KR20090067336A - 싸이리스터 정류기 열화 예측 방법 - Google Patents
싸이리스터 정류기 열화 예측 방법 Download PDFInfo
- Publication number
- KR20090067336A KR20090067336A KR1020070134958A KR20070134958A KR20090067336A KR 20090067336 A KR20090067336 A KR 20090067336A KR 1020070134958 A KR1020070134958 A KR 1020070134958A KR 20070134958 A KR20070134958 A KR 20070134958A KR 20090067336 A KR20090067336 A KR 20090067336A
- Authority
- KR
- South Korea
- Prior art keywords
- thyristor
- degradation
- rectifier
- calculating
- thyristor rectifier
- Prior art date
Links
- 238000000034 method Methods 0.000 title claims abstract description 20
- 230000015556 catabolic process Effects 0.000 title claims abstract description 18
- 238000006731 degradation reaction Methods 0.000 title claims abstract description 18
- 230000006866 deterioration Effects 0.000 claims abstract description 10
- 230000002596 correlated effect Effects 0.000 description 2
- 238000000746 purification Methods 0.000 description 2
- 230000001276 controlling effect Effects 0.000 description 1
- 230000000875 corresponding effect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Images
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/0092—Arrangements for measuring currents or voltages or for indicating presence or sign thereof measuring current only
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/02—Measuring effective values, i.e. root-mean-square values
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- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02M—APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
- H02M7/00—Conversion of AC power input into DC power output; Conversion of DC power input into AC power output
- H02M7/02—Conversion of AC power input into DC power output without possibility of reversal
- H02M7/04—Conversion of AC power input into DC power output without possibility of reversal by static converters
- H02M7/12—Conversion of AC power input into DC power output without possibility of reversal by static converters using discharge tubes with control electrode or semiconductor devices with control electrode
- H02M7/145—Conversion of AC power input into DC power output without possibility of reversal by static converters using discharge tubes with control electrode or semiconductor devices with control electrode using devices of a thyratron or thyristor type requiring extinguishing means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor
- G01R31/263—Circuits therefor for testing thyristors
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Power Conversion In General (AREA)
Abstract
Description
Claims (2)
- 싸이리스터 정류기 열화 예측 방법에 있어서,(a) 병렬로 연결된 싸이리스터 소자의 턴-온(turn-on) 되는 시점을 측정하는 단계(S10);(b) 각 파형의 실효치(RMS) 값을 계산(Ri)하는 단계(S20);(c) 각각의 파형의 실효치에 대한 실효치(RMS)평균을 산출하는 단계(S30); 및(d) 상기 동일 그룹 내의 소자들의 평균 실효치를 이용하여 편차로써 열화 정도를 계산하는 단계(S40);를 포함하는 것을 특징으로 하는 싸이리스터 정류기 열화 예측 방법.
- 제 1항에 있어서,상기 (c) 단계는,각 싸이리스터의 실효치(RMS)의 상대차가Del(%) = (Ri-M)/M*100를 통해 계산되도록 하는 것을 포함하는 싸이리스터 정류기 열화 예측방법.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020070134958A KR100956502B1 (ko) | 2007-12-21 | 2007-12-21 | 싸이리스터 정류기 열화 예측 방법 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020070134958A KR100956502B1 (ko) | 2007-12-21 | 2007-12-21 | 싸이리스터 정류기 열화 예측 방법 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20090067336A true KR20090067336A (ko) | 2009-06-25 |
KR100956502B1 KR100956502B1 (ko) | 2010-05-07 |
Family
ID=40995068
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020070134958A KR100956502B1 (ko) | 2007-12-21 | 2007-12-21 | 싸이리스터 정류기 열화 예측 방법 |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR100956502B1 (ko) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101374504B1 (ko) * | 2013-03-29 | 2014-03-14 | 엘에스산전 주식회사 | 직류 송전 장치의 구동방법 |
CN109901039A (zh) * | 2019-03-29 | 2019-06-18 | 国网上海市电力公司 | 一种换流阀晶闸管均压元件测试装置及方法 |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101750285B1 (ko) | 2016-05-31 | 2017-06-26 | 산일전기 주식회사 | 온도 센서를 이용하여 scr의 온도를 감시하기 위한 소프트 스타터 시스템 |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100321060B1 (ko) | 1997-12-05 | 2002-03-08 | 이구택 | 싸이리스터 열화진단장치 |
KR100481228B1 (ko) * | 2003-08-08 | 2005-04-07 | 한국전기연구원 | 직류/교류 인버터 및 교류/직류 정류기의 열화진단 방법 |
KR100852919B1 (ko) * | 2005-11-17 | 2008-08-22 | 정재호 | 반도체 소자 진단을 위한 전압-전류 측정 장치 |
-
2007
- 2007-12-21 KR KR1020070134958A patent/KR100956502B1/ko active IP Right Grant
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101374504B1 (ko) * | 2013-03-29 | 2014-03-14 | 엘에스산전 주식회사 | 직류 송전 장치의 구동방법 |
CN109901039A (zh) * | 2019-03-29 | 2019-06-18 | 国网上海市电力公司 | 一种换流阀晶闸管均压元件测试装置及方法 |
Also Published As
Publication number | Publication date |
---|---|
KR100956502B1 (ko) | 2010-05-07 |
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