 것을 특징으로 하는 X선 발생장치.
- 제1항 내지 제6항 중 어느 하나의 항의 X선 발생장치와 물리량 또는 화학량을 측정할 수 있는 센서(sensor)가 동일면 상에 배열되는 것을 특징으로 하는 복합장치.
- 에너지를 받아서 전자를 방출하는 전자방출소자와,
상기 전자방출소자로부터 방출된 전자를 받아서 X선을 방출하는 금속편과,
상기 전자방출소자로 에너지를 공급하는 에너지 공급부를
구비하는 X선 발생장치를 사용하는 X선의 발생방법으로서,
상기 에너지 공급부로부터 상기 전자방출소자로 에너지를 공급하고, 상기 전자방출소자에 국소적인 고에너지 부분을 형성하는 것을 특징으로 하는 X선 발생방법.
- 제8항에 있어서,
상기 에너지 공급부는 자외선을 상기 전자방출소자로 조사하는 것을 특징으로 하는 X선 발생방법.
- 제9항에 있어서,
상기 자외선은 300nm 이하의 파장을 구비하는 것을 특징으로 하는 X선 발생장치.
- 제9항 또는 제10항에 있어서,
상기 자외선을 펄스 모양으로 하여 상기 전자방출소자로 조사하는 것을 특징으로 하는 X선 발생방법.
- 제9항 내지 제11항 중 어느 하나의 항에 있어서,
상기 전자방출소자에 있어서 상기 금속편과 대향하는 면과 반대측의 면으로 상기 자외선을 조사하는 것을 특징으로 하는 X선 발생방법.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2009092852 | 2009-04-07 | ||
JPJP-P-2009-092852 | 2009-04-07 |
Publications (1)
Publication Number | Publication Date |
---|---|
KR20120006501A true KR20120006501A (ko) | 2012-01-18 |
Family
ID=42936005
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020117023428A KR20120006501A (ko) | 2009-04-07 | 2010-04-05 | 엑스선 발생장치와 그것을 사용하는 복합장치 및 엑스선 발생방법 |
Country Status (7)
Country | Link |
---|---|
US (1) | US8917814B2 (ko) |
EP (1) | EP2418671B1 (ko) |
JP (1) | JP4688978B2 (ko) |
KR (1) | KR20120006501A (ko) |
CN (1) | CN202549784U (ko) |
CA (1) | CA2758022A1 (ko) |
WO (1) | WO2010116709A1 (ko) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8976932B2 (en) * | 2010-07-09 | 2015-03-10 | Bsr Co., Ltd. | X-ray generating device |
JP6123063B2 (ja) * | 2011-09-10 | 2017-05-10 | 株式会社Bsr | X線照射装置 |
WO2013058342A1 (ja) * | 2011-10-18 | 2013-04-25 | 株式会社Bsr | 荷電粒子放射装置および同装置を用いたx線発生装置 |
US9117622B2 (en) * | 2012-08-08 | 2015-08-25 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | Miniaturized high-speed modulated X-ray source |
US9520260B2 (en) * | 2012-09-14 | 2016-12-13 | The Board Of Trustees Of The Leland Stanford Junior University | Photo emitter X-ray source array (PeXSA) |
JP6661149B2 (ja) | 2014-10-08 | 2020-03-11 | 株式会社Bsr | 荷電粒子放射方法及びその装置並びにx線発生方法及びその装置 |
GB201622206D0 (en) | 2016-12-23 | 2017-02-08 | Univ Of Dundee See Pulcea Ltd Univ Of Huddersfield | Mobile material analyser |
Family Cites Families (31)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5042058A (en) * | 1989-03-22 | 1991-08-20 | University Of California | Ultrashort time-resolved x-ray source |
WO1999062589A2 (en) * | 1998-06-04 | 1999-12-09 | Uriel Halavee | Radiotherapeutical device and use thereof |
JP3090910B2 (ja) * | 1999-01-19 | 2000-09-25 | 株式会社エー・イー・ティー・ジャパン | 超小形x線発生装置 |
US6319188B1 (en) * | 1999-04-26 | 2001-11-20 | Xoft Microtube, Inc. | Vascular X-ray probe |
US6195411B1 (en) * | 1999-05-13 | 2001-02-27 | Photoelectron Corporation | Miniature x-ray source with flexible probe |
US6333968B1 (en) * | 2000-05-05 | 2001-12-25 | The United States Of America As Represented By The Secretary Of The Navy | Transmission cathode for X-ray production |
US20020191746A1 (en) * | 2001-06-19 | 2002-12-19 | Mark Dinsmore | X-ray source for materials analysis systems |
US7266178B2 (en) * | 2002-05-17 | 2007-09-04 | Thermoniton Analyzers Llc | Calibration source for X-ray detectors |
US6882703B2 (en) * | 2002-07-31 | 2005-04-19 | Ge Medical Systems Global Technology Company, Llc | Electron source and cable for x-ray tubes |
EP1493466B1 (en) * | 2003-06-30 | 2012-06-20 | Nucletron Operations B.V. | Miniature X-ray source with cryogenic cooling |
