KR20040039201A - 공구 열화를 측정하기 위한 장치 및 방법 - Google Patents

공구 열화를 측정하기 위한 장치 및 방법 Download PDF

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Publication number
KR20040039201A
KR20040039201A KR10-2003-7016078A KR20037016078A KR20040039201A KR 20040039201 A KR20040039201 A KR 20040039201A KR 20037016078 A KR20037016078 A KR 20037016078A KR 20040039201 A KR20040039201 A KR 20040039201A
Authority
KR
South Korea
Prior art keywords
tool
sample
state
light
dicing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
KR10-2003-7016078A
Other languages
English (en)
Korean (ko)
Inventor
마이클 로우스너
만프레드 쉬니건스
데이비드 왈리스
Original Assignee
모토로라 인코포레이티드
인피네온 테크놀로지즈 에스시300 게엠베하 운트 코. 카게
인피니언 테크놀로지스 아게
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 모토로라 인코포레이티드, 인피네온 테크놀로지즈 에스시300 게엠베하 운트 코. 카게, 인피니언 테크놀로지스 아게 filed Critical 모토로라 인코포레이티드
Publication of KR20040039201A publication Critical patent/KR20040039201A/ko
Ceased legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/005Control means for lapping machines or devices
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23QDETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
    • B23Q17/00Arrangements for observing, indicating or measuring on machine tools
    • B23Q17/09Arrangements for observing, indicating or measuring on machine tools for indicating or measuring cutting pressure or for determining cutting-tool condition, e.g. cutting ability, load on tool
    • B23Q17/0904Arrangements for observing, indicating or measuring on machine tools for indicating or measuring cutting pressure or for determining cutting-tool condition, e.g. cutting ability, load on tool before or after machining
    • B23Q17/0909Detection of broken tools
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23QDETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
    • B23Q17/00Arrangements for observing, indicating or measuring on machine tools
    • B23Q17/24Arrangements for observing, indicating or measuring on machine tools using optics or electromagnetic waves
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B21/00Machines or devices using grinding or polishing belts; Accessories therefor
    • B24B21/04Machines or devices using grinding or polishing belts; Accessories therefor for grinding plane surfaces
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B27/00Other grinding machines or devices
    • B24B27/06Grinders for cutting-off
    • B24B27/0683Accessories therefor
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B49/00Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation
    • B24B49/12Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation involving optical means
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B49/00Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation
    • B24B49/18Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation taking regard of the presence of dressing tools
    • B24B49/183Wear compensation without the presence of dressing tools
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/65Raman scattering

Landscapes

  • Mechanical Engineering (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Immunology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Pathology (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Machine Tool Sensing Apparatuses (AREA)
  • Constituent Portions Of Griding Lathes, Driving, Sensing And Control (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
KR10-2003-7016078A 2001-06-08 2002-05-02 공구 열화를 측정하기 위한 장치 및 방법 Ceased KR20040039201A (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US09/877,531 US6633379B2 (en) 2001-06-08 2001-06-08 Apparatus and method for measuring the degradation of a tool
US09/877,531 2001-06-08
PCT/US2002/013875 WO2002100592A1 (en) 2001-06-08 2002-05-02 Apparatus and method for measuring tool degradation

Publications (1)

Publication Number Publication Date
KR20040039201A true KR20040039201A (ko) 2004-05-10

Family

ID=25370164

Family Applications (1)

Application Number Title Priority Date Filing Date
KR10-2003-7016078A Ceased KR20040039201A (ko) 2001-06-08 2002-05-02 공구 열화를 측정하기 위한 장치 및 방법

Country Status (7)

Country Link
US (1) US6633379B2 (https=)
EP (1) EP1399291B1 (https=)
JP (1) JP4238130B2 (https=)
KR (1) KR20040039201A (https=)
DE (1) DE60227807D1 (https=)
TW (1) TWI291395B (https=)
WO (1) WO2002100592A1 (https=)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102175530B1 (ko) * 2019-07-04 2020-11-09 강원대학교 산학협력단 드릴 상태 모니터링 시스템
KR20210097017A (ko) * 2020-01-29 2021-08-06 가부시기가이샤 디스코 절삭 장치

