KR20030048516A - 온도조절계용 통합 검사지그 - Google Patents
온도조절계용 통합 검사지그 Download PDFInfo
- Publication number
- KR20030048516A KR20030048516A KR1020010078430A KR20010078430A KR20030048516A KR 20030048516 A KR20030048516 A KR 20030048516A KR 1020010078430 A KR1020010078430 A KR 1020010078430A KR 20010078430 A KR20010078430 A KR 20010078430A KR 20030048516 A KR20030048516 A KR 20030048516A
- Authority
- KR
- South Korea
- Prior art keywords
- product
- test jig
- temperature control
- jig
- test
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2834—Automated test systems [ATE]; using microprocessors or computers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2836—Fault-finding or characterising
- G01R31/2844—Fault-finding or characterising using test interfaces, e.g. adapters, test boxes, switches, PIN drivers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2836—Fault-finding or characterising
- G01R31/2849—Environmental or reliability testing, e.g. burn-in or validation tests
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Environmental & Geological Engineering (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
Description
Claims (1)
- 베이스판(1)상에 제품취부부(2)가 형성되고, 상기 제품취부부(2)의 일측에 통신부(5)가 형성되어 온도조절계의 기능검사를 수행하는 온도조절계용 검사지그(10)에 있어서,상기 검사지그(10)를 적어도 두개이상 조합하되, 제품의 크기에 따라 상기 제품취부부(2)가 상이하고, 제품의 종류를 선택하는 제품선택버튼(20)가 형성되어진 것을 특징으로 하는 온도조절계용 통합검사지그.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR10-2001-0078430A KR100445345B1 (ko) | 2001-12-12 | 2001-12-12 | 온도조절계용 통합 검사지그 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR10-2001-0078430A KR100445345B1 (ko) | 2001-12-12 | 2001-12-12 | 온도조절계용 통합 검사지그 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20030048516A true KR20030048516A (ko) | 2003-06-25 |
KR100445345B1 KR100445345B1 (ko) | 2004-08-25 |
Family
ID=29574398
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR10-2001-0078430A KR100445345B1 (ko) | 2001-12-12 | 2001-12-12 | 온도조절계용 통합 검사지그 |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR100445345B1 (ko) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR102001947B1 (ko) * | 2018-01-23 | 2019-07-19 | 주식회사 알티솔루션 | 극한 환경조건이 적용가능한 다부품 내구성 테스트 시스템 |
KR102397987B1 (ko) * | 2021-12-21 | 2022-05-16 | 글로벤스 주식회사 | 온도 제어기 통합 출력 지그 어셈블리 |
CN116594441A (zh) * | 2023-05-10 | 2023-08-15 | 佛山市通宝华龙控制器有限公司 | 一种冷调节设备结构及检测方法 |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0769038B2 (ja) * | 1989-07-21 | 1995-07-26 | 富士電機株式会社 | 油加温装置 |
KR19980039119A (ko) * | 1996-11-27 | 1998-08-17 | 배순훈 | 자동조정기능을 구비한 회로기능 검사장치 및 그 조정방법 |
KR100213370B1 (ko) * | 1996-12-28 | 1999-08-02 | 전주범 | 자동검사 지그장치를 구비한 회로기능 검사장치 |
KR200327382Y1 (ko) * | 1998-12-26 | 2003-12-24 | 주식회사 포스코 | 제철소에서사용되는복사온도계의자동교정장치 |
-
2001
- 2001-12-12 KR KR10-2001-0078430A patent/KR100445345B1/ko active IP Right Grant
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR102001947B1 (ko) * | 2018-01-23 | 2019-07-19 | 주식회사 알티솔루션 | 극한 환경조건이 적용가능한 다부품 내구성 테스트 시스템 |
KR102397987B1 (ko) * | 2021-12-21 | 2022-05-16 | 글로벤스 주식회사 | 온도 제어기 통합 출력 지그 어셈블리 |
CN116594441A (zh) * | 2023-05-10 | 2023-08-15 | 佛山市通宝华龙控制器有限公司 | 一种冷调节设备结构及检测方法 |
CN116594441B (zh) * | 2023-05-10 | 2024-01-30 | 佛山市通宝华龙控制器有限公司 | 一种冷调节设备结构及检测方法 |
Also Published As
Publication number | Publication date |
---|---|
KR100445345B1 (ko) | 2004-08-25 |
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