KR20060048061A - 화학 기계 연마용 패드 - Google Patents

화학 기계 연마용 패드 Download PDF

Info

Publication number
KR20060048061A
KR20060048061A KR1020050042855A KR20050042855A KR20060048061A KR 20060048061 A KR20060048061 A KR 20060048061A KR 1020050042855 A KR1020050042855 A KR 1020050042855A KR 20050042855 A KR20050042855 A KR 20050042855A KR 20060048061 A KR20060048061 A KR 20060048061A
Authority
KR
South Korea
Prior art keywords
polishing
polishing pad
water
groove
range
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
KR1020050042855A
Other languages
English (en)
Korean (ko)
Inventor
고우지 가와하라
고우 하세가와
후지오 사꾸라이
Original Assignee
제이에스알 가부시끼가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 제이에스알 가부시끼가이샤 filed Critical 제이에스알 가부시끼가이샤
Publication of KR20060048061A publication Critical patent/KR20060048061A/ko
Withdrawn legal-status Critical Current

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/11Lapping tools
    • B24B37/20Lapping pads for working plane surfaces
    • B24B37/26Lapping pads for working plane surfaces characterised by the shape of the lapping pad surface, e.g. grooved
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/304Mechanical treatment, e.g. grinding, polishing, cutting

Landscapes

  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
KR1020050042855A 2004-05-24 2005-05-23 화학 기계 연마용 패드 Withdrawn KR20060048061A (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JPJP-P-2004-00153335 2004-05-24
JP2004153335A JP2005340271A (ja) 2004-05-24 2004-05-24 化学機械研磨用パッド

Publications (1)

Publication Number Publication Date
KR20060048061A true KR20060048061A (ko) 2006-05-18

Family

ID=34936757

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020050042855A Withdrawn KR20060048061A (ko) 2004-05-24 2005-05-23 화학 기계 연마용 패드

Country Status (6)

Country Link
US (1) US7097550B2 (enExample)
EP (1) EP1600260A1 (enExample)
JP (1) JP2005340271A (enExample)
KR (1) KR20060048061A (enExample)
CN (1) CN1701919A (enExample)
TW (1) TW200613090A (enExample)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20110092988A1 (en) * 2002-10-29 2011-04-21 Microfabrica Inc. Microdevices for Tissue Approximation and Retention, Methods for Using, and Methods for Making
TWI455795B (zh) * 2007-10-18 2014-10-11 Iv Technologies Co Ltd 研磨墊及研磨方法
US8052507B2 (en) * 2007-11-20 2011-11-08 Praxair Technology, Inc. Damping polyurethane CMP pads with microfillers
US8398462B2 (en) 2008-02-21 2013-03-19 Chien-Min Sung CMP pads and method of creating voids in-situ therein
US9180570B2 (en) 2008-03-14 2015-11-10 Nexplanar Corporation Grooved CMP pad
TWI409137B (zh) * 2008-06-19 2013-09-21 Bestac Advanced Material Co Ltd 研磨墊及其微型結構形成方法
TWM352127U (en) * 2008-08-29 2009-03-01 Bestac Advanced Material Co Ltd Polishing pad
TWM352126U (en) * 2008-10-23 2009-03-01 Bestac Advanced Material Co Ltd Polishing pad
TWI510328B (zh) * 2010-05-03 2015-12-01 Iv Technologies Co Ltd 基底層、包括此基底層的研磨墊及研磨方法
US20120009847A1 (en) * 2010-07-06 2012-01-12 Applied Materials, Inc. Closed-loop control of cmp slurry flow
JP2012056021A (ja) * 2010-09-09 2012-03-22 Jsr Corp 化学機械研磨パッドおよびそれを用いた化学機械研磨方法
US9211628B2 (en) * 2011-01-26 2015-12-15 Nexplanar Corporation Polishing pad with concentric or approximately concentric polygon groove pattern
CN103666276A (zh) * 2012-09-25 2014-03-26 安集微电子(上海)有限公司 一种化学机械抛光液
CN104745092A (zh) * 2013-12-26 2015-07-01 安集微电子(上海)有限公司 一种应用于sti领域的化学机械抛光液及其使用方法
US9649741B2 (en) * 2014-07-07 2017-05-16 Jh Rhodes Company, Inc. Polishing material for polishing hard surfaces, media including the material, and methods of forming and using same
US9748090B2 (en) * 2015-01-22 2017-08-29 Toshiba Memory Corporation Semiconductor manufacturing apparatus and manufacturing method of semiconductor device

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5650039A (en) 1994-03-02 1997-07-22 Applied Materials, Inc. Chemical mechanical polishing apparatus with improved slurry distribution
JPH08216029A (ja) 1995-02-07 1996-08-27 Daiki:Kk 精密研磨シート
US5921855A (en) 1997-05-15 1999-07-13 Applied Materials, Inc. Polishing pad having a grooved pattern for use in a chemical mechanical polishing system
EP1211023B1 (en) * 1999-03-30 2008-05-28 Nikon Corporation Polishing body, polisher, polishing method, and method for producing semiconductor device
US6869343B2 (en) 2001-12-19 2005-03-22 Toho Engineering Kabushiki Kaisha Turning tool for grooving polishing pad, apparatus and method of producing polishing pad using the tool, and polishing pad produced by using the tool
US6736709B1 (en) 2000-05-27 2004-05-18 Rodel Holdings, Inc. Grooved polishing pads for chemical mechanical planarization
JP3925041B2 (ja) * 2000-05-31 2007-06-06 Jsr株式会社 研磨パッド用組成物及びこれを用いた研磨パッド
US6641471B1 (en) * 2000-09-19 2003-11-04 Rodel Holdings, Inc Polishing pad having an advantageous micro-texture and methods relating thereto
TWI228768B (en) * 2002-08-08 2005-03-01 Jsr Corp Processing method of polishing pad for semiconductor wafer and polishing pad for semiconductor wafer
JP4039214B2 (ja) * 2002-11-05 2008-01-30 Jsr株式会社 研磨パッド
US20040224622A1 (en) * 2003-04-15 2004-11-11 Jsr Corporation Polishing pad and production method thereof
JP4292025B2 (ja) * 2003-05-23 2009-07-08 Jsr株式会社 研磨パッド
KR100661445B1 (ko) * 2004-02-05 2006-12-27 제이에스알 가부시끼가이샤 화학 기계 연마 패드, 그의 제조 방법 및 화학 기계 연마방법

Also Published As

Publication number Publication date
CN1701919A (zh) 2005-11-30
TW200613090A (en) 2006-05-01
JP2005340271A (ja) 2005-12-08
EP1600260A1 (en) 2005-11-30
US7097550B2 (en) 2006-08-29
US20050260942A1 (en) 2005-11-24

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Legal Events

Date Code Title Description
PA0109 Patent application

Patent event code: PA01091R01D

Comment text: Patent Application

Patent event date: 20050523

PG1501 Laying open of application
PC1203 Withdrawal of no request for examination
WITN Application deemed withdrawn, e.g. because no request for examination was filed or no examination fee was paid