US7558373B2 (en) * | 2004-03-30 | 2009-07-07 | The Doshisha | X-ray generator employing hemimorphic crystal and ozone generator employing it |
WO2006060030A2 (en) * | 2004-05-19 | 2006-06-08 | The Regents Of The University Of California | High energy crystal generators and their applications |
JP4606839B2 (ja) * | 2004-10-25 | 2011-01-05 | 浜松ホトニクス株式会社 | 電子流供給装置及び供給方法 |
US7187755B2 (en) * | 2004-11-02 | 2007-03-06 | General Electric Company | Electron emitter assembly and method for generating electron beams |
US7085350B2 (en) * | 2004-11-02 | 2006-08-01 | General Electric Company | Electron emitter assembly and method for adjusting a power level of electron beams |
US7136455B2 (en) * | 2004-11-02 | 2006-11-14 | General Electric Company | Electron emitter assembly and method for adjusting a size of electron beams |
US7729474B2 (en) * | 2005-03-29 | 2010-06-01 | Kyoto University | X-ray generator using hemimorphic crystal |
DE102005043372B4 (de) * | 2005-09-12 | 2012-04-26 | Siemens Ag | Röntgenstrahler |
WO2007083662A1 (ja) * | 2006-01-18 | 2007-07-26 | Kyoto University | 異極像結晶を用いたx線発生装置 |
DE102006024435B4 (de) * | 2006-05-24 | 2012-02-16 | Siemens Ag | Röntgenstrahler |
DE102006024436B4 (de) * | 2006-05-24 | 2013-01-03 | Siemens Aktiengesellschaft | Röntgeneinheit |
US7791019B2 (en) * | 2007-01-11 | 2010-09-07 | California Institute Of Technology | Ambient pressure pyroelectric ion source for mass spectrometry |
US7796733B2 (en) * | 2007-02-01 | 2010-09-14 | Rapiscan Systems, Inc. | Personnel security screening system with enhanced privacy |
JP5019302B2 (ja) * | 2007-03-26 | 2012-09-05 | 学校法人同志社 | 異極像結晶を用いたx線発生装置 |
US7627087B2 (en) * | 2007-06-28 | 2009-12-01 | General Electric Company | One-dimensional grid mesh for a high-compression electron gun |
DE102007035177A1 (de) * | 2007-07-27 | 2009-02-05 | Siemens Ag | Computertomographie-System mit feststehendem Anodenring |
DE102007046278A1 (de) * | 2007-09-27 | 2009-04-09 | Siemens Ag | Röntgenröhre mit Transmissionsanode |
WO2009052176A1 (en) * | 2007-10-15 | 2009-04-23 | Excellims Corporation | Compact pyroelectric sealed electron beam |
DE102008034584A1 (de) * | 2008-07-24 | 2010-02-04 | Siemens Aktiengesellschaft | Röntgen-Computertomograph |
NZ597840A (en) * | 2009-08-07 | 2013-09-27 | Univ California | Apparatus for producing x-rays for use in imaging |
US8223925B2 (en) * | 2010-04-15 | 2012-07-17 | Bruker Axs Handheld, Inc. | Compact collimating device |
-
2010
- 2010-04-05 CA CA2758022A patent/CA2758022A1/en not_active Abandoned
- 2010-04-05 WO PCT/JP2010/002489 patent/WO2010116709A1/ja active Application Filing
- 2010-04-05 EP EP10761413.3A patent/EP2418671B1/en not_active Not-in-force
- 2010-04-05 CN CN201090000816XU patent/CN202549784U/zh not_active Expired - Lifetime
- 2010-04-05 KR KR1020117023428A patent/KR20120006501A/ko not_active Application Discontinuation
- 2010-04-05 US US13/263,065 patent/US8917814B2/en not_active Expired - Fee Related
- 2010-04-05 JP JP2010538250A patent/JP4688978B2/ja not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
US20120027181A1 (en) | 2012-02-02 |
EP2418671B1 (en) | 2017-05-31 |
EP2418671A1 (en) | 2012-02-15 |
EP2418671A4 (en) | 2014-05-21 |
JPWO2010116709A1 (ja) | 2012-10-18 |
