KR20030045858A - 이온 이동 분광분석법에 의해 아르곤 중의 질소 농도를측정하는 방법 - Google Patents

이온 이동 분광분석법에 의해 아르곤 중의 질소 농도를측정하는 방법 Download PDF

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Publication number
KR20030045858A
KR20030045858A KR10-2003-7006726A KR20037006726A KR20030045858A KR 20030045858 A KR20030045858 A KR 20030045858A KR 20037006726 A KR20037006726 A KR 20037006726A KR 20030045858 A KR20030045858 A KR 20030045858A
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KR
South Korea
Prior art keywords
argon
hydrogen
ppb
gas
nitrogen
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
KR10-2003-7006726A
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English (en)
Korean (ko)
Inventor
루카 퍼스텔라
로버트 스티맥
안토니오 보누치
마르코 수치
Original Assignee
사에스 게터스 에스.페.아.
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Filing date
Publication date
Application filed by 사에스 게터스 에스.페.아. filed Critical 사에스 게터스 에스.페.아.
Publication of KR20030045858A publication Critical patent/KR20030045858A/ko
Abandoned legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/62—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
    • G01N27/622—Ion mobility spectrometry
    • C—CHEMISTRY; METALLURGY
    • C01—INORGANIC CHEMISTRY
    • C01B—NON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
    • C01B23/00—Noble gases; Compounds thereof
    • C01B23/001—Purification or separation processes of noble gases
    • C01B23/0036—Physical processing only
    • C01B23/0052—Physical processing only by adsorption in solids
    • C01B23/0084—Physical processing only by adsorption in solids in getters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/62—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
    • G01N27/64—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode using wave or particle radiation to ionise a gas, e.g. in an ionisation chamber
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/0004—Gaseous mixtures, e.g. polluted air
    • G01N33/0009—General constructional details of gas analysers, e.g. portable test equipment
    • G01N33/0027—General constructional details of gas analysers, e.g. portable test equipment concerning the detector
    • G01N33/0036—General constructional details of gas analysers, e.g. portable test equipment concerning the detector specially adapted to detect a particular component
    • C—CHEMISTRY; METALLURGY
    • C01—INORGANIC CHEMISTRY
    • C01B—NON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
    • C01B2210/00—Purification or separation of specific gases
    • C01B2210/0029—Obtaining noble gases
    • C01B2210/0034—Argon
    • C—CHEMISTRY; METALLURGY
    • C01—INORGANIC CHEMISTRY
    • C01B—NON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
    • C01B2210/00—Purification or separation of specific gases
    • C01B2210/0042—Making ultrapure specific gas
    • C—CHEMISTRY; METALLURGY
    • C01—INORGANIC CHEMISTRY
    • C01B—NON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
    • C01B2210/00—Purification or separation of specific gases
    • C01B2210/0043—Impurity removed
    • C01B2210/0046—Nitrogen

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  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Organic Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Engineering & Computer Science (AREA)
  • Electrochemistry (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Inorganic Chemistry (AREA)
  • Combustion & Propulsion (AREA)
  • Food Science & Technology (AREA)
  • Medicinal Chemistry (AREA)
  • Toxicology (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
KR10-2003-7006726A 2000-11-17 2001-11-08 이온 이동 분광분석법에 의해 아르곤 중의 질소 농도를측정하는 방법 Abandoned KR20030045858A (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
ITMI2000A002479 2000-11-17
IT2000MI002479A IT1319667B1 (it) 2000-11-17 2000-11-17 Metodo per la misura della concentrazione di azoto in argon mediantespettroscopia di mobilita' ionica.
PCT/IT2001/000561 WO2002040984A1 (en) 2000-11-17 2001-11-08 A method for measuring the concentration of nitrogen in argon by means of ion mobility spectrometry

Publications (1)

Publication Number Publication Date
KR20030045858A true KR20030045858A (ko) 2003-06-11

Family

ID=11446120

Family Applications (1)

Application Number Title Priority Date Filing Date
KR10-2003-7006726A Abandoned KR20030045858A (ko) 2000-11-17 2001-11-08 이온 이동 분광분석법에 의해 아르곤 중의 질소 농도를측정하는 방법

Country Status (12)

