TW524972B - A method for measuring the concentration of nitrogen in argon by means of ionization mobility spectrometry - Google Patents
A method for measuring the concentration of nitrogen in argon by means of ionization mobility spectrometry Download PDFInfo
- Publication number
- TW524972B TW524972B TW090127440A TW90127440A TW524972B TW 524972 B TW524972 B TW 524972B TW 090127440 A TW090127440 A TW 090127440A TW 90127440 A TW90127440 A TW 90127440A TW 524972 B TW524972 B TW 524972B
- Authority
- TW
- Taiwan
- Prior art keywords
- argon
- hydrogen
- patent application
- item
- gas
- Prior art date
Links
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 title claims abstract description 177
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 title claims abstract description 131
- 229910052786 argon Inorganic materials 0.000 title claims abstract description 89
- 229910052757 nitrogen Inorganic materials 0.000 title claims abstract description 66
- 238000000034 method Methods 0.000 title claims abstract description 58
- 238000004611 spectroscopical analysis Methods 0.000 title claims abstract description 8
- 239000001257 hydrogen Substances 0.000 claims abstract description 61
- 229910052739 hydrogen Inorganic materials 0.000 claims abstract description 61
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 claims abstract description 57
- 238000004458 analytical method Methods 0.000 claims abstract description 55
- 239000012535 impurity Substances 0.000 claims abstract description 24
- 239000007789 gas Substances 0.000 claims description 66
- 150000002500 ions Chemical class 0.000 claims description 35
- 239000000203 mixture Substances 0.000 claims description 35
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 claims description 23
- 239000000523 sample Substances 0.000 claims description 20
- 238000000746 purification Methods 0.000 claims description 17
- 238000002955 isolation Methods 0.000 claims description 16
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical compound O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 15
- 229910001868 water Inorganic materials 0.000 claims description 15
- 230000002079 cooperative effect Effects 0.000 claims description 11
- 229910045601 alloy Inorganic materials 0.000 claims description 10
- 239000000956 alloy Substances 0.000 claims description 10
- 229910052759 nickel Inorganic materials 0.000 claims description 10
- 239000001307 helium Substances 0.000 claims description 5
- 229910052734 helium Inorganic materials 0.000 claims description 5
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 claims description 5
- 239000000463 material Substances 0.000 claims description 5
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 claims description 4
- 229910052751 metal Inorganic materials 0.000 claims description 4
- 239000002184 metal Substances 0.000 claims description 4
- 239000002808 molecular sieve Substances 0.000 claims description 4
- URGAHOPLAPQHLN-UHFFFAOYSA-N sodium aluminosilicate Chemical compound [Na+].[Al+3].[O-][Si]([O-])=O.[O-][Si]([O-])=O URGAHOPLAPQHLN-UHFFFAOYSA-N 0.000 claims description 4
- 238000002156 mixing Methods 0.000 claims description 3
- 229910003445 palladium oxide Inorganic materials 0.000 claims description 3
- OYPRJOBELJOOCE-UHFFFAOYSA-N Calcium Chemical compound [Ca] OYPRJOBELJOOCE-UHFFFAOYSA-N 0.000 claims description 2
- 229910052784 alkaline earth metal Inorganic materials 0.000 claims description 2
- 150000001342 alkaline earth metals Chemical class 0.000 claims description 2
- 229910021529 ammonia Inorganic materials 0.000 claims description 2
- 229910052788 barium Inorganic materials 0.000 claims description 2
