KR20070039600A - 광 보호 수단을 포함하는 칩 및 그 제조 방법 - Google Patents

광 보호 수단을 포함하는 칩 및 그 제조 방법 Download PDF

Info

Publication number
KR20070039600A
KR20070039600A KR1020077004316A KR20077004316A KR20070039600A KR 20070039600 A KR20070039600 A KR 20070039600A KR 1020077004316 A KR1020077004316 A KR 1020077004316A KR 20077004316 A KR20077004316 A KR 20077004316A KR 20070039600 A KR20070039600 A KR 20070039600A
Authority
KR
South Korea
Prior art keywords
chip
integrated circuit
dielectric
mirror coating
dielectric mirror
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
KR1020077004316A
Other languages
English (en)
Korean (ko)
Inventor
크리스티안 젠즈
Original Assignee
코닌클리즈케 필립스 일렉트로닉스 엔.브이.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 코닌클리즈케 필립스 일렉트로닉스 엔.브이. filed Critical 코닌클리즈케 필립스 일렉트로닉스 엔.브이.
Publication of KR20070039600A publication Critical patent/KR20070039600A/ko
Withdrawn legal-status Critical Current

Links

Images

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/552—Protection against radiation, e.g. light or electromagnetic waves
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/57—Protection from inspection, reverse engineering or tampering
    • H01L23/573—Protection from inspection, reverse engineering or tampering using passive means
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Landscapes

  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Health & Medical Sciences (AREA)
  • Electromagnetism (AREA)
  • Toxicology (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Optical Elements Other Than Lenses (AREA)
  • Light Receiving Elements (AREA)
  • Formation Of Insulating Films (AREA)
KR1020077004316A 2004-07-26 2005-07-20 광 보호 수단을 포함하는 칩 및 그 제조 방법 Withdrawn KR20070039600A (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP04103562.7 2004-07-26
EP04103562 2004-07-26

Publications (1)

Publication Number Publication Date
KR20070039600A true KR20070039600A (ko) 2007-04-12

Family

ID=35423325

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020077004316A Withdrawn KR20070039600A (ko) 2004-07-26 2005-07-20 광 보호 수단을 포함하는 칩 및 그 제조 방법

Country Status (6)

Country Link
US (1) US20080093712A1 (enExample)
EP (1) EP1774592A1 (enExample)
JP (1) JP2008507851A (enExample)
KR (1) KR20070039600A (enExample)
CN (1) CN101027774B (enExample)
WO (1) WO2006013507A1 (enExample)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9230852B2 (en) 2013-02-25 2016-01-05 Texas Instruments Incorporated Integrated circuit (IC) having electrically conductive corrosion protecting cap over bond pads
DE102014100469A1 (de) 2013-11-29 2015-06-03 Epcos Ag Elektronisches Bauelement und Verwendung desselben
US9697455B2 (en) * 2014-12-26 2017-07-04 Avery Dennison Retail Information Services, Llc Using reactive coupling of a printed RFID chip on a strap to allow the printed material to be over-laminated with a barrier film against oxygen and moisture ingress
CN113130722B (zh) 2015-09-25 2025-08-12 美题隆公司 利用通过焊接附着的磷光体元件的高光功率的光转换装置
US11205625B2 (en) 2019-04-12 2021-12-21 Invensas Bonding Technologies, Inc. Wafer-level bonding of obstructive elements
US11373963B2 (en) 2019-04-12 2022-06-28 Invensas Bonding Technologies, Inc. Protective elements for bonded structures
US11610846B2 (en) 2019-04-12 2023-03-21 Adeia Semiconductor Bonding Technologies Inc. Protective elements for bonded structures including an obstructive element
US11385278B2 (en) 2019-05-23 2022-07-12 Invensas Bonding Technologies, Inc. Security circuitry for bonded structures
WO2021196039A1 (zh) * 2020-03-31 2021-10-07 深圳市汇顶科技股份有限公司 安全芯片、安全芯片的制造方法和电子设备
US12278255B2 (en) * 2021-06-11 2025-04-15 Raytheon Company Thin film obscurant for microelectronics
EP4371153A4 (en) * 2021-07-16 2025-05-21 Adeia Semiconductor Bonding Technologies Inc. OPTICALLY OBSTRUCTIVE PROTECTIVE ELEMENT FOR BONDED STRUCTURES
JP2024528964A (ja) 2021-08-02 2024-08-01 アデイア セミコンダクター ボンディング テクノロジーズ インコーポレイテッド ボンデッド構造体用の保護半導体素子