Country Link
US (1) US6740873B2 (cg-RX-API-DMAC10.html)
EP (1) EP1334354A1 (cg-RX-API-DMAC10.html)
JP (1) JP3964785B2 (cg-RX-API-DMAC10.html)
KR (1) KR20030045858A (cg-RX-API-DMAC10.html)
CN (1) CN1232820C (cg-RX-API-DMAC10.html)
AU (1) AU2002222511A1 (cg-RX-API-DMAC10.html)
CA (1) CA2427299A1 (cg-RX-API-DMAC10.html)
IL (1) IL155547A0 (cg-RX-API-DMAC10.html)
IT (1) IT1319667B1 (cg-RX-API-DMAC10.html)
MY (1) MY128966A (cg-RX-API-DMAC10.html)
TW (1) TW524972B (cg-RX-API-DMAC10.html)
WO (1) WO2002040984A1 (cg-RX-API-DMAC10.html)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
ITMI20012389A1 (it) * 2001-11-12 2003-05-12 Getters Spa Catodo cavo con getter integrato per lampade a scarica e metodi per la sua realizzazione
ITMI20041523A1 (it) * 2004-07-27 2004-10-27 Getters Spa Spettrometro di mobilita' ionica comprendente un elemento ionizzante a scarica a corona
CA2643094C (en) * 2006-02-28 2013-12-03 Panalytique Inc. System and method of eliminating interference for impurities measurement in noble gases
CA2653623C (en) 2006-06-09 2018-05-29 Ion Applications, Inc. Miniaturized ion mobility spectrometer
TWI486573B (zh) * 2009-12-04 2015-06-01 Hon Hai Prec Ind Co Ltd 離子濃度監控系統
US9769122B2 (en) * 2014-08-28 2017-09-19 Facebook, Inc. Anonymous single sign-on to third-party systems
CN105628779A (zh) * 2014-10-28 2016-06-01 中国科学院大连化学物理研究所 一种血液中丙泊酚的在线监测仪及其应用

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4551624A (en) 1983-09-23 1985-11-05 Allied Corporation Ion mobility spectrometer system with improved specificity
JPS623008A (ja) * 1985-06-28 1987-01-09 大陽酸素株式会社 アルゴンの超精製装置、並びに精製方法
US5032721A (en) 1990-06-01 1991-07-16 Environmental Technologies Group, Inc. Acid gas monitor based on ion mobility spectrometry
US5095206A (en) 1990-06-01 1992-03-10 Environmental Technologies Group, Inc. Method and apparatus for improving the specificity of an ion mobility spectrometer utillizing sulfur dioxide dopant chemistry
AT396075B (de) 1990-11-20 1993-05-25 Voest Alpine Ind Anlagen Verfahren zum legen eines drahtes in kreisfoermige windungen
US5457316A (en) * 1994-12-23 1995-10-10 Pcp, Inc. Method and apparatus for the detection and identification of trace gases
US5902561A (en) * 1995-09-29 1999-05-11 D.D.I. Limited Low temperature inert gas purifier
US5955886A (en) 1997-07-10 1999-09-21 Pcp, Inc. Microliter-sized ionization device and method
US5789745A (en) * 1997-10-28 1998-08-04 Sandia Corporation Ion mobility spectrometer using frequency-domain separation

Also Published As

Publication number Publication date
HK1062199A1 (en) 2004-10-21
CA2427299A1 (en) 2002-05-23
EP1334354A1 (en) 2003-08-13
MY128966A (en) 2007-03-30
CN1232820C (zh) 2005-12-21
IL155547A0 (en) 2003-11-23
JP2004514137A (ja) 2004-05-13
US6740873B2 (en) 2004-05-25
US20030201388A1 (en) 2003-10-30
IT1319667B1 (it) 2003-10-23
WO2002040984A1 (en) 2002-05-23
CN1474942A (zh) 2004-02-11
TW524972B (en) 2003-03-21
JP3964785B2 (ja) 2007-08-22
AU2002222511A1 (en) 2002-05-27
ITMI20002479A1 (it) 2002-05-17

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PA0105 International application

Patent event date: 20030517

Patent event code: PA01051R01D

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Patent event date: 20071224

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Patent event date: 20080612

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