- DSAJWYNOEDNPEQ-UHFFFAOYSA-N barium atom Chemical compound [Ba] DSAJWYNOEDNPEQ-UHFFFAOYSA-N 0.000 claims description 2
- 229910052791 calcium Inorganic materials 0.000 claims description 2
- 239000011575 calcium Substances 0.000 claims description 2
- 229910000986 non-evaporable getter Inorganic materials 0.000 claims description 2
- 239000012521 purified sample Substances 0.000 claims description 2
- 230000003068 static effect Effects 0.000 claims description 2
- 238000011144 upstream manufacturing Methods 0.000 claims 2
- 239000011358 absorbing material Substances 0.000 claims 1
- -1 bulk flow Substances 0.000 claims 1
- 229910052756 noble gas Inorganic materials 0.000 claims 1
- JQPTYAILLJKUCY-UHFFFAOYSA-N palladium(ii) oxide Chemical compound [O-2].[Pd+2] JQPTYAILLJKUCY-UHFFFAOYSA-N 0.000 claims 1
- 229910052706 scandium Inorganic materials 0.000 claims 1
- SIXSYDAISGFNSX-UHFFFAOYSA-N scandium atom Chemical compound [Sc] SIXSYDAISGFNSX-UHFFFAOYSA-N 0.000 claims 1
- 238000011403 purification operation Methods 0.000 abstract description 3
- 238000012360 testing method Methods 0.000 description 45
- CURLTUGMZLYLDI-UHFFFAOYSA-N Carbon dioxide Chemical compound O=C=O CURLTUGMZLYLDI-UHFFFAOYSA-N 0.000 description 16
- VNWKTOKETHGBQD-UHFFFAOYSA-N methane Chemical compound C VNWKTOKETHGBQD-UHFFFAOYSA-N 0.000 description 12
- 238000005259 measurement Methods 0.000 description 11
- 238000005516 engineering process Methods 0.000 description 10
- 230000000875 corresponding effect Effects 0.000 description 9
- 239000001569 carbon dioxide Substances 0.000 description 8
- 229910002092 carbon dioxide Inorganic materials 0.000 description 8
- 239000000126 substance Substances 0.000 description 8
- 238000002474 experimental method Methods 0.000 description 7
- 238000006243 chemical reaction Methods 0.000 description 6
- 238000012546 transfer Methods 0.000 description 6
- 230000035945 sensitivity Effects 0.000 description 5
- 150000002431 hydrogen Chemical class 0.000 description 4
- 238000004445 quantitative analysis Methods 0.000 description 4
- 230000002441 reversible effect Effects 0.000 description 4
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 3
- 230000005684 electric field Effects 0.000 description 3
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- RAHZWNYVWXNFOC-UHFFFAOYSA-N Sulphur dioxide Chemical compound O=S=O RAHZWNYVWXNFOC-UHFFFAOYSA-N 0.000 description 2
- 239000012491 analyte Substances 0.000 description 2
- 239000012300 argon atmosphere Substances 0.000 description 2
- 238000000668 atmospheric pressure chemical ionisation mass spectrometry Methods 0.000 description 2
- 230000008901 benefit Effects 0.000 description 2
- 239000003153 chemical reaction reagent Substances 0.000 description 2
- 230000000052 comparative effect Effects 0.000 description 2
- 238000001514 detection method Methods 0.000 description 2
- OSVXSBDYLRYLIG-UHFFFAOYSA-N dioxidochlorine(.) Chemical compound O=Cl=O OSVXSBDYLRYLIG-UHFFFAOYSA-N 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000012530 fluid Substances 0.000 description 2
- 239000008246 gaseous mixture Substances 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 230000007935 neutral effect Effects 0.000 description 2
- QJGQUHMNIGDVPM-UHFFFAOYSA-N nitrogen(.) Chemical compound [N] QJGQUHMNIGDVPM-UHFFFAOYSA-N 0.000 description 2
- HBEQXAKJSGXAIQ-UHFFFAOYSA-N oxopalladium Chemical compound [Pd]=O HBEQXAKJSGXAIQ-UHFFFAOYSA-N 0.000 description 2
- 229910052760 oxygen Inorganic materials 0.000 description 2
- 239000001301 oxygen Substances 0.000 description 2
- 239000002245 particle Substances 0.000 description 2
- 238000005240 physical vapour deposition Methods 0.000 description 2
- 238000005381 potential energy Methods 0.000 description 2
- 229910052704 radon Inorganic materials 0.000 description 2