Families Citing this family (42)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6808345B2 (en) * 2001-10-16 2004-10-26 Toshiba Kikai Kabushiki Kaisha Tool, tool holder, and machine tool
US6741342B2 (en) * 2002-04-10 2004-05-25 Hewlett-Packard Development Company, L.P. Using a laser beam to indicate roller wear
US6752694B2 (en) * 2002-11-08 2004-06-22 Motorola, Inc. Apparatus for and method of wafer grinding
CN1910011B (zh) * 2004-01-26 2010-12-15 Tbw工业有限公司 使用原位修整制程的化学机械平面化制程控制
US7489856B2 (en) * 2004-06-25 2009-02-10 Nokia Corporation Electrical device for automatically adjusting operating speed of a tool
US20060025048A1 (en) * 2004-07-28 2006-02-02 3M Innovative Properties Company Abrasive article detection system and method
US20060025047A1 (en) * 2004-07-28 2006-02-02 3M Innovative Properties Company Grading system and method for abrasive article
US7090560B2 (en) * 2004-07-28 2006-08-15 3M Innovative Properties Company System and method for detecting abrasive article orientation
ATE390244T1 (de) * 2005-02-08 2008-04-15 Mikron Agie Charmilles Ag Kontrollverfahren für eine werkzeugmaschine
JP5060808B2 (ja) * 2007-03-27 2012-10-31 オリンパス株式会社 外観検査装置
CH701168B1 (de) * 2007-08-17 2010-12-15 Kellenberger & Co Ag L Verfahren und Bearbeitungsmaschine zur Behandlung von Werkstücken.
JP2009210423A (ja) * 2008-03-04 2009-09-17 Sony Corp テラヘルツ分光装置
US8419508B2 (en) * 2010-05-28 2013-04-16 Corning Incorporated Methods of fabricating a honeycomb extrusion die from a die body
JP5603175B2 (ja) * 2010-09-03 2014-10-08 株式会社ディスコ 切削装置の切削ブレード検出機構
US20120270474A1 (en) * 2011-04-20 2012-10-25 Nanya Technology Corporation Polishing pad wear detecting apparatus
US8760668B1 (en) * 2011-08-03 2014-06-24 Us Synthetic Corporation Methods for determining wear volume of a tested polycrystalline diamond element
CN102426119A (zh) * 2011-08-25 2012-04-25 上海华碧检测技术有限公司 一种小尺寸晶圆样品结构截面观察的样品制备方法
WO2013102900A1 (en) * 2012-01-04 2013-07-11 Mike Goldstein Inspection device for mechanical instruments and uses thereof
CA2883247C (en) 2012-08-31 2017-12-12 Halliburton Energy Services, Inc. System and method for analyzing cuttings using an opto-analytical device
US10012070B2 (en) 2012-08-31 2018-07-03 Halliburton Energy Services, Inc. System and method for measuring gaps using an opto-analytical device
US9885234B2 (en) * 2012-08-31 2018-02-06 Halliburton Energy Services, Inc. System and method for measuring temperature using an opto-analytical device
US10012067B2 (en) 2012-08-31 2018-07-03 Halliburton Energy Services, Inc. System and method for determining torsion using an opto-analytical device
US10167718B2 (en) 2012-08-31 2019-01-01 Halliburton Energy Services, Inc. System and method for analyzing downhole drilling parameters using an opto-analytical device
EP2877695A4 (en) 2012-08-31 2016-07-13 Halliburton Energy Services Inc SYSTEM AND METHOD FOR DETECTING DRILLING EVENTS USING AN OPTO-ANALYTICAL DEVICE
EP2890988A4 (en) 2012-08-31 2016-07-20 Halliburton Energy Services Inc SYSTEM AND METHOD FOR DETECTING VIBRATIONS USING AN OPTO-ANALYTICAL DEVICE
JP2014092437A (ja) * 2012-11-02 2014-05-19 Hitachi Chemical Co Ltd 複合材料の分析方法
JP6068209B2 (ja) * 2013-03-12 2017-01-25 株式会社ディスコ 切削方法
DE102013209963A1 (de) * 2013-05-28 2014-12-18 Siemens Aktiengesellschaft Anordnung zum Aufrakeln eines Pulvers
JP6521687B2 (ja) * 2015-03-23 2019-05-29 株式会社ディスコ 切削ブレードの検査方法
DE102017206179A1 (de) * 2017-04-11 2018-10-11 Homag Bohrsysteme Gmbh Schleifvorrichtung
CH713798A1 (de) * 2017-05-19 2018-11-30 Reishauer Ag Maschine zur Feinbearbeitung von verzahnten Werkstücken sowie Verfahren zur Vermessung von Kenngrössen eines Feinbearbeitungswerkzeugs.
EP3511101B1 (de) * 2018-01-10 2020-09-23 Klingelnberg GmbH Verfahren zum prüfen eines schleifwerkzeugs und entsprechende vorrichtung
DE102018105133A1 (de) * 2018-03-06 2019-09-12 Karl Heesemann Maschinenfabrik Gmbh & Co. Kg Verfahren zum Betreiben einer Schleifvorrichtung
DE102018105134A1 (de) * 2018-03-06 2019-09-12 Karl Heesemann Maschinenfabrik Gmbh & Co. Kg Verfahren zum Betreiben einer Schleifvorrichtung und Schleifvorrichtung
US11904428B2 (en) * 2019-10-25 2024-02-20 Vitaly Tsukanov Systems for blade sharpening and contactless blade sharpness detection
TWI717302B (zh) * 2020-07-30 2021-01-21 頂極科技股份有限公司 半導體製程零配件的質變檢測系統及方法
EP3950223B1 (en) * 2020-08-07 2024-10-02 Schneider GmbH & Co. KG Apparatus and method for processing optical workpieces
TWI749961B (zh) 2020-12-22 2021-12-11 雷應科技股份有限公司 刀具檢測器
WO2023018917A2 (en) * 2021-08-11 2023-02-16 Bedrock Surgical, Inc Infrared imaging for damage detection in surgical instruments
CN114260813B (zh) * 2021-12-29 2023-06-23 西安奕斯伟材料科技有限公司 水平度调整装置、抛光设备及水平度调整方法
CN115127597B (zh) * 2022-08-25 2022-12-09 江苏京创先进电子科技有限公司 刀片安装状态检测方法及系统
JP7798078B2 (ja) * 2023-04-26 2026-01-14 信越半導体株式会社 機械加工用ダイヤモンド工具の検査方法、及び、機械加工用ダイヤモンド工具の性能評価方法

