KR20050026825A - 광 간섭 현상을 이용한 박막의 두께 측정 장치에 있어서박막의 두께에 따른 등고선을 얻는 방법 및 장치 - Google Patents
광 간섭 현상을 이용한 박막의 두께 측정 장치에 있어서박막의 두께에 따른 등고선을 얻는 방법 및 장치 Download PDFInfo
- Publication number
- KR20050026825A KR20050026825A KR1020030063447A KR20030063447A KR20050026825A KR 20050026825 A KR20050026825 A KR 20050026825A KR 1020030063447 A KR1020030063447 A KR 1020030063447A KR 20030063447 A KR20030063447 A KR 20030063447A KR 20050026825 A KR20050026825 A KR 20050026825A
- Authority
- KR
- South Korea
- Prior art keywords
- thin film
- thickness
- light
- wavelength
- value
- Prior art date
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
- G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
- G01B11/0625—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of absorption or reflection
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
- G01B11/306—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces for measuring evenness
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
Description
Claims (3)
- 증착된 박막이 균일한 두께분포를 가지지 않을 때에 증착된 박막의 두께 분포를 측정하는 장치에 있어서, 단파장의 광을 수직 입사하여 각 매질의 경계면에서 수직으로 반사되는 광의 두께 변화에 따라서 일으키는 상쇄 보강 간섭에 의한 감지부의 명암차를 검출하여 두께 변화에 따른 2차원 두께 지도를 얻는 방법.
- 제 1항에 있어서,이미지 상에서의 화소들을 비교하여 같은 밝기의 밝은 화소(Pixel)들을 서로 연결시킴으로서 얻어지는 선을 보강 간섭 등고선으로 하고, 어두운 화소(Pixel)들을 서로 연결시킴으로서 얻어지는 선을 상쇄 간섭 등고선으로 할 때, 보강 간섭 등고선에 접하여 생성되는 상쇄 간섭 등고선사이의 부분에서의 화소에서 파장별 반사도를 측정하여 수식 [1]과 수식 [2]로부터 정수인 N값을 결정하고 이 N값으로 박막의 두께를 결정하는 방법
- 제 2항에 있어서,보강 간섭 등고선 상의 밝은 화소와 직후의 상쇄간섭 등고선 상의 어두운 화소 사이에 위치한, 보강간섭 반사도와 상쇄간섭 반사도의 중간 값인 점에서 파장변화에 따른 반사율의 차이로부터 수식 [3]과 수식 [4]에서 기울기를 결정하여 수식 [1]과 수식 [2]로부터 정수인 N값을 결정하는 방법.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020030063447A KR100588988B1 (ko) | 2003-09-09 | 2003-09-09 | 박막의 두께를 측정하는 방법 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020030063447A KR100588988B1 (ko) | 2003-09-09 | 2003-09-09 | 박막의 두께를 측정하는 방법 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20050026825A true KR20050026825A (ko) | 2005-03-16 |
KR100588988B1 KR100588988B1 (ko) | 2006-06-13 |
Family
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020030063447A KR100588988B1 (ko) | 2003-09-09 | 2003-09-09 | 박막의 두께를 측정하는 방법 |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR100588988B1 (ko) |
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2003
- 2003-09-09 KR KR1020030063447A patent/KR100588988B1/ko active IP Right Grant
Also Published As
Publication number | Publication date |
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KR100588988B1 (ko) | 2006-06-13 |
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