- SYUHGPGVQRZVTB-UHFFFAOYSA-N radon atom Chemical compound [Rn] SYUHGPGVQRZVTB-UHFFFAOYSA-N 0.000 description 2
- 238000001179 sorption measurement Methods 0.000 description 2
- 238000001228 spectrum Methods 0.000 description 2
- 238000006276 transfer reaction Methods 0.000 description 2
- UGFAIRIUMAVXCW-UHFFFAOYSA-N Carbon monoxide Chemical class [O+]#[C-] UGFAIRIUMAVXCW-UHFFFAOYSA-N 0.000 description 1
- 239000004155 Chlorine dioxide Substances 0.000 description 1
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 1
- 229910021536 Zeolite Inorganic materials 0.000 description 1
- 230000005856 abnormality Effects 0.000 description 1
- 230000001133 acceleration Effects 0.000 description 1
- 239000002253 acid Substances 0.000 description 1
- 239000003463 adsorbent Substances 0.000 description 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- 150000001412 amines Chemical class 0.000 description 1
- 239000012298 atmosphere Substances 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 229910002090 carbon oxide Inorganic materials 0.000 description 1
- 230000003197 catalytic effect Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000000451 chemical ionisation Methods 0.000 description 1
- 239000013626 chemical specie Substances 0.000 description 1
- 235000019398 chlorine dioxide Nutrition 0.000 description 1
- 229910052804 chromium Inorganic materials 0.000 description 1
- 239000011651 chromium Substances 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 239000000356 contaminant Substances 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 238000007872 degassing Methods 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000010790 dilution Methods 0.000 description 1
- 239000012895 dilution Substances 0.000 description 1
- HNPSIPDUKPIQMN-UHFFFAOYSA-N dioxosilane;oxo(oxoalumanyloxy)alumane Chemical compound O=[Si]=O.O=[Al]O[Al]=O HNPSIPDUKPIQMN-UHFFFAOYSA-N 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 239000007792 gaseous phase Substances 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 150000002576 ketones Chemical class 0.000 description 1
- VUZPPFZMUPKLLV-UHFFFAOYSA-N methane;hydrate Chemical compound C.O VUZPPFZMUPKLLV-UHFFFAOYSA-N 0.000 description 1
- 238000013508 migration Methods 0.000 description 1
- 230000005012 migration Effects 0.000 description 1
- 238000006386 neutralization reaction Methods 0.000 description 1
- 150000002989 phenols Chemical class 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 230000002285 radioactive effect Effects 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 230000000717 retained effect Effects 0.000 description 1
- 229910052701 rubidium Inorganic materials 0.000 description 1
- IGLNJRXAVVLDKE-UHFFFAOYSA-N rubidium atom Chemical compound [Rb] IGLNJRXAVVLDKE-UHFFFAOYSA-N 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- 238000012306 spectroscopic technique Methods 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 239000010935 stainless steel Substances 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
- 238000010561 standard procedure Methods 0.000 description 1
- 230000009466 transformation Effects 0.000 description 1
- 230000001960 triggered effect Effects 0.000 description 1
- 229910052720 vanadium Inorganic materials 0.000 description 1
- GPPXJZIENCGNKB-UHFFFAOYSA-N vanadium Chemical compound [V]#[V] GPPXJZIENCGNKB-UHFFFAOYSA-N 0.000 description 1
- 239000012808 vapor phase Substances 0.000 description 1
- 239000002699 waste material Substances 0.000 description 1
- 239000010457 zeolite Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/62—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
- G01N27/622—Ion mobility spectrometry
