KR20100095351A - 직선 왕복 테스트 모듈 및 그 테스트 시스템 - Google Patents
직선 왕복 테스트 모듈 및 그 테스트 시스템 Download PDFInfo
- Publication number
- KR20100095351A KR20100095351A KR1020090058108A KR20090058108A KR20100095351A KR 20100095351 A KR20100095351 A KR 20100095351A KR 1020090058108 A KR1020090058108 A KR 1020090058108A KR 20090058108 A KR20090058108 A KR 20090058108A KR 20100095351 A KR20100095351 A KR 20100095351A
- Authority
- KR
- South Korea
- Prior art keywords
- test
- linear reciprocating
- device under
- test module
- handler
- Prior art date
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
- G01R31/2865—Holding devices, e.g. chucks; Handlers or transport devices
- G01R31/2867—Handlers or transport devices, e.g. loaders, carriers, trays
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2834—Automated test systems [ATE]; using microprocessors or computers
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2836—Fault-finding or characterising
- G01R31/2837—Characterising or performance testing, e.g. of frequency response
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2896—Testing of IC packages; Test features related to IC packages
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- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Environmental & Geological Engineering (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
Description
Claims (5)
- 피시험 소자(DUT)를 수용하는 하나 이상의 수용 장치; 및상기 피시험 소자를 직선 왕복 운동시키는 직선 왕복 기구를 포함하는 것을 특징으로 하는 직선 왕복 테스트 시스템.
- 제1항에 있어서,상기 피시험 소자에 전기적 인터페이스를 제공하는 소자 인터페이스 보드(DIB)를 더 포함하는 직선 왕복 테스트 시스템.
- 제1항에 있어서,상기 직선 왕복 기구는,회전하도록 구동되는 회전판;궤적을 따라 운동하는 슬라이딩 베이스; 및활동 축을 통해 상기 회전판과 상기 슬라이딩 베이스와 각각 연결되는 연결 로드를 포함하고,상기 회전판은 회전시 상기 연결 로드를 통해 상기 슬라이딩 베이스를 이끌어 상기 궤적을 따라 직선 왕복 운동을 하도록 되어 있는, 직선 왕복 테스트 시스템.
- 제1항에 있어서,상기 피시험 소자를 픽업하여 상기 수용 장치에 수용시키는 핸들러(handler) ; 및상기 직선 왕복 기구 및 상기 핸들러를 각각 제어하는 테스터(tester)를 더 포함하는 직선 왕복 테스트 시스템.
- 제4항에 있어서,상기 테스터가 상기 직선 왕복 기구를 제어할 수 있도록 하는 제1 전송선;및상기 테스터가 상기 핸들러를 제어할 수 있도록 하는 제2 전송선을 더 포함하 는 직선 왕복 테스트 시스템.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW098105501 | 2009-02-20 | ||
TW098105501A TWI395950B (zh) | 2009-02-20 | 2009-02-20 | 直線往復測試模組及其測試系統 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20100095351A true KR20100095351A (ko) | 2010-08-30 |
KR101130125B1 KR101130125B1 (ko) | 2012-04-02 |
Family
ID=42759110
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020090058108A KR101130125B1 (ko) | 2009-02-20 | 2009-06-29 | 직선 왕복 테스트 모듈 및 그 테스트 시스템 |
Country Status (2)
Country | Link |
---|---|
KR (1) | KR101130125B1 (ko) |
TW (1) | TWI395950B (ko) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101367069B1 (ko) * | 2012-12-28 | 2014-02-25 | 삼성전기주식회사 | 관성센서의 테스트 장치 및 테스트 방법 |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI410633B (zh) * | 2010-10-15 | 2013-10-01 | Well Handle Technology Co Ltd | 電子組件之直立式測試設備 |
TWI416137B (zh) * | 2010-10-15 | 2013-11-21 | Well Handle Technology Co Ltd | 電子零件之轉接式測試設備 |
TWI474002B (zh) * | 2012-10-25 | 2015-02-21 | King Yuan Electronics Co Ltd | 水平對臥式動態測試機及使用該測試機之動態測試設備 |
CN103791941B (zh) * | 2012-10-30 | 2016-08-24 | 京元电子股份有限公司 | 水平对卧式动态测试机及使用该测试机的动态测试设备 |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3265133B2 (ja) * | 1994-08-23 | 2002-03-11 | 株式会社日立製作所 | 検査装置 |
JP2929948B2 (ja) * | 1994-09-20 | 1999-08-03 | 三菱電機株式会社 | プローブ式テストハンドラー及びそれを用いたicのテスト方法 |
WO1996037765A1 (en) * | 1995-05-22 | 1996-11-28 | Analog Devices, Inc. | Integrated accelerometer test system |
KR970072531A (ko) * | 1996-04-16 | 1997-11-07 | 손욱 | 전지의 전극판 및 그 제조방법 |
JP3777395B2 (ja) * | 2001-09-17 | 2006-05-24 | アキム株式会社 | 電子部品の温度特性試験方法および装置 |
KR20050066313A (ko) * | 2003-12-26 | 2005-06-30 | 미래산업 주식회사 | 반도체 소자 테스트 핸들러 |
CN2733361Y (zh) * | 2004-09-13 | 2005-10-12 | 武汉市金鹤电气技术有限责任公司 | 高压开关万能测速传感器 |
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2009
- 2009-02-20 TW TW098105501A patent/TWI395950B/zh active
- 2009-06-29 KR KR1020090058108A patent/KR101130125B1/ko active IP Right Grant
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101367069B1 (ko) * | 2012-12-28 | 2014-02-25 | 삼성전기주식회사 | 관성센서의 테스트 장치 및 테스트 방법 |
Also Published As
Publication number | Publication date |
---|---|
KR101130125B1 (ko) | 2012-04-02 |
TW201031922A (en) | 2010-09-01 |
TWI395950B (zh) | 2013-05-11 |
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