JP4688978B2 (ja) | 2011-05-25 |
WO2010116709A1 (ja) | 2010-10-14 |
US8917814B2 (en) | 2014-12-23 |
CA2758022A1 (en) | 2010-10-14 |
CN202549784U (zh) | 2012-11-21 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
KR20120006501A (ko) | 엑스선 발생장치와 그것을 사용하는 복합장치 및 엑스선 발생방법 | |
KR101564360B1 (ko) | 고속 이온 생성 시스템 및 그 생성 방법 | |
Shen et al. | Pair and γ-photon production from a thin foil confined by two laser pulses | |
EP1976344A3 (en) | Extreme ultraviolet light source device and extreme ultraviolet radiation generating method | |
US9455113B2 (en) | System for fast ions generation and a method thereof | |
JP5895300B2 (ja) | 電子線照射装置 | |
JP2003036805A (ja) | 微小x線源 | |
JP2011086425A (ja) | X線発生装置及びそれを用いる複合装置 | |
JP2010205651A (ja) | プラズマ発生方法およびこのプラズマ発生方法を用いた極端紫外光光源装置 | |
RU183140U1 (ru) | Импульсный пироэлектрический ускоритель | |
Hoffman et al. | High brightness laser/plasma source for high throughput submicron x‐ray lithography | |
Takai et al. | Development of a tiny X-ray source controlled by laser light for medical application | |
Nakahama et al. | Electron emission from LiTaO 3 crystal excited by Nd: YLF laser light and its X-ray source application | |
Valle Brozas et al. | X-ray emission from a liquid curtain jet when irradiated by femtosecond laser pulses | |
EP3209097B1 (en) | Method and apparatus for radiating charged particles, and method and apparatus for emitting x-rays | |
JP2012030015A (ja) | 治療装置 | |
JP2006172898A (ja) | レーザープラズマx線発生装置 | |
Kuk et al. | Laser driven proton acceleration experiment with micro-structured target at the Texas Petawatt Laser Facility | |
Ni et al. | Li+ ion emission from a hot-plate alumina-silicate source stimulated by flash heating with an infrared laser | |
Skinner et al. | X-ray laser sources for microscopy | |
JP2006189350A (ja) | 軟x線発生装置 | |
Terauchi et al. | Compact extreme ultraviolet source by use of a discharge-produced potassium plasma for surface morphology application | |
JPS63224277A (ja) | パルスガスレ−ザ装置 | |
Mocek | Applications of a 10-mJ soft X-ray laser: from dense plasma physics to micro-structuring | |
Eder et al. | Relativistic electron beam interaction and Ka-generation in solid targets |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PA0105 | International application |
Patent event date: 20111005 Patent event code: PA01051R01D Comment text: International Patent Application |
|
PG1501 | Laying open of application | ||
A201 | Request for examination | ||
PA0201 | Request for examination |
Patent event code: PA02012R01D Patent event date: 20150310 Comment text: Request for Examination of Application |
|
N231 | Notification of change of applicant | ||
PN2301 | Change of applicant |
Patent event date: 20150318 Comment text: Notification of Change of Applicant Patent event code: PN23011R01D |
|
E902 | Notification of reason for refusal | ||
PE0902 | Notice of grounds for rejection |
Comment text: Notification of reason for refusal Patent event date: 20160622 Patent event code: PE09021S01D |
|
E601 | Decision to refuse application | ||
PE0601 | Decision on rejection of patent |
Patent event date: 20160912 Comment text: Decision to Refuse Application Patent event code: PE06012S01D Patent event date: 20160622 Comment text: Notification of reason for refusal Patent event code: PE06011S01I |