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01B—NON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
- C01B23/00—Noble gases; Compounds thereof
- C01B23/001—Purification or separation processes of noble gases
- C01B23/0036—Physical processing only
- C01B23/0052—Physical processing only by adsorption in solids
- C01B23/0084—Physical processing only by adsorption in solids in getters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/62—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
- G01N27/64—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode using wave or particle radiation to ionise a gas, e.g. in an ionisation chamber
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
- G01N33/0004—Gaseous mixtures, e.g. polluted air
- G01N33/0009—General constructional details of gas analysers, e.g. portable test equipment
- G01N33/0027—General constructional details of gas analysers, e.g. portable test equipment concerning the detector
- G01N33/0036—General constructional details of gas analysers, e.g. portable test equipment concerning the detector specially adapted to detect a particular component
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01B—NON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
- C01B2210/00—Purification or separation of specific gases
- C01B2210/0029—Obtaining noble gases
- C01B2210/0034—Argon
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01B—NON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
- C01B2210/00—Purification or separation of specific gases
- C01B2210/0042—Making ultrapure specific gas
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01B—NON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
- C01B2210/00—Purification or separation of specific gases
- C01B2210/0043—Impurity removed
- C01B2210/0046—Nitrogen
Landscapes
- Chemical & Material Sciences (AREA)
- Health & Medical Sciences (AREA)
- Physics & Mathematics (AREA)
- Analytical Chemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Organic Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Electrochemistry (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Inorganic Chemistry (AREA)
- Combustion & Propulsion (AREA)
- Food Science & Technology (AREA)
- Medicinal Chemistry (AREA)
- Toxicology (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| IT2000MI002479A IT1319667B1 (it) | 2000-11-17 | 2000-11-17 | Metodo per la misura della concentrazione di azoto in argon mediantespettroscopia di mobilita' ionica. |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TW524972B true TW524972B (en) | 2003-03-21 |
Family
ID=11446120
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW090127440A TW524972B (en) | 2000-11-17 | 2001-11-05 | A method for measuring the concentration of nitrogen in argon by means of ionization mobility spectrometry |
Country Status (12)
| Country | Link |
|---|---|
| US (1) | US6740873B2 (cg-RX-API-DMAC10.html) |
| EP (1) | EP1334354A1 (cg-RX-API-DMAC10.html) |
| JP (1) | JP3964785B2 (cg-RX-API-DMAC10.html) |
| KR (1) | KR20030045858A (cg-RX-API-DMAC10.html) |
| CN (1) | CN1232820C (cg-RX-API-DMAC10.html) |
| AU (1) | AU2002222511A1 (cg-RX-API-DMAC10.html) |
| CA (1) | CA2427299A1 (cg-RX-API-DMAC10.html) |
| IL (1) | IL155547A0 (cg-RX-API-DMAC10.html) |
| IT (1) | IT1319667B1 (cg-RX-API-DMAC10.html) |
| MY (1) | MY128966A (cg-RX-API-DMAC10.html) |
| TW (1) | TW524972B (cg-RX-API-DMAC10.html) |
| WO (1) | WO2002040984A1 (cg-RX-API-DMAC10.html) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI486573B (zh) * | 2009-12-04 | 2015-06-01 | Hon Hai Prec Ind Co Ltd | 離子濃度監控系統 |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| ITMI20012389A1 (it) * | 2001-11-12 | 2003-05-12 | Getters Spa | Catodo cavo con getter integrato per lampade a scarica e metodi per la sua realizzazione |
