KR20090059032A - 디스플레이 패널의 검사 방법 및 검사 장치 - Google Patents
디스플레이 패널의 검사 방법 및 검사 장치 Download PDFInfo
- Publication number
- KR20090059032A KR20090059032A KR1020080111555A KR20080111555A KR20090059032A KR 20090059032 A KR20090059032 A KR 20090059032A KR 1020080111555 A KR1020080111555 A KR 1020080111555A KR 20080111555 A KR20080111555 A KR 20080111555A KR 20090059032 A KR20090059032 A KR 20090059032A
- Authority
- KR
- South Korea
- Prior art keywords
- display panel
- image
- lens system
- image pickup
- ccd
- Prior art date
Links
Images
Classifications
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N2021/9513—Liquid crystal panels
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007314920 | 2007-12-05 | ||
JPJP-P-2007-314920 | 2007-12-05 | ||
JP2008115844A JP2009156857A (ja) | 2007-12-05 | 2008-04-25 | ディスプレイパネルの検査方法および検査装置 |
JPJP-P-2008-115844 | 2008-04-25 |
Publications (1)
Publication Number | Publication Date |
---|---|
KR20090059032A true KR20090059032A (ko) | 2009-06-10 |
Family
ID=40734275
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020080111555A KR20090059032A (ko) | 2007-12-05 | 2008-11-11 | 디스플레이 패널의 검사 방법 및 검사 장치 |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP2009156857A (zh) |
KR (1) | KR20090059032A (zh) |
CN (1) | CN101451909B (zh) |
TW (1) | TWI390195B (zh) |
Families Citing this family (21)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5499295B2 (ja) * | 2007-12-05 | 2014-05-21 | 株式会社日本マイクロニクス | ディスプレイパネルの検査方法および検査装置 |
CN102831870B (zh) * | 2009-08-18 | 2015-05-13 | 夏普株式会社 | 显示装置和显示装置的亮度不均校正方法 |
JP4865849B2 (ja) * | 2009-12-16 | 2012-02-01 | シャープ株式会社 | 撮像条件決定装置、撮像条件決定方法、撮像条件決定プログラム、コンピュータ読み取り可能な記録媒体、及び上記撮像条件決定装置を備えたムラ補正システム |
JP5702634B2 (ja) * | 2011-03-15 | 2015-04-15 | 株式会社日本マイクロニクス | カメラ解像度自動測定方法及び自動調節方法並びに画像検査方法及び装置 |
KR101306289B1 (ko) | 2011-09-15 | 2013-09-09 | (주) 인텍플러스 | 평판 패널 검사방법 |
TWI512277B (zh) * | 2013-01-04 | 2015-12-11 | Taiwan Power Testing Technology Co Ltd | 顯示器之檢測設備 |
KR102149480B1 (ko) * | 2013-10-31 | 2020-10-14 | 엘지디스플레이 주식회사 | 표시장치의 얼룩 보상 방법 및 및 장치 |
CN103645036B (zh) * | 2013-12-30 | 2017-07-18 | 京东方科技集团股份有限公司 | 摩尔纹测评方法及测评装置 |
CN104867429B (zh) * | 2014-02-25 | 2018-02-06 | 台湾动力检测科技股份有限公司 | 显示器的检测设备 |
CN104111547B (zh) * | 2014-05-23 | 2017-10-27 | 苏州日和科技有限公司 | 一种彩色滤光片自动切换装置 |
CN106664359B (zh) * | 2014-07-15 | 2019-09-27 | 宜客斯股份有限公司 | 图像处理方法及实施该图像处理方法的图像处理装置 |
CN105654898B (zh) * | 2016-02-25 | 2018-09-21 | 西安诺瓦电子科技有限公司 | 图像采集设备成像摩尔纹抑制方法及其应用 |
CN106292003B (zh) * | 2016-08-16 | 2019-08-16 | 凌云光技术集团有限责任公司 | 一种用于光学检测lcd屏幕的自动调整方法、装置及系统 |
CN108254160A (zh) * | 2016-12-29 | 2018-07-06 | 天津梦祥原科技有限公司 | 一种测量显示屏色度的快速测量装置 |
CN106596563A (zh) * | 2016-12-30 | 2017-04-26 | 镇江苏仪德科技有限公司 | 一种太阳能电池片机器视觉检测平台 |
WO2018176261A1 (zh) * | 2017-03-29 | 2018-10-04 | 深圳配天智能技术研究院有限公司 | 一种检测参数确定方法和检测装置 |
CN108918533B (zh) * | 2018-06-27 | 2024-04-05 | 武汉精测电子集团股份有限公司 | 一种Demura多轴全自动检测机构 |
KR101954089B1 (ko) * | 2018-08-21 | 2019-03-06 | (주)트라이시스 | 표시 패널 얼룩 검사 시스템 |
KR20200068117A (ko) * | 2018-12-04 | 2020-06-15 | 삼성디스플레이 주식회사 | 검사 장치 및 이의 구동 방법 |
CN111182296B (zh) * | 2020-01-03 | 2021-08-27 | 歌尔光学科技有限公司 | 摄像模组的检测装置、检测方法及存储介质 |
KR102608202B1 (ko) * | 2021-11-11 | 2023-12-01 | 서울대학교산학협력단 | 투과율 측정용 자외선-가시광선-적외선 분광 분석기 |
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2008
- 2008-04-25 JP JP2008115844A patent/JP2009156857A/ja active Pending
- 2008-10-17 TW TW097140013A patent/TWI390195B/zh not_active IP Right Cessation
- 2008-11-11 KR KR1020080111555A patent/KR20090059032A/ko not_active Application Discontinuation
- 2008-12-05 CN CN2008101789442A patent/CN101451909B/zh active Active
Also Published As
Publication number | Publication date |
---|---|
CN101451909A (zh) | 2009-06-10 |
TW200933134A (en) | 2009-08-01 |
TWI390195B (zh) | 2013-03-21 |
CN101451909B (zh) | 2011-11-16 |
JP2009156857A (ja) | 2009-07-16 |
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A201 | Request for examination | ||
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E902 | Notification of reason for refusal | ||
E601 | Decision to refuse application |