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3809870A (en) * 1972-06-08 1974-05-07 Gleason Works Method and apparatus for monitoring condition of cutting blades
GB8300792D0 (en) * 1983-01-12 1983-02-16 Production Eng Res Monitoring tool life
US4786220A (en) 1984-06-18 1988-11-22 Borg-Warner Corporation Cutting tool wear monitor
JPS61252051A (ja) 1985-04-30 1986-11-10 Mitsubishi Heavy Ind Ltd 切削機械の刃欠検出装置
DE3725652A1 (de) * 1987-08-03 1989-02-16 Kadia Diamant Werkzeug zur spanabhebenden bearbeitung
DD270142A1 (de) 1988-03-11 1989-07-19 Komb Pumpen Und Verdichter Veb Verfahren und vorrichtung zur kontinuierlichen erfassung des momentanverschleisses an spanwerkzeugen
FR2645782B1 (fr) 1989-04-14 1995-01-27 Aerospatiale Systeme de controle de bris d'outil sur centre d'usinage
DK164621C (da) 1989-10-09 1992-12-07 Kirk Acoustics As Elektrodynamisk transducer
DE4003696C1 (https=) * 1990-02-07 1990-12-13 Petzetakis, George Aristovoulos, Piraeus, Gr
JPH04189447A (ja) * 1990-03-26 1992-07-07 Ntn Corp 切削機械の制御装置
JP3119308B2 (ja) * 1991-03-12 2000-12-18 ヤマザキマザック株式会社 マシニングセンタ
JPH05148089A (ja) * 1991-12-03 1993-06-15 Sumitomo Electric Ind Ltd 切削工具用ダイヤモンド膜
JP3675577B2 (ja) * 1995-07-05 2005-07-27 日本特殊陶業株式会社 ダイヤモンド被覆物品の製造方法
JPH0985587A (ja) * 1995-09-28 1997-03-31 Mitsubishi Materials Corp 回転切削工具による切削状態の検出装置および検出方法
US5718615A (en) 1995-10-20 1998-02-17 Boucher; John N. Semiconductor wafer dicing method
CA2263850C (en) 1996-08-22 2003-04-29 Eastman Chemical Company On-line quantitative analysis of chemical compositions by raman spectrometry
US5929986A (en) 1996-08-26 1999-07-27 Kaiser Optical Systems, Inc. Synchronous spectral line imaging methods and apparatus
US5934974A (en) 1997-11-05 1999-08-10 Aplex Group In-situ monitoring of polishing pad wear
GB9819732D0 (en) * 1998-09-11 1998-11-04 Renishaw Plc Tool conditioning monitoring
US6033288A (en) 1998-10-29 2000-03-07 Kulicke & Soffa Investments, Inc. Monitoring system for dicing saws
US6348943B1 (en) * 1998-10-30 2002-02-19 Industrial Technology Research Institute Digital non-contact blade position detection apparatus

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102175530B1 (ko) * 2019-07-04 2020-11-09 강원대학교 산학협력단 드릴 상태 모니터링 시스템
KR20210097017A (ko) * 2020-01-29 2021-08-06 가부시기가이샤 디스코 절삭 장치

Also Published As

Publication number Publication date
JP4238130B2 (ja) 2009-03-11
TWI291395B (en) 2007-12-21
JP2004530886A (ja) 2004-10-07
DE60227807D1 (de) 2008-09-04
WO2002100592A1 (en) 2002-12-19
US6633379B2 (en) 2003-10-14
US20020186370A1 (en) 2002-12-12
TW200417721A (en) 2004-09-16
EP1399291A1 (en) 2004-03-24
EP1399291B1 (en) 2008-07-23

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Comment text: Trial Decision on Objection to Decision on Refusal

Appeal kind category: Appeal against decision to decline refusal

Request date: 20080519

Decision date: 20091127

Appeal identifier: 2008101004455