| ITMI20041523A1 (it) * | 2004-07-27 | 2004-10-27 | Getters Spa | Spettrometro di mobilita' ionica comprendente un elemento ionizzante a scarica a corona |
| CA2643094C (en) * | 2006-02-28 | 2013-12-03 | Panalytique Inc. | System and method of eliminating interference for impurities measurement in noble gases |
| CA2653623C (en) | 2006-06-09 | 2018-05-29 | Ion Applications, Inc. | Miniaturized ion mobility spectrometer |
| US9769122B2 (en) * | 2014-08-28 | 2017-09-19 | Facebook, Inc. | Anonymous single sign-on to third-party systems |
| CN105628779A (zh) * | 2014-10-28 | 2016-06-01 | 中国科学院大连化学物理研究所 | 一种血液中丙泊酚的在线监测仪及其应用 |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4551624A (en) | 1983-09-23 | 1985-11-05 | Allied Corporation | Ion mobility spectrometer system with improved specificity |
| JPS623008A (ja) * | 1985-06-28 | 1987-01-09 | 大陽酸素株式会社 | アルゴンの超精製装置、並びに精製方法 |
| US5032721A (en) | 1990-06-01 | 1991-07-16 | Environmental Technologies Group, Inc. | Acid gas monitor based on ion mobility spectrometry |
| US5095206A (en) | 1990-06-01 | 1992-03-10 | Environmental Technologies Group, Inc. | Method and apparatus for improving the specificity of an ion mobility spectrometer utillizing sulfur dioxide dopant chemistry |
| AT396075B (de) | 1990-11-20 | 1993-05-25 | Voest Alpine Ind Anlagen | Verfahren zum legen eines drahtes in kreisfoermige windungen |
| US5457316A (en) * | 1994-12-23 | 1995-10-10 | Pcp, Inc. | Method and apparatus for the detection and identification of trace gases |
| US5902561A (en) * | 1995-09-29 | 1999-05-11 | D.D.I. Limited | Low temperature inert gas purifier |
| US5955886A (en) | 1997-07-10 | 1999-09-21 | Pcp, Inc. | Microliter-sized ionization device and method |
| US5789745A (en) * | 1997-10-28 | 1998-08-04 | Sandia Corporation | Ion mobility spectrometer using frequency-domain separation |
-
2000
- 2000-11-17 IT IT2000MI002479A patent/IT1319667B1/it active
-
2001
- 2001-11-05 TW TW090127440A patent/TW524972B/zh not_active IP Right Cessation
- 2001-11-08 KR KR10-2003-7006726A patent/KR20030045858A/ko not_active Abandoned
- 2001-11-08 JP JP2002542862A patent/JP3964785B2/ja not_active Expired - Fee Related
- 2001-11-08 CA CA002427299A patent/CA2427299A1/en not_active Abandoned
- 2001-11-08 CN CNB01819043XA patent/CN1232820C/zh not_active Expired - Fee Related
- 2001-11-08 WO PCT/IT2001/000561 patent/WO2002040984A1/en not_active Ceased
- 2001-11-08 EP EP01996737A patent/EP1334354A1/en not_active Withdrawn
- 2001-11-08 IL IL15554701A patent/IL155547A0/xx not_active IP Right Cessation
- 2001-11-08 AU AU2002222511A patent/AU2002222511A1/en not_active Abandoned
- 2001-11-16 MY MYPI20015268A patent/MY128966A/en unknown
-
2003
- 2003-05-16 US US10/439,888 patent/US6740873B2/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI486573B (zh) * | 2009-12-04 | 2015-06-01 | Hon Hai Prec Ind Co Ltd | 離子濃度監控系統 |
Also Published As
| Publication number | Publication date |
|---|---|
| HK1062199A1 (en) | 2004-10-21 |
| CA2427299A1 (en) | 2002-05-23 |
| EP1334354A1 (en) | 2003-08-13 |
| MY128966A (en) | 2007-03-30 |
| CN1232820C (zh) | 2005-12-21 |
| IL155547A0 (en) | 2003-11-23 |
| JP2004514137A (ja) | 2004-05-13 |
| US6740873B2 (en) | 2004-05-25 |
| US20030201388A1 (en) | 2003-10-30 |
| IT1319667B1 (it) | 2003-10-23 |
| WO2002040984A1 (en) | 2002-05-23 |
| CN1474942A (zh) | 2004-02-11 |
| KR20030045858A (ko) | 2003-06-11 |
| JP3964785B2 (ja) | 2007-08-22 |
| AU2002222511A1 (en) | 2002-05-27 |
| ITMI20002479A1 (it) | 2002-05-17 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GD4A | Issue of patent certificate for granted invention patent | ||
| MM4A | Annulment or lapse of patent due to non-payment of fees |