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2228298B1 (enExample) * 1973-05-03 1978-01-06 Ibm
US5468990A (en) * 1993-07-22 1995-11-21 National Semiconductor Corp. Structures for preventing reverse engineering of integrated circuits
JPH07301824A (ja) * 1994-05-09 1995-11-14 Seiko Instr Inc 光弁用半導体装置
FR2735437B1 (fr) * 1995-06-19 1997-08-14 Sevylor International Vehicule roulant, notamment robot de nettoyage en particulier de piscine, a changement automatique de direction de deplacement devant un obstacle
US5917202A (en) * 1995-12-21 1999-06-29 Hewlett-Packard Company Highly reflective contacts for light emitting semiconductor devices
US5711987A (en) * 1996-10-04 1998-01-27 Dow Corning Corporation Electronic coatings
DE19840251B4 (de) * 1998-09-03 2004-02-12 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Schaltungschip, insbesondere Transponder mit Lichtschutz
US6515304B1 (en) * 2000-06-23 2003-02-04 International Business Machines Corporation Device for defeating reverse engineering of integrated circuits by optical means
US6686977B2 (en) * 2001-07-24 2004-02-03 Three-Five Systems, Inc. Liquid crystal on silicon device
GB2405531B (en) * 2002-05-14 2006-04-12 Hrl Lab Llc Integrated circuit with reverse engineering protection
US6933013B2 (en) * 2003-10-14 2005-08-23 Photon Dynamics, Inc. Vacuum deposition of dielectric coatings on volatile material

Also Published As

Publication number Publication date
WO2006013507A1 (en) 2006-02-09
EP1774592A1 (en) 2007-04-18
CN101027774B (zh) 2011-10-26
US20080093712A1 (en) 2008-04-24
CN101027774A (zh) 2007-08-29
JP2008507851A (ja) 2008-03-13

Similar Documents

Publication Publication Date Title
US7142363B2 (en) Diffraction element and optical device
KR20070039600A (ko) 광 보호 수단을 포함하는 칩 및 그 제조 방법
EP2128665B1 (en) Optical filter that uses localized plasmons
US11747529B2 (en) Wafer level microstructures for an optical lens
KR20180082508A (ko) 광 검출 장치 및 광 검출 장치를 제조하는 방법
JP2002328222A (ja) 偏光素子及びその製造方法
US6926841B2 (en) Stepped etalon
JP7504072B2 (ja) 導電性光半導体コーティングの装置及び方法
CN109769398B (zh) 包括多个区域的光学透明的电磁屏蔽元件
KR100340068B1 (ko) 광투과도 개선을 위하여 광학적으로 설계된 층을 갖는 이미지센서
US20040263981A1 (en) Diffractive optical element with anti-reflection coating
JP2019028424A (ja) フィルターコリメータおよびその形成方法
JP3189922B2 (ja) 回折光学素子
JP3214964B2 (ja) 回折光学素子
KR101891912B1 (ko) 구조색 필터 및 이의 제조방법
EP2166383B1 (en) Optical filter
JPH06302845A (ja) 反射防止膜の形成方法
WO2024082212A1 (en) Optical element with distant layer
RU2282222C2 (ru) Зеркало-монохроматор для жесткого ультрафиолетового излучения
US20250334720A1 (en) Low-transmittance and low-reflectance coated substrate and manufacturing method thereof
JP2025085235A (ja) 光検出素子
TW202430843A (zh) 編碼器用反射型光學尺、反射型光學式編碼器及編碼器用反射型光學尺用積層體
AU2024228918A1 (en) Bonded substrate arrangement and method for manufacturing of such an arrangement
KR19990015314A (ko) 적외선 차단용 코팅 박막
JP2020024424A (ja) 光学素子

Legal Events

Date Code Title Description
PA0105 International application

Patent event date: 20070223

Patent event code: PA01051R01D

Comment text: International Patent Application

PG1501 Laying open of application
N231 Notification of change of applicant
PN2301 Change of applicant

Patent event date: 20080717

Comment text: Notification of Change of Applicant

Patent event code: PN23011R01D

PC1203 Withdrawal of no request for examination
WITN Application deemed withdrawn, e.g. because no request for examination was filed or no examination fee was paid