KR20070085369A - 반도체 조립 및 테스트 시설용 다이-레벨 추적 메커니즘 - Google Patents

반도체 조립 및 테스트 시설용 다이-레벨 추적 메커니즘 Download PDF

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Publication number
KR20070085369A
KR20070085369A KR1020077011038A KR20077011038A KR20070085369A KR 20070085369 A KR20070085369 A KR 20070085369A KR 1020077011038 A KR1020077011038 A KR 1020077011038A KR 20077011038 A KR20077011038 A KR 20077011038A KR 20070085369 A KR20070085369 A KR 20070085369A
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South Korea
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die
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Korean (ko)
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호르네 룽 코흐
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어플라이드 머티어리얼스, 인코포레이티드
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Publication of KR20070085369A publication Critical patent/KR20070085369A/ko
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    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06Q—INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES, NOT OTHERWISE PROVIDED FOR
    • G06Q10/00—Administration; Management
    • G06Q10/06—Resources, workflows, human or project management; Enterprise or organisation planning; Enterprise or organisation modelling
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P52/00—Grinding, lapping or polishing of wafers, substrates or parts of devices
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06Q—INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES, NOT OTHERWISE PROVIDED FOR
    • G06Q10/00—Administration; Management
    • G06Q10/08—Logistics, e.g. warehousing, loading or distribution; Inventory or stock management
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P95/00—Generic processes or apparatus for manufacture or treatments not covered by the other groups of this subclass

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  • Business, Economics & Management (AREA)
  • Engineering & Computer Science (AREA)
  • Economics (AREA)
  • Strategic Management (AREA)
  • Entrepreneurship & Innovation (AREA)
  • Human Resources & Organizations (AREA)
  • Quality & Reliability (AREA)
  • Operations Research (AREA)
  • Marketing (AREA)
  • Development Economics (AREA)
  • Tourism & Hospitality (AREA)
  • Physics & Mathematics (AREA)
  • General Business, Economics & Management (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Educational Administration (AREA)
  • Game Theory and Decision Science (AREA)
  • General Factory Administration (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
KR1020077011038A 2004-10-15 2005-10-12 반도체 조립 및 테스트 시설용 다이-레벨 추적 메커니즘 Withdrawn KR20070085369A (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US61880504P 2004-10-15 2004-10-15
US60/618,805 2004-10-15

Publications (1)

Publication Number Publication Date
KR20070085369A true KR20070085369A (ko) 2007-08-27

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ID=35754092

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KR1020077011038A Withdrawn KR20070085369A (ko) 2004-10-15 2005-10-12 반도체 조립 및 테스트 시설용 다이-레벨 추적 메커니즘

Country Status (7)

Country Link
US (2) US7343214B2 (https=)
EP (1) EP1810326A1 (https=)
JP (1) JP2008517465A (https=)
KR (1) KR20070085369A (https=)
CN (1) CN101040290A (https=)
TW (1) TW200629026A (https=)
WO (1) WO2006044399A1 (https=)

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US9559113B2 (en) 2014-05-01 2017-01-31 Macronix International Co., Ltd. SSL/GSL gate oxide in 3D vertical channel NAND
KR20160018227A (ko) * 2014-08-08 2016-02-17 에스케이하이닉스 주식회사 웨이퍼 처리 시스템 및 이를 이용한 웨이퍼 처리 방법
US10419410B2 (en) * 2016-12-15 2019-09-17 Seagate Technology Llc Automatic generation of unique identifiers for distributed directory management users
KR102653937B1 (ko) 2018-07-17 2024-04-02 삼성전자주식회사 반도체 장치의 테스트 방법및 반도체 장치의 테스트 시스템
US11063000B2 (en) * 2019-01-29 2021-07-13 Infineon Technologies Ag Semiconductor package authentication feature
US11450616B2 (en) 2020-07-29 2022-09-20 Nxp Usa, Inc. Using a backside mask layer for forming a unique die mark identifier pattern

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Also Published As

Publication number Publication date
WO2006044399A1 (en) 2006-04-27
US20060085089A1 (en) 2006-04-20
EP1810326A1 (en) 2007-07-25
US20080071413A1 (en) 2008-03-20
US7343214B2 (en) 2008-03-11
JP2008517465A (ja) 2008-05-22
TW200629026A (en) 2006-08-16
CN101040290A (zh) 2007-09-19

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