KR20110102205A - 정보 표시용 패널의 활성화 장치 및 도통 검사 방법 - Google Patents

정보 표시용 패널의 활성화 장치 및 도통 검사 방법 Download PDF

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Publication number
KR20110102205A
KR20110102205A KR1020110020206A KR20110020206A KR20110102205A KR 20110102205 A KR20110102205 A KR 20110102205A KR 1020110020206 A KR1020110020206 A KR 1020110020206A KR 20110020206 A KR20110020206 A KR 20110020206A KR 20110102205 A KR20110102205 A KR 20110102205A
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KR
South Korea
Prior art keywords
probe
information display
display panel
conduction
activation
Prior art date
Application number
KR1020110020206A
Other languages
English (en)
Korean (ko)
Inventor
고지 다구찌
Original Assignee
가부시키가이샤 브리지스톤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 가부시키가이샤 브리지스톤 filed Critical 가부시키가이샤 브리지스톤
Publication of KR20110102205A publication Critical patent/KR20110102205A/ko

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    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/10—Measuring as part of the manufacturing process
    • H01L22/14—Measuring as part of the manufacturing process for electrical parameters, e.g. resistance, deep-levels, CV, diffusions by electrical means
KR1020110020206A 2010-03-09 2011-03-08 정보 표시용 패널의 활성화 장치 및 도통 검사 방법 KR20110102205A (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2010052246A JP2011186242A (ja) 2010-03-09 2010-03-09 情報表示用パネルの活性化装置および導通検査方法
JPJP-P-2010-052246 2010-03-09

Publications (1)

Publication Number Publication Date
KR20110102205A true KR20110102205A (ko) 2011-09-16

Family

ID=44602389

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020110020206A KR20110102205A (ko) 2010-03-09 2011-03-08 정보 표시용 패널의 활성화 장치 및 도통 검사 방법

Country Status (4)

Country Link
JP (1) JP2011186242A (zh)
KR (1) KR20110102205A (zh)
CN (1) CN102194419A (zh)
TW (1) TW201137486A (zh)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105931590B (zh) * 2016-04-28 2019-07-05 深圳市海达唯赢科技有限公司 一种lcd驱动板自动检测方法和系统
JP7306593B1 (ja) 2022-09-30 2023-07-11 住友ベークライト株式会社 検査装置および検査方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09211418A (ja) * 1996-02-01 1997-08-15 Toshiba Electron Eng Corp 液晶表示装置の検査装置及びその検査方法
JP2003092061A (ja) * 2001-09-17 2003-03-28 Canon Inc 電圧印加装置、電子源の製造装置及び製造方法
JP2007024582A (ja) * 2005-07-13 2007-02-01 Agilent Technol Inc 表示パネルの検査装置、及びそれに用いるインターフェース
JP2008224738A (ja) * 2007-03-08 2008-09-25 Bridgestone Corp 情報表示用パネルの活性化方法

Also Published As

Publication number Publication date
TW201137486A (en) 2011-11-01
JP2011186242A (ja) 2011-09-22
CN102194419A (zh) 2011-09-21

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A201 Request for examination
E902 Notification of reason for refusal
E601 Decision to refuse application