KR20090015929A - 다수의 시준된 빔과 개별 공급원의 배열체를 이용한 수화물및 사람에 대한 x-레이 이미지화 - Google Patents
다수의 시준된 빔과 개별 공급원의 배열체를 이용한 수화물및 사람에 대한 x-레이 이미지화 Download PDFInfo
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- KR20090015929A KR20090015929A KR1020087028326A KR20087028326A KR20090015929A KR 20090015929 A KR20090015929 A KR 20090015929A KR 1020087028326 A KR1020087028326 A KR 1020087028326A KR 20087028326 A KR20087028326 A KR 20087028326A KR 20090015929 A KR20090015929 A KR 20090015929A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/201—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials by measuring small-angle scattering
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/203—Measuring back scattering
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
- G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
- G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
- G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
- G01V5/222—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays measuring scattered radiation
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- Crystallography & Structural Chemistry (AREA)
- Health & Medical Sciences (AREA)
- Pathology (AREA)
- High Energy & Nuclear Physics (AREA)
- General Life Sciences & Earth Sciences (AREA)
- Geophysics (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
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Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US79429506P | 2006-04-21 | 2006-04-21 | |
US60/794,295 | 2006-04-21 |
Publications (1)
Publication Number | Publication Date |
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KR20090015929A true KR20090015929A (ko) | 2009-02-12 |
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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KR1020087028326A Ceased KR20090015929A (ko) | 2006-04-21 | 2007-04-19 | 다수의 시준된 빔과 개별 공급원의 배열체를 이용한 수화물및 사람에 대한 x-레이 이미지화 |
Country Status (9)
Cited By (2)
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KR101305300B1 (ko) * | 2012-10-11 | 2013-09-06 | 사단법인 대덕원자력포럼 | 밀리미터파 검색시스템 및 상기 검색시스템을 이용한 화물 및 승객에 대한 통합검색방법 |
KR20140120382A (ko) * | 2012-03-09 | 2014-10-13 | 눅테크 컴퍼니 리미티드 | 방사선 스캔영상화를 위한 장치 및 방법 |
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- 2007-04-19 EP EP07868238A patent/EP2010943A2/en not_active Withdrawn
- 2007-04-19 JP JP2009506767A patent/JP2009534669A/ja active Pending
- 2007-04-19 KR KR1020087028326A patent/KR20090015929A/ko not_active Ceased
- 2007-04-19 CN CN2007800218495A patent/CN101467071B/zh active Active
- 2007-04-19 RU RU2008146009/28A patent/RU2411506C2/ru not_active IP Right Cessation
- 2007-04-19 WO PCT/US2007/066936 patent/WO2008063695A2/en active Application Filing
- 2007-04-19 US US11/737,317 patent/US7505562B2/en active Active
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Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
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KR20140120382A (ko) * | 2012-03-09 | 2014-10-13 | 눅테크 컴퍼니 리미티드 | 방사선 스캔영상화를 위한 장치 및 방법 |
US9448325B2 (en) | 2012-03-09 | 2016-09-20 | Nutech Company Limited | Apparatus and method for ray scanning imaging |
KR101305300B1 (ko) * | 2012-10-11 | 2013-09-06 | 사단법인 대덕원자력포럼 | 밀리미터파 검색시스템 및 상기 검색시스템을 이용한 화물 및 승객에 대한 통합검색방법 |
Also Published As
Publication number | Publication date |
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CN101467071B (zh) | 2012-06-13 |
WO2008063695A3 (en) | 2008-11-20 |
US20070258562A1 (en) | 2007-11-08 |
MX2008013595A (es) | 2009-03-06 |
EP2010943A2 (en) | 2009-01-07 |
IL194851A (en) | 2012-06-28 |
RU2008146009A (ru) | 2010-05-27 |
WO2008063695A2 (en) | 2008-05-29 |
US7505562B2 (en) | 2009-03-17 |
JP2009534669A (ja) | 2009-09-24 |
IL194851A0 (en) | 2009-08-03 |
CN101467071A (zh) | 2009-06-24 |
RU2411506C2 (ru) | 2011